FE-SEM JEOL 7800F (Hultgren)
The JEOL JSM 7800F is a high-resolution high-current Schottky field-emission SEM that allows for imaging with a spatial resolution down to 0.8 nm at 15 kV and 1.2 nm at 1 kV.
With a very low incident electron energy, fine surface structures are revealed. A large probe current (up to 200 nA) allows you to analyze samples quickly without sacrificing the precision and quality of the analyses. The instrument is equipped with a retractable backscattered detector for short-range BSE imaging (SRBSE) and in-lens SE and BSE detector. It is further equipped with Bruker analytical windowless EDS and e-flash EBSD for chemical and crystallographic analysis, respectively. The microscope's super hybrid lens is a field free lens at the analytical working distance. Magnetic samples can be observed and analyzed at high magnifications. Non-conductive samples are easily observed at low voltages with high resolution. Gentle beam deceleration mode is available.
To booking page for JEOL JSM 7800F
Main contact person: Peter Hedström ( pheds@kth.se )
Location: Brinellvägen 23, Hultgren Laboratory www.kth.se/hultgrenlab