Class information for:
Level 1: SHEAROGRAPHY//SPECKLE INTERFEROMETRY//PHASE UNWRAPPING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
805 3054 17.7 59%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
10 4 OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY 1131262
217 3       OPTICS//APPLIED OPTICS//OPTICAL ENGINEERING 50829
1780 2             DIGITAL IMAGE CORRELATION//OPTICS AND LASERS IN ENGINEERING//SPECKLE INTERFEROMETRY 6371
805 1                   SHEAROGRAPHY//SPECKLE INTERFEROMETRY//PHASE UNWRAPPING 3054

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SHEAROGRAPHY authKW 645174 3% 69% 93
2 SPECKLE INTERFEROMETRY authKW 592194 4% 50% 118
3 PHASE UNWRAPPING authKW 540125 5% 37% 145
4 PL COMP MECH address 494411 3% 63% 78
5 FRINGE ANALYSIS authKW 418960 3% 40% 104
6 PHASE SHIFTING authKW 327918 4% 28% 116
7 OPTICS AND LASERS IN ENGINEERING journal 308334 11% 10% 325
8 ELECTRONIC SPECKLE PATTERN INTERFEROMETRY authKW 302045 2% 44% 68
9 PHASE SHIFTING INTERFEROMETRY authKW 298600 2% 43% 70
10 ESPI authKW 274410 2% 44% 62

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with term
in class
1 Optics 111511 78% 0% 2390
2 Materials Science, Characterization, Testing 3920 5% 0% 141
3 Engineering, General 797 4% 0% 134
4 Instruments & Instrumentation 730 6% 0% 173
5 Imaging Science & Photographic Technology 227 1% 0% 43
6 Remote Sensing 125 1% 0% 32
7 Mechanics 123 3% 0% 100
8 Engineering, Mechanical 122 3% 0% 91
9 Materials Science, Composites 43 1% 0% 23
10 Physics, Applied 16 5% 0% 151

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PL COMP MECH 494411 3% 63% 78
2 TECNOL OPT FOTON 51410 0% 86% 6
3 PL OPT METROL 46510 0% 42% 11
4 GERI 43452 0% 43% 10
5 COHERENT ELE OOPT GRP 37626 0% 47% 8
6 OPT FIS 35699 0% 71% 5
7 MICROMECH PHOTON 34167 1% 13% 27
8 INTERFEROMETRIA HOLOG 29990 0% 100% 3
9 PL OPT 27261 1% 7% 42
10 MECH PROD SCI ENGN 26655 0% 67% 4

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 OPTICS AND LASERS IN ENGINEERING 308334 11% 10% 325
2 APPLIED OPTICS 120960 21% 2% 649
3 OPTICAL ENGINEERING 63579 10% 2% 297
4 OPTICS AND LASER TECHNOLOGY 18531 3% 2% 92
5 OPTIK 15314 4% 1% 128
6 OPTICS COMMUNICATIONS 15160 7% 1% 200
7 JOURNAL OF MODERN OPTICS 10025 3% 1% 80
8 MEASUREMENT SCIENCE AND TECHNOLOGY 8592 3% 1% 89
9 JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION 8304 3% 1% 91
10 OPTICS LETTERS 6462 5% 0% 140

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SHEAROGRAPHY 645174 3% 69% 93 Search SHEAROGRAPHY Search SHEAROGRAPHY
2 SPECKLE INTERFEROMETRY 592194 4% 50% 118 Search SPECKLE+INTERFEROMETRY Search SPECKLE+INTERFEROMETRY
3 PHASE UNWRAPPING 540125 5% 37% 145 Search PHASE+UNWRAPPING Search PHASE+UNWRAPPING
4 FRINGE ANALYSIS 418960 3% 40% 104 Search FRINGE+ANALYSIS Search FRINGE+ANALYSIS
5 PHASE SHIFTING 327918 4% 28% 116 Search PHASE+SHIFTING Search PHASE+SHIFTING
6 ELECTRONIC SPECKLE PATTERN INTERFEROMETRY 302045 2% 44% 68 Search ELECTRONIC+SPECKLE+PATTERN+INTERFEROMETRY Search ELECTRONIC+SPECKLE+PATTERN+INTERFEROMETRY
7 PHASE SHIFTING INTERFEROMETRY 298600 2% 43% 70 Search PHASE+SHIFTING+INTERFEROMETRY Search PHASE+SHIFTING+INTERFEROMETRY
8 ESPI 274410 2% 44% 62 Search ESPI Search ESPI
9 DIGITAL SPECKLE PATTERN INTERFEROMETRY 249232 1% 64% 39 Search DIGITAL+SPECKLE+PATTERN+INTERFEROMETRY Search DIGITAL+SPECKLE+PATTERN+INTERFEROMETRY
10 FRINGE PATTERN ANALYSIS 166730 1% 60% 28 Search FRINGE+PATTERN+ANALYSIS Search FRINGE+PATTERN+ANALYSIS

