Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 26079 | 263 | 14.5 | 28% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
| 217 | 3 | OPTICS//APPLIED OPTICS//OPTICAL ENGINEERING | 50829 |
| 2616 | 2 | TALBOT EFFECT//BACKGROUND ORIENTED SCHLIEREN//MOIRE DEFLECTOMETRY | 3564 |
| 26079 | 1 | 180 DEGREES ROTATION OF THE WEDGED PLATE//AMPLITUDE PHASE CHARACTERISTICS//BEAM REPLICATOR | 263 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | 180 DEGREES ROTATION OF THE WEDGED PLATE | authKW | 116104 | 0% | 100% | 1 |
| 2 | AMPLITUDE PHASE CHARACTERISTICS | authKW | 116104 | 0% | 100% | 1 |
| 3 | BEAM REPLICATOR | authKW | 116104 | 0% | 100% | 1 |
| 4 | BLOCKING OF REFRACTED RAYS | authKW | 116104 | 0% | 100% | 1 |
| 5 | CW CHEMICAL DF LASER | authKW | 116104 | 0% | 100% | 1 |
| 6 | CW CHEMICAL LASER | authKW | 116104 | 0% | 100% | 1 |
| 7 | DUAL HOLOGRAM SHEARING INTERFEROMETRY | authKW | 116104 | 0% | 100% | 1 |
| 8 | ELE OOPT RD UNIT | address | 116104 | 0% | 100% | 1 |
| 9 | ENHANCEMENT OF MEASUREMENT SENSITIVITY | authKW | 116104 | 0% | 100% | 1 |
| 10 | ENHANCEMENT OF THE MEASUREMENT SENSITIVITY | authKW | 116104 | 0% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Optics | 4103 | 52% | 0% | 136 |
| 2 | Spectroscopy | 2893 | 29% | 0% | 76 |
| 3 | Physics, Applied | 956 | 40% | 0% | 104 |
| 4 | Engineering, Electrical & Electronic | 121 | 15% | 0% | 39 |
| 5 | Engineering, General | 29 | 3% | 0% | 8 |
| 6 | Instruments & Instrumentation | 17 | 3% | 0% | 9 |
| 7 | Engineering, Aerospace | 10 | 1% | 0% | 3 |
| 8 | Telecommunications | 6 | 2% | 0% | 5 |
| 9 | Thermodynamics | 1 | 1% | 0% | 3 |
| 10 | Engineering, Mechanical | 1 | 2% | 0% | 4 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ELE OOPT RD UNIT | 116104 | 0% | 100% | 1 |
| 2 | NI POLUSHKIN PHYS MICROSTRUCT | 116104 | 0% | 100% | 1 |
| 3 | VP GLUSHKO ENERGOMASH PROD ASSOC | 116104 | 0% | 100% | 1 |
| 4 | A YA USIKOVS RADIOPHYS ELECT | 58051 | 0% | 50% | 1 |
| 5 | FCQEI | 23219 | 0% | 20% | 1 |
| 6 | OPEN JOINT STOCK CO | 12899 | 0% | 11% | 1 |
| 7 | ZAVOISKII KAZAN PHYSICOTECH | 12899 | 0% | 11% | 1 |
| 8 | RAJA RAMANNA ADV TECHNOL | 5046 | 0% | 4% | 1 |
| 9 | TROITSK INNOVAT THERMONUCL | 3868 | 0% | 3% | 1 |
| 10 | LEHRSTUHL OPT | 2368 | 0% | 2% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | OPTIKA I SPEKTROSKOPIYA | 29995 | 16% | 1% | 42 |
| 2 | OPTICS AND SPECTROSCOPY | 22994 | 13% | 1% | 33 |
| 3 | JOURNAL OF OPTICAL TECHNOLOGY | 21644 | 9% | 1% | 24 |
| 4 | TECHNICAL PHYSICS | 14049 | 10% | 0% | 26 |
