Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
13090 | 861 | 14.5 | 59% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
217 | 3 | OPTICS//APPLIED OPTICS//OPTICAL ENGINEERING | 50829 |
1223 | 2 | PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY//THERMAL ERROR//COORDINATE MEASURING MACHINE | 9117 |
13090 | 1 | HETERODYNE INTERFEROMETER//HETERODYNE INTERFEROMETRY//FRINGE INTERPOLATION | 861 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | HETERODYNE INTERFEROMETER | authKW | 427713 | 3% | 43% | 28 |
2 | HETERODYNE INTERFEROMETRY | authKW | 370515 | 4% | 33% | 32 |
3 | FRINGE INTERPOLATION | authKW | 177318 | 1% | 100% | 5 |
4 | PERIODIC NONLINEARITY | authKW | 159583 | 1% | 75% | 6 |
5 | NANOMETER MEASUREMENT | address | 159577 | 1% | 50% | 9 |
6 | HEYDEMANN CORRECTION | authKW | 141854 | 0% | 100% | 4 |
7 | ANGULAR DISPLACEMENT MEASUREMENT | authKW | 126653 | 1% | 71% | 5 |
8 | DISPLACEMENT INTERFEROMETRY | authKW | 113482 | 0% | 80% | 4 |
9 | COMMON OPTICAL PATH | authKW | 106391 | 0% | 100% | 3 |
10 | COMP SOR DEV GRP | address | 106391 | 0% | 100% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Instruments & Instrumentation | 12392 | 38% | 0% | 324 |
2 | Optics | 10267 | 45% | 0% | 391 |
3 | Engineering, General | 5580 | 20% | 0% | 169 |
4 | Engineering, Manufacturing | 2020 | 9% | 0% | 74 |
5 | Physics, Applied | 335 | 15% | 0% | 132 |
6 | Nanoscience & Nanotechnology | 206 | 6% | 0% | 53 |
7 | Engineering, Mechanical | 95 | 4% | 0% | 37 |
8 | Engineering, Electrical & Electronic | 89 | 9% | 0% | 74 |
9 | Engineering, Industrial | 12 | 1% | 0% | 8 |
10 | Electrochemistry | 6 | 1% | 0% | 12 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | NANOMETER MEASUREMENT | 159577 | 1% | 50% | 9 |
2 | COMP SOR DEV GRP | 106391 | 0% | 100% | 3 |
3 | SECT PRECIS ENGN | 94567 | 0% | 67% | 4 |
4 | PRECIS ENGN STRAT GRP | 70927 | 0% | 100% | 2 |
5 | POSTDOCTORAL STN OPT ENGN | 63042 | 0% | 44% | 4 |
6 | RUMENTS CO | 51578 | 0% | 36% | 4 |
7 | CEMETRO | 47283 | 0% | 67% | 2 |
8 | DIMENS METROL SECT | 47283 | 0% | 67% | 2 |
9 | PME MECH SYST DESIGN | 47283 | 0% | 67% | 2 |
10 | SPACE NANOTECHNOL | 40292 | 1% | 23% | 5 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MEASUREMENT SCIENCE AND TECHNOLOGY | 40649 | 12% | 1% | 102 |
2 | PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING | 34061 | 2% | 5% | 18 |
3 | PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 25656 | 4% | 2% | 32 |
4 | APPLIED OPTICS | 14586 | 14% | 0% | 120 |
5 | RADIO-ELECTRONICS | 8864 | 0% | 25% | 1 |
6 | OPTICAL ENGINEERING | 7981 | 7% | 0% | 56 |
7 | PTB-MITTEILUNGEN | 6328 | 1% | 3% | 7 |
8 | METROLOGIA | 5621 | 2% | 1% | 21 |
9 | TM-TECHNISCHES MESSEN | 4109 | 1% | 1% | 9 |
10 | MEASUREMENT | 3123 | 2% | 0% | 19 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | LU, C , TROUTMAN, JR , SCHMITZ, TL , ELLIS, JD , TARBUTTON, JA , (2016) APPLICATION OF THE CONTINUOUS WAVELET TRANSFORM IN PERIODIC ERROR COMPENSATION.PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY. VOL. 44. ISSUE . P. 245 -251 | 34 | 87% | 0 |
2 | SCHMITZ, TL , CHU, DC , KIM, HS , (2009) FIRST AND SECOND ORDER PERIODIC ERROR MEASUREMENT FOR NON-CONSTANT VELOCITY MOTIONS.PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY. VOL. 33. ISSUE 4. P. 353-361 | 29 | 100% | 4 |
3 | HUANG, JH , WANG, Z , GAO, JM , YU, B , (2016) MODELING AND ANALYSIS OF PHASE FLUCTUATION IN A HIGH-PRECISION ROLL ANGLE MEASUREMENT BASED ON A HETERODYNE INTERFEROMETER.SENSORS. VOL. 16. ISSUE 8. P. - | 21 | 100% | 1 |
4 | SCHMITZ, TL , KIM, HS , (2007) MONTE CARLO EVALUATION OF PERIODIC ERROR UNCERTAINTY.PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY. VOL. 31. ISSUE 3. P. 251-259 | 27 | 100% | 3 |
5 | SCHMITZ, TL , HOUCK, L , CHU, D , KALEM, L , (2006) BENCH-TOP SETUP FOR VALIDATION OF REAL TIME, DIGITAL PERIODIC ERROR CORRECTION.PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY. VOL. 30. ISSUE 3. P. 306 -313 | 27 | 100% | 0 |
6 | SCHMITZ, TL , CHU, D , HOUCK, L , (2006) FIRST-ORDER PERIODIC ERROR CORRECTION: VALIDATION FOR CONSTANT AND NON-CONSTANT VELOCITIES WITH VARIABLE ERROR MAGNITUDES.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 17. ISSUE 12. P. 3195 -3203 | 26 | 100% | 12 |
7 | OLYAEE, S , YOON, TH , HAMEDI, S , (2009) JONES MATRIX ANALYSIS OF FREQUENCY MIXING ERROR IN THREE-LONGITUDINAL-MODE LASER HETERODYNE INTERFEROMETER.IET OPTOELECTRONICS. VOL. 3. ISSUE 5. P. 215 -224 | 23 | 88% | 21 |
8 | SCHMITZ, TL , BECKWITH, JF , (2003) AN INVESTIGATION OF TWO UNEXPLORED PERIODIC ERROR SOURCES IN DIFFERENTIAL-PATH INTERFEROMETRY.PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY. VOL. 27. ISSUE 3. P. 311 -322 | 25 | 100% | 9 |
9 | MESKERS, AJH , SPRONCK, JW , SCHMIDT, RHM , (2014) HETERODYNE DISPLACEMENT INTERFEROMETER, INSENSITIVE FOR INPUT POLARIZATION.OPTICS LETTERS. VOL. 39. ISSUE 7. P. 1949-1952 | 19 | 90% | 6 |
10 | SCHMITZ, TL , BECKWITH, JF , (2002) ACOUSTO-OPTIC DISPLACEMENT-MEASURING INTERFEROMETER: A NEW HETERODYNE INTERFEROMETER WITH ANGSTROM-LEVEL PERIODIC ERROR.JOURNAL OF MODERN OPTICS. VOL. 49. ISSUE 13. P. 2105-2114 | 24 | 100% | 24 |
Classes with closest relation at Level 1 |