Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
22617 | 374 | 15.0 | 55% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
637 | 3 | SCULPTURED THIN FILMS//MUELLER MATRIX//GLANCING ANGLE DEPOSITION | 12611 |
2361 | 2 | MUELLER MATRIX//DIGITAL PHOTOELASTICITY//PHOTOELASTICITY | 4342 |
22617 | 1 | WAVE PLATE//PHASE RETARDANCE//OPTICAL ROTATION ANGLE | 374 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | WAVE PLATE | authKW | 522506 | 4% | 40% | 16 |
2 | PHASE RETARDANCE | authKW | 444506 | 2% | 78% | 7 |
3 | OPTICAL ROTATION ANGLE | authKW | 408223 | 1% | 100% | 5 |
4 | ACHROMATIC RETARDER | authKW | 291585 | 1% | 71% | 5 |
5 | RETARDANCE | authKW | 246959 | 3% | 28% | 11 |
6 | CIRCULAR POLARISCOPE | authKW | 244934 | 1% | 100% | 3 |
7 | PRINCIPAL AXIS ANGLE | authKW | 244934 | 1% | 100% | 3 |
8 | FAST AXIS | authKW | 183699 | 1% | 75% | 3 |
9 | CIRCULAR BIREFRINGENCE | authKW | 173929 | 2% | 30% | 7 |
10 | CIRCULAR HETERODYNE INTERFEROMETER | authKW | 163289 | 1% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Optics | 11493 | 72% | 0% | 269 |
2 | Instruments & Instrumentation | 216 | 8% | 0% | 31 |
3 | Physics, Applied | 143 | 15% | 0% | 57 |
4 | Spectroscopy | 111 | 5% | 0% | 20 |
5 | Engineering, General | 68 | 4% | 0% | 14 |
6 | Biochemical Research Methods | 7 | 2% | 0% | 9 |
7 | Radiology, Nuclear Medicine & Medical Imaging | 3 | 2% | 0% | 9 |
8 | Physics, Multidisciplinary | 1 | 3% | 0% | 10 |
9 | Engineering, Electrical & Electronic | 1 | 4% | 0% | 14 |
10 | Medical Informatics | 0 | 0% | 0% | 1 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SYST PHOTON OPT NON LINEAIRE | 163289 | 1% | 100% | 2 |
2 | COMP PLICAT ENGN | 137927 | 4% | 12% | 14 |
3 | AGE SYST INNOVAT ENGN | 81645 | 0% | 100% | 1 |
4 | ASTROPRIBOR PROD COOPERAT MAIN ASTRON OBSERV | 81645 | 0% | 100% | 1 |
5 | ELECT PHYS 9 | 81645 | 0% | 100% | 1 |
6 | ENGN NET SH E MANU TURING | 81645 | 0% | 100% | 1 |
7 | ESCUELA CS FISICOMATEMAT | 81645 | 0% | 100% | 1 |
8 | GAO | 81645 | 0% | 100% | 1 |
9 | LASER GLOMAE | 81645 | 0% | 100% | 1 |
10 | LICAC OPT GLOMAE | 81645 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | APPLIED OPTICS | 9282 | 17% | 0% | 63 |
2 | OPTICS AND LASER TECHNOLOGY | 7920 | 6% | 0% | 21 |
3 | OPTIK | 6924 | 8% | 0% | 30 |
4 | OPTICS COMMUNICATIONS | 3604 | 9% | 0% | 34 |
5 | OPTICS AND LASERS IN ENGINEERING | 3416 | 3% | 0% | 12 |
6 | OPTICAL ENGINEERING | 1683 | 5% | 0% | 17 |
7 | OPTICA APPLICATA | 1251 | 1% | 0% | 5 |
8 | OPTIKA I SPEKTROSKOPIYA | 1179 | 3% | 0% | 10 |
9 | MEASUREMENT SCIENCE AND TECHNOLOGY | 1072 | 3% | 0% | 11 |
10 | JOURNAL OF BIOMEDICAL OPTICS | 984 | 2% | 0% | 8 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | WAVE PLATE | 522506 | 4% | 40% | 16 | Search WAVE+PLATE | Search WAVE+PLATE |
2 | PHASE RETARDANCE | 444506 | 2% | 78% | 7 | Search PHASE+RETARDANCE | Search PHASE+RETARDANCE |
