Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
21489 | 417 | 18.3 | 30% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | IN SITU HEATING EXPERIMENT | authKW | 398669 | 2% | 78% | 7 |
2 | NEARLY PERFECT CRYSTAL | authKW | 146451 | 0% | 100% | 2 |
3 | X RAY SCATTERING TOPOGRAPH | authKW | 146451 | 0% | 100% | 2 |
4 | CNRS L NEEL | address | 97633 | 0% | 67% | 2 |
5 | CUGA2 | authKW | 97633 | 0% | 67% | 2 |
6 | MAGNETIC DOUBLE REFRACTION | authKW | 97633 | 0% | 67% | 2 |
7 | 1MV ELE ON MICROSCOPY | address | 73225 | 0% | 100% | 1 |
8 | BEHAVIOR OF LATTICE DEFECTS | authKW | 73225 | 0% | 100% | 1 |
9 | C 60 FULLERENE SINGLE CRYSTAL | authKW | 73225 | 0% | 100% | 1 |
10 | CITTYM | address | 73225 | 0% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Crystallography | 1978 | 19% | 0% | 79 |
2 | Microscopy | 1342 | 6% | 0% | 26 |
3 | Physics, Applied | 1054 | 34% | 0% | 140 |
4 | Materials Science, Multidisciplinary | 1012 | 36% | 0% | 149 |
5 | Instruments & Instrumentation | 750 | 14% | 0% | 58 |
6 | Physics, Condensed Matter | 585 | 21% | 0% | 88 |
7 | Metallurgy & Metallurgical Engineering | 410 | 11% | 0% | 47 |
8 | Nuclear Science & Technology | 254 | 8% | 0% | 33 |
9 | Materials Science, Characterization, Testing | 236 | 3% | 0% | 13 |
10 | METALLURGY & MINING | 66 | 0% | 0% | 2 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | CNRS L NEEL | 97633 | 0% | 67% | 2 |
2 | 1MV ELE ON MICROSCOPY | 73225 | 0% | 100% | 1 |
3 | CITTYM | 73225 | 0% | 100% | 1 |
4 | ESC UNIV | 73225 | 0% | 100% | 1 |
5 | FAMUFSU | 73225 | 0% | 100% | 1 |
6 | HAMBURGER SYNCROTRON STRAHRUNGS OR | 73225 | 0% | 100% | 1 |
7 | HIGH VOLTAGE ELE ON CHIKUSA KU | 73225 | 0% | 100% | 1 |
8 | IMV ELE ON MICROSCOPE | 73225 | 0% | 100% | 1 |
9 | LOUIS NEEL CNRS | 73225 | 0% | 100% | 1 |
10 | MET CHIKUSA KU | 73225 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF APPLIED CRYSTALLOGRAPHY | 14121 | 8% | 1% | 33 |
2 | INDUSTRIAL LABORATORY | 4598 | 2% | 1% | 9 |
3 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 3924 | 3% | 0% | 12 |
4 | MATERIALS SCIENCE REPORTS | 3485 | 0% | 5% | 1 |
5 | PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 2887 | 3% | 0% | 12 |
6 | MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1742 | 1% | 1% | 3 |
7 | KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY | 1506 | 0% | 1% | 2 |
8 | JOURNAL OF CRYSTAL GROWTH | 1441 | 6% | 0% | 25 |
9 | JOURNAL OF ELECTRON MICROSCOPY | 1411 | 1% | 0% | 6 |
10 | MATERIALS TRANSACTIONS JIM | 1152 | 1% | 0% | 6 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | BARUCHEL, J , (1993) X-RAY AND NEUTRON TOPOGRAPHICAL STUDIES OF MAGNETIC-MATERIALS.PHYSICA B-CONDENSED MATTER. VOL. 192. ISSUE 1-2. P. 79 -93 | 27 | 57% | 21 |
2 | STEINER, B , KURIYAMA, M , DOBBYN, RC , (1990) INSIGHT INTO THE GENESIS OF IRREGULARITY DURING CRYSTAL-GROWTH ACHIEVED THROUGH HIGH-SENSITIVITY MONOCHROMATIC SYNCHROTRON X-RADIATION DIFFRACTION IMAGING (TOPOGRAPHY).PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS. VOL. 20. ISSUE 3. P. 189-216 | 45 | 38% | 2 |
3 | MIMA, T , TAKEUCHI, H , ARAI, S , KISHITA, K , KURODA, K , SAKA, H , (2009) IN SITU OBSERVATION OF OXIDATION OF LIQUID DROPLETS OF TIN AND MELTING BEHAVIOR OF A TIN PARTICLE COVERED WITH A TIN OXIDE LAYER.MICROSCOPY RESEARCH AND TECHNIQUE. VOL. 72. ISSUE 3. P. 223 -231 | 10 | 83% | 1 |
4 | KURIYAMA, M , STEINER, BW , DOBBYN, RC , (1989) DYNAMICAL DIFFRACTION IMAGING (TOPOGRAPHY) WITH X-RAY SYNCHROTRON RADIATION.ANNUAL REVIEW OF MATERIALS SCIENCE. VOL. 19. ISSUE . P. 183-207 | 21 | 78% | 9 |
5 | SAKA, H , KAMINO, T , ARAI, S , SASAKI, K , (2008) IN SITU HEATING TRANSMISSION ELECTRON MICROSCOPY.MRS BULLETIN. VOL. 33. ISSUE 2. P. 93-100 | 9 | 75% | 17 |
6 | SUZUKI, Y , CHIKAURA, Y , KII, H , YOSHIDA, M , (1999) ENERGY-DISPERSIVE SYNCHROTRON RADIATION TOPOGRAPHIC OBSERVATION OF INAS/GAAS LATTICE-MISMATCHED LAYER.JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS. VOL. 38. ISSUE 5A. P. L543-L546 | 9 | 100% | 1 |
7 | TANNER, BK , BOWEN, DK , (1992) SYNCHROTRON X-RADIATION TOPOGRAPHY.MATERIALS SCIENCE REPORTS. VOL. 8. ISSUE 8. P. 369-407 | 31 | 37% | 12 |
8 | BARUCHEL, J , MEDRANO, C , SCHLENKER, M , (2005) SYNCHROTRON RADIATION TOPOGRAPHIC STUDY OF THE THICK FERROMAGNETIC-FAN INTERFACE IN MNP.JOURNAL OF PHYSICS D-APPLIED PHYSICS. VOL. 38. ISSUE 10A. P. A67 -A72 | 10 | 71% | 1 |
9 | SUZUKI, Y , NOVIKOV, D , MATERLIK, G , YOSHIDA, M , CHIKAURA, Y , KII, H , (1998) X-RAY PENETRATION DEPTH FOR LARGE LATTICE-MISMATCHED HETEROEPITAXIAL LAYER BY DYNAMICAL DIFFRACTION THEORY USING COMPUTER SIMULATION.JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS. VOL. 37. ISSUE 7A. P. L820-L823 | 8 | 100% | 1 |
10 | SMITH, DK , SMITH, KL , (1982) X-RAY-DIFFRACTION.ANALYTICAL CHEMISTRY. VOL. 54. ISSUE 5. P. R156 -R165 | 47 | 38% | 1 |
Classes with closest relation at Level 1 |