| 5 | QUANTUM ELECTRONICS | 12243 | 8% | 1% | 21 |
| 6 | SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 5777 | 2% | 1% | 6 |
| 7 | ZHURNAL TEKHNICHESKOI FIZIKI | 4286 | 6% | 0% | 15 |
| 8 | TECHNICAL PHYSICS LETTERS | 2160 | 4% | 0% | 11 |
| 9 | AVIATION WEEK & SPACE TECHNOLOGY | 1830 | 1% | 1% | 3 |
| 10 | LASER FOCUS WITH FIBEROPTIC TECHNOLOGY | 1125 | 0% | 1% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | BUT', AI , LYALIKOV, AM , (2011) ENHANCEMENT OF MEASUREMENT SENSITIVITY IN THE FORMATION OF SHEAR INTERFEROGRAMS OF TRANSPARENT PLATES WITH SMALL RESIDUAL WEDGING.QUANTUM ELECTRONICS. VOL. 41. ISSUE 10. P. 934 -938 | 9 | 100% | 0 |
| 2 | LYALIKOV, AM , (2014) INTERFEROMETRY THAT COMBINES THE MEASUREMENT AND TESTING OF THE WEDGING OF TRANSPARENT PLATES.TECHNICAL PHYSICS. VOL. 59. ISSUE 6. P. 899 -903 | 9 | 90% | 0 |
| 3 | LYALIKOV, AM , (2006) HOLOGRAPHIC REVERSE SHEARING INTERFEROMETRY WITH HIGH MEASUREMENT SENSITIVITY.OPTICS AND SPECTROSCOPY. VOL. 101. ISSUE 1. P. 162-167 | 9 | 100% | 0 |
| 4 | BUT', AI , LYALIKOV, AM , (2012) REDUCTION OF THE ERROR IN MEASURING THE WEDGE ANGLE OF TRANSPARENT PLATES IN HOLOGRAPHIC REVERSE-SHEARING INTERFEROMETRY.OPTICS AND SPECTROSCOPY. VOL. 112. ISSUE 6. P. 943 -948 | 7 | 100% | 0 |
| 5 | LYALIKOV, AM , (2010) REDUCING THE ERROR OF RESIDUAL WEDGE ANGLE MEASUREMENT ON PLATES BY SHEAR INTERFEROMETRY.TECHNICAL PHYSICS LETTERS. VOL. 36. ISSUE 10. P. 969-972 | 7 | 100% | 0 |
| 6 | LYALIKOV, AM , (2002) ENHANCING SENSITIVITY OF A CONTACTLESS METHOD FOR MEASURING PROFILES AND REVEALING MACRODEFECTS IN COMPOSITE PERIODIC STRUCTURES OF THE TRANSMISSION TYPE.OPTICS AND SPECTROSCOPY. VOL. 92. ISSUE 2. P. 305 -310 | 11 | 79% | 0 |
| 7 | LYALIKOV, AM , (2005) REVEALING MACRODEFECTS IN PERIODIC STRUCTURES OF THE TRANSMISSION TYPE IN WHITE LIGHT ON THE BASIS OF SHIFT OF IMAGES.OPTICS AND SPECTROSCOPY. VOL. 98. ISSUE 3. P. 477-482 | 11 | 69% | 0 |
| 8 | BUT', AI , LYALIKOV, AM , (2011) HIGH-SENSITIVITY MEASUREMENTS FOR FORMATION OF HOLOGRAPHIC INTERFEROGRAMS OF WEDGE-SHAPED PLATES.TECHNICAL PHYSICS LETTERS. VOL. 37. ISSUE 9. P. 814 -816 | 7 | 88% | 3 |
| 9 | LYALIKOV, AM , (2006) SHEARING INTERFEROMETRY USING LATERAL SHEARS IN OPPOSITE DIRECTIONS.OPTICS AND SPECTROSCOPY. VOL. 101. ISSUE 3. P. 473-477 | 7 | 100% | 0 |
| 10 | LYALIKOV, AM , (2012) HIGHLY SENSITIVE INTERFEROMETRIC TESTING OF DEVIATION OF THE WEDGE ANGLE OF TRANSPARENT PLATES.OPTICS AND SPECTROSCOPY. VOL. 113. ISSUE 2. P. 204-207 | 6 | 100% | 0 |
Classes with closest relation at Level 1 |