Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
25228 | 287 | 20.1 | 72% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
339 | 3 | METAMATERIALS//SURFACE PLASMONS//PLASMONICS | 37115 |
3724 | 2 | OPTICAL NEAR FIELD//JOURNAL OF OPTICAL TECHNOLOGY//EMISSION LIGHT | 1064 |
25228 | 1 | OPTICAL NEAR FIELD//EMISSION LIGHT//ELECT ENGN INFORMAT SYST | 287 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | OPTICAL NEAR FIELD | authKW | 1225689 | 10% | 40% | 29 |
2 | EMISSION LIGHT | authKW | 851157 | 3% | 100% | 8 |
3 | ELECT ENGN INFORMAT SYST | address | 541354 | 21% | 9% | 59 |
4 | INT NANO ELECT PHOTON TECHNOL | address | 531973 | 2% | 100% | 5 |
5 | SURFACE PLASMON EXCITATION | authKW | 462574 | 3% | 43% | 10 |
6 | PHOTON NETWORK | address | 446485 | 6% | 26% | 16 |
7 | LOCALIZED PHOTON PROJECT | address | 425574 | 2% | 67% | 6 |
8 | ATTENUATED TOTAL REFLECTION PROPERTY | authKW | 319184 | 1% | 100% | 3 |
9 | REVERSE IRRADIATION | authKW | 319184 | 1% | 100% | 3 |
10 | SP EMISSION LIGHT | authKW | 319184 | 1% | 100% | 3 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 1856 | 52% | 0% | 148 |
2 | Optics | 1542 | 31% | 0% | 89 |
3 | Nanoscience & Nanotechnology | 252 | 11% | 0% | 31 |
4 | Microscopy | 176 | 3% | 0% | 8 |
5 | Materials Science, Multidisciplinary | 173 | 20% | 0% | 57 |
6 | Crystallography | 112 | 6% | 0% | 17 |
7 | Materials Science, Coatings & Films | 92 | 5% | 0% | 13 |
8 | Engineering, Electrical & Electronic | 74 | 12% | 0% | 34 |
9 | Physics, Condensed Matter | 74 | 10% | 0% | 30 |
10 | Computer Science, Hardware & Architecture | 5 | 1% | 0% | 3 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ELECT ENGN INFORMAT SYST | 541354 | 21% | 9% | 59 |
2 | INT NANO ELECT PHOTON TECHNOL | 531973 | 2% | 100% | 5 |
3 | PHOTON NETWORK | 446485 | 6% | 26% | 16 |
4 | LOCALIZED PHOTON PROJECT | 425574 | 2% | 67% | 6 |
5 | OHTSU LOCALIZED PHOTON PROJECT | 239386 | 1% | 75% | 3 |
6 | NANOPHOTON | 225455 | 18% | 4% | 53 |
7 | MEGURU KU | 119690 | 1% | 38% | 3 |
8 | ELECTOR ENGN | 106395 | 0% | 100% | 1 |
9 | ERATO OHTSU LOCALIZED PHOTON PROJECT | 106395 | 0% | 100% | 1 |
10 | INFORMAT SYST NANOPHOTON | 106395 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | APPLIED PHYSICS B-LASERS AND OPTICS | 13657 | 11% | 0% | 31 |
2 | IEICE TRANSACTIONS ON ELECTRONICS | 5737 | 6% | 0% | 18 |
3 | JOURNAL OF NANOPHOTONICS | 5547 | 2% | 1% | 6 |
4 | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1959 | 6% | 0% | 16 |
5 | OPTICAL REVIEW | 1869 | 2% | 0% | 6 |
6 | JOURNAL OF MICROSCOPY | 1497 | 2% | 0% | 6 |
7 | MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 1301 | 5% | 0% | 13 |
8 | APPLIED PHYSICS EXPRESS | 1039 | 2% | 0% | 6 |
9 | NANOPHOTONICS | 663 | 0% | 1% | 1 |
10 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 564 | 5% | 0% | 13 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | OPTICAL NEAR FIELD | 1225689 | 10% | 40% | 29 | Search OPTICAL+NEAR+FIELD | Search OPTICAL+NEAR+FIELD |
2 | EMISSION LIGHT | 851157 | 3% | 100% | 8 | Search EMISSION+LIGHT | Search EMISSION+LIGHT |
3 | SURFACE PLASMON EXCITATION | 462574 | 3% | 43% | 10 | Search SURFACE+PLASMON+EXCITATION | Search SURFACE+PLASMON+EXCITATION |
