Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
17471 | 597 | 21.0 | 30% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | TECHNOLOGY MAPPING | authKW | 513430 | 5% | 31% | 32 |
2 | FPGA ARCHITECTURE | authKW | 364037 | 2% | 65% | 11 |
3 | FINE GRAIN RECONFIGURABLE VLSI | authKW | 306881 | 1% | 100% | 6 |
4 | ROUTABILITY | authKW | 210417 | 2% | 34% | 12 |
5 | FIELD PROGRAMMABLE GATE ARRAY FPGA ARCHITECTURE | authKW | 204587 | 1% | 100% | 4 |
6 | FPGA TESTING | authKW | 204587 | 1% | 100% | 4 |
7 | FPGA | authKW | 203094 | 17% | 4% | 100 |
8 | STRUCTURED ASIC | authKW | 184124 | 1% | 60% | 6 |
9 | FIELD PROGRAMMABLE GATE ARRAYS FPGAS | authKW | 173328 | 6% | 10% | 34 |
10 | SEGMENTED CHANNEL | authKW | 163668 | 1% | 80% | 4 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Computer Science, Hardware & Architecture | 67631 | 60% | 0% | 356 |
2 | Engineering, Electrical & Electronic | 7924 | 66% | 0% | 396 |
3 | Computer Science, Software Engineering | 2842 | 16% | 0% | 97 |
4 | Computer Science, Interdisciplinary Applications | 1805 | 15% | 0% | 91 |
5 | Computer Science, Theory & Methods | 1113 | 12% | 0% | 74 |
6 | Computer Science, Information Systems | 839 | 10% | 0% | 61 |
7 | Logic | 48 | 1% | 0% | 4 |
8 | Automation & Control Systems | 36 | 2% | 0% | 12 |
9 | Computer Science, Artificial Intelligence | 31 | 3% | 0% | 15 |
10 | Nanoscience & Nanotechnology | 25 | 3% | 0% | 19 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | DESIGN AUTOMAT TEST | 102294 | 0% | 100% | 2 |
2 | ELE OINFORMAT GRP | 102294 | 0% | 100% | 2 |
3 | EMBEDDED SYST ON CHIP GRP | 102294 | 0% | 100% | 2 |
4 | SYST LEVEL INTEGRAT GRP | 92062 | 1% | 60% | 3 |
5 | FPGA SOFTWARE CORE GRP | 76717 | 1% | 50% | 3 |
6 | SYST PROGRAMMABLE CHIP | 68194 | 0% | 67% | 2 |
7 | ADV PROP SYST GRP | 51147 | 0% | 100% | 1 |
8 | ASICS GRP | 51147 | 0% | 100% | 1 |
9 | COM SCI SYST ENGN | 51147 | 0% | 100% | 1 |
10 | COMBINATOR OPTIMIZAT MC 6056 | 51147 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS | 73989 | 12% | 2% | 70 |
2 | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 72622 | 14% | 2% | 83 |
3 | ACM TRANSACTIONS ON RECONFIGURABLE TECHNOLOGY AND SYSTEMS | 68401 | 3% | 8% | 17 |
4 | ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS | 42292 | 4% | 3% | 25 |
5 | JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 13704 | 3% | 2% | 17 |
6 | IET COMPUTERS AND DIGITAL TECHNIQUES | 9550 | 2% | 2% | 9 |
7 | VLSI DESIGN | 9292 | 2% | 2% | 9 |
8 | IEEE DESIGN & TEST OF COMPUTERS | 7454 | 2% | 1% | 12 |
9 | IEEE TRANSACTIONS ON COMPUTERS | 7179 | 5% | 1% | 27 |
10 | IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES | 6066 | 2% | 1% | 9 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | TECHNOLOGY MAPPING | 513430 | 5% | 31% | 32 | Search TECHNOLOGY+MAPPING | Search TECHNOLOGY+MAPPING |
2 | FPGA ARCHITECTURE | 364037 | 2% | 65% | 11 | Search FPGA+ARCHITECTURE | Search FPGA+ARCHITECTURE |
3 | FINE GRAIN RECONFIGURABLE VLSI | 306881 | 1% | 100% | 6 | Search FINE+GRAIN+RECONFIGURABLE+VLSI | Search FINE+GRAIN+RECONFIGURABLE+VLSI |
