Class information for:
Level 1: BULK AND SURFACE MODES//DIELECTRIC RESONANT MIRRORS//DISPERSION FREE INTERFEROMETER

Basic class information

Class id #P Avg. number of
references
Database coverage
of references
31972 145 10.6 35%



Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
637 3       SCULPTURED THIN FILMS//MUELLER MATRIX//GLANCING ANGLE DEPOSITION 12611
1771 2             LASER INDUCED DAMAGE//ELLIPSOMETRY//APPLIED OPTICS 6386
31972 1                   BULK AND SURFACE MODES//DIELECTRIC RESONANT MIRRORS//DISPERSION FREE INTERFEROMETER 145

Terms with highest relevance score



rank Term termType Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 BULK AND SURFACE MODES authKW 210590 1% 100% 1
2 DIELECTRIC RESONANT MIRRORS authKW 210590 1% 100% 1
3 DISPERSION FREE INTERFEROMETER authKW 210590 1% 100% 1
4 DISPERSION FREE OPERATION authKW 210590 1% 100% 1
5 FIBRE REFLECTION INTERFEROMETER authKW 210590 1% 100% 1
6 FNPTS address 210590 1% 100% 1
7 FREQUENCY SELECTION IN LASERS authKW 210590 1% 100% 1
8 HIGH POWER LASER MIRRORS authKW 210590 1% 100% 1
9 MULTIBEAM REFLECTION INTERFEROMETER authKW 210590 1% 100% 1
10 MULTICOMPONENT SUPERLATTICE authKW 210590 1% 100% 1

Web of Science journal categories



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 Optics 3760 66% 0% 96
2 Spectroscopy 2385 35% 0% 51
3 Engineering, Electrical & Electronic 117 19% 0% 27
4 Physics, Applied 110 20% 0% 29
5 Telecommunications 37 5% 0% 7
6 Physics, Multidisciplinary 24 8% 0% 11
7 Astronomy & Astrophysics 3 3% 0% 5
8 Materials Science, Coatings & Films 2 1% 0% 2
9 Physics, Condensed Matter 2 4% 0% 6
10 Engineering, Aerospace 1 1% 0% 1

Address terms



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 FNPTS 210590 1% 100% 1
2 NAZL STRUTTURA MAT GRP UNITA RIC 24 210590 1% 100% 1
3 STATE INT PL OPT 210590 1% 100% 1
4 AUTOMAT ELE OMETRY 147421 19% 3% 27
5 THIN FILM PROD GRP 105294 1% 50% 1
6 ALL RUSSIA SCI 5846 1% 1% 2
7 SIBERIAN 4406 11% 0% 16
8 PHYS SOLIDS 3050 1% 1% 1
9 LEHRSTUHL HOCHFREQUENZTECH 1460 1% 1% 1
10 SIBERIAN BRANCH 533 6% 0% 8

Journals



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 OPTIKA I SPEKTROSKOPIYA 25953 20% 0% 29
2 JOURNAL OF OPTICAL TECHNOLOGY 17455 11% 1% 16
3 OPTICS AND SPECTROSCOPY 16896 14% 0% 21
4 SOVIET JOURNAL OF OPTICAL TECHNOLOGY 4659 3% 1% 4
5 VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 3 FIZIKA ASTRONOMIYA 3727 3% 0% 5
6 KVANTOVAYA ELEKTRONIKA 2599 6% 0% 9
7 RADIOTEKHNIKA I ELEKTRONIKA 1736 4% 0% 6
8 QUANTUM ELECTRONICS 1253 3% 0% 5
9 IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII AVIATSIONAYA TEKHNIKA 991 1% 0% 1
10 INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES 953 3% 0% 4

Author Key Words



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
LCSH search Wikipedia search
1 BULK AND SURFACE MODES 210590 1% 100% 1 Search BULK+AND+SURFACE+MODES Search BULK+AND+SURFACE+MODES
2 DIELECTRIC RESONANT MIRRORS 210590 1% 100% 1 Search DIELECTRIC+RESONANT+MIRRORS Search DIELECTRIC+RESONANT+MIRRORS
3 DISPERSION FREE INTERFEROMETER 210590 1% 100% 1 Search DISPERSION+FREE+INTERFEROMETER Search DISPERSION+FREE+INTERFEROMETER
4 DISPERSION FREE OPERATION 210590 1% 100% 1 Search DISPERSION+FREE+OPERATION Search DISPERSION+FREE+OPERATION
5 FIBRE REFLECTION INTERFEROMETER 210590 1% 100% 1 Search FIBRE+REFLECTION+INTERFEROMETER Search FIBRE+REFLECTION+INTERFEROMETER
6 FREQUENCY SELECTION IN LASERS 210590 1% 100% 1 Search FREQUENCY+SELECTION+IN+LASERS Search FREQUENCY+SELECTION+IN+LASERS
7 HIGH POWER LASER MIRRORS 210590 1% 100% 1 Search HIGH+POWER+LASER+MIRRORS Search HIGH+POWER+LASER+MIRRORS
8 MULTIBEAM REFLECTION INTERFEROMETER 210590 1% 100% 1 Search MULTIBEAM+REFLECTION+INTERFEROMETER Search MULTIBEAM+REFLECTION+INTERFEROMETER
9 MULTICOMPONENT SUPERLATTICE 210590 1% 100% 1 Search MULTICOMPONENT+SUPERLATTICE Search MULTICOMPONENT+SUPERLATTICE
10 OBLIQUE FORBIDDEN BAND 210590 1% 100% 1 Search OBLIQUE+FORBIDDEN+BAND Search OBLIQUE+FORBIDDEN+BAND

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.



