Class information for:
Level 1: X-RAY SPECTROMETRY//X RAY FLUORESCENCE SPECTROMETRY//FUNDAMENTAL PARAMETER METHOD

Basic class information

Class id #P Avg. number of
references
Database coverage
of references
12683 888 18.8 28%



Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes

The table includes all classes above and classes immediately below the current class.



Cluster id Level Cluster label #P
4 4 ENVIRONMENTAL SCIENCES//GEOSCIENCES, MULTIDISCIPLINARY//METEOROLOGY & ATMOSPHERIC SCIENCES 1766162
95 3       CHEMISTRY, ANALYTICAL//JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY//SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY 76493
105 2             SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY//JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY//SPECTROSCOPY 25467
12683 1                   X-RAY SPECTROMETRY//X RAY FLUORESCENCE SPECTROMETRY//FUNDAMENTAL PARAMETER METHOD 888

Terms with highest relevance score



rank Term termType Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 X-RAY SPECTROMETRY journal 1442272 33% 14% 294
2 X RAY FLUORESCENCE SPECTROMETRY authKW 119157 3% 13% 26
3 FUNDAMENTAL PARAMETER METHOD authKW 84629 1% 31% 8
4 QUANTITATIVE XRF ANALYSIS authKW 77365 0% 75% 3
5 CORRECTION FOR MATRIX EFFECTS authKW 68770 0% 100% 2
6 PELLET SAMPLE authKW 68770 0% 100% 2
7 PHOTO AND AUGER ELECTRONS authKW 68770 0% 100% 2
8 POLYMER FILM SUBSTRATE authKW 68770 0% 100% 2
9 PORTABLE RI X RAY FLUORESCENCE SPECTROMETER authKW 68770 0% 100% 2
10 SUBSTITUTION DILUTION METHOD authKW 68770 0% 100% 2

Web of Science journal categories



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 Spectroscopy 25292 46% 0% 409
2 Chemistry, Analytical 2272 23% 0% 200
3 Materials Science, Characterization, Testing 821 4% 0% 35
4 Instruments & Instrumentation 619 9% 0% 80
5 Nuclear Science & Technology 536 8% 0% 70
6 Materials Science, Ceramics 125 3% 0% 24
7 Physics, Nuclear 50 3% 0% 27
8 Chemistry, Inorganic & Nuclear 44 4% 0% 32
9 Microscopy 24 1% 0% 6
10 Metallurgy & Metallurgical Engineering 14 2% 0% 21

Address terms



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 UNIT 63653 68770 0% 100% 2
2 TECNOL CERAM 46793 2% 9% 16
3 CENT 30 34385 0% 100% 1
4 CHINESE ENGN TECHNOL OPT RUMEN 34385 0% 100% 1
5 DETECTOR ADV DEV 34385 0% 100% 1
6 HUTNI CHEM 34385 0% 100% 1
7 INFORMAT TECHNOL MODELING 34385 0% 100% 1
8 MFG PROCESSES 34385 0% 100% 1
9 MICROSCOPIA ELE ONICA MICROANAL MEM 34385 0% 100% 1
10 PL NUCL TECH GEOSCI SICHUAN PROVIANCE 34385 0% 100% 1

Journals



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
1 X-RAY SPECTROMETRY 1442272 33% 14% 294
2 ADVANCES IN X-RAY ANALYSIS 34027 1% 10% 10
3 INDUSTRIAL LABORATORY 15366 3% 2% 24
4 SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY 9373 4% 1% 39
5 GLASS TECHNOLOGY-EUROPEAN JOURNAL OF GLASS SCIENCE AND TECHNOLOGY PART A 8853 1% 3% 9
6 JOURNAL OF ANALYTICAL CHEMISTRY 7801 4% 1% 32
7 FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE 5505 3% 1% 23
8 SPECTROSCOPY AND SPECTRAL ANALYSIS 4073 4% 0% 35
9 CERAMICS-TECHNICAL 1908 0% 6% 1
10 JOURNAL OF TRACE AND MICROPROBE TECHNIQUES 1573 1% 1% 5

Author Key Words



Rank Term Chi square Shr. of publ. in
class containing
term
Class's shr. of
term's tot. occurrences
#P with
term in
class
LCSH search Wikipedia search
1 X RAY FLUORESCENCE SPECTROMETRY 119157 3% 13% 26 Search X+RAY+FLUORESCENCE+SPECTROMETRY Search X+RAY+FLUORESCENCE+SPECTROMETRY
2 FUNDAMENTAL PARAMETER METHOD 84629 1% 31% 8 Search FUNDAMENTAL+PARAMETER+METHOD Search FUNDAMENTAL+PARAMETER+METHOD
3 QUANTITATIVE XRF ANALYSIS 77365 0% 75% 3 Search QUANTITATIVE+XRF+ANALYSIS Search QUANTITATIVE+XRF+ANALYSIS
4 CORRECTION FOR MATRIX EFFECTS 68770 0% 100% 2 Search CORRECTION+FOR+MATRIX+EFFECTS Search CORRECTION+FOR+MATRIX+EFFECTS
5 PELLET SAMPLE 68770 0% 100% 2 Search PELLET+SAMPLE Search PELLET+SAMPLE
6 PHOTO AND AUGER ELECTRONS 68770 0% 100% 2 Search PHOTO+AND+AUGER+ELECTRONS Search PHOTO+AND+AUGER+ELECTRONS
7 POLYMER FILM SUBSTRATE 68770 0% 100% 2 Search POLYMER+FILM+SUBSTRATE Search POLYMER+FILM+SUBSTRATE
8 PORTABLE RI X RAY FLUORESCENCE SPECTROMETER 68770 0% 100% 2 Search PORTABLE+RI+X+RAY+FLUORESCENCE+SPECTROMETER Search PORTABLE+RI+X+RAY+FLUORESCENCE+SPECTROMETER
9 SUBSTITUTION DILUTION METHOD 68770 0% 100% 2 Search SUBSTITUTION+DILUTION+METHOD Search SUBSTITUTION+DILUTION+METHOD
10 THEORETICAL INTENSITY CALCULATION 68770 0% 100% 2 Search THEORETICAL+INTENSITY+CALCULATION Search THEORETICAL+INTENSITY+CALCULATION

Core articles

The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.



