Class information for:
Level 1: ELECTRON BEAM DOPING//KEK PF//BORRMANN EFFECT

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
17096 618 16.6 33%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
277 3       NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//JOURNAL OF SYNCHROTRON RADIATION//NUCLEAR SCIENCE & TECHNOLOGY 43290
1643 2             ACTA CRYSTALLOGRAPHICA SECTION A//JOURNAL OF APPLIED CRYSTALLOGRAPHY//JOURNAL OF SYNCHROTRON RADIATION 6935
17096 1                   ELECTRON BEAM DOPING//KEK PF//BORRMANN EFFECT 618

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ELECTRON BEAM DOPING authKW 400209 1% 90% 9
2 KEK PF address 374457 2% 63% 12
3 BORRMANN EFFECT authKW 210803 1% 53% 8
4 BRAGG LAUE DIFFRACTION authKW 197635 1% 100% 4
5 PLANE WAVE X RAY TOPOGRAPHY authKW 148226 0% 100% 3
6 X RAY BEAM CONDENSATION authKW 148226 0% 100% 3
7 X RAY BEAM CONFINEMENT authKW 148226 0% 100% 3
8 PENDELLOSUNG FRINGES authKW 112931 1% 57% 4
9 AIII B V SEMICONDUCTORS authKW 98817 0% 100% 2
10 MIRAGE FRINGE authKW 98817 0% 100% 2

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Crystallography 7781 30% 0% 188
2 Physics, Applied 1871 36% 0% 225
3 Physics, Condensed Matter 1775 29% 0% 180
4 Materials Science, Multidisciplinary 680 25% 0% 157
5 Instruments & Instrumentation 436 9% 0% 56
6 Metallurgy & Metallurgical Engineering 302 8% 0% 51
7 Physics, Multidisciplinary 210 10% 0% 62
8 Materials Science, Characterization, Testing 151 2% 0% 13
9 Nuclear Science & Technology 112 5% 0% 29
10 Chemistry, Multidisciplinary 96 11% 0% 68

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 KEK PF 374457 2% 63% 12
2 UPS LURE 98817 0% 100% 2
3 AF IOFFE ENGN PHYS 65877 0% 67% 2
4 BAG MCT CMM 49409 0% 100% 1
5 GRP XRAY SOLID STATE INVEST 49409 0% 100% 1
6 IMM SEZ N OLI 49409 0% 100% 1
7 MICROELECT TECH ULTRA HIGH PURITY MAT 49409 0% 100% 1
8 PHYS WERKSTOFFBEARBEITUNG 49409 0% 100% 1
9 SHUBNIKOV CRYSTLLOG 49409 0% 100% 1
10 SIBERIAN BRANCH MOL BEAM EPITAXY 49409 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ACTA CRYSTALLOGRAPHICA SECTION A 52256 8% 2% 49
2 JOURNAL OF APPLIED CRYSTALLOGRAPHY 21876 8% 1% 50
3 PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE 16895 13% 0% 83
4 METALLOFIZIKA I NOVEISHIE TEKHNOLOGII 15508 5% 1% 28
5 ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 12629 3% 1% 18
6 CRYSTAL RESEARCH AND TECHNOLOGY 5107 4% 0% 26
7 KRISTALLOGRAFIYA 3681 3% 0% 17
8 JOURNAL OF SYNCHROTRON RADIATION 3615 2% 0% 15
9 PHYSICA STATUS SOLIDI A-APPLIED RESEARCH 3103 1% 1% 6
10 CRYSTALLOGRAPHY REPORTS 2061 2% 0% 12

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ELECTRON BEAM DOPING 400209 1% 90% 9 Search ELECTRON+BEAM+DOPING Search ELECTRON+BEAM+DOPING
2 BORRMANN EFFECT 210803 1% 53% 8 Search BORRMANN+EFFECT Search BORRMANN+EFFECT
3 BRAGG LAUE DIFFRACTION 197635 1% 100% 4 Search BRAGG+LAUE+DIFFRACTION Search BRAGG+LAUE+DIFFRACTION
4 PLANE WAVE X RAY TOPOGRAPHY 148226 0% 100% 3 Search PLANE+WAVE+X+RAY+TOPOGRAPHY Search PLANE+WAVE+X+RAY+TOPOGRAPHY
5 X RAY BEAM CONDENSATION 148226 0% 100% 3 Search X+RAY+BEAM+CONDENSATION Search X+RAY+BEAM+CONDENSATION
6 X RAY BEAM CONFINEMENT 148226 0% 100% 3 Search X+RAY+BEAM+CONFINEMENT Search X+RAY+BEAM+CONFINEMENT
7 PENDELLOSUNG FRINGES 112931 1% 57% 4 Search PENDELLOSUNG+FRINGES Search PENDELLOSUNG+FRINGES
8 AIII B V SEMICONDUCTORS 98817 0% 100% 2 Search AIII+B+V+SEMICONDUCTORS Search AIII+B+V+SEMICONDUCTORS
9 MIRAGE FRINGE 98817 0% 100% 2 Search MIRAGE+FRINGE Search MIRAGE+FRINGE
10 MULTICRYSTAL DIFFRACTOMETRY 98817 0% 100% 2 Search MULTICRYSTAL+DIFFRACTOMETRY Search MULTICRYSTAL+DIFFRACTOMETRY

