Class information for:
Level 1: ELECTRON DENSITY DISTRIBUTIONS//ALUMINUM OXYNITRIDES//ALUMINUM SILICON OXYCARBIDE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
23387 347 20.8 42%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
550 3       FERROELECTRICS//JOURNAL OF APPLIED CRYSTALLOGRAPHY//PHYSICS, CONDENSED MATTER 18138
3875 2             DIRECT THREE BODY RECOMBINATION//ELECT PROP SPACE EXPT//ELECT PROP SPACE EXPT PROGRAM 866
23387 1                   ELECTRON DENSITY DISTRIBUTIONS//ALUMINUM OXYNITRIDES//ALUMINUM SILICON OXYCARBIDE 347

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ELECTRON DENSITY DISTRIBUTIONS authKW 211187 2% 40% 6
2 ALUMINUM OXYNITRIDES authKW 175995 1% 100% 2
3 ALUMINUM SILICON OXYCARBIDE authKW 175995 1% 100% 2
4 MEM authKW 116988 3% 12% 11
5 MAXIMUM ENTROPY METHOD authKW 115069 6% 6% 22
6 12H SIALON authKW 87997 0% 100% 1
7 15R SIAION authKW 87997 0% 100% 1
8 16H SIALON authKW 87997 0% 100% 1
9 20 ALPHA SCANNING DIFFRACTOMETER authKW 87997 0% 100% 1
10 20H ALON authKW 87997 0% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Crystallography 8117 41% 0% 143
2 Physics, Condensed Matter 974 29% 0% 100
3 Chemistry, Multidisciplinary 168 17% 0% 58
4 Materials Science, Characterization, Testing 103 2% 0% 8
5 Physics, Multidisciplinary 88 9% 0% 31
6 Physics, Applied 57 11% 0% 39
7 Chemistry, Inorganic & Nuclear 19 4% 0% 13
8 Chemistry, Physical 13 7% 0% 26
9 Materials Science, Multidisciplinary 11 8% 0% 27
10 Physics, Mathematical 7 2% 0% 7

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 C 902 87997 0% 100% 1
2 CEA CNRS COMMUN 87997 0% 100% 1
3 SPSMS RECH FONDAMENTALE MAT CONDENSEE 87997 0% 100% 1
4 COOPERAT IL 31874 1% 7% 5
5 HPCAT GEOPHYS 21998 0% 25% 1
6 NIFTI 17598 0% 20% 1
7 UMR CNRS 7036 CRM2 12569 0% 14% 1
8 SWISS LIGHT SOURCE PROJECT 10998 0% 13% 1
9 INFORMAT BASIC SCI 8798 0% 10% 1
10 NEUTRON SCI CONSORTIUM 7331 0% 8% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 ACTA CRYSTALLOGRAPHICA SECTION A 85692 14% 2% 47
2 ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 30660 6% 2% 21
3 JOURNAL OF APPLIED CRYSTALLOGRAPHY 4490 5% 0% 17
4 PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS 2781 7% 0% 25
5 KRISTALLOGRAFIYA 2748 3% 0% 11
6 POWDER DIFFRACTION 2728 2% 1% 6
7 AUSTRALIAN JOURNAL OF PHYSICS 2324 2% 0% 6
8 JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS 1910 4% 0% 15
9 KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY 1810 1% 1% 2
10 ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE 1512 2% 0% 7

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 ELECTRON DENSITY DISTRIBUTIONS 211187 2% 40% 6 Search ELECTRON+DENSITY+DISTRIBUTIONS Search ELECTRON+DENSITY+DISTRIBUTIONS
2 ALUMINUM OXYNITRIDES 175995 1% 100% 2 Search ALUMINUM+OXYNITRIDES Search ALUMINUM+OXYNITRIDES
3 ALUMINUM SILICON OXYCARBIDE 175995 1% 100% 2 Search ALUMINUM+SILICON+OXYCARBIDE Search ALUMINUM+SILICON+OXYCARBIDE
4 MEM 116988 3% 12% 11 Search MEM Search MEM
5 MAXIMUM ENTROPY METHOD 115069 6% 6% 22 Search MAXIMUM+ENTROPY+METHOD Search MAXIMUM+ENTROPY+METHOD
6 12H SIALON 87997 0% 100% 1 Search 12H+SIALON Search 12H+SIALON
7 15R SIAION 87997 0% 100% 1 Search 15R+SIAION Search 15R+SIAION
8 16H SIALON 87997 0% 100% 1 Search 16H+SIALON Search 16H+SIALON
9 20 ALPHA SCANNING DIFFRACTOMETER 87997 0% 100% 1 Search 20+ALPHA+SCANNING+DIFFRACTOMETER Search 20+ALPHA+SCANNING+DIFFRACTOMETER
10 20H ALON 87997 0% 100% 1 Search 20H+ALON Search 20H+ALON

