Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
20878 | 442 | 16.4 | 69% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
376 | 3 | SENSORS AND ACTUATORS A-PHYSICAL//JOURNAL OF MICROELECTROMECHANICAL SYSTEMS//MEMS | 32422 |
308 | 2 | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS//MEMS//JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 18480 |
20878 | 1 | TUNABLE OPTICAL FILTER//MICROMACHINED FILTER//SEMICONDUCTOR DBR | 442 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | TUNABLE OPTICAL FILTER | authKW | 284741 | 3% | 32% | 13 |
2 | MICROMACHINED FILTER | authKW | 221066 | 1% | 80% | 4 |
3 | SEMICONDUCTOR DBR | authKW | 221066 | 1% | 80% | 4 |
4 | MOEMS | authKW | 151222 | 4% | 13% | 17 |
5 | TUNABLE FILTERS | authKW | 144350 | 8% | 6% | 34 |
6 | 13 MU M WAVELENGTH INGAASP | authKW | 138167 | 0% | 100% | 2 |
7 | EXTREMELY SHORT EXTERNAL CAVITY SEMICONDUCTOR LASER | authKW | 138167 | 0% | 100% | 2 |
8 | GAS ENGN MONTROUGE | address | 138167 | 0% | 100% | 2 |
9 | GRP SEMICOND STUDIES | address | 138167 | 0% | 100% | 2 |
10 | HGEBIET OPT NACHRICHTENTECH | address | 138167 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Optics | 5231 | 45% | 0% | 200 |
2 | Engineering, Electrical & Electronic | 4820 | 60% | 0% | 267 |
3 | Physics, Applied | 2807 | 51% | 0% | 226 |
4 | Instruments & Instrumentation | 1429 | 18% | 0% | 81 |
5 | Nanoscience & Nanotechnology | 949 | 16% | 0% | 72 |
6 | Engineering, Mechanical | 97 | 6% | 0% | 25 |
7 | Materials Science, Multidisciplinary | 87 | 13% | 0% | 58 |
8 | Mechanics | 64 | 5% | 0% | 23 |
9 | Telecommunications | 8 | 2% | 0% | 8 |
10 | Electrochemistry | 3 | 1% | 0% | 6 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | GAS ENGN MONTROUGE | 138167 | 0% | 100% | 2 |
2 | GRP SEMICOND STUDIES | 138167 | 0% | 100% | 2 |
3 | HGEBIET OPT NACHRICHTENTECH | 138167 | 0% | 100% | 2 |
4 | MICROSTRUCT TECHNOL ANALYT | 102809 | 2% | 19% | 8 |
5 | LEAME | 95645 | 1% | 23% | 6 |
6 | PHOTON INTEGRAT SYST | 93248 | 2% | 15% | 9 |
7 | ADV INTEGRATED CIRCUIT TECHNOL BRANCH | 69084 | 0% | 100% | 1 |
8 | COACHMAKERS BUSINESS | 69084 | 0% | 100% | 1 |
9 | COMBINED MSC PHD PROGRAM | 69084 | 0% | 100% | 1 |
10 | COMPOSANTS SPECIF | 69084 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS | 14867 | 5% | 1% | 24 |
2 | IEEE PHOTONICS TECHNOLOGY LETTERS | 14860 | 13% | 0% | 59 |
3 | IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS | 11565 | 6% | 1% | 26 |
4 | JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | 5993 | 2% | 1% | 9 |
5 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 5484 | 5% | 0% | 21 |
6 | JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS | 4541 | 1% | 2% | 4 |
7 | ELECTRONICS LETTERS | 3077 | 10% | 0% | 42 |
8 | SENSORS AND ACTUATORS A-PHYSICAL | 3042 | 5% | 0% | 21 |
9 | LASER FOCUS WORLD | 1569 | 1% | 0% | 6 |
10 | OPTICAL REVIEW | 1210 | 1% | 0% | 6 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | TUNABLE OPTICAL FILTER | 284741 | 3% | 32% | 13 | Search TUNABLE+OPTICAL+FILTER | Search TUNABLE+OPTICAL+FILTER |
2 | MICROMACHINED FILTER | 221066 | 1% | 80% | 4 | Search MICROMACHINED+FILTER | Search MICROMACHINED+FILTER |
3 | SEMICONDUCTOR DBR | 221066 | 1% | 80% | 4 | Search SEMICONDUCTOR+DBR | Search SEMICONDUCTOR+DBR |
