Class information for:
Level 1: XEOL//CONVERSION ELECTRON YIELD//CAPACITANCE XAFS

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
21271 426 18.7 63%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
277 3       NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//JOURNAL OF SYNCHROTRON RADIATION//NUCLEAR SCIENCE & TECHNOLOGY 43290
1473 2             JOURNAL OF SYNCHROTRON RADIATION//RESONANT INELASTIC X RAY SCATTERING//RIXS 7684
21271 1                   XEOL//CONVERSION ELECTRON YIELD//CAPACITANCE XAFS 426

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 XEOL authKW 632732 4% 55% 16
2 CONVERSION ELECTRON YIELD authKW 573427 2% 100% 8
3 CAPACITANCE XAFS authKW 229369 1% 80% 4
4 CRYSTAL TECHNOL DEV address 215035 1% 100% 3
5 SIK EDGE XANES authKW 215035 1% 100% 3
6 SMART TIPS authKW 215035 1% 100% 3
7 TRXEOL authKW 215035 1% 100% 3
8 X RAY PHOTOACOUSTIC EFFECT authKW 215035 1% 100% 3
9 OD XAS authKW 161275 1% 75% 3
10 TRXPS authKW 161275 1% 75% 3

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Instruments & Instrumentation 1412 19% 0% 79
2 Physics, Applied 1233 36% 0% 152
3 Spectroscopy 599 11% 0% 46
4 Physics, Condensed Matter 432 18% 0% 78
5 Nuclear Science & Technology 157 6% 0% 27
6 Physics, Nuclear 150 6% 0% 27
7 Optics 72 7% 0% 29
8 Metallurgy & Metallurgical Engineering 68 5% 0% 22
9 Physics, Multidisciplinary 63 7% 0% 31
10 Chemistry, Physical 60 11% 0% 47

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CRYSTAL TECHNOL DEV 215035 1% 100% 3
2 CANADIAN SYNCHROTRON RADIAT IL 137827 2% 19% 10
3 CRI NANORODS 71678 0% 100% 1
4 DESIGN TECHNOL RUMENT 71678 0% 100% 1
5 DISTRETTO TECHNOL 71678 0% 100% 1
6 IFN CNR SECT 71678 0% 100% 1
7 J AN SYNCHTROTRON RADIAT 71678 0% 100% 1
8 JASRI J AN SYNCHROTRON RADIAT 71678 0% 100% 1
9 LAST1 71678 0% 100% 1
10 NANOSCALE QUANTUM CONDUCT ARRAY PROJECT 71678 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF SYNCHROTRON RADIATION 12386 5% 1% 23
2 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 2685 4% 0% 15
3 TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN 1860 3% 0% 11
4 SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY 1841 3% 0% 12
5 SURFACE AND INTERFACE ANALYSIS 1796 3% 0% 13
6 REVIEW OF SCIENTIFIC INSTRUMENTS 1575 6% 0% 26
7 JOURNAL DE PHYSIQUE IV 1344 3% 0% 14
8 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS 1198 5% 0% 23
9 X-RAY SPECTROMETRY 860 1% 0% 5
10 PHYSICA B-CONDENSED MATTER 646 4% 0% 17

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 XEOL 632732 4% 55% 16 Search XEOL Search XEOL
2 CONVERSION ELECTRON YIELD 573427 2% 100% 8 Search CONVERSION+ELECTRON+YIELD Search CONVERSION+ELECTRON+YIELD
3 CAPACITANCE XAFS 229369 1% 80% 4 Search CAPACITANCE+XAFS Search CAPACITANCE+XAFS
4 SIK EDGE XANES 215035 1% 100% 3 Search SIK+EDGE+XANES Search SIK+EDGE+XANES
5 SMART TIPS 215035 1% 100% 3 Search SMART+TIPS Search SMART+TIPS
6 TRXEOL 215035 1% 100% 3 Search TRXEOL Search TRXEOL
7 X RAY PHOTOACOUSTIC EFFECT 215035 1% 100% 3 Search X+RAY+PHOTOACOUSTIC+EFFECT Search X+RAY+PHOTOACOUSTIC+EFFECT
8 OD XAS 161275 1% 75% 3 Search OD+XAS Search OD+XAS
9 TRXPS 161275 1% 75% 3 Search TRXPS Search TRXPS
10 X RAY EXCITED CURRENT 161275 1% 75% 3 Search X+RAY+EXCITED+CURRENT Search X+RAY+EXCITED+CURRENT

