Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
23586 | 341 | 16.1 | 56% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
311 | 3 | SERS//SURFACE ENHANCED RAMAN SCATTERING//CHEMOMETRICS AND INTELLIGENT LABORATORY SYSTEMS | 40151 |
3122 | 2 | POLARIZATION INTERFERENCE IMAGING SPECTROMETER//HADAMARD TRANSFORM//IMAGING SPECTROMETER | 2285 |
23586 | 1 | MICROSPECTROMETER//ME EI//MICROELECT ELECT RUMENTAT | 341 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | MICROSPECTROMETER | authKW | 457885 | 4% | 34% | 15 |
2 | ME EI | address | 293054 | 2% | 55% | 6 |
3 | MICROELECT ELECT RUMENTAT | address | 268638 | 1% | 100% | 3 |
4 | TUNABLE PHOTODETECTOR | authKW | 238786 | 1% | 67% | 4 |
5 | MEASUREMENT SENSOR TECHNOL | address | 208931 | 2% | 33% | 7 |
6 | TRANSPARENT PHOTODETECTOR | authKW | 201477 | 1% | 75% | 3 |
7 | INGAAS INP PHOTODETECTOR | authKW | 179092 | 1% | 100% | 2 |
8 | INTEGRATED SILICON MICROSYSTEM | authKW | 179092 | 1% | 100% | 2 |
9 | MINIATURE FOURIER TRANSFORM SPECTROMETER | authKW | 179092 | 1% | 100% | 2 |
10 | ON CHIP OPTICAL MICROSPECTROMETER | authKW | 179092 | 1% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Optics | 3347 | 41% | 0% | 141 |
2 | Instruments & Instrumentation | 1528 | 21% | 0% | 73 |
3 | Spectroscopy | 1079 | 16% | 0% | 54 |
4 | Engineering, Electrical & Electronic | 586 | 26% | 0% | 88 |
5 | Physics, Applied | 449 | 25% | 0% | 86 |
6 | Nanoscience & Nanotechnology | 267 | 10% | 0% | 35 |
7 | Materials Science, Multidisciplinary | 68 | 13% | 0% | 45 |
8 | Mechanics | 26 | 4% | 0% | 14 |
9 | Materials Science, Coatings & Films | 16 | 2% | 0% | 7 |
10 | Materials Science, Paper & Wood | 5 | 1% | 0% | 2 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ME EI | 293054 | 2% | 55% | 6 |
2 | MICROELECT ELECT RUMENTAT | 268638 | 1% | 100% | 3 |
3 | MEASUREMENT SENSOR TECHNOL | 208931 | 2% | 33% | 7 |
4 | ITS ELECT ENGN | 161180 | 1% | 60% | 3 |
5 | ADV COMPONENTS SENSOR SYST | 89546 | 0% | 100% | 1 |
6 | BS JENA | 89546 | 0% | 100% | 1 |
7 | MESUREMENT TECHNOL | 89546 | 0% | 100% | 1 |
8 | SOLID STATE PHOTON S | 89546 | 0% | 100% | 1 |
9 | UMR 5130 MICROELECT ELE OMAGNET PHOTON | 89546 | 0% | 100% | 1 |
10 | KEY DISCIPLINES NEW MICRO NANO DEVICES | 89544 | 1% | 50% | 2 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SPECTROSCOPY | 59744 | 7% | 3% | 25 |
2 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 2719 | 4% | 0% | 13 |
3 | SPECTROSCOPY AND SPECTRAL ANALYSIS | 2511 | 5% | 0% | 17 |
4 | SENSORS AND ACTUATORS A-PHYSICAL | 2289 | 5% | 0% | 16 |
