Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
20623 | 451 | 17.7 | 46% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | X RAY MULTIPLE DIFFRACTION | authKW | 421848 | 2% | 69% | 9 |
2 | DOUBLE CRYSTAL TECHNIQUE | authKW | 338525 | 1% | 100% | 5 |
3 | HIGH RESOLUTION EXPERIMENT | authKW | 282102 | 1% | 83% | 5 |
4 | RENNINGER SCAN | authKW | 270820 | 1% | 100% | 4 |
5 | ACTA CRYSTALLOGRAPHICA SECTION A | journal | 252716 | 20% | 4% | 92 |
6 | THREE BEAM X RAY DIFFRACTION | authKW | 203115 | 1% | 100% | 3 |
7 | UMWEGANREGUNG | authKW | 203115 | 1% | 100% | 3 |
8 | DOMAIN POPULATION | authKW | 135410 | 0% | 100% | 2 |
9 | NANOENGN BUNKYO KU | address | 135410 | 0% | 100% | 2 |
10 | SIX BEAM DIFFRACTION | authKW | 135410 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Crystallography | 17879 | 53% | 0% | 241 |
2 | Chemistry, Multidisciplinary | 480 | 23% | 0% | 104 |
3 | Physics, Multidisciplinary | 267 | 13% | 0% | 57 |
4 | Physics, Condensed Matter | 232 | 14% | 0% | 62 |
5 | Physics, Applied | 223 | 17% | 0% | 76 |
6 | Instruments & Instrumentation | 134 | 6% | 0% | 28 |
7 | Materials Science, Multidisciplinary | 27 | 9% | 0% | 41 |
8 | Nuclear Science & Technology | 18 | 3% | 0% | 12 |
9 | Physics, Nuclear | 17 | 3% | 0% | 12 |
10 | Spectroscopy | 14 | 2% | 0% | 10 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NANOENGN BUNKYO KU | 135410 | 0% | 100% | 2 |
2 | CCSST | 103662 | 2% | 22% | 7 |
3 | CORNELL HIGH ENERGY SYNCHROTRON SOUCE | 67705 | 0% | 100% | 1 |
4 | DF LORXI | 67705 | 0% | 100% | 1 |
5 | DMC ENGN | 67705 | 0% | 100% | 1 |
6 | EXTREME LIGHT INFRASTRUCT | 67705 | 0% | 100% | 1 |
7 | WILSON 283 | 67705 | 0% | 100% | 1 |
8 | PROGRAMA POS CIENCIAS MAT PGCIMAT | 67703 | 0% | 50% | 2 |
9 | LETI MINATEC CAMPUS | 33851 | 0% | 50% | 1 |
10 | CORNELL HIGH ENERGY SYNCHROTRON SOURCE | 27218 | 3% | 3% | 13 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ACTA CRYSTALLOGRAPHICA SECTION A | 252716 | 20% | 4% | 92 |
2 | ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 94406 | 9% | 3% | 42 |
3 | JOURNAL OF APPLIED CRYSTALLOGRAPHY | 24302 | 10% | 1% | 45 |
4 | KRISTALLOGRAFIYA | 1741 | 2% | 0% | 10 |
5 | CRYSTAL RESEARCH AND TECHNOLOGY | 1244 | 2% | 0% | 11 |
6 | ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 1081 | 2% | 0% | 9 |
7 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 637 | 3% | 0% | 14 |
8 | PHASE TRANSITIONS | 615 | 1% | 0% | 5 |
9 | JOURNAL OF SYNCHROTRON RADIATION | 545 | 1% | 0% | 5 |
10 | ACTA CRYSTALLOGRAPHICA SECTION D-BIOLOGICAL CRYSTALLOGRAPHY | 544 | 1% | 0% | 6 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | STETSKO, YP , LEE, YR , TANG, MT , CHANG, SL , (2004) PHASE-DEPENDENT POLARIZATION ASPECTS OF THREE-WAVE X-RAY DIFFRACTION: AN ITERATIVE BORN APPROXIMATION.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 60. ISSUE . P. 64 -74 | 36 | 95% | 4 |
2 | SHEN, Q , (2005) PHASE PROBLEM AND REFERENCE-BEAM DIFFRACTION.ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 134. VOL. 134. ISSUE . P. 69 -112 | 39 | 66% | 1 |
3 | THORKILDSEN, G , LARSEN, HB , WECKERT, E , SEMMINGSEN, D , (2003) THREE-BEAM X-RAY DIFFRACTION - PROFILE ANALYSIS.JOURNAL OF APPLIED CRYSTALLOGRAPHY. VOL. 36. ISSUE . P. 1324 -1333 | 27 | 79% | 1 |
4 | LAI, X , MA, CY , ROBERTS, KJ , CARDOSO, LP , DOS SANTOS, AO , BOGG, D , MILLER, MC , (2009) AN INSTRUMENT FOR COMBINING X-RAY MULTIPLE DIFFRACTION AND X-RAY TOPOGRAPHIC IMAGING FOR EXAMINING CRYSTAL MICROCRYSTALLOGRAPHY AND PERFECTION.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 80. ISSUE 3. P. - | 19 | 90% | 0 |
5 | WECKERT, E , HUMMER, K , (1997) MULTIPLE-BEAM X-RAY DIFFRACTION FOR PHYSICAL DETERMINATION OF REFLECTION PHASES AND ITS APPLICATIONS.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 53. ISSUE . P. 108-143 | 28 | 74% | 122 |
6 | MORELHAO, SL , REMEDIOS, CMR , FREITAS, RO , DOS SANTOS, AO , (2011) X-RAY PHASE MEASUREMENTS AS A PROBE OF SMALL STRUCTURAL CHANGES IN DOPED NONLINEAR OPTICAL CRYSTALS.JOURNAL OF APPLIED CRYSTALLOGRAPHY. VOL. 44. ISSUE . P. 93 -101 | 20 | 80% | 0 |
7 | WANG, CM , CHAO, CH , CHANG, SL , (2001) PHASE DETERMINATION AND EXTENSION USING X-RAY MULTIPLE DIFFRACTION AND THE MAXIMUM-ENTROPY METHOD.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 57. ISSUE . P. 420-428 | 24 | 86% | 3 |
8 | WECKERT, E , HUMMER, K , (1998) ON THE INFLUENCE OF THE DIFFRACTION GEOMETRY ON THREE-BEAM INTERFERENCE PROFILES.CRYSTAL RESEARCH AND TECHNOLOGY. VOL. 33. ISSUE 4. P. 653 -676 | 28 | 78% | 8 |
9 | STETSKO, YP , JURETSCHKE, HJ , HUANG, YS , CHAO, CH , CHEN, CK , CHANG, SL , (2000) THE PHENOMENON OF POLARIZATION SUPPRESSION OF X-RAY UMWEG MULTIPLE WAVES IN CRYSTALS.ACTA CRYSTALLOGRAPHICA SECTION A. VOL. 56. ISSUE . P. 394-400 | 23 | 85% | 7 |
10 | CHANG, SL , (1998) DETERMINATION OF X-RAY REFLECTION PHASES USING N-BEAM DIFFRACTION.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES. VOL. 54. ISSUE . P. 886-894 | 25 | 83% | 10 |
Classes with closest relation at Level 1 |