Class information for:
Level 1: PHOTOCARRIER RADIOMETRY//ELECTRON ACOUSTIC MICROSCOPY//PA IMAGING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
10508 1057 14.8 52%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
16 4 ENGINEERING, CIVIL//CONSTRUCTION & BUILDING TECHNOLOGY//MECHANICS 627508
623 3       THERMAL DIFFUSIVITY//SALT WEATHERING//THERMAL LENS SPECTROMETRY 13641
1739 2             THERMAL LENS SPECTROMETRY//PHOTOACOUSTIC SPECTROSCOPY//THERMAL LENS 6529
10508 1                   PHOTOCARRIER RADIOMETRY//ELECTRON ACOUSTIC MICROSCOPY//PA IMAGING 1057

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PHOTOCARRIER RADIOMETRY authKW 295427 1% 68% 15
2 ELECTRON ACOUSTIC MICROSCOPY authKW 288871 1% 100% 10
3 PA IMAGING authKW 233984 1% 90% 9
4 CADIFT address 218452 1% 69% 11
5 PHOTOTHERMAL OPTOELECT DIAGNOST S address 160523 2% 33% 17
6 PHOTOACOUSTIC MICROSCOPE authKW 144436 0% 100% 5
7 NONDESTRUCTIVE OBSERVATION authKW 129989 1% 75% 6
8 ADV DIFFUS WAVE TECHNOL address 115777 2% 19% 21
9 PHOTODISPLACEMENT authKW 115549 0% 100% 4
10 ION ACOUSTIC MICROSCOPY authKW 86661 0% 100% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Applied 6780 51% 0% 543
2 Microscopy 540 3% 0% 27
3 Physics, Multidisciplinary 515 12% 0% 123
4 Instruments & Instrumentation 455 7% 0% 77
5 Physics, Condensed Matter 429 12% 0% 132
6 Materials Science, Characterization, Testing 333 2% 0% 25
7 Materials Science, Multidisciplinary 197 13% 0% 136
8 Engineering, Electrical & Electronic 141 9% 0% 99
9 Acoustics 111 2% 0% 24
10 Thermodynamics 102 3% 0% 33

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CADIFT 218452 1% 69% 11
2 PHOTOTHERMAL OPTOELECT DIAGNOST S 160523 2% 33% 17
3 ADV DIFFUS WAVE TECHNOL 115777 2% 19% 21
4 PURE PL SCI NAT SCI 77030 0% 67% 4
5 CNRS URA 840 38515 0% 67% 2
6 CNRSESPCI 10 28887 0% 100% 1
7 DCEDGA 28887 0% 100% 1
8 DIFFUS TECHNOL GRP 28887 0% 100% 1
9 DIFFUS WAVE TECHNOL 28887 0% 100% 1
10 ECOLE SUPER PHYS CHIM IND RUMENTAT 28887 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PROGRESS IN NATURAL SCIENCE-MATERIALS INTERNATIONAL 10120 3% 1% 29
2 JOURNAL DE PHYSIQUE IV 6138 4% 0% 47
3 PHYSICAL ACOUSTICS 6041 0% 7% 3
4 JOURNAL OF APPLIED PHYSICS 4693 13% 0% 133
5 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 4502 7% 0% 70
6 INTERNATIONAL JOURNAL OF THERMOPHYSICS 2980 2% 0% 21
7 SCANNING ELECTRON MICROSCOPY 2234 1% 1% 9
8 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 2092 1% 1% 8
9 APPLIED PHYSICS LETTERS 1878 8% 0% 87
10 SEMICONDUCTORS AND SEMIMETALS 1415 0% 1% 5