5 | TM-TECHNISCHES MESSEN | 2051 | 1% | 1% | 4 |
6 | OPTICS EXPRESS | 2046 | 8% | 0% | 28 |
7 | IEEE INSTRUMENTATION & MEASUREMENT MAGAZINE | 1927 | 1% | 1% | 3 |
8 | APPLIED OPTICS | 1706 | 8% | 0% | 26 |
9 | JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | 1531 | 1% | 0% | 4 |
10 | JOURNAL OF MICROLITHOGRAPHY MICROFABRICATION AND MICROSYSTEMS | 1470 | 1% | 1% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | WANG, SW , XIA, CS , CHEN, XS , LU, W , LI, M , WANG, HQ , ZHENG, WB , ZHANG, T , (2007) CONCEPT OF A HIGH-RESOLUTION MINIATURE SPECTROMETER USING AN INTEGRATED FILTER ARRAY.OPTICS LETTERS. VOL. 32. ISSUE 6. P. 632 -634 | 13 | 76% | 48 |
2 | AYERDEN, NP , GHADERI, M , ENOKSSON, P , DE GRAAF, G , WOLFFENBUTTEL, RF , (2016) A MINIATURIZED OPTICAL GAS-COMPOSITION SENSOR WITH INTEGRATED SAMPLE CHAMBER.SENSORS AND ACTUATORS B-CHEMICAL. VOL. 236. ISSUE . P. 917 -925 | 15 | 52% | 0 |
3 | WOLFFENBUTTEL, RF , (2005) MEMS-BASED OPTICAL MINI- AND MICROSPECTROMETERS FOR THE VISIBLE AND INFRARED SPECTRAL RANGE.JOURNAL OF MICROMECHANICS AND MICROENGINEERING. VOL. 15. ISSUE 7. P. S145-S152 | 15 | 58% | 75 |
4 | CMCOMBE, RA , (2008) MINIATURE OPTICAL SPECTROMETERS: THERE'S PLENTY OF ROOM AT THE BOTTOM.SPECTROSCOPY. VOL. 23. ISSUE 1. P. 38-56 | 13 | 68% | 0 |
5 | AYERDEN, NP , DE GRAAF, G , WOLFFENBUTTEL, RF , (2016) COMPACT GAS CELL INTEGRATED WITH A LINEAR VARIABLE OPTICAL FILTER.OPTICS EXPRESS. VOL. 24. ISSUE 3. P. 2981 -3002 | 15 | 39% | 3 |
6 | JOVANOV, V , IVANCHEV, J , KNIPP, D , (2010) STANDING WAVE SPECTROMETER.OPTICS EXPRESS. VOL. 18. ISSUE 2. P. 426 -438 | 9 | 90% | 9 |
7 | GRABARNIK, S , EMADI, A , SOKOLOVA, E , VDOVIN, G , WOLFFENBUTTEL, RF , (2008) OPTIMAL IMPLEMENTATION OF A MICROSPECTROMETER BASED ON A SINGLE FLAT DIFFRACTION GRATING.APPLIED OPTICS. VOL. 47. ISSUE 12. P. 2082 -2090 | 11 | 73% | 8 |
8 | EMADI, A , WU, HW , DE GRAAF, G , WOLFFENBUTTEL, R , (2012) DESIGN AND IMPLEMENTATION OF A SUB-NM RESOLUTION MICROSPECTROMETER BASED ON A LINEAR-VARIABLE OPTICAL FILTER.OPTICS EXPRESS. VOL. 20. ISSUE 1. P. 489 -507 | 8 | 80% | 23 |
9 | CHANDRAMOHAN, S , AVRUTSKY, I , (2016) ENHANCING SENSITIVITY OF A MINIATURE SPECTROMETER USING A REAL-TIME IMAGE PROCESSING ALGORITHM.APPLIED SPECTROSCOPY. VOL. 70. ISSUE 5. P. 756 -765 | 11 | 58% | 0 |
10 | CHEN, JJ , ZHU, Y , WEI, W , LI, Y , YANG, YN , WANG, N , ZHANG, J , (2015) EXPERIMENTAL STUDY OF A FOURIER TRANSFORM SPECTROMETER BASED ON SCANNING MICRO-ELECTROMECHANICAL MIRRORS.SPECTROSCOPY LETTERS. VOL. 48. ISSUE 2. P. 96 -100 | 8 | 80% | 0 |
Classes with closest relation at Level 1 |