Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
18551 | 547 | 18.2 | 45% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
217 | 3 | OPTICS//APPLIED OPTICS//OPTICAL ENGINEERING | 50829 |
1223 | 2 | PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY//THERMAL ERROR//COORDINATE MEASURING MACHINE | 9117 |
18551 | 1 | BULK INHOMOGENEITY//TOTAL INTEGRATED SCATTER//ISOTROPY DEGREE | 547 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | BULK INHOMOGENEITY | authKW | 279111 | 1% | 100% | 5 |
2 | TOTAL INTEGRATED SCATTER | authKW | 223289 | 1% | 100% | 4 |
3 | ISOTROPY DEGREE | authKW | 178629 | 1% | 80% | 4 |
4 | DEV OPT IL | address | 167467 | 1% | 100% | 3 |
5 | CHIP COILS | authKW | 111644 | 0% | 100% | 2 |
6 | DEEP HOLE MEASUREMENT | authKW | 111644 | 0% | 100% | 2 |
7 | FREE SPACE PATTERN | authKW | 111644 | 0% | 100% | 2 |
8 | PRECISION GROUND GLASS | authKW | 111644 | 0% | 100% | 2 |
9 | ROUGHNESS COUPLING | authKW | 111644 | 0% | 100% | 2 |
10 | UMR CNRSTIC | address | 111644 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Optics | 12016 | 61% | 0% | 334 |
2 | Spectroscopy | 713 | 10% | 0% | 57 |
3 | Physics, Applied | 324 | 18% | 0% | 99 |
4 | Materials Science, Coatings & Films | 310 | 6% | 0% | 32 |
5 | Instruments & Instrumentation | 186 | 7% | 0% | 36 |
6 | Physics, Condensed Matter | 98 | 9% | 0% | 50 |
7 | Engineering, General | 73 | 3% | 0% | 18 |
8 | Physics, Multidisciplinary | 56 | 6% | 0% | 35 |
9 | Materials Science, Multidisciplinary | 34 | 9% | 0% | 50 |
10 | Microscopy | 18 | 1% | 0% | 4 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | DEV OPT IL | 167467 | 1% | 100% | 3 |
2 | UMR CNRSTIC | 111644 | 0% | 100% | 2 |
3 | F NEL MARSEILLE | 100478 | 1% | 60% | 3 |
4 | ADV OPT PROC | 74428 | 0% | 67% | 2 |
5 | ARBEITSGRP OBERFLACHEN ICHTCHARAKTERISIERUNG | 55822 | 0% | 100% | 1 |
6 | BERLIN GE AFTSBEREICH LASERTECHN | 55822 | 0% | 100% | 1 |
7 | BUNDESAMT MAT PRUFUNG | 55822 | 0% | 100% | 1 |
8 | CHEM PHYS INTERDISCIPLINATY PROGRAM | 55822 | 0% | 100% | 1 |
9 | CNRS ST2I 6133UNIT MIXTE RECH F NEL S | 55822 | 0% | 100% | 1 |
10 | CNRS T2I 6133 F NELUNIT MIXTE RECH SC | 55822 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | APPLIED OPTICS | 25476 | 23% | 0% | 126 |
2 | PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | 18285 | 8% | 1% | 42 |
3 | JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE | 8555 | 2% | 2% | 10 |
4 | OPTICAL ENGINEERING | 4906 | 6% | 0% | 35 |
5 | MICRO | 2849 | 1% | 2% | 3 |
6 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 2383 | 1% | 1% | 6 |
7 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1818 | 3% | 0% | 18 |
8 | MEASUREMENT TECHNIQUES | 1030 | 1% | 0% | 6 |
9 | METALLOGRAPHY | 774 | 0% | 1% | 2 |
10 | INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES | 766 | 1% | 0% | 7 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | BULK INHOMOGENEITY | 279111 | 1% | 100% | 5 | Search BULK+INHOMOGENEITY | Search BULK+INHOMOGENEITY |
2 | TOTAL INTEGRATED SCATTER | 223289 | 1% | 100% | 4 | Search TOTAL+INTEGRATED+SCATTER | Search TOTAL+INTEGRATED+SCATTER |
3 | ISOTROPY DEGREE | 178629 | 1% | 80% | 4 | Search ISOTROPY+DEGREE | Search ISOTROPY+DEGREE |