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 PHOTOCARRIER RADIOMETRY 295427 1% 68% 15 Search PHOTOCARRIER+RADIOMETRY Search PHOTOCARRIER+RADIOMETRY
2 ELECTRON ACOUSTIC MICROSCOPY 288871 1% 100% 10 Search ELECTRON+ACOUSTIC+MICROSCOPY Search ELECTRON+ACOUSTIC+MICROSCOPY
3 PA IMAGING 233984 1% 90% 9 Search PA+IMAGING Search PA+IMAGING
4 PHOTOACOUSTIC MICROSCOPE 144436 0% 100% 5 Search PHOTOACOUSTIC+MICROSCOPE Search PHOTOACOUSTIC+MICROSCOPE
5 NONDESTRUCTIVE OBSERVATION 129989 1% 75% 6 Search NONDESTRUCTIVE+OBSERVATION Search NONDESTRUCTIVE+OBSERVATION
6 PHOTODISPLACEMENT 115549 0% 100% 4 Search PHOTODISPLACEMENT Search PHOTODISPLACEMENT
7 ION ACOUSTIC MICROSCOPY 86661 0% 100% 3 Search ION+ACOUSTIC+MICROSCOPY Search ION+ACOUSTIC+MICROSCOPY
8 MODULATED FREE CARRIER ABSORPTION 86661 0% 100% 3 Search MODULATED+FREE+CARRIER+ABSORPTION Search MODULATED+FREE+CARRIER+ABSORPTION
9 MULTI PARAMETER FITTING 86661 0% 100% 3 Search MULTI+PARAMETER+FITTING Search MULTI+PARAMETER+FITTING
10 SCANNING PHOTOACOUSTIC MICROSCOPE 86661 0% 100% 3 Search SCANNING+PHOTOACOUSTIC+MICROSCOPE Search SCANNING+PHOTOACOUSTIC+MICROSCOPE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 WANG, Q , LI, BC , (2015) ACCURATE DETERMINATION OF ELECTRONIC TRANSPORT PROPERTIES OF SILICON WAFERS BY NONLINEAR PHOTOCARRIER RADIOMETRY WITH MULTIPLE PUMP BEAM SIZES.JOURNAL OF APPLIED PHYSICS. VOL. 118. ISSUE 21. P. - 21 91% 0
2 CHRISTOFIDES, C , (1997) PHOTOMODULATED THERMOREFLECTANCE INVESTIGATION OF IMPLANTED WAFERS. ANNEALING KINETICS OF DEFECTS.EFFECT OF DISORDER AND DEFECTS IN ION-IMPLANTED SEMICONDUCTORS : OPTICAL AND PHOTOTHERMAL CHARACTERIZATION. VOL. 46. ISSUE . P. 115 -150 36 84% 1
3 HUANG, QP , LI, BC , (2011) ELECTRONIC TRANSPORT CHARACTERIZATION OF SILICON WAFERS BY COMBINATION OF MODULATED FREE CARRIER ABSORPTION AND PHOTOCARRIER RADIOMETRY.JOURNAL OF APPLIED PHYSICS. VOL. 109. ISSUE 2. P. - 19 86% 4
4 LI, BC , SHAUGHNESSY, D , MANDELIS, A , BATISTA, J , GARCIA, J , (2004) THREE-LAYER PHOTOCARRIER RADIOMETRY MODEL OF ION-IMPLANTED SILICON WAFERS.JOURNAL OF APPLIED PHYSICS. VOL. 95. ISSUE 12. P. 7832-7840 24 77% 21
5 HUANG, QP , LI, BC , (2011) SELF-ELIMINATING INSTRUMENTAL FREQUENCY RESPONSE FROM FREE CARRIER ABSORPTION SIGNALS FOR SILICON WAFER CHARACTERIZATION.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 82. ISSUE 4. P. - 16 94% 3
6 MANDELIS, A , BATISTA, J , SHAUGHNESSY, D , (2003) INFRARED PHOTOCARRIER RADIOMETRY OF SEMICONDUCTORS: PHYSICAL PRINCIPLES, QUANTITATIVE DEPTH PROFILOMETRY, AND SCANNING IMAGING OF DEEP SUBSURFACE ELECTRONIC DEFECTS.PHYSICAL REVIEW B. VOL. 67. ISSUE 20. P. - 19 86% 88
7 ZHANG, XR , LI, BC , LIU, XM , (2008) ACCURACY ANALYSIS FOR THE DETERMINATION OF ELECTRONIC TRANSPORT PROPERTIES OF SI WAFERS USING MODULATED FREE CARRIER ABSORPTION.JOURNAL OF APPLIED PHYSICS. VOL. 104. ISSUE 10. P. - 19 83% 5
8 LI, BC , SHAUGHNESSY, D , MANDELIS, A , (2005) INFLUENCE OF VIGNETTING ON SIGNAL ANALYSIS OF PHOTOCARRIER RADIOMETRY OF SEMICONDUCTOR WAFERS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 76. ISSUE 6. P. - 16 100% 3
9 NAKATA, T , YOSHIMURA, K , NINOMIYA, T , (2006) REAL-TIME PHOTODISPLACEMENT MICROSCOPE FOR HIGH-SENSITIVITY SIMULTANEOUS SURFACE AND SUBSURFACE INSPECTION.APPLIED OPTICS. VOL. 45. ISSUE 12. P. 2643 -2655 17 89% 1
10 SHIRAISHI, D , ENDOH, H , HOSHIMIYA, T , (2009) NONDESTRUCTIVE EVALUATION OF COMPOUND WELD DEFECT BY PHOTOACOUSTIC MICROSCOPY.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 48. ISSUE 7. P. - 14 93% 1

Classes with closest relation at Level 1


Rank Class id link
1 4276 THERMAL EFFUSIVITY//PHOTOPYROELECTRIC TECHNIQUE//THERMAL DIFFUSIVITY
2 5417 THERMAL LENS SPECTROMETRY//THERMAL LENS//THERMAL LENS MICROSCOPE
3 11893 SCANNING THERMAL MICROSCOPY//MICRO THERMAL ANALYSIS//SCANNING THERMAL MICROSCOPE
4 7446 PULSED THERMOGRAPHY//INFRARED THERMOGRAPHY//VIBROTHERMOGRAPHY
5 13964 PHOTOACOUSTIC SPECTROSCOPY//PHOTOACOUSTIC PHASE//CO FLUORESCENCE EFFECT
6 19952 TEMPERATURE WAVE ANALYSIS//DIAMOND FIBRES//SILICON ON DIAMOND
7 25265 TRANSIENT REFLECTING GRATING//ANISOTROPY OF THE REFRACTIVE INDICES//LASER STIMULATED SCATTERING MICROSCOPE
8 24466 THERMOELECTRIC DETECTOR//LADDER SILICONE SPIN ON GLASS LS SOG//PICOSECOND PHOTOINDUCED ABSORPTION
9 37604 MATH MODELLING UKRAINIAN//ADVECTIVE DIFFUSIVE PROCESS//ASYMMETRIC STRESS TENSOR
10 6976 LASER ULTRASONICS//LASER ULTRASOUND//EMAT

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