4 | ROUTABILITY | 210417 | 2% | 34% | 12 | Search ROUTABILITY | Search ROUTABILITY |
5 | FIELD PROGRAMMABLE GATE ARRAY FPGA ARCHITECTURE | 204587 | 1% | 100% | 4 | Search FIELD+PROGRAMMABLE+GATE+ARRAY+FPGA+ARCHITECTURE | Search FIELD+PROGRAMMABLE+GATE+ARRAY+FPGA+ARCHITECTURE |
6 | FPGA TESTING | 204587 | 1% | 100% | 4 | Search FPGA+TESTING | Search FPGA+TESTING |
7 | FPGA | 203094 | 17% | 4% | 100 | Search FPGA | Search FPGA |
8 | STRUCTURED ASIC | 184124 | 1% | 60% | 6 | Search STRUCTURED+ASIC | Search STRUCTURED+ASIC |
9 | FIELD PROGRAMMABLE GATE ARRAYS FPGAS | 173328 | 6% | 10% | 34 | Search FIELD+PROGRAMMABLE+GATE+ARRAYS+FPGAS | Search FIELD+PROGRAMMABLE+GATE+ARRAYS+FPGAS |
10 | SEGMENTED CHANNEL | 163668 | 1% | 80% | 4 | Search SEGMENTED+CHANNEL | Search SEGMENTED+CHANNEL |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | RUAN, AW , HUANG, HY , WANG, JW , ZHAO, YF , (2016) A ROUTABILITY-AWARE ALGORITHM FOR BOTH GLOBAL AND LOCAL INTERCONNECT RESOURCE TEST AND DIAGNOSIS OF XILINX SRAM-FPGAS.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS. VOL. 32. ISSUE 6. P. 749 -762 | 12 | 92% | 0 |
2 | GUPTE, A , VYAS, S , JONES, PH , (2015) A FAULT-AWARE TOOLCHAIN APPROACH FOR FPGA FAULT TOLERANCE.ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. VOL. 20. ISSUE 2. P. - | 15 | 65% | 0 |
3 | DOUMAR, A , ITO, H , (2003) DETECTING, DIAGNOSING, AND TOLERATING FAULTS IN SRAM-BASED FIELD PROGRAMMABLE GATE ARRAYS: A SURVEY.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. VOL. 11. ISSUE 3. P. 386 -405 | 15 | 79% | 23 |
4 | RUAN, AW , JIE, BR , WAN, L , YANG, JH , XIANG, CY , ZHU, ZJ , WANG, Y , (2014) A BITSTREAM READBACK-BASED AUTOMATIC FUNCTIONAL TEST AND DIAGNOSIS METHOD FOR XILINX FPGAS.MICROELECTRONICS RELIABILITY. VOL. 54. ISSUE 8. P. 1627 -1635 | 9 | 100% | 1 |
5 | ZHANG, DH , LI, W , DU, T , (2015) A MULTILEVEL PSEUDO-BOOLEAN SATISFIABILITY-BASED APPROACH FOR SEGMENTED CHANNEL ROUTING.JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS. VOL. 24. ISSUE 6. P. - | 10 | 83% | 0 |
6 | FAN, HB , LIU, JP , WU, YL , CHEUNG, CC , (2003) ON OPTIMAL HYPERUNIVERSAL AND REARRANGEABLE SWITCH BOX DESIGNS.IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. VOL. 22. ISSUE 12. P. 1637-1649 | 11 | 100% | 8 |
7 | MUTUKUDA, O , YE, A , KHAN, G , (2012) UTILIZING MULTI-BIT CONNECTIONS TO IMPROVE THE AREA EFFICIENCY OF UNIDIRECTIONAL ROUTING RESOURCES FOR ROUTING MULTI-BIT SIGNALS ON FPGAS.MICROPROCESSORS AND MICROSYSTEMS. VOL. 36. ISSUE 3. P. 167 -175 | 8 | 100% | 0 |
8 | SEDCOLE, P , CHEUNG, P , STOTT, E , (2010) FAULT TOLERANCE AND RELIABILITY IN FIELD-PROGRAMMABLE GATE ARRAYS.IET COMPUTERS AND DIGITAL TECHNIQUES. VOL. 4. ISSUE 3. P. 196 -210 | 12 | 67% | 8 |
9 | PARRIS, MG , SHARMA, CA , DEMARA, RF , (2011) PROGRESS IN AUTONOMOUS FAULT RECOVERY OF FIELD PROGRAMMABLE GATE ARRAYS.ACM COMPUTING SURVEYS. VOL. 43. ISSUE 4. P. - | 10 | 77% | 7 |
10 | WANG, D , YANG, HG , XIE, XH , FAN, DR , WANG, F , (2016) ON-CHIP GENERATING FPGA TEST CONFIGURATION BITSTREAMS TO REDUCE MANUFACTURING TEST TIME.CHINESE JOURNAL OF ELECTRONICS. VOL. 25. ISSUE 1. P. 64 -70 | 7 | 100% | 0 |
Classes with closest relation at Level 1 |