Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
8129 | 1289 | 16.7 | 64% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | PROTON BEAM WRITING | authKW | 1731233 | 6% | 89% | 82 |
2 | NUCLEAR MICROPROBE | authKW | 795309 | 8% | 34% | 98 |
3 | ION BEAM PLICAT | address | 762831 | 7% | 37% | 87 |
4 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | journal | 551286 | 66% | 3% | 854 |
5 | QUADRUPOLE LENS | authKW | 364415 | 2% | 77% | 20 |
6 | PROBE FORMING SYSTEM | authKW | 333104 | 1% | 94% | 15 |
7 | CIBA | address | 252625 | 2% | 33% | 32 |
8 | MEV ION BEAM LITHOGRAPHY | authKW | 236875 | 1% | 100% | 10 |
9 | STIM | authKW | 213878 | 3% | 27% | 34 |
10 | SCANNING TRANSMISSION ION MICROSCOPY | authKW | 213182 | 1% | 75% | 12 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Nuclear Science & Technology | 82192 | 73% | 0% | 946 |
2 | Instruments & Instrumentation | 70632 | 73% | 0% | 935 |
3 | Physics, Nuclear | 69176 | 69% | 0% | 884 |
4 | Physics, Atomic, Molecular & Chemical | 37839 | 67% | 0% | 860 |
5 | Physics, Applied | 341 | 13% | 0% | 171 |
6 | Nanoscience & Nanotechnology | 181 | 5% | 0% | 64 |
7 | Microscopy | 140 | 1% | 0% | 16 |
8 | Spectroscopy | 55 | 2% | 0% | 32 |
9 | Engineering, Electrical & Electronic | 39 | 6% | 0% | 78 |
10 | Physics, Particles & Fields | 29 | 3% | 0% | 33 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ION BEAM PLICAT | 762831 | 7% | 37% | 87 |
2 | CIBA | 252625 | 2% | 33% | 32 |
3 | NUCL MICROSCOPY | 206697 | 2% | 36% | 24 |
4 | LOUISIANA ACCELERATOR | 130271 | 1% | 50% | 11 |
5 | TAKASAKI ADV RADIAT | 115500 | 2% | 16% | 31 |
6 | NUCL PHYS SPM UNIT | 94750 | 0% | 100% | 4 |
7 | RCNM | 75799 | 0% | 80% | 4 |
8 | MICROANALYT | 55989 | 1% | 13% | 18 |
9 | IST IPFN | 42635 | 0% | 60% | 3 |
10 | NUCL MICROSCOPY GRP | 42635 | 0% | 60% | 3 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 551286 | 66% | 3% | 854 |
2 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1966 | 1% | 1% | 15 |
3 | SCANNING MICROSCOPY | 1193 | 1% | 1% | 8 |
4 | PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY | 905 | 1% | 0% | 8 |
5 | MICROELECTRONIC ENGINEERING | 900 | 2% | 0% | 20 |
6 | MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 837 | 1% | 0% | 11 |
7 | TECHNICAL PHYSICS | 493 | 1% | 0% | 11 |
8 | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 481 | 1% | 0% | 19 |
9 | JOURNAL OF MICROMECHANICS AND MICROENGINEERING | 410 | 1% | 0% | 10 |
10 | X-RAY SPECTROMETRY | 402 | 0% | 0% | 6 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | PROTON BEAM WRITING | 1731233 | 6% | 89% | 82 | Search PROTON+BEAM+WRITING | Search PROTON+BEAM+WRITING |
2 | NUCLEAR MICROPROBE | 795309 | 8% | 34% | 98 | Search NUCLEAR+MICROPROBE | Search NUCLEAR+MICROPROBE |
3 | QUADRUPOLE LENS | 364415 | 2% | 77% | 20 | Search QUADRUPOLE+LENS | Search QUADRUPOLE+LENS |
4 | PROBE FORMING SYSTEM | 333104 | 1% | 94% | 15 | Search PROBE+FORMING+SYSTEM | Search PROBE+FORMING+SYSTEM |
5 | MEV ION BEAM LITHOGRAPHY | 236875 | 1% | 100% | 10 | Search MEV+ION+BEAM+LITHOGRAPHY | Search MEV+ION+BEAM+LITHOGRAPHY |