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 DILULLO, A , SHIRATO, N , CUMMINGS, M , KERSELL, H , CHANG, H , ROSENMANN, D , MILLER, D , FREELAND, JW , HLA, SW , ROSE, V , (2016) LOCAL X-RAY MAGNETIC CIRCULAR DICHROISM STUDY OF FE/CU(111) USING A TUNNELING SMART TIP.JOURNAL OF SYNCHROTRON RADIATION. VOL. 23. ISSUE . P. 574 -578 17 68% 0
2 KAWAI, J , (2010) TOTAL REFLECTION X-RAY PHOTOELECTRON SPECTROSCOPY: A REVIEW.JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. VOL. 178. ISSUE . P. 268-272 24 55% 4
3 WANG, KK , ROSENMANN, D , HOLT, M , WINARSKI, R , HLA, SW , ROSE, V , (2013) AN EASY-TO-IMPLEMENT FILTER FOR SEPARATING PHOTO-EXCITED SIGNALS FROM TOPOGRAPHY IN SCANNING TUNNELING MICROSCOPY.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 84. ISSUE 6. P. - 15 65% 2
4 ROSE, V , WANG, KK , CHIEN, TY , HILLER, J , ROSENMANN, D , FREELAND, JW , PREISSNER, C , HLA, SW , (2013) SYNCHROTRON X-RAY SCANNING TUNNELING MICROSCOPY: FINGERPRINTING NEAR TO FAR FIELD TRANSITIONS ON CU(111) INDUCED BY SYNCHROTRON RADIATION.ADVANCED FUNCTIONAL MATERIALS. VOL. 23. ISSUE 20. P. 2646 -2652 13 68% 5
5 KAWAI, J , SAI, M , SUGIMURA, T , HAYASHI, K , TAKENAKA, H , KITAJIMA, Y , (1999) TOTAL REFLECTION X-RAY PHOTOELECTRON SPECTROSCOPY OF A TANTALUM-TITANIUM MULTILAYER.X-RAY SPECTROMETRY. VOL. 28. ISSUE 6. P. 519-522 15 88% 2
6 ROSE, V , CHIEN, TY , FREELAND, JW , ROSENMANN, D , HILLER, J , METLUSHKO, V , (2012) SPIN-DEPENDENT SYNCHROTRON X-RAY EXCITATIONS STUDIED BY SCANNING TUNNELING MICROSCOPY.JOURNAL OF APPLIED PHYSICS. VOL. 111. ISSUE 7. P. - 11 79% 7
7 ALSHEHABI, A , SASAKI, N , KAWAI, J , (2015) TOTAL REFLECTION X-RAY PHOTOELECTRON SPECTROSCOPY AS A SEMICONDUCTOR LUBRICANT ELEMENTAL ANALYSIS METHOD.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 114. ISSUE . P. 34 -37 11 73% 1
8 ROSE, V , CHIEN, TY , HILLER, J , ROSENMANN, D , WINARSKI, RP , (2011) X-RAY NANOTOMOGRAPHY OF SIO2-COATED PT90IR10 TIPS WITH SUB-MICRON CONDUCTING APEX.APPLIED PHYSICS LETTERS. VOL. 99. ISSUE 17. P. - 12 63% 14
9 HAYAKAWA, S , TANAKA, A , HIROKAWA, T , (2010) CONTRIBUTION OF NI KLL AUGER ELECTRONS TO THE PROBING DEPTH OF THE CONVERSION ELECTRON YIELD MEASUREMENTS.ANALYTICAL SCIENCES. VOL. 26. ISSUE 2. P. 233-237 8 100% 1
10 CUMMINGS, ML , CHIEN, TY , PREISSNER, C , MADHAVAN, V , DIESING, D , BODE, M , FREELAND, JW , ROSE, V , (2012) COMBINING SCANNING TUNNELING MICROSCOPY AND SYNCHROTRON RADIATION FOR HIGH-RESOLUTION IMAGING AND SPECTROSCOPY WITH CHEMICAL, ELECTRONIC, AND MAGNETIC CONTRAST.ULTRAMICROSCOPY. VOL. 112. ISSUE 1. P. 22 -31 12 57% 18

Classes with closest relation at Level 1


Rank Class id link
1 22572 ANISOTROPIC STRUCTURE ANALYSIS//HBEREICH C EXPT PHYS//NAOHNAF ELECTROLYTES
2 9415 DEBYE WALLER FACTOR//EXAFS//MEAN SQUARE RELATIVE DISPLACEMENT
3 21519 EELFS//TUNGSTEN 100 SURFACE//ATOMIC PAIR CORRELATION FUNCTION
4 8495 ELNES//CORE HOLE EFFECT//NEAR EDGE STRUCTURE
5 33188 WESTERN UNIV SYNCHROTRON RADIAT//ANGLE RESOLVED NEXAFS//BIPOLAR RESISTIVE SWITCHING MECHANISM
6 19239 QEXAFS//TIME RESOLVED XAS//QUICK EXAFS
7 8822 TXRF//TOTAL REFLECTION X RAY FLUORESCENCE//TOTAL REFLECTION X RAY FLUORESCENCE TXRF
8 27789 BEAM POSITION MONITOR//IONIZING BEAMS//PHOTON BEAM POSITION MONITORS
9 26620 ELECTRON BEAM ANNEALING//RAFTER//ION BEAM SYNTHESIS
10 18872 SITE OCCUPATION PREFERENCES//ATOMIC LOCAL STRUCTURE//DAFNE L

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