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FE-TEM JEOL JEM-2100F (Kista)

JEOL JEM-2100F is an advanced Field Emission TEM. Electron gun composes of ZrO/W(100) emitter with accelerating voltage 80 kV-200 kV, providing point resolution 0.23 nm and lattice resolution 0.10 nm. Magnification is from 50× to 1 500 000×.

FE-TEM JEOL JEM-2100F microscope.
FE-TEM JEOL JEM-2100F, KTH.

The JEM 2100F provides atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries, with information on morphology, chemical composition, crystal structure and bonding states of atoms.

The JEM-2100F is equipped with STEM, EDS, EELS, and CCD-cameras. Analytical methods include BF-TEM, HAADF-TEM, EF-TEM, ED and EELS. The side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift.

To the booking page for the JEM 2100F

Main contact person: Fei Ye ( feiy@kth.se ).

Location: Isafjordsgatan 22, Kista Electrum Laboratory

Department of Applied Physics, Division of Materials and Nanophysics, www.aphys.kth.se/mnp