Rank Reference # ref.
in cl.
Shr. of ref. in
cl.
Citations
1 MOLCHANOVA, EI , SMAGUNOVA, AN , KOZLOV, VA , AZMUKO, NA , (1994) CONSTRAINT EQUATIONS IN X-RAY-FLUORESCENCE ANALYSIS (REVIEW).INDUSTRIAL LABORATORY. VOL. 60. ISSUE 2. P. 90 -99 42 91% 1
2 REVENKO, AG , (2011) DEVELOPMENT OF X-RAY FLUORESCENCE ANALYSIS IN RUSSIA IN 1991-2010.JOURNAL OF ANALYTICAL CHEMISTRY. VOL. 66. ISSUE 11. P. 1059-1072 37 49% 3
3 HAN, XY , ZHUO, SJ , WANG, PL , (2006) ANALYSIS OF FILMS BY X-RAY FLUORESCENCE SPECTROMETRY.SPECTROSCOPY AND SPECTRAL ANALYSIS. VOL. 26. ISSUE 1. P. 159-165 26 65% 6
4 SITKO, R , (2005) EMPIRICAL COEFFICIENTS MODELS FOR X-RAY FLUORESCENCE ANALYSIS OF INTERMEDIATE-THICKNESS SAMPLES.X-RAY SPECTROMETRY. VOL. 34. ISSUE 1. P. 11-18 17 85% 9
5 SITKO, R , (2008) STUDY ON THE INFLUENCE OF X-RAY TUBE SPECTRAL DISTRIBUTION ON THE ANALYSIS OF BULK SAMPLES AND THIN FILMS: FUNDAMENTAL PARAMETERS METHOD AND THEORETICAL COEFFICIENT ALGORITHMS.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 63. ISSUE 11. P. 1297-1302 14 70% 4
6 ZARKADAS, C , KARYDAS, AG , (2004) FUNDAMENTAL PARAMETERS APPROACH IN TUBE-EXCITED SECONDARY TARGET XRF SET-UPS: COMPARISON BETWEEN THEORY AND EXPERIMENT.X-RAY SPECTROMETRY. VOL. 33. ISSUE 6. P. 447 -454 14 78% 7
7 MARKOWICZ, A , (2011) AN OVERVIEW OF QUANTIFICATION METHODS IN ENERGY-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS.PRAMANA-JOURNAL OF PHYSICS. VOL. 76. ISSUE 2. P. 321 -329 11 79% 13
8 VUCHKOVA, L , JORDANOV, J , (2000) FUSION METHOD FOR PREPARATION OF REFRACTORY NICKEL BASED ALLOY POWDERS FOR X-RAY FLUORESCENCE SPECTROMETRY.ANALYST. VOL. 125. ISSUE 9. P. 1681 -1685 15 79% 5
9 WANG, YZ , (1996) DIRECT DETERMINATION METHOD FOR HOMOGENEOUS SOLID SAMPLES IN X-RAY FLUORESCENCE ANALYSIS.X-RAY SPECTROMETRY. VOL. 25. ISSUE 5. P. 245-257 13 100% 5
10 HAN, XY , ZHUO, SJ , SHEN, RX , WANG, PL , (2007) CALCULATION OF THE CONTRIBUTIONS OF SCATTERING EFFECTS TO THE X-RAY FLUORESCENCE INTENSITIES.SPECTROSCOPY AND SPECTRAL ANALYSIS. VOL. 27. ISSUE 2. P. 391-394 9 100% 1

Classes with closest relation at Level 1



Rank Class id link
1 21287 XRF ANALYSIS OF BIOLOGICAL SAMPLES//WDXRF ANALYSIS//PEDXRF
2 9340 POLYCAPILLARY OPTICS//CAPILLARY OPTICS//POLYCAPILLARY X RAY OPTICS
3 32444 ENERGY DISPERSIVE X RAY FLUORESCENCE AND SCATTERING//GERX//PLASTICS CHARACTERIZATION
4 20335 SRXRF TECHNIQUE//GEOCHEMISTRY OF LUNAR ROCKS//MONOXIDE FLAME EMISSION SPECTROMETRY
5 33327 ANGLE RESOLVED MEASUREMENT//APMSF//FLOW THROUGH COLUMN
6 8822 TXRF//TOTAL REFLECTION X RAY FLUORESCENCE//TOTAL REFLECTION X RAY FLUORESCENCE TXRF
7 30121 DIRECT ANALYSIS OF MOLTEN STEEL//ELE ON SPECT GRP//HOTSPOT RADIATION
8 21311 STAHL UND EISEN//BATH METALS//BETRIEB EF FOR ENTWICKLUNG STAHLERZEUGUNG
9 28640 252CF NEUTRON SOURCE//COPRECIPITATION SEPARATION OF TRACE ELEMENTS//EGYPTIAN MONAZITE SAMPLES
10 18698 ENGN PLICAT RADIOISOTOPES//NUCLEAR GEOPHYSICS//MONTECUCCOLINO DIN

Go to start page