4 | CHIP COILS | 111644 | 0% | 100% | 2 | Search CHIP+COILS | Search CHIP+COILS |
5 | DEEP HOLE MEASUREMENT | 111644 | 0% | 100% | 2 | Search DEEP+HOLE+MEASUREMENT | Search DEEP+HOLE+MEASUREMENT |
6 | FREE SPACE PATTERN | 111644 | 0% | 100% | 2 | Search FREE+SPACE+PATTERN | Search FREE+SPACE+PATTERN |
7 | PRECISION GROUND GLASS | 111644 | 0% | 100% | 2 | Search PRECISION+GROUND+GLASS | Search PRECISION+GROUND+GLASS |
8 | ROUGHNESS COUPLING | 111644 | 0% | 100% | 2 | Search ROUGHNESS+COUPLING | Search ROUGHNESS+COUPLING |
9 | ANGLE RESOLVED SCATTERING | 107344 | 1% | 38% | 5 | Search ANGLE+RESOLVED+SCATTERING | Search ANGLE+RESOLVED+SCATTERING |
10 | DEFECT INDUCED ABSORPTION | 74428 | 0% | 67% | 2 | Search DEFECT+INDUCED+ABSORPTION | Search DEFECT+INDUCED+ABSORPTION |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | VON FINCK, A , HERFFURTH, T , SCHRODER, S , DUPARRE, A , SINZINGER, S , (2014) CHARACTERIZATION OF OPTICAL COATINGS USING A MULTISOURCE TABLE-TOP SCATTEROMETER.APPLIED OPTICS. VOL. 53. ISSUE 4. P. A259 -A269 | 28 | 97% | 4 |
2 | GEORGES, G , ARNAUD, L , SIOZADE, L , LE NEINDRE, N , CHAZALLET, F , ZERRAD, M , DEUMIE, C , AMRA, C , (2008) FROM ANGLE-RESOLVED ELLIPSOMETRY OF LIGHT SCATTERING TO IMAGING IN RANDOM MEDIA.APPLIED OPTICS. VOL. 47. ISSUE 13. P. C257 -C265 | 22 | 100% | 2 |
3 | PAN, YQ , WU, ZS , HANG, LX , (2010) INVESTIGATION OF INTERFACE ROUGHNESS CROSS-CORRELATION PROPERTIES OF OPTICAL THIN FILMS FROM TOTAL SCATTERING LOSSES.APPLIED SURFACE SCIENCE. VOL. 256. ISSUE 11. P. 3503 -3507 | 20 | 100% | 1 |
4 | ZERRAD, M , LIUKAITYTE, S , LEQUIME, M , AMRA, C , (2016) LIGHT SCATTERED BY OPTICAL COATINGS: NUMERICAL PREDICTIONS AND COMPARISON TO EXPERIMENT FOR A GLOBAL ANALYSIS.APPLIED OPTICS. VOL. 55. ISSUE 34. P. 9680 -9687 | 19 | 90% | 0 |
5 | AMRA, C , DEUMIE, C , GILBERT, O , (2005) ELIMINATION OF POLARIZED LIGHT SCATTERED BY SURFACE ROUGHNESS OR BULK HETEROGENEITY.OPTICS EXPRESS. VOL. 13. ISSUE 26. P. 10854-10864 | 19 | 95% | 21 |
6 | ZERRAD, M , DEUMIE, C , LEQUIME, M , AMRA, C , (2007) AN ALTERNATIVE SCATTERING METHOD TO CHARACTERIZE SURFACE ROUGHNESS FROM TRANSPARENT SUBSTRATES.OPTICS EXPRESS. VOL. 15. ISSUE 15. P. 9222-9231 | 17 | 100% | 11 |
7 | HERFFURTH, T , TROST, M , SCHRODER, S , TASCHNER, K , BARTZSCH, H , FRACH, P , DUPARRE, A , TUNNERMANN, A , (2014) ROUGHNESS AND OPTICAL LOSSES OF RUGATE COATINGS.APPLIED OPTICS. VOL. 53. ISSUE 4. P. A351 -A359 | 15 | 88% | 0 |
8 | ZERRAD, M , LEQUIME, M , AMRA, C , (2014) FAR-FIELD SPATIALLY ANGLE-RESOLVED SCATTERING MEASUREMENTS: PRACTICAL WAY TO RECOVER SURFACE TOPOGRAPHY.OPTICAL ENGINEERING. VOL. 53. ISSUE 9. P. - | 14 | 93% | 0 |
9 | PAN, YQ , WU, ZS , HANG, LX , YIN, YB , (2010) LIGHT SCATTERING LOSSES OF HIGH REFLECTION DIELECTRIC MULTILAYER OPTICAL DEVICES.THIN SOLID FILMS. VOL. 518. ISSUE 8. P. 2001 -2005 | 14 | 100% | 1 |
10 | MAZULE, L , LIUKAITYTE, S , ECKARDT, RC , MELNINKAITIS, A , BALACHNINAITE, O , SIRUTKAITIS, V , (2011) A SYSTEM FOR MEASURING SURFACE ROUGHNESS BY TOTAL INTEGRATED SCATTERING.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 44. ISSUE 50. P. - | 16 | 84% | 4 |
Classes with closest relation at Level 1 |