Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
3132 | 2057 | 18.3 | 77% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
6 | 3 | PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON | 155028 |
1327 | 2 | SILICON NANOCRYSTALS//SI NANOCRYSTALS//ERBIUM | 8411 |
3132 | 1 | ERBIUM//ERBIUM DOPED SILICON//RUTHERFORD BACKSCATTERING TECHNIQUE | 2057 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ERBIUM | authKW | 866034 | 14% | 21% | 280 |
2 | ERBIUM DOPED SILICON | authKW | 120225 | 0% | 90% | 9 |
3 | RUTHERFORD BACKSCATTERING TECHNIQUE | authKW | 94991 | 0% | 80% | 8 |
4 | PHYS MICROSTRUCT | address | 77446 | 4% | 6% | 90 |
5 | AUGER EXCITATION | authKW | 74214 | 0% | 100% | 5 |
6 | LIGHT EMITTING STRUCTURES | authKW | 74214 | 0% | 100% | 5 |
7 | SI NANOCLUSTERS | authKW | 73762 | 1% | 38% | 13 |
8 | ERBIUM DOPING | authKW | 72581 | 1% | 33% | 15 |
9 | MIND IN2UB | address | 67073 | 1% | 20% | 23 |
10 | UMR 6176 | address | 63539 | 1% | 19% | 22 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 9234 | 44% | 0% | 896 |
2 | Physics, Condensed Matter | 7780 | 33% | 0% | 680 |
3 | Materials Science, Multidisciplinary | 1864 | 23% | 0% | 482 |
4 | Optics | 1344 | 12% | 0% | 244 |
5 | Materials Science, Coatings & Films | 441 | 4% | 0% | 78 |
6 | Nanoscience & Nanotechnology | 380 | 6% | 0% | 114 |
7 | Physics, Multidisciplinary | 248 | 7% | 0% | 139 |
8 | Materials Science, Ceramics | 139 | 2% | 0% | 41 |
9 | Instruments & Instrumentation | 129 | 3% | 0% | 69 |
10 | Nuclear Science & Technology | 104 | 3% | 0% | 59 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PHYS MICROSTRUCT | 77446 | 4% | 6% | 90 |
2 | MIND IN2UB | 67073 | 1% | 20% | 23 |
3 | UMR 6176 | 63539 | 1% | 19% | 22 |
4 | SIFCOM | 54093 | 1% | 19% | 19 |
5 | FOR UNGSZENTRUM ISI 2 | 44529 | 0% | 100% | 3 |
6 | FOR UNGSZENTRUM ZCH | 44529 | 0% | 100% | 3 |
7 | UMR CNRS CEA ENSICAEN UCBN | 44529 | 0% | 100% | 3 |
8 | VAN DER WAALS ZEEMAN | 44462 | 3% | 5% | 57 |
9 | BIOL ENERGY ENVIRONM MEASUREMENT | 40397 | 0% | 39% | 7 |
10 | ADV MAT PHOTON | 33395 | 0% | 75% | 3 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SEMICONDUCTORS | 27033 | 5% | 2% | 111 |
2 | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 17720 | 5% | 1% | 94 |
3 | APPLIED PHYSICS LETTERS | 10500 | 14% | 0% | 282 |
4 | OPTICAL MATERIALS | 9033 | 3% | 1% | 63 |
5 | JOURNAL OF LUMINESCENCE | 8115 | 4% | 1% | 82 |
6 | JOURNAL OF APPLIED PHYSICS | 6534 | 11% | 0% | 220 |
7 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 5317 | 2% | 1% | 45 |
8 | SOLID STATE PHENOMENA | 3842 | 1% | 1% | 24 |
9 | PHYSICS OF THE SOLID STATE | 2046 | 2% | 0% | 34 |
10 | IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA | 1753 | 1% | 1% | 20 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ERBIUM | 866034 | 14% | 21% | 280 | Search ERBIUM | Search ERBIUM |
2 | ERBIUM DOPED SILICON | 120225 | 0% | 90% | 9 | Search ERBIUM+DOPED+SILICON | Search ERBIUM+DOPED+SILICON |
