Class information for:
Level 1: ADV SUBSUR E IMAGING//SAMPLING OSCILLOSCOPE//TRANSITION DURATION

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
23939 329 14.6 35%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
24 4 ENGINEERING, ELECTRICAL & ELECTRONIC//IEEE TRANSACTIONS ON POWER SYSTEMS//IEEE TRANSACTIONS ON POWER ELECTRONICS 122956
125 3       IEEE TRANSACTIONS ON POWER SYSTEMS//IEEE TRANSACTIONS ON POWER ELECTRONICS//ENGINEERING, ELECTRICAL & ELECTRONIC 67681
2946 2             IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT//THERMAL CONVERTER//AC DC TRANSFER 2686
23939 1                   ADV SUBSUR E IMAGING//SAMPLING OSCILLOSCOPE//TRANSITION DURATION 329

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ADV SUBSUR E IMAGING address 1396040 6% 79% 19
2 SAMPLING OSCILLOSCOPE authKW 954635 4% 86% 12
3 TRANSITION DURATION authKW 593994 2% 80% 8
4 OSCILLOSCOPES authKW 494984 4% 44% 12
5 WAVEFORM METROLOGY authKW 296997 1% 80% 4
6 NOSE TO NOSE CALIBRATION authKW 278436 1% 100% 3
7 QUANTUM ELECT METROL address 212130 2% 29% 8
8 DATA RECORDING TIME authKW 185624 1% 100% 2
9 KICK OUT PULSE authKW 185624 1% 100% 2
10 MIXER MEASUREMENT authKW 185624 1% 100% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Instruments & Instrumentation 10284 55% 0% 181
2 Engineering, Electrical & Electronic 5053 71% 0% 234
3 Engineering, General 242 7% 0% 23
4 Computer Science, Hardware & Architecture 118 4% 0% 12
5 Telecommunications 98 5% 0% 17
6 Engineering, Geological 94 2% 0% 7
7 Geochemistry & Geophysics 30 3% 0% 11
8 Medical Informatics 25 1% 0% 4
9 Education, Scientific Disciplines 14 1% 0% 4
10 Mining & Mineral Processing 8 1% 0% 2

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ADV SUBSUR E IMAGING 1396040 6% 79% 19
2 QUANTUM ELECT METROL 212130 2% 29% 8
3 ARBEITSGRP MESSDATENANALYSE MESSUNSICHERHEIT 92812 0% 100% 1
4 CRC BROADBAND TELECOMMUN NETWORK 92812 0% 100% 1
5 MILAN TECH UNIV 92812 0% 100% 1
6 MIN TECHNOL GRP 92812 0% 100% 1
7 PL ELECT METROL 92812 0% 100% 1
8 RF TECHNOL 813 01 92812 0% 100% 1
9 SOLAR THERMAL ALTERNAT RENEWABLE ENERGY 92812 0% 100% 1
10 STAND TECHNOL COMMERCE 92812 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 177400 40% 1% 130
2 JOURNAL OF ENVIRONMENTAL AND ENGINEERING GEOPHYSICS 16464 2% 3% 7
3 HEWLETT-PACKARD JOURNAL 13643 2% 2% 7
4 ELECTROCOMPONENT SCIENCE AND TECHNOLOGY 4579 1% 2% 2
5 IET SCIENCE MEASUREMENT & TECHNOLOGY 3679 2% 1% 5
6 EDN 3194 1% 1% 3
7 MEASUREMENT SCIENCE AND TECHNOLOGY 2599 5% 0% 16
8 IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 2354 5% 0% 18
9 METROLOGIA 1633 2% 0% 7
10 SIGNAL PROCESSING 1424 3% 0% 10

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 SAMPLING OSCILLOSCOPE 954635 4% 86% 12 Search SAMPLING+OSCILLOSCOPE Search SAMPLING+OSCILLOSCOPE
2 TRANSITION DURATION 593994 2% 80% 8 Search TRANSITION+DURATION Search TRANSITION+DURATION
3 OSCILLOSCOPES 494984 4% 44% 12 Search OSCILLOSCOPES Search OSCILLOSCOPES
4 WAVEFORM METROLOGY 296997 1% 80% 4 Search WAVEFORM+METROLOGY Search WAVEFORM+METROLOGY
5 NOSE TO NOSE CALIBRATION 278436 1% 100% 3 Search NOSE+TO+NOSE+CALIBRATION Search NOSE+TO+NOSE+CALIBRATION
6 DATA RECORDING TIME 185624 1% 100% 2 Search DATA+RECORDING+TIME Search DATA+RECORDING+TIME
7 KICK OUT PULSE 185624 1% 100% 2 Search KICK+OUT+PULSE Search KICK+OUT+PULSE
8 MIXER MEASUREMENT 185624 1% 100% 2 Search MIXER+MEASUREMENT Search MIXER+MEASUREMENT
9 STEP LIKE WAVEFORMS 185624 1% 100% 2 Search STEP+LIKE+WAVEFORMS Search STEP+LIKE+WAVEFORMS
10 TIMEBASE DISTORTION TBD 185624 1% 100% 2 Search TIMEBASE+DISTORTION+TBD Search TIMEBASE+DISTORTION+TBD