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 DOVAL, AF , (2000) A SYSTEMATIC APPROACH TO TV HOLOGRAPHY.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 11. ISSUE 1. P. R1 -R36 133 87% 53
2 TRUSIAK, M , SLUZEWSKI, L , PATORSKI, K , (2016) SINGLE SHOT FRINGE PATTERN PHASE DEMODULATION USING HILBERT-HUANG TRANSFORM AIDED BY THE PRINCIPAL COMPONENT ANALYSIS.OPTICS EXPRESS. VOL. 24. ISSUE 4. P. 4221 -4238 66 93% 1
3 FRANCIS, D , TATAM, RP , GROVES, RM , (2010) SHEAROGRAPHY TECHNOLOGY AND APPLICATIONS: A REVIEW.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 21. ISSUE 10. P. - 77 87% 42
4 HACK, E , BURKE, J , (2011) INVITED REVIEW ARTICLE: MEASUREMENT UNCERTAINTY OF LINEAR PHASE-STEPPING ALGORITHMS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 82. ISSUE 6. P. - 64 96% 24
5 MENESES-FABIAN, C , LARA-CORTES, FA , (2015) PHASE RETRIEVAL BY EUCLIDEAN DISTANCE IN SELF-CALIBRATING GENERALIZED PHASE-SHIFTING INTERFEROMETRY OF THREE STEPS.OPTICS EXPRESS. VOL. 23. ISSUE 10. P. 13589 -13604 54 96% 3
6 DORRIO, BV , FERNANDEZ, JL , (1999) PHASE-EVALUATION METHODS IN WHOLE-FIELD OPTICAL MEASUREMENT TECHNIQUES.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 10. ISSUE 3. P. R33 -R55 97 75% 68
7 LIU, FW , WANG, J , WU, YQ , WU, F , TRUSIAK, M , PATORSKI, K , WAN, YJ , CHEN, Q , HOU, X , (2016) SIMULTANEOUS EXTRACTION OF PHASE AND PHASE SHIFT FROM TWO INTERFEROGRAMS USING LISSAJOUS FIGURE AND ELLIPSE FITTING TECHNOLOGY WITH HILBERT-HUANG PREFILTERING.JOURNAL OF OPTICS. VOL. 18. ISSUE 10. P. - 38 97% 0
8 CHEN, F , (2001) DIGITAL SHEAROGRAPHY: STATE OF THE ART AND SOME APPLICATIONS.JOURNAL OF ELECTRONIC IMAGING. VOL. 10. ISSUE 1. P. 240 -251 59 91% 10
9 TRUSIAK, M , PATORSKI, K , (2015) TWO-SHOT FRINGE PATTERN PHASE-AMPLITUDE DEMODULATION USING GRAM-SCHMIDT ORTHONORMALIZATION WITH HILBERT-HUANG PRE-FILTERING.OPTICS EXPRESS. VOL. 23. ISSUE 4. P. 4672 -4690 37 84% 11
10 TIAN, C , LIU, SC , (2016) DEMODULATION OF TWO-SHOT FRINGE PATTERNS WITH RANDOM PHASE SHIFTS BY USE OF ORTHOGONAL POLYNOMIALS AND GLOBAL OPTIMIZATION.OPTICS EXPRESS. VOL. 24. ISSUE 4. P. 3202 -3215 39 85% 1

Classes with closest relation at Level 1


Rank Class id link
1 31736 HISTORICAL PLASTER//THIN VAULTS//ARTWORK DIAGNOSTICS
2 2651 FRINGE PROJECTION//STRUCTURED LIGHT//3D SHAPE MEASUREMENT
3 17895 MOIRE INTERFEROMETRY//ELECTRON BEAM MOIRE//GEOMETRIC PHASE ANALYSIS
4 1642 DIGITAL HOLOGRAPHY//DIGITAL HOLOGRAPHIC MICROSCOPY//QUANTITAT LIGHT IMAGING
5 11434 WHITE LIGHT INTERFEROMETRY//WHITE LIGHT SCANNING INTERFEROMETRY//ELLIPSO HEIGHT TOPOMETRY
6 14103 SPECKLE PHOTOGRAPHY//OPTIMO//SPECKLE METROLOGY
7 21280 COLLIMATION TESTING//FOCAL LENGTH MEASUREMENT//BEIJING PRECIS OPTOELECT MEASUREMENT
8 14505 ABSOLUTE TEST//SUBAPERTURE STITCHING//OPTICAL TESTING
9 12982 ABSOLUTE DISTANCE MEASUREMENT//GAUGE BLOCK//AIR REFRACTIVE INDEX
10 14433 BACKGROUND ORIENTED SCHLIEREN//INFORMAT PHYS ENGN//MOIRE DEFLECTOMETRY

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