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 JONGSUKSWAT, S , FUKAMACHI, T , HIRANO, K , JU, DY , NEGISHI, R , SHIMOJO, M , HIRANO, K , KAWAMURA, T , (2012) DETERMINATION OF CONSTANT STRAIN GRADIENTS OF ELASTICALLY BENT CRYSTAL USING X-RAY MIRAGE FRINGES.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 51. ISSUE 7. P. - 14 100% 0
2 YOSHIMURA, J , (2015) THEORETICAL STUDY OF THE PROPERTIES OF X-RAY DIFFRACTION MOIRE FRINGES. I.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. VOL. 71. ISSUE . P. 368 -381 13 100% 0
3 HIRANO, K , FUKAMACHI, T , KANEMATSU, Y , JONGSUKSWAT, S , NEGISHI, R , JU, DY , HIRANO, K , KAWAMURA, T , (2012) MOIRE PATTERN FROM A MULTIPLE BRAGG-LAUE INTERFEROMETER.JOURNAL OF SYNCHROTRON RADIATION. VOL. 19. ISSUE . P. 101-105 13 100% 1
4 SHUL'PINA, IL , (2000) X-RAY PLANE-WAVE DIFFRACTION TOPOGRAPHY (REVIEW).INDUSTRIAL LABORATORY. VOL. 66. ISSUE 2. P. 96 -107 24 75% 0
5 FUKAMACHI, T , JONGSUKSWAT, S , KANEMATSU, Y , HIRANO, K , NEGISHI, R , SHIMOJO, M , JU, D , HIRANO, K , KAWAMURA, T , (2011) X-RAY INTERFERENCE FRINGES FROM WEAKLY BENT CRYSTAL.JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN. VOL. 80. ISSUE 8. P. - 13 100% 1
6 WADA, T , FUJIMOTO, H , (2003) DIODES FABRICATED BY ELECTRON BEAM DOPING (SUPERDIFFUSION) TECHNIQUE IN SEMICONDUCTORS AT ROOM TEMPERATURE.DEFECTS AND DIFFUSION IN SEMICONDUCTORS: AN ANNUAL RETROSPECTIVE VI. VOL. 221-2. ISSUE . P. 23 -30 15 100% 0
7 FUKAMACHI, T , TOHYAMA, M , HIRANO, K , YOSHIZAWA, M , NEGISHI, R , JU, DY , HIRANO, K , KAWAMURA, T , (2010) INTERFERENCE FRINGES IN MULTIPLE BRAGG-LAUE MODE AND MIRAGE FRINGES FROM BENT CRYSTALS.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 66. ISSUE . P. 421 -426 11 100% 4
8 JONGSUKSWAT, S , FUKAMACHI, T , HIRANO, K , JU, DY , NEGISHI, R , SHIMOJO, M , HIRANO, K , KAWAMURA, T , (2012) X-RAY INTERFERENCE FRINGES IN TRANSMITTED BEAM OF BRAGG MODE FROM VERY WEAKLY BENT CRYSTAL.JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN. VOL. 81. ISSUE 9. P. - 11 92% 0
9 VOLOSHIN, AE , (2011) PECULIARITIES OF THE DIFFRACTION CONTRAST IN PLANE-WAVE X-RAY TOPOGRAPHS OF WEAKLY DEFORMED CRYSTALS IN THE BRAGG GEOMETRY.CRYSTALLOGRAPHY REPORTS. VOL. 56. ISSUE 5. P. 802-810 11 92% 0
10 SAKA, T , (2016) FORMULATION OF DYNAMICAL THEORY OF X-RAY DIFFRACTION FOR PERFECT CRYSTALS IN THE LAUE CASE USING THE RIEMANN SURFACE.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. VOL. 72. ISSUE . P. 338 -348 8 100% 0

Classes with closest relation at Level 1


Rank Class id link
1 9132 METALLOFIZIKA I NOVEISHIE TEKHNOLOGII//PHYSICA STATUS SOLIDI//X RAY EXTINCTION
2 24849 ACOUSTIC MONOCHROMATOR//BACK FACE SCATTERING//BULK ACOUSTIC WAVES IN CRYSTALS
3 21489 IN SITU HEATING EXPERIMENT//NEARLY PERFECT CRYSTAL//X RAY SCATTERING TOPOGRAPH
4 28368 DOUBLY CURVED CRYSTAL//BIOCAT PROJECT//COMPACT OPTIC SOURCE COMBINATIONS
5 14823 X RAY MONOCHROMATORS//SAGITTAL FOCUSING//HIGH HEAT LOAD OPTICS
6 20623 X RAY MULTIPLE DIFFRACTION//DOUBLE CRYSTAL TECHNIQUE//HIGH RESOLUTION EXPERIMENT
7 12305 TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//BACKSCATTERING DIFFRACTION
8 28332 KOSSEL TECHNIQUE//LATTICE SOURCE INTERFERENCES//DETERMINATION OF LATTICE PARAMETERS
9 23387 ELECTRON DENSITY DISTRIBUTIONS//ALUMINUM OXYNITRIDES//ALUMINUM SILICON OXYCARBIDE
10 22740 X RAY PHOTON CORRELATION SPECTROSCOPY//XPCS//COHERENT X RAYS

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