3 | RUTHERFORD BACKSCATTERING TECHNIQUE | 94991 | 0% | 80% | 8 | Search RUTHERFORD+BACKSCATTERING+TECHNIQUE | Search RUTHERFORD+BACKSCATTERING+TECHNIQUE |
4 | AUGER EXCITATION | 74214 | 0% | 100% | 5 | Search AUGER+EXCITATION | Search AUGER+EXCITATION |
5 | LIGHT EMITTING STRUCTURES | 74214 | 0% | 100% | 5 | Search LIGHT+EMITTING+STRUCTURES | Search LIGHT+EMITTING+STRUCTURES |
6 | SI NANOCLUSTERS | 73762 | 1% | 38% | 13 | Search SI+NANOCLUSTERS | Search SI+NANOCLUSTERS |
7 | ERBIUM DOPING | 72581 | 1% | 33% | 15 | Search ERBIUM+DOPING | Search ERBIUM+DOPING |
8 | ERBIUM SILICATE | 59371 | 0% | 100% | 4 | Search ERBIUM+SILICATE | Search ERBIUM+SILICATE |
9 | SI ER | 59371 | 0% | 100% | 4 | Search SI+ER | Search SI+ER |
10 | SUBLIMATION MBE | 59371 | 0% | 100% | 4 | Search SUBLIMATION+MBE | Search SUBLIMATION+MBE |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | KENYON, AJ , (2005) ERBIUM IN SILICON.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 20. ISSUE 12. P. R65 -R84 | 115 | 80% | 120 |
2 | VINH, NQ , HA, NN , GREGORKIEWICZ, T , (2009) PHOTONIC PROPERTIES OF ER-DOPED CRYSTALLINE SILICON.PROCEEDINGS OF THE IEEE. VOL. 97. ISSUE 7. P. 1269 -1283 | 64 | 90% | 25 |
3 | (2003) LIGHT EMISSION OF ER3+ IN SILICON.LIGHT EMITTING SILICON FOR MICROPHOTONICS. VOL. 194. ISSUE . P. 179-225 | 57 | 98% | 0 |
4 | COFFA, S , FRANZO, G , PRIOLO, F , (1998) LIGHT EMISSION FROM ER-DOPED SI: MATERIALS PROPERTIES, MECHANISMS, AND DEVICE PERFORMANCE.MRS BULLETIN. VOL. 23. ISSUE 4. P. 25 -32 | 36 | 100% | 111 |
5 | KENYON, AJ , (2002) RECENT DEVELOPMENTS IN RARE-EARTH DOPED MATERIALS FOR OPTOELECTRONICS.PROGRESS IN QUANTUM ELECTRONICS. VOL. 26. ISSUE 4-5. P. 225 -284 | 61 | 39% | 416 |
6 | FRANZO, G , NAPOLITANI, E , CARDILE, P , BONINELLI, S , MARINO, A , PRIOLO, F , (2011) ERBIUM-OXYGEN INTERACTIONS IN CRYSTALLINE SILICON.SEMICONDUCTOR SCIENCE AND TECHNOLOGY. VOL. 26. ISSUE 5. P. - | 28 | 100% | 5 |
7 | PODHORODECKI, A , ZATRYB, G , GOLACKI, LW , MISIEWICZ, J , WOJCIK, J , MASCHER, P , (2013) ON THE ORIGIN OF EMISSION AND THERMAL QUENCHING OF SRSO:ER3+ FILMS GROWN BY ECR-PECVD.NANOSCALE RESEARCH LETTERS. VOL. 8. ISSUE . P. 1-12 | 32 | 71% | 11 |
8 | JANOTTA, A , SCHMIDT, M , JANSSEN, R , STUTZMANN, M , BUCHAL, C , (2003) PHOTOLUMINESCENCE OF ER3+-IMPLANTED AMORPHOUS HYDROGENATED SILICON SUBOXIDES.PHYSICAL REVIEW B. VOL. 68. ISSUE 16. P. - | 43 | 72% | 17 |
9 | MICHEL, J , ASSALI, LVC , MORSE, MT , KIMERLING, LC , (1998) ERBIUM IN SILICON.LIGHT EMISSION IN SILICON: FROM PHYSICS TO DEVICES. VOL. 49. ISSUE . P. 111 -156 | 40 | 89% | 27 |
10 | PRTLJAGA, N , NAVARRO-URRIOS, D , TENGATTINI, A , ANOPCHENKO, A , RAMIREZ, JM , REBLED, JM , ESTRADE, S , COLONNA, JP , FEDELI, JM , GARRIDO, B , ET AL (2012) LIMIT TO THE ERBIUM IONS EMISSION IN SILICON-RICH OXIDE FILMS BY ERBIUM ION CLUSTERING.OPTICAL MATERIALS EXPRESS. VOL. 2. ISSUE 9. P. 1278 -1285 | 29 | 81% | 12 |
Classes with closest relation at Level 1 |