Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
8822 | 1213 | 21.9 | 57% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | TXRF | authKW | 2517041 | 14% | 59% | 170 |
2 | TOTAL REFLECTION X RAY FLUORESCENCE | authKW | 1372683 | 7% | 62% | 88 |
3 | TOTAL REFLECTION X RAY FLUORESCENCE TXRF | authKW | 425183 | 2% | 68% | 25 |
4 | SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | journal | 414277 | 25% | 5% | 302 |
5 | GIXRF | authKW | 265872 | 1% | 81% | 13 |
6 | SR TXRF | authKW | 236328 | 1% | 72% | 13 |
7 | LOW Z ELEMENTS | authKW | 203047 | 1% | 73% | 11 |
8 | TOTAL REFLECTION X RAY FLUORESCENCE ANALYSIS | authKW | 193355 | 1% | 59% | 13 |
9 | X-RAY SPECTROMETRY | journal | 190692 | 10% | 6% | 125 |
10 | GRAZING EXIT | authKW | 179793 | 1% | 71% | 10 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Spectroscopy | 29858 | 43% | 0% | 520 |
2 | Chemistry, Analytical | 4870 | 28% | 0% | 337 |
3 | Nuclear Science & Technology | 671 | 8% | 0% | 92 |
4 | Instruments & Instrumentation | 662 | 8% | 0% | 98 |
5 | Physics, Applied | 316 | 13% | 0% | 160 |
6 | Materials Science, Characterization, Testing | 156 | 2% | 0% | 19 |
7 | Physics, Nuclear | 91 | 3% | 0% | 41 |
8 | Chemistry, Inorganic & Nuclear | 79 | 4% | 0% | 48 |
9 | Materials Science, Coatings & Films | 78 | 2% | 0% | 28 |
10 | Physics, Condensed Matter | 48 | 6% | 0% | 68 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | TXRF | 154176 | 1% | 88% | 7 |
2 | GRP ENVIRONM MACROMOL CHEM | 100679 | 1% | 50% | 8 |
3 | ATOM | 62528 | 4% | 5% | 53 |
4 | XRAY ANALYT PLICAT | 61380 | 1% | 24% | 10 |
5 | NIPPON STEEL CORP | 56635 | 0% | 75% | 3 |
6 | PROC CHARACTERIZAT | 56635 | 0% | 75% | 3 |
7 | SERV INTER INVEST | 54081 | 1% | 18% | 12 |
8 | CHEM TECHNOL ENVIRONM CHEM | 51462 | 1% | 14% | 15 |
9 | ATOM OSTERR | 50344 | 0% | 100% | 2 |
10 | COOPERAT ENVIRONM CHEM | 50344 | 0% | 100% | 2 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 414277 | 25% | 5% | 302 |
2 | X-RAY SPECTROMETRY | 190692 | 10% | 6% | 125 |
3 | JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 11743 | 4% | 1% | 53 |
4 | JOURNAL OF TRACE AND MICROPROBE TECHNIQUES | 7809 | 1% | 2% | 13 |
5 | SOLID STATE PHENOMENA | 3675 | 1% | 1% | 18 |
6 | FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 3558 | 2% | 1% | 28 |
7 | ANALYTICAL SCIENCES | 3289 | 3% | 0% | 31 |
8 | POWDER DIFFRACTION | 2158 | 1% | 1% | 10 |
9 | JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY | 1769 | 2% | 0% | 28 |
10 | BUNSEKI KAGAKU | 1698 | 2% | 0% | 20 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | TXRF | 2517041 | 14% | 59% | 170 | Search TXRF | Search TXRF |
2 | TOTAL REFLECTION X RAY FLUORESCENCE | 1372683 | 7% | 62% | 88 | Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE | Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE |
3 | TOTAL REFLECTION X RAY FLUORESCENCE TXRF | 425183 | 2% | 68% | 25 | Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+TXRF | Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+TXRF |
4 | GIXRF | 265872 | 1% | 81% | 13 | Search GIXRF | Search GIXRF |