Rank Reference # ref.
in cl.
Shr. of ref. in
cl.
Citations
1 TERENT'EV, VS , TROSHIN, BI , KOL'CHENKO, AP , (2007) CHARACTERISTICS OF A THREE-MIRROR INTERFERENCE SYSTEM WITH A NONINVERTED RESPONSE FUNCTION IN REFLECTED LIGHT.OPTICS AND SPECTROSCOPY. VOL. 103. ISSUE 5. P. 816-819 7 100% 0
2 TROITSKII, YV , (1995) FABRY-PEROT-INTERFEROMETER WITH RESONANT MIRRORS.KVANTOVAYA ELEKTRONIKA. VOL. 22. ISSUE 6. P. 619-624 5 100% 2
3 GAINUTDINOV, IS , GUSEV, AG , DUSHIN, AV , MUSTAEV, RM , NASYROV, AR , MIRKHANOV, NG , MIKHAILOV, AV , (2010) DIRECTLY MONITORING THE OPTICAL THICKNESSES OF DEPOSITED LAYERS ON THE WORKING SAMPLES WHILE THEY ARE BEING GROWN.JOURNAL OF OPTICAL TECHNOLOGY. VOL. 77. ISSUE 1. P. 63-66 3 100% 0
4 TERENT'EV, VS , TROSHIN, BI , (2008) CONTROL OF THE SPECTRAL DEPENDENCE OF THE OUTPUT SIGNAL OF A REFLECTION INTERFEROMETER WITH A NONINVERTED INSTRUMENTAL FUNCTION.OPTICS AND SPECTROSCOPY. VOL. 104. ISSUE 1. P. 121-123 3 100% 0
5 GAINUTDINOV, IS , NESMELOV, EA , ALIAKBEROV, RD , ABZALOVA, GI , MIKHAILOV, AV , (2004) STABILIZATION OF THE OPTICAL PARAMETERS OF FILTERS BASED ON AMORPHOUS SILICON.JOURNAL OF OPTICAL TECHNOLOGY. VOL. 71. ISSUE 12. P. 842-846 3 100% 1
6 TROITSKII, YV , (2000) APPLICATION OF STANDARD RECURRENT FORMULAS TO THE CALCULATION OF MULTILAYER SYSTEMS WITH LIGHT ABSORPTION NEAR THE LAYER BOUNDARIES.OPTICS AND SPECTROSCOPY. VOL. 88. ISSUE 5. P. 778-783 4 80% 0
7 TROITSKII, YV , (2005) A REFLECTION INTERFEROMETER WITH TRANSMISSION-LIKE CHARACTERISTICS AS AN ELEMENT OF INTERFEROMETRIC GRAVITATIONAL WAVE DETECTORS.OPTICS AND SPECTROSCOPY. VOL. 98. ISSUE 1. P. 125-130 4 67% 2
8 GRISHINA, NV , (1992) SYNTHESIS OF WIDE-BAND METALLODIELECTRIC COATINGS.OPTIKA I SPEKTROSKOPIYA. VOL. 72. ISSUE 4. P. 1033-1038 4 100% 2
9 TROITSKII, YV , (1997) DIELECTRIC MIRRORS WITH ANOMALOUS ANGULAR DISPERSION OF THE PHASE OF REFLECTION.OPTICS AND SPECTROSCOPY. VOL. 82. ISSUE 3. P. 420-422 4 80% 0
10 MAHDIEH, MH , ALAVI-NEJAD, M , (2005) A NEW METHOD FOR ELECTRIC FIELD OPTIMIZATION IN HIGH POWER LASER MULTILAYERS.IRANIAN JOURNAL OF SCIENCE AND TECHNOLOGY TRANSACTION A-SCIENCE. VOL. 29. ISSUE A3. P. 401 -410 4 57% 0

Classes with closest relation at Level 1



Rank Class id link
1 37349 POST BUCKLED//CAVITY ENHANCED DETECTION//ENS PSLCNRSCDF
2 26088 QUARTERWAVE RETARDERS//ABSORBING SUBSTRATE//BROAD AND WIDE ANGLE
3 11599 VISIBLE SPECTRAL REGION//RUGATE FILTER//INFRARED MULTILAYER
4 29471 ILSE KATZ NANOMETER SCALE SCI TECHNOL//SINGLE SPIN DETECTION//PHYS TECHNOL NANOMETR STRUCT
5 8635 LASER INDUCED DAMAGE//LASER INDUCED DAMAGE THRESHOLD//RD OPT THIN FILM COATINGS
6 35106 LEAD SELENITE//ARMAMENT DEV ENGN COMMAND//ATTN RDAR MEF A
7 23804 MICROTRON//COMPACT FEL//FREE ELECTRON LASER
8 14613 VARIABLE REFLECTIVITY MIRROR//MILIEUX IONISES LASERS//GAUSSIAN MIRROR
9 18551 BULK INHOMOGENEITY//TOTAL INTEGRATED SCATTER//ISOTROPY DEGREE
10 21855 ANALYTICAL REGULARIZATION METHOD//RADIOTEKHNIKA I ELEKTRONIKA//MILLIMETER WAVE INTEGRATED CIRCUIT APPLICATIONS

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