Class information for:
Level 1: TOF SIMS//CLUSTER SIMS//MOLECULAR DEPTH PROFILING

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
5304 1643 27.8 80%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
0 4 BIOCHEMISTRY & MOLECULAR BIOLOGY//CELL BIOLOGY//ONCOLOGY 4064930
157 3       JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY//BIOCHEMICAL RESEARCH METHODS//INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 61558
1201 2             TOF SIMS//IMAGING MASS SPECTROMETRY//MALDI 9229
5304 1                   TOF SIMS//CLUSTER SIMS//MOLECULAR DEPTH PROFILING 1643

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 TOF SIMS authKW 1496820 20% 24% 332
2 CLUSTER SIMS authKW 688061 2% 97% 38
3 MOLECULAR DEPTH PROFILING authKW 557502 2% 100% 30
4 STATIC SIMS authKW 361313 2% 56% 35
5 SURFACE AND INTERFACE ANALYSIS journal 307390 20% 5% 332
6 G SIMS authKW 301048 1% 90% 18
7 PCPM address 289196 2% 38% 41
8 CLUSTER BOMBARDMENT authKW 275299 1% 74% 20
9 SMOLUCHOWSKI PHYS address 207888 3% 21% 53
10 ORGANIC OVERLAYERS authKW 196282 1% 81% 13

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Materials Science, Coatings & Films 11204 19% 0% 313
2 Chemistry, Physical 9103 49% 0% 812
3 Chemistry, Analytical 4999 24% 0% 401
4 Spectroscopy 2922 12% 0% 198
5 Physics, Applied 1888 24% 0% 391
6 Physics, Condensed Matter 1812 19% 0% 312
7 Biochemical Research Methods 1422 11% 0% 174
8 Physics, Atomic, Molecular & Chemical 836 10% 0% 165
9 Materials Science, Biomaterials 559 3% 0% 54
10 Instruments & Instrumentation 511 6% 0% 104

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 PCPM 289196 2% 38% 41
2 SMOLUCHOWSKI PHYS 207888 3% 21% 53
3 ESCA SUR E ANAL BIOMED PROBLEMS 181188 2% 30% 32
4 ELE ON OPT SALES 130084 0% 100% 7
5 ATMOSPHER SCI GLOBAL CLIMATE CHANGE 113822 0% 88% 7
6 SUR E ANAL 111416 3% 13% 48
7 EPSRC XPS USERS SERV NEXUS 107512 1% 64% 9
8 CHEM CHARACTERIZAT ANAL 82762 1% 32% 14
9 CONDENSED MATTER NANOSCI BIO SOFT MATTER 76204 1% 22% 19
10 CHEM CDE 74334 0% 100% 4

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 SURFACE AND INTERFACE ANALYSIS 307390 20% 5% 332
2 APPLIED SURFACE SCIENCE 41561 17% 1% 280
3 BIOINTERPHASES 39426 2% 6% 34
4 ANALYTICAL CHEMISTRY 16495 11% 1% 179
5 RAPID COMMUNICATIONS IN MASS SPECTROMETRY 10117 4% 1% 70
6 JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY 8041 3% 1% 45
7 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY 6168 3% 1% 47
8 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS 4130 5% 0% 85
9 JOURNAL OF MASS SPECTROMETRY 1821 1% 1% 18
10 ANALYTICAL AND BIOANALYTICAL CHEMISTRY 1197 2% 0% 27

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 TOF SIMS 1496820 20% 24% 332 Search TOF+SIMS Search TOF+SIMS
2 CLUSTER SIMS 688061 2% 97% 38 Search CLUSTER+SIMS Search CLUSTER+SIMS
3 MOLECULAR DEPTH PROFILING 557502 2% 100% 30 Search MOLECULAR+DEPTH+PROFILING Search MOLECULAR+DEPTH+PROFILING
4 STATIC SIMS 361313 2% 56% 35 Search STATIC+SIMS Search STATIC+SIMS
5 G SIMS 301048 1% 90% 18 Search G+SIMS Search G+SIMS
6 CLUSTER BOMBARDMENT 275299 1% 74% 20 Search CLUSTER+BOMBARDMENT Search CLUSTER+BOMBARDMENT
7 ORGANIC OVERLAYERS 196282 1% 81% 13 Search ORGANIC+OVERLAYERS Search ORGANIC+OVERLAYERS
8 TOF SIMS IMAGING 184735 1% 76% 13 Search TOF+SIMS+IMAGING Search TOF+SIMS+IMAGING
9 SIMS 183800 9% 7% 146 Search SIMS Search SIMS
10 ORGANIC DEPTH PROFILING 168938 1% 91% 10 Search ORGANIC+DEPTH+PROFILING Search ORGANIC+DEPTH+PROFILING