5 | SR TXRF | 236328 | 1% | 72% | 13 | Search SR+TXRF | Search SR+TXRF |
6 | LOW Z ELEMENTS | 203047 | 1% | 73% | 11 | Search LOW+Z+ELEMENTS | Search LOW+Z+ELEMENTS |
7 | TOTAL REFLECTION X RAY FLUORESCENCE ANALYSIS | 193355 | 1% | 59% | 13 | Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+ANALYSIS | Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+ANALYSIS |
8 | GRAZING EXIT | 179793 | 1% | 71% | 10 | Search GRAZING+EXIT | Search GRAZING+EXIT |
9 | VAPOR PHASE DECOMPOSITION VPD | 176203 | 1% | 100% | 7 | Search VAPOR+PHASE+DECOMPOSITION+VPD | Search VAPOR+PHASE+DECOMPOSITION+VPD |
10 | TOTAL REFLECTION | 166246 | 3% | 21% | 32 | Search TOTAL+REFLECTION | Search TOTAL+REFLECTION |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | DE LA CALLE, I , CABALEIRO, N , ROMERO, V , LAVILLA, I , BENDICHO, C , (2013) SAMPLE PRETREATMENT STRATEGIES FOR TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS: A TUTORIAL REVIEW.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 90. ISSUE . P. 23 -54 | 150 | 63% | 25 |
2 | PASHKOVA, GV , REVENKO, AG , (2015) A REVIEW OF APPLICATION OF TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY TO WATER ANALYSIS.APPLIED SPECTROSCOPY REVIEWS. VOL. 50. ISSUE 6. P. 443 -472 | 113 | 76% | 4 |
3 | WOBRAUSCHEK, P , (2007) TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS - A REVIEW.X-RAY SPECTROMETRY. VOL. 36. ISSUE 5. P. 289 -300 | 57 | 84% | 75 |
4 | HELLIN, D , DE GENDT, S , VALCKX, N , MERTENS, PW , VINCKIER, C , (2006) TRENDS IN TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY FOR METALLIC CONTAMINATION CONTROL IN SEMICONDUCTOR NANOTECHNOLOGY.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 61. ISSUE 5. P. 496 -514 | 65 | 82% | 31 |
5 | STOEV, KN , SAKURAI, K , (1999) REVIEW ON GRAZING INCIDENCE X-RAY SPECTROMETRY AND REFLECTOMETRY.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 54. ISSUE 1. P. 41 -82 | 144 | 40% | 74 |
6 | SZOBOSZLAI, N , POLGARI, Z , MIHUCZ, VG , ZARAY, G , (2009) RECENT TRENDS IN TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETRY FOR BIOLOGICAL APPLICATIONS.ANALYTICA CHIMICA ACTA. VOL. 633. ISSUE 1. P. 1 -18 | 71 | 52% | 34 |
7 | ALOV, NV , (2011) TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS: PHYSICAL FOUNDATIONS AND ANALYTICAL APPLICATION (A REVIEW).INORGANIC MATERIALS. VOL. 47. ISSUE 14. P. 1487-1499 | 43 | 80% | 13 |
8 | VON BOHLEN, A , (2009) TOTAL REFLECTION X-RAY FLUORESCENCE AND GRAZING INCIDENCE X-RAY SPECTROMETRY - TOOLS FOR MICRO- AND SURFACE ANALYSIS. A REVIEW.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 64. ISSUE 9. P. 821 -832 | 44 | 71% | 48 |
9 | KLOCKENKAMPER, R , VON BOHLEN, A , (2001) TOTAL-REFLECTION X-RAY FLUORESCENCE MOVING TOWARDS NANOANALYSIS: A SURVEY.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 56. ISSUE 11. P. 2005 -2018 | 46 | 87% | 36 |
10 | STRELI, C , WOBRAUSCHEK, P , MEIRER, F , PEPPONI, G , (2008) SYNCHROTRON RADIATION INDUCED TXRF.JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. VOL. 23. ISSUE 6. P. 792 -798 | 43 | 77% | 17 |
Classes with closest relation at Level 1 |