Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
23287 | 351 | 15.7 | 58% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
37 | 3 | PHYSICS, CONDENSED MATTER//PHYSICAL REVIEW B//QUANTUM DOTS | 103171 |
125 | 2 | SUPERLATTICES AND MICROSTRUCTURES//QUANTUM WELLS//PHYSICS, CONDENSED MATTER | 24068 |
23287 | 1 | GAAS DOPING SUPERLATTICE//SELF ORDERED GROWTH//ABSORPTIVE OPTICAL SWITCHES | 351 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | GAAS DOPING SUPERLATTICE | authKW | 173989 | 1% | 100% | 2 |
2 | SELF ORDERED GROWTH | authKW | 173989 | 1% | 100% | 2 |
3 | ABSORPTIVE OPTICAL SWITCHES | authKW | 86995 | 0% | 100% | 1 |
4 | BASIC TECHNOL CORP | address | 86995 | 0% | 100% | 1 |
5 | BE FOCUSSED ION BEAM IMPLANTATION | authKW | 86995 | 0% | 100% | 1 |
6 | DISPLACEMENT DAMAGE DOSE PROFILE | authKW | 86995 | 0% | 100% | 1 |
7 | ETCHING GAAS | authKW | 86995 | 0% | 100% | 1 |
8 | FOR UNGSZENTRUM ICT IONENTECH | address | 86995 | 0% | 100% | 1 |
9 | FREE CARRIER PLASMA | authKW | 86995 | 0% | 100% | 1 |
10 | GIANT AMBIPOLAR DIFFUSION | authKW | 86995 | 0% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 2268 | 42% | 0% | 149 |
2 | Physics, Applied | 1534 | 43% | 0% | 151 |
3 | Engineering, Electrical & Electronic | 154 | 15% | 0% | 51 |
4 | Optics | 153 | 10% | 0% | 35 |
5 | Physics, Multidisciplinary | 49 | 7% | 0% | 25 |
6 | Nanoscience & Nanotechnology | 46 | 5% | 0% | 17 |
7 | Crystallography | 37 | 3% | 0% | 12 |
8 | Materials Science, Multidisciplinary | 26 | 10% | 0% | 34 |
9 | Computer Science, Hardware & Architecture | 22 | 2% | 0% | 6 |
10 | Instruments & Instrumentation | 18 | 3% | 0% | 11 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | BASIC TECHNOL CORP | 86995 | 0% | 100% | 1 |
2 | FOR UNGSZENTRUM ICT IONENTECH | 86995 | 0% | 100% | 1 |
3 | HUNTER S 375 | 86995 | 0% | 100% | 1 |
4 | ORION STATE SCI | 86995 | 0% | 100% | 1 |
5 | PHOTON FUNCT DEVICE | 86995 | 0% | 100% | 1 |
6 | TECH PHYS 1 | 61766 | 2% | 10% | 7 |
7 | SONDERFOR BEREICH SFB 254 | 28997 | 0% | 33% | 1 |
8 | UNMANNED SYST | 6690 | 0% | 8% | 1 |
9 | NANOPOWER | 3623 | 0% | 4% | 1 |
10 | TECH PHYS 3 | 3344 | 0% | 4% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SUPERLATTICES AND MICROSTRUCTURES | 14007 | 9% | 1% | 32 |
2 | HEWLETT-PACKARD JOURNAL | 9393 | 2% | 2% | 6 |
3 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 2618 | 4% | 0% | 13 |
4 | APPLIED PHYSICS LETTERS | 2356 | 16% | 0% | 55 |
5 | CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES | 1190 | 0% | 1% | 1 |
6 | JOURNAL OF APPLIED PHYSICS | 1022 | 10% | 0% | 36 |
7 | PHYSICAL REVIEW B | 636 | 10% | 0% | 36 |
8 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 621 | 3% | 0% | 12 |
9 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 507 | 3% | 0% | 10 |
10 | TECHNISCHES MESSEN | 469 | 1% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | DOHLER, GH , (1987) THE PHYSICS AND APPLICATIONS OF N-I-P-I DOPING SUPERLATTICES.CRC CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES. VOL. 13. ISSUE 2. P. 97 -141 | 35 | 70% | 20 |
2 | DOHLER, GH , (1986) DOPING SUPERLATTICES (N-I-P-I CRYSTALS).IEEE JOURNAL OF QUANTUM ELECTRONICS. VOL. 22. ISSUE 9. P. 1682-1695 | 27 | 71% | 145 |
3 | YANG, ZYJ , GARMIRE, EM , DOCTOR, D , (1997) OPTICAL STUDIES OF CARRIER KINETICS IN A TYPE II MULTIPLE QUANTUM WELL HETERO-N-I-P-I STRUCTURE.JOURNAL OF APPLIED PHYSICS. VOL. 82. ISSUE 8. P. 3874-3880 | 17 | 68% | 3 |
4 | DOHLER, GH , (1990) NONLINEAR OPTICAL-PROPERTIES OF N-I-P-I AND HETERO-N-I-P-I STRUCTURES AND THEIR POTENTIAL FOR APPLICATION IN PHOTONICS.OPTICAL AND QUANTUM ELECTRONICS. VOL. 22. ISSUE . P. S121-S139 | 18 | 82% | 22 |
5 | DOHLER, GH , (1986) LIGHT GENERATION, MODULATION, AND AMPLIFICATION BY N-I-P-I DOPING SUPERLATTICES.OPTICAL ENGINEERING. VOL. 25. ISSUE 2. P. 211 -218 | 18 | 86% | 7 |
6 | MALZER, S , KNEISSL, M , KIESEL, P , GULDEN, KH , WU, XX , SMITH, JS , DOHLER, GH , (1996) PROPERTIES AND APPLICATIONS OF THE ''EPITAXIAL SHADOW MASK MOLECULAR BEAM EPITAXY TECHNIQUE''.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 14. ISSUE 3. P. 2175 -2179 | 10 | 91% | 2 |
7 | DOHLER, GH , (1990) ELECTROOPTICAL AND OPTOOPTICAL DEVICES BASED ON N-I-P-I DOPING SUPERLATTICES.SUPERLATTICES AND MICROSTRUCTURES. VOL. 8. ISSUE 1. P. 49-58 | 14 | 82% | 6 |
8 | DOHLER, GH , (1985) THE POTENTIAL OF N-I-P-I DOPING SUPERLATICES FOR NOVEL SEMICONDUCTOR-DEVICES.SUPERLATTICES AND MICROSTRUCTURES. VOL. 1. ISSUE 3. P. 279-287 | 16 | 94% | 7 |
9 | OSWALD, J , PIPPAN, M , (1993) REVIEW OF NIPI STRUCTURES FOR PHOTON DETECTION.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 8. ISSUE 1. P. S435-S442 | 14 | 70% | 3 |
10 | DOHLER, GH , RUDEN, P , (1984) PROPERTIES OF N-I-P-I DOPING SUPERLATTICES IN III-V AND IV-VI SEMICONDUCTORS.SURFACE SCIENCE. VOL. 142. ISSUE 1-3. P. 474-485 | 16 | 94% | 13 |
Classes with closest relation at Level 1 |