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 CLEMENT, TS , HALE, PD , WILLIAMS, DF , WANG, CM , DIENSTFREY, A , KEENAN, DA , (2006) CALIBRATION OF SAMPLING OSCILLOSCOPES WITH HIGH-SPEED PHOTODIODES.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 54. ISSUE 8. P. 3173-3181 18 95% 32
2 WANG, CMJ , HALE, PD , JARGON, JA , WILLIAMS, DF , REMLEY, KA , (2012) SEQUENTIAL ESTIMATION OF TIMEBASE CORRECTIONS FOR AN ARBITRARILY LONG WAVEFORM.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 61. ISSUE 10. P. 2689-2694 14 100% 4
3 WILLIAMS, DF , CLEMENT, TS , REMLEY, KA , HALE, TD , VERBEYST, F , (2007) SYSTEMATIC ERROR OF THE NOSE-TO-NOSE SAMPLING-OSCILLOSCOPE CALIBRATION.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 55. ISSUE 9. P. 1951-1957 16 84% 2
4 KAHRS, M , (2003) 50 YEARS OF RF AND MICROWAVE SAMPLING.IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. VOL. 51. ISSUE 6. P. 1787-1805 30 48% 38
5 HALE, PD , DIENSTFREY, A , WANG, JCM , WILLIAMS, DF , LEWANDOWSKI, A , KEENAN, DA , CLEMENT, TS , (2009) TRACEABLE WAVEFORM CALIBRATION WITH A COVARIANCE-BASED UNCERTAINTY ANALYSIS.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 58. ISSUE 10. P. 3554-3568 15 75% 19
6 EICHSTADT, S , LINK, A , HARRIS, P , ELSTER, C , (2012) EFFICIENT IMPLEMENTATION OF A MONTE CARLO METHOD FOR UNCERTAINTY EVALUATION IN DYNAMIC MEASUREMENTS.METROLOGIA. VOL. 49. ISSUE 3. P. 401-410 12 86% 10
7 HALE, PD , WANG, CM , WILLIAMS, DF , REMLEY, KA , WEPMAN, JD , (2006) COMPENSATION OF RANDOM AND SYSTEMATIC TIMING ERRORS IN SAMPLING OSCILLOSCOPES.IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. VOL. 55. ISSUE 6. P. 2146-2154 13 87% 24
8 FUSER, H , EICHSTADT, S , BAASKE, K , ELSTER, C , KUHLMANN, K , JUDASCHKE, R , PIERZ, K , BIELER, M , (2012) OPTOELECTRONIC TIME-DOMAIN CHARACTERIZATION OF A 100 GHZ SAMPLING OSCILLOSCOPE.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 23. ISSUE 2. P. - 14 67% 9
9 WILLIAMS, D , HALE, P , REMLEY, KA , (2007) THE SAMPLING OSCILLOSCOPE AS A MICROWAVE INSTRUMENT.IEEE MICROWAVE MAGAZINE. VOL. 8. ISSUE 4. P. 59-68 12 86% 10
10 LARSON, DR , PAULTER, NG , (2012) PULSE METROLOGY - PART 2 PART 39 IN A SERIES OF TUTORIALS ON INSTRUMENTATION AND MEASUREMENT.IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE. VOL. 15. ISSUE 3. P. 43 -47 12 67% 2

Classes with closest relation at Level 1


Rank Class id link
1 32799 INTELLIGENT CYCLIC A D CONVERTERS//MULTIFUNCTIONAL SENSING//ENOB
2 10450 FREQUENCY ESTIMATION//ADC TESTING//NONCOHERENT SAMPLING
3 28161 PRESSURE SQUARE WAVE GENERATOR//VICALLOY WIRE//RESISTANCE TEMPERATURE SENSOR
4 12989 ELECTRO OPTIC SAMPLING//ELECTROOPTIC MEASUREMENTS//ELECTROOPTIC PROBING
5 32641 INERTIAL FORCE//OPTICAL INTERFEROMETER//INERTIAL MASS
6 10472 THERMAL CONVERTER//IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT//AC DC TRANSFER
7 13325 METROLOGIA//MEASUREMENT UNCERTAINTY//COVERAGE INTERVAL
8 5693 LARGE SIGNAL MODEL//NONLINEAR MEASUREMENTS//IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
9 34946 MULTIPORT AMPLIFIER MPA//RANDOM PROPAGATION TIMES//STABLE PROBABILITY LAWS
10 18049 VECTOR NETWORK ANALYZER VNA//SCATTERING PARAMETER MEASUREMENT//MICROWAVE NETWORK ANALYZER

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