3 | OPTICAL ROTATION ANGLE | 408223 | 1% | 100% | 5 | Search OPTICAL+ROTATION+ANGLE | Search OPTICAL+ROTATION+ANGLE |
4 | ACHROMATIC RETARDER | 291585 | 1% | 71% | 5 | Search ACHROMATIC+RETARDER | Search ACHROMATIC+RETARDER |
5 | RETARDANCE | 246959 | 3% | 28% | 11 | Search RETARDANCE | Search RETARDANCE |
6 | CIRCULAR POLARISCOPE | 244934 | 1% | 100% | 3 | Search CIRCULAR+POLARISCOPE | Search CIRCULAR+POLARISCOPE |
7 | PRINCIPAL AXIS ANGLE | 244934 | 1% | 100% | 3 | Search PRINCIPAL+AXIS+ANGLE | Search PRINCIPAL+AXIS+ANGLE |
8 | FAST AXIS | 183699 | 1% | 75% | 3 | Search FAST+AXIS | Search FAST+AXIS |
9 | CIRCULAR BIREFRINGENCE | 173929 | 2% | 30% | 7 | Search CIRCULAR+BIREFRINGENCE | Search CIRCULAR+BIREFRINGENCE |
10 | CIRCULAR HETERODYNE INTERFEROMETER | 163289 | 1% | 100% | 2 | Search CIRCULAR+HETERODYNE+INTERFEROMETER | Search CIRCULAR+HETERODYNE+INTERFEROMETER |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | WANG, W , CHEN, JZ , LIU, ZB , (2015) SPECTRAL TECHNIQUE FOR MEASURING PHASE RETARDATION OF A WAVE PLATE.CHINESE OPTICS LETTERS. VOL. 13. ISSUE 1. P. - | 18 | 82% | 2 |
2 | WILSON, SM , VATS, V , VACCARO, PH , (2007) TIME-DOMAIN METHOD FOR CHARACTERIZING RETARDATION PLATES WITH HIGH SENSITIVITY AND RESOLUTION.JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS. VOL. 24. ISSUE 9. P. 2500 -2508 | 28 | 64% | 7 |
3 | ZHANG, P , TAN, YD , LIU, WX , CHEN, WX , (2013) METHODS FOR OPTICAL PHASE RETARDATION MEASUREMENT: A REVIEW.SCIENCE CHINA-TECHNOLOGICAL SCIENCES. VOL. 56. ISSUE 5. P. 1155 -1163 | 22 | 67% | 4 |
4 | ZENG, AJ , LI, FY , ZHU, LL , HUANG, HJ , (2011) SIMULTANEOUS MEASUREMENT OF RETARDANCE AND FAST AXIS ANGLE OF A QUARTER-WAVE PLATE USING ONE PHOTOELASTIC MODULATOR.APPLIED OPTICS. VOL. 50. ISSUE 22. P. 4347 -4352 | 16 | 94% | 12 |
5 | NAGIB, NN , BAHRAWI, MS , ISMAIL, LZ , OTHMAN, MH , ABDALLAH, AW , (2015) EVALUATION OF A PHOTOMETRIC METHOD FOR RETARDANCE MEASUREMENT OF A QUARTERWAVE PHASE PLATE.OPTICS AND LASER TECHNOLOGY. VOL. 69. ISSUE . P. 77 -79 | 13 | 93% | 0 |
6 | WANG, W , (2012) DETERMINING THE RETARDATION OF A WAVE PLATE BY USING SPECTROSCOPIC METHOD.OPTICS COMMUNICATIONS. VOL. 285. ISSUE 24. P. 4850-4855 | 15 | 79% | 3 |
7 | XIE, CG , ZENG, AJ , HUANG, HJ , ZHU, LL , YUAN, Q , LI, FY , (2015) REAL-TIME MEASUREMENT OF RETARDATION AND FAST AXIS AZIMUTH FOR WAVE PLATES.JOURNAL OF OPTICAL TECHNOLOGY. VOL. 82. ISSUE 5. P. 294 -297 | 11 | 100% | 0 |
8 | LIU, WX , LIU, M , ZHANG, SL , (2008) METHOD FOR THE MEASUREMENT OF PHASE RETARDATION OF ANY WAVE PLATE WITH HIGH PRECISION.APPLIED OPTICS. VOL. 47. ISSUE 30. P. 5562 -5569 | 17 | 74% | 8 |
9 | LIN, JF , WU, JS , HUANG, CH , JENG, JS , (2011) AN INSTRUMENT FOR MEASURING LOW OPTICAL ROTATION ANGLE.OPTIK. VOL. 122. ISSUE 8. P. 733 -738 | 13 | 87% | 2 |
10 | NAGIB, NN , MAHMOUD, NA , (2016) ON THE THEORY OF SIMULTANEOUS RETARDANCE MEASUREMENT OF TWO PHASE PLATES.OPTIK. VOL. 127. ISSUE 14. P. 5597 -5602 | 10 | 100% | 0 |
Classes with closest relation at Level 1 |