4 | ATTENUATED TOTAL REFLECTION PROPERTY | 319184 | 1% | 100% | 3 | Search ATTENUATED+TOTAL+REFLECTION+PROPERTY | Search ATTENUATED+TOTAL+REFLECTION+PROPERTY |
5 | REVERSE IRRADIATION | 319184 | 1% | 100% | 3 | Search REVERSE+IRRADIATION | Search REVERSE+IRRADIATION |
6 | SP EMISSION LIGHT | 319184 | 1% | 100% | 3 | Search SP+EMISSION+LIGHT | Search SP+EMISSION+LIGHT |
7 | YUKAWA FUNCTION | 319184 | 1% | 100% | 3 | Search YUKAWA+FUNCTION | Search YUKAWA+FUNCTION |
8 | LC MOLECULE | 239386 | 1% | 75% | 3 | Search LC+MOLECULE | Search LC+MOLECULE |
9 | OPTICAL NEAR FIELD INTERACTION | 239386 | 1% | 75% | 3 | Search OPTICAL+NEAR+FIELD+INTERACTION | Search OPTICAL+NEAR+FIELD+INTERACTION |
10 | ATTENUATED TOTAL REFLECTION MEASUREMENT | 212789 | 1% | 100% | 2 | Search ATTENUATED+TOTAL+REFLECTION+MEASUREMENT | Search ATTENUATED+TOTAL+REFLECTION+MEASUREMENT |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | OHTSU, M , (2014) FROM CLASSICAL TO MODERN NEAR-FIELD OPTICS AND THE FUTURE.OPTICAL REVIEW. VOL. 21. ISSUE 6. P. 905 -910 | 50 | 89% | 0 |
2 | OHTSU, M , (2012) DRESSED PHOTON TECHNOLOGY.NANOPHOTONICS. VOL. 1. ISSUE 1. P. 83 -97 | 41 | 60% | 6 |
3 | NARUSE, M , TATE, N , AONO, M , OHTSU, M , (2013) INFORMATION PHYSICS FUNDAMENTALS OF NANOPHOTONICS.REPORTS ON PROGRESS IN PHYSICS. VOL. 76. ISSUE 5. P. - | 51 | 41% | 2 |
4 | NARUSE, M , TATE, N , OHTSU, M , (2012) OPTICAL SECURITY BASED ON NEAR-FIELD PROCESSES AT THE NANOSCALE.JOURNAL OF OPTICS. VOL. 14. ISSUE 9. P. - | 21 | 75% | 2 |
5 | LIU, Y , YATSUI, T , OHTSU, M , (2012) CONTROLLING THE SIZE OF ZNO QUANTUM DOTS USING THE DRESSED PHOTON-PHONON-ASSISTED SOL-GEL METHOD.APPLIED PHYSICS B-LASERS AND OPTICS. VOL. 108. ISSUE 4. P. 707 -711 | 16 | 80% | 3 |
6 | KATO, K , KAWASHIMA, J , BABA, A , SHINBO, K , KANEKO, F , ADVINCULA, RC , (2003) ATTENUATED TOTAL REFLECTION AND EMISSION DUE TO SURFACE PLASMON EXCITATION OF LAYER-BY-LAYER ULTRATHIN FILMS CONTAINING AZO-DYE.THIN SOLID FILMS. VOL. 438. ISSUE . P. 101-107 | 21 | 78% | 2 |
7 | KATO, K , KAWASHIMA, J , SHINBO, K , KANEKO, F , KATO, K , SHINBO, K , KANEKO, F , BABA, A , ADVINCULA, RC , (2003) ATTENUATED TOTAL REFLECTION AND EMISSION PROPERTIES OF SELF-ASSEMBLED LAYER-BYLAYER FILMS CONTAINING AZOBENZENE DYE.MOLECULAR CRYSTALS AND LIQUID CRYSTALS. VOL. 407. ISSUE . P. 501-509 | 19 | 83% | 0 |
8 | TATE, N , NARUSE, M , LIU, Y , KAWAZOE, T , YATSUI, T , OHTSU, M , (2013) EXPERIMENTAL DEMONSTRATION AND STOCHASTIC MODELING OF AUTONOMOUS FORMATION OF NANOPHOTONIC DROPLETS.APPLIED PHYSICS B-LASERS AND OPTICS. VOL. 112. ISSUE 4. P. 587-592 | 14 | 78% | 2 |
9 | NARUSE, M , YATSUI, T , NOMURA, W , KAWAZOE, T , AIDA, M , OHTSU, M , (2013) UNVEILING THE MECHANISMS OF DRESSED-PHOTON-PHONON ETCHING BASED ON HIERARCHICAL SURFACE ROUGHNESS MEASURE.APPLIED PHYSICS LETTERS. VOL. 102. ISSUE 7. P. - | 13 | 81% | 0 |
10 | TATE, N , LIU, Y , KAWAZOE, T , NARUSE, M , YATSUI, T , OHTSU, M , (2013) FIXED-DISTANCE COUPLING AND ENCAPSULATION OF HETEROGENEOUS QUANTUM DOTS USING PHONON-ASSISTED PHOTO-CURING.APPLIED PHYSICS B-LASERS AND OPTICS. VOL. 110. ISSUE 1. P. 39-45 | 12 | 80% | 1 |
Classes with closest relation at Level 1 |