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref. in
cl.		 Shr. of ref. in
cl.		 Citations
1 FLETCHER, JS , VICKERMAN, JC , (2013) SECONDARY ION MASS SPECTROMETRY: CHARACTERIZING COMPLEX SAMPLES IN TWO AND THREE DIMENSIONS.ANALYTICAL CHEMISTRY. VOL. 85. ISSUE 2. P. 610 -639 141 81% 42
2 MAHONEY, CM , (2010) CLUSTER SECONDARY ION MASS SPECTROMETRY OF POLYMERS AND RELATED MATERIALS.MASS SPECTROMETRY REVIEWS. VOL. 29. ISSUE 2. P. 247 -293 127 57% 141
3 GILMORE, IS , (2013) SIMS OF ORGANICS-ADVANCES IN 2D AND 3D IMAGING AND FUTURE OUTLOOK.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. VOL. 31. ISSUE 5. P. - 73 82% 11
4 FLETCHER, JS , LOCKYER, NP , VICKERMAN, JC , (2011) DEVELOPMENTS IN MOLECULAR SIMS DEPTH PROFILING AND 3D IMAGING OF BIOLOGICAL SYSTEMS USING POLYATOMIC PRIMARY IONS.MASS SPECTROMETRY REVIEWS. VOL. 30. ISSUE 1. P. 142-174 60 79% 61
5 KRAFT, ML , KLITZING, HA , (2014) IMAGING LIPIDS WITH SECONDARY ION MASS SPECTROMETRY.BIOCHIMICA ET BIOPHYSICA ACTA-MOLECULAR AND CELL BIOLOGY OF LIPIDS. VOL. 1841. ISSUE 8. P. 1108 -1119 75 56% 28
6 WUCHER, A , WINOGRAD, N , (2010) MOLECULAR SPUTTER DEPTH PROFILING USING CARBON CLUSTER BEAMS.ANALYTICAL AND BIOANALYTICAL CHEMISTRY. VOL. 396. ISSUE 1. P. 105 -114 53 98% 28
7 RABBANI, SSN , RAZO, IB , KOHN, T , LOCKYER, NP , VICKERMAN, JC , (2015) ENHANCING ION YIELDS IN TIME-OF-FLIGHT-SECONDARY ION MASS SPECTROMETRY: A COMPARATIVE STUDY OF ARGON AND WATER CLUSTER PRIMARY BEAMS.ANALYTICAL CHEMISTRY. VOL. 87. ISSUE 4. P. 2367 -2374 47 90% 10
8 BRISON, J , ROBINSON, MA , BENOIT, DSW , MURAMOTO, S , STAYTON, PS , CASTNER, DG , (2013) TOF-SIMS 3D IMAGING OF NATIVE AND NON-NATIVE SPECIES WITHIN HELA CELLS.ANALYTICAL CHEMISTRY. VOL. 85. ISSUE 22. P. 10869-10877 52 88% 22
9 GRAHAM, DJ , CASTNER, DG , (2012) MULTIVARIATE ANALYSIS OF TOF-SIMS DATA FROM MULTICOMPONENT SYSTEMS: THE WHY, WHEN, AND HOW.BIOINTERPHASES. VOL. 7. ISSUE 1-4. P. - 79 57% 35
10 WUCHER, A , (2006) MOLECULAR SECONDARY ION FORMATION UNDER CLUSTER BOMBARDMENT: A FUNDAMENTAL REVIEW.APPLIED SURFACE SCIENCE. VOL. 252. ISSUE 19. P. 6482 -6489 58 79% 92

Classes with closest relation at Level 1


Rank Class id link
1 17171 MAT CHARACTERIZAT PREPARAT IL//BLACKBURN TECHNOL//ADV ENGN MAT IL
2 8148 IMAGING MASS SPECTROMETRY//MASS SPECTROMETRY IMAGING//MALDI IMAGING
3 8050 ION BEAM ENGN EXPT//GAS CLUSTER ION BEAM//CLUSTER ION BEAM
4 14583 CONDENSED GASES//PLASMA DESORPTION MASS SPECTROMETRY//ELECTRONIC SPUTTERING
5 17997 SIMS MICROSCOPY//ION MICROSCOPY//NEUTRON CAPTURE RADIOGRAPHY
6 5232 SIMS//DEPTH RESOLUTION//SCI ANAL MAT SAM
7 3870 NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//ION PHOTON EMISSION//KINETIC EXCITATION
8 25463 MERCURIZATION//SURFACE LIGNIN//COMPOSITE FLAME RETARDANT FILLER
9 27392 SHAVE OFF DEPTH PROFILING//SHAVE OFF//SAMPLE ROTATION SIMS
10 4556 AMBIENT IONIZATION//AMBIENT MASS SPECTROMETRY//DIRECT ANALYSIS IN REAL TIME

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