6 | STIM | 213878 | 3% | 27% | 34 | Search STIM | Search STIM |
7 | SCANNING TRANSMISSION ION MICROSCOPY | 213182 | 1% | 75% | 12 | Search SCANNING+TRANSMISSION+ION+MICROSCOPY | Search SCANNING+TRANSMISSION+ION+MICROSCOPY |
8 | PROTON BEAM WRITING PBW | 165813 | 1% | 100% | 7 | Search PROTON+BEAM+WRITING+PBW | Search PROTON+BEAM+WRITING+PBW |
9 | ION MICROBEAM | 160115 | 1% | 52% | 13 | Search ION+MICROBEAM | Search ION+MICROBEAM |
10 | PROTON BEAM MICROMACHINING | 151597 | 1% | 80% | 8 | Search PROTON+BEAM+MICROMACHINING | Search PROTON+BEAM+MICROMACHINING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | VAN KAN, JA , MALAR, P , WANG, YH , (2014) RESIST MATERIALS FOR PROTON BEAM WRITING: A REVIEW.APPLIED SURFACE SCIENCE. VOL. 310. ISSUE . P. 100 -111 | 43 | 69% | 10 |
2 | KOLINKO, SV , PONOMAREV, AG , (2016) EFFECT OF MAGNETIC QUADRUPOLE LENS ALIGNMENT ON A NUCLEAR MICROPROBE RESOLUTION.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. VOL. 373. ISSUE . P. 110 -116 | 22 | 92% | 0 |
3 | MICHELET, C , BARBERET, P , MORETTO, P , SEZNEC, H , (2015) DEVELOPMENT AND APPLICATIONS OF STIM- AND PIXE-TOMOGRAPHY: A REVIEW.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. VOL. 363. ISSUE . P. 55 -60 | 29 | 67% | 2 |
4 | PARAJULI, RK , MATSUBARA, Y , SARUYA, R , AKUTZU, N , MIURA, S , KADA, W , KAWABATA, S , SATOH, T , KOKA, M , YAMADA, N , ET AL (2016) FABRICATION AND EVALUATION OF FLEXIBLE MACH-ZEHNDER WAVEGUIDE STRUCTURE EMBEDDED IN A POLY(DIMETHYLSILOXANE) THIN FILM USING A PROTON MICROBEAM.JAPANESE JOURNAL OF APPLIED PHYSICS. VOL. 55. ISSUE 6. P. - | 22 | 88% | 0 |
5 | KADA, W , MIURA, K , KATO, H , SARUYA, R , KUBOTA, A , SATOH, T , KOKA, M , ISHII, Y , KAMIYA, T , NISHIKAWA, H , ET AL (2015) DEVELOPMENT OF EMBEDDED MACH-ZEHNDER OPTICAL WAVEGUIDE STRUCTURES IN POLYDIMETHYLSILOXANE THIN FILMS BY PROTON BEAM WRITING.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. VOL. 348. ISSUE . P. 218 -222 | 19 | 95% | 2 |
6 | YAO, Y , VAN KAN, JA , (2015) AUTOMATIC BEAM FOCUSING IN THE 2ND GENERATION PBW LINE AT SUB-10 NM LINE RESOLUTION.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. VOL. 348. ISSUE . P. 203 -208 | 20 | 87% | 3 |
7 | WANG, YH , MALAR, P , VAN KAN, JA , (2014) RESIST EVALUATION FOR PROTON BEAM WRITING, NI MOLD FABRICATION AND NANO-REPLICATION.MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS. VOL. 20. ISSUE 10-11. P. 2079 -2088 | 22 | 79% | 0 |
8 | DIERING, D , SPEMANN, D , LENZNER, J , MULLER, S , BONTGEN, T , VON WENCKSTERN, H , (2013) GREYSCALE PROTON BEAM WRITING IN P-TYPE GALLIUM ARSENIDE.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. VOL. 306. ISSUE . P. 275-280 | 18 | 95% | 3 |
9 | WATT, F , BREESE, MBH , BETTIOL, AA , VAN KAN, JA , (2007) PROTON BEAM WRITING.MATERIALS TODAY. VOL. 10. ISSUE 6. P. 20 -29 | 28 | 58% | 97 |
10 | YNSA, MD , SHAO, P , KULKARNI, SR , LIU, NN , VAN KAN, JA , (2011) EXPOSURE PARAMETERS IN PROTON BEAM WRITING FOR KMPR AND EPO CORE NEGATIVE TONE PHOTORESISTS.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS. VOL. 269. ISSUE 20. P. 2409 -2412 | 20 | 87% | 3 |
Classes with closest relation at Level 1 |