FSK3740 Introduction to Scanning Probe Microscopy 6.0 credits

The course is designed for students from a wide variety of educational backgrounds, from Physics, Chemistry and Biology, who would like to learn about the technical details of how SPMs work, and the possibilities and pitfalls in interpreting the images that SPM's produce.  We will look in detail at some of the many different modes of SPM usage, with particular emphasis on Atomic Force Microscopy (AFM) and its many variations. 

• SPM overview
• Scanners, Sensors, Feedback and Control
• Cantilevers and Tips, Force Measurements
• Fluctuations, Noise and Fundamental Limits
• Surface Forces, Adhesion and Friction
• AFM Colloidal Probe Technique
• SPM Applications in Microelectronics
• Nonlinear Cantilever Dynamics

• To provide the theoretical background and physical intuitation necessary to understand how SPM's operate and how to interpret the images they produce. 
• To provide an practical, hands-on introduction to the operation of SPMs in a laboratory setting.

Solid background in Physics, Chemistry and Biology.

Language of instruction: English

Various articles, lecture notes, and training manuals, made available to participating students.

• LAB1 - Laboratory work, 6.0 credits, grading scale: G

Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

The examiner may apply another examination format when re-examining individual students.

If the course is discontinued, students may request to be examined during the following two academic years.

LAB1 - Laboratory work, 6 hp 

Two Written lab reports, and either one  literature project or one simulation project.

• All members of a group are responsible for the group's work.
• In any assessment, every student shall honestly disclose any help received and sources used.
• In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.