4 | MOEMS | 151222 | 4% | 13% | 17 | Search MOEMS | Search MOEMS |
5 | TUNABLE FILTERS | 144350 | 8% | 6% | 34 | Search TUNABLE+FILTERS | Search TUNABLE+FILTERS |
6 | 13 MU M WAVELENGTH INGAASP | 138167 | 0% | 100% | 2 | Search 13+MU+M+WAVELENGTH+INGAASP | Search 13+MU+M+WAVELENGTH+INGAASP |
7 | EXTREMELY SHORT EXTERNAL CAVITY SEMICONDUCTOR LASER | 138167 | 0% | 100% | 2 | Search EXTREMELY+SHORT+EXTERNAL+CAVITY+SEMICONDUCTOR+LASER | Search EXTREMELY+SHORT+EXTERNAL+CAVITY+SEMICONDUCTOR+LASER |
8 | RADIOMETRIC PRESSURE | 138167 | 0% | 100% | 2 | Search RADIOMETRIC+PRESSURE | Search RADIOMETRIC+PRESSURE |
9 | THERMO OPTIC FILTER | 138167 | 0% | 100% | 2 | Search THERMO+OPTIC+FILTER | Search THERMO+OPTIC+FILTER |
10 | VERTICAL CAVITY FILTER | 138167 | 0% | 100% | 2 | Search VERTICAL+CAVITY+FILTER | Search VERTICAL+CAVITY+FILTER |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | SIWAK, NP , FAN, XZ , GHODSSI, R , (2015) FABRICATION CHALLENGES FOR INDIUM PHOSPHIDE MICROSYSTEMS.JOURNAL OF MICROMECHANICS AND MICROENGINEERING. VOL. 25. ISSUE 4. P. - | 33 | 35% | 3 |
2 | LIU, AQ , ZHANG, XM , (2007) A REVIEW OF MEMS EXTERNAL-CAVITY TUNABLE LASERS.JOURNAL OF MICROMECHANICS AND MICROENGINEERING. VOL. 17. ISSUE 1. P. R1 -R13 | 27 | 46% | 61 |
3 | LI, SH , ZHONG, SL , XU, J , HE, F , WU, YM , (2012) FABRICATION AND CHARACTERIZATION OF A THERMAL TUNABLE BULK-MICROMACHINED OPTICAL FILTER.SENSORS AND ACTUATORS A-PHYSICAL. VOL. 188. ISSUE . P. 298-304 | 17 | 71% | 1 |
4 | SANO, H , NAKATA, N , MATSUTANI, A , KOYAMA, F , (2012) WAVELENGTH TRIMMING OF MICRO-MACHINED VCSELS.IEICE TRANSACTIONS ON ELECTRONICS. VOL. E95C. ISSUE 2. P. 237 -242 | 15 | 79% | 0 |
5 | KOYAMA, F , NAKAHAMA, M , (2015) MICROMACHINED VERTICAL CAVITY SURFACE EMITTING LASERS-ATHERMALIZATION, TUNING, AND MULTIWAVELENGTH INTEGRATION.IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS. VOL. 21. ISSUE 4. P. - | 21 | 50% | 0 |
6 | TUOHINIEMI, M , NASILA, A , AKUJARVI, A , BLOMBERG, M , (2014) MOEMS FABRY-PEROT INTERFEROMETER WITH POINT-ANCHORED SI-AIR MIRRORS FOR MIDDLE INFRARED.JOURNAL OF MICROMECHANICS AND MICROENGINEERING. VOL. 24. ISSUE 9. P. - | 13 | 76% | 1 |
7 | DALEIDEN, J , TARRAF, A , IRMER, S , ROMER, F , PROTT, C , ATARO, E , (2003) WIDE AND CONTINUOUS WAVELENGTH TUNING OF MICROCAVITY DEVICES FOR OPTOELECTRONIC APPLICATIONS.JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS. VOL. 2. ISSUE 4. P. 265-274 | 15 | 79% | 2 |
8 | NAKAHAMA, M , SANO, H , INOUE, S , SAKAGUCHI, T , MATSUTANI, A , AHMED, M , BAKRY, A , KOYAMA, F , (2014) WAVELENGTH TUNING AND CONTROLLED TEMPERATURE DEPENDENCE IN VERTICAL-CAVITY SURFACE-EMITTING LASERS WITH A THERMALLY AND ELECTROSTATICALLY ACTUATED CANTILEVER STRUCTURE.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 53. ISSUE 1. P. - | 11 | 79% | 1 |
9 | NAKAHAMA, M , SAKAGUCHI, T , MATUSTANI, A , KOYAMA, F , (2014) ATHERMAL AND WIDELY TUNABLE VCSEL WITH BIMORPH MICROMACHINED MIRROR.OPTICS EXPRESS. VOL. 22. ISSUE 18. P. 21471 -21479 | 14 | 61% | 0 |
10 | DALEIDEN, J , CHITICA, N , STRASSNER, M , (2002) TUNABLE INP-BASED MICROCAVITY DEVICES FOR OPTICAL COMMUNICATION SYSTEMS.SENSORS AND MATERIALS. VOL. 14. ISSUE 1. P. 35 -45 | 14 | 82% | 4 |
Classes with closest relation at Level 1 |