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 BANNO, H , ASAKA, T , FUKUDA, K , (2014) ELECTRON DENSITY DISTRIBUTION AND CRYSTAL STRUCTURE OF 27R-SIALON, SI3-XAL6+XOXN10-X (X SIMILAR TO 1.9).JOURNAL OF THE CERAMIC SOCIETY OF JAPAN. VOL. 122. ISSUE 1424. P. 281 -287 12 80% 0
2 GORFMAN, S , SCHMIDT, O , TSIRELSON, V , ZIOLKOWSKI, M , PIETSCH, U , (2013) CRYSTALLOGRAPHY UNDER EXTERNAL ELECTRIC FIELD.ZEITSCHRIFT FUR ANORGANISCHE UND ALLGEMEINE CHEMIE. VOL. 639. ISSUE 11. P. 1953 -1962 18 51% 6
3 SARAVANAN, R , ISRAEL, S , (2004) BONDING IN FLUORITE COMPOUND CAF2 USING MEM.PHYSICA B-CONDENSED MATTER. VOL. 352. ISSUE 1-4. P. 220-226 12 86% 5
4 GORFMAN, S , SCHMIDT, O , ZIOLKOWSKI, M , VON KOZIEROWSKI, M , PIETSCH, U , (2010) TIME-RESOLVED X-RAY DIFFRACTION STUDY OF THE PIEZOELECTRIC CRYSTAL RESPONSE TO A FAST CHANGE OF AN APPLIED ELECTRIC FIELD.JOURNAL OF APPLIED PHYSICS. VOL. 108. ISSUE 6. P. - 10 83% 5
5 SARAVANAN, R , (2006) APPLICATION OF MAXIMUM ENTROPY METHOD FOR THE STUDY OF ELECTRON DENSITY DISTRIBUTION IN SRS, BAS AND PUS USING POWDER X-RAY DATA.PRAMANA-JOURNAL OF PHYSICS. VOL. 66. ISSUE 6. P. 1057-1065 12 75% 0
6 KUHS, WF , (1992) GENERALIZED ATOMIC DISPLACEMENTS IN CRYSTALLOGRAPHIC STRUCTURE-ANALYSIS.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 48. ISSUE . P. 80-98 21 57% 137
7 BANNO, H , ASAKA, T , FUKUDA, K , (2014) ELECTRON DENSITY DISTRIBUTION AND DISORDERED CRYSTAL STRUCTURE OF 8H-SIALON, SI3-XAL1+XOXN5-X (X SIMILAR TO 2.2).JOURNAL OF SOLID STATE CHEMISTRY. VOL. 213. ISSUE . P. 169 -175 11 65% 1
8 SARAVANAN, R , MAJELA, AMA , JAINULABDEEN, S , (2007) NON-NUCLEAR MAXIMA (NNM), SYMMETRIC AND ASYMMETRIC CHARGE DISTRIBUTION IN SOLAR GRADE SI AND N-GAAS, USING X-RAY POWDER DATA.PHYSICA B-CONDENSED MATTER. VOL. 400. ISSUE 1-2. P. 16 -21 17 50% 1
9 GORFMAN, SV , TSIRELSON, VG , PIETSCH, U , (2005) X-RAY DIFFRACTION BY A CRYSTAL IN A PERMANENT EXTERNAL ELECTRIC FIELD: GENERAL CONSIDERATIONS.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 61. ISSUE . P. 387 -396 12 71% 12
10 SCHMIDT, O , GORFMAN, S , BOHATY, L , NEUMANN, E , ENGELEN, B , PIETSCH, U , (2009) INVESTIGATIONS OF THE BOND-SELECTIVE RESPONSE IN A PIEZOELECTRIC LI2SO4 CENTER DOT H2O CRYSTAL TO AN APPLIED EXTERNAL ELECTRIC FIELD.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 65. ISSUE . P. 267 -275 13 57% 12

Classes with closest relation at Level 1


Rank Class id link
1 13334 PRECESSION ELECTRON DIFFRACTION//CONVERGENT BEAM ELECTRON DIFFRACTION//ELECTRON PRECESSION
2 35149 DEBYE WALLERS THERMAL PARAMETER//FLUORESCENT BETA DIKETONES//HCP ELEMENT
3 29864 ATOMISTIC DESCRIPTION//LENS INFM//PALO ALTO 3333 COYOTE HILL RD
4 3594 MOL THEORY GRP//ATOMS IN MOLECULES//INTERATOMIC SURFACE
5 9636 ACTA CRYSTALLOGRAPHICA SECTION A//ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES//DIPARTIMENTO GEOMINERAL
6 24849 ACOUSTIC MONOCHROMATOR//BACK FACE SCATTERING//BULK ACOUSTIC WAVES IN CRYSTALS
7 20623 X RAY MULTIPLE DIFFRACTION//DOUBLE CRYSTAL TECHNIQUE//HIGH RESOLUTION EXPERIMENT
8 37457 VESTNIK LENINGRADSKOGO UNIVERSITETA SERIYA FIZIKA KHIMIYA//HARMONIC FORCE FIELD//OPTIKA I SPEKTROSKOPIYA
9 18872 SITE OCCUPATION PREFERENCES//ATOMIC LOCAL STRUCTURE//DAFNE L
10 6639 POWDER DIFFRACTION//JOURNAL OF APPLIED CRYSTALLOGRAPHY//STRUCTURE SOLUTION

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