Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
12683 | 888 | 18.8 | 28% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | X-RAY SPECTROMETRY | journal | 1442272 | 33% | 14% | 294 |
2 | X RAY FLUORESCENCE SPECTROMETRY | authKW | 119157 | 3% | 13% | 26 |
3 | FUNDAMENTAL PARAMETER METHOD | authKW | 84629 | 1% | 31% | 8 |
4 | QUANTITATIVE XRF ANALYSIS | authKW | 77365 | 0% | 75% | 3 |
5 | CORRECTION FOR MATRIX EFFECTS | authKW | 68770 | 0% | 100% | 2 |
6 | PELLET SAMPLE | authKW | 68770 | 0% | 100% | 2 |
7 | PHOTO AND AUGER ELECTRONS | authKW | 68770 | 0% | 100% | 2 |
8 | POLYMER FILM SUBSTRATE | authKW | 68770 | 0% | 100% | 2 |
9 | PORTABLE RI X RAY FLUORESCENCE SPECTROMETER | authKW | 68770 | 0% | 100% | 2 |
10 | SUBSTITUTION DILUTION METHOD | authKW | 68770 | 0% | 100% | 2 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Spectroscopy | 25292 | 46% | 0% | 409 |
2 | Chemistry, Analytical | 2272 | 23% | 0% | 200 |
3 | Materials Science, Characterization, Testing | 821 | 4% | 0% | 35 |
4 | Instruments & Instrumentation | 619 | 9% | 0% | 80 |
5 | Nuclear Science & Technology | 536 | 8% | 0% | 70 |
6 | Materials Science, Ceramics | 125 | 3% | 0% | 24 |
7 | Physics, Nuclear | 50 | 3% | 0% | 27 |
8 | Chemistry, Inorganic & Nuclear | 44 | 4% | 0% | 32 |
9 | Microscopy | 24 | 1% | 0% | 6 |
10 | Metallurgy & Metallurgical Engineering | 14 | 2% | 0% | 21 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | UNIT 63653 | 68770 | 0% | 100% | 2 |
2 | TECNOL CERAM | 46793 | 2% | 9% | 16 |
3 | CENT 30 | 34385 | 0% | 100% | 1 |
4 | CHINESE ENGN TECHNOL OPT RUMEN | 34385 | 0% | 100% | 1 |
5 | DETECTOR ADV DEV | 34385 | 0% | 100% | 1 |
6 | HUTNI CHEM | 34385 | 0% | 100% | 1 |
7 | INFORMAT TECHNOL MODELING | 34385 | 0% | 100% | 1 |
8 | MFG PROCESSES | 34385 | 0% | 100% | 1 |
9 | MICROSCOPIA ELE ONICA MICROANAL MEM | 34385 | 0% | 100% | 1 |
10 | PL NUCL TECH GEOSCI SICHUAN PROVIANCE | 34385 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | X-RAY SPECTROMETRY | 1442272 | 33% | 14% | 294 |
2 | ADVANCES IN X-RAY ANALYSIS | 34027 | 1% | 10% | 10 |
3 | INDUSTRIAL LABORATORY | 15366 | 3% | 2% | 24 |
4 | SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 9373 | 4% | 1% | 39 |
5 | GLASS TECHNOLOGY-EUROPEAN JOURNAL OF GLASS SCIENCE AND TECHNOLOGY PART A | 8853 | 1% | 3% | 9 |
6 | JOURNAL OF ANALYTICAL CHEMISTRY | 7801 | 4% | 1% | 32 |
7 | FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 5505 | 3% | 1% | 23 |
8 | SPECTROSCOPY AND SPECTRAL ANALYSIS | 4073 | 4% | 0% | 35 |
9 | CERAMICS-TECHNICAL | 1908 | 0% | 6% | 1 |
10 | JOURNAL OF TRACE AND MICROPROBE TECHNIQUES | 1573 | 1% | 1% | 5 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | MOLCHANOVA, EI , SMAGUNOVA, AN , KOZLOV, VA , AZMUKO, NA , (1994) CONSTRAINT EQUATIONS IN X-RAY-FLUORESCENCE ANALYSIS (REVIEW).INDUSTRIAL LABORATORY. VOL. 60. ISSUE 2. P. 90 -99 | 42 | 91% | 1 |
2 | REVENKO, AG , (2011) DEVELOPMENT OF X-RAY FLUORESCENCE ANALYSIS IN RUSSIA IN 1991-2010.JOURNAL OF ANALYTICAL CHEMISTRY. VOL. 66. ISSUE 11. P. 1059-1072 | 37 | 49% | 3 |
3 | HAN, XY , ZHUO, SJ , WANG, PL , (2006) ANALYSIS OF FILMS BY X-RAY FLUORESCENCE SPECTROMETRY.SPECTROSCOPY AND SPECTRAL ANALYSIS. VOL. 26. ISSUE 1. P. 159-165 | 26 | 65% | 6 |
4 | SITKO, R , (2005) EMPIRICAL COEFFICIENTS MODELS FOR X-RAY FLUORESCENCE ANALYSIS OF INTERMEDIATE-THICKNESS SAMPLES.X-RAY SPECTROMETRY. VOL. 34. ISSUE 1. P. 11-18 | 17 | 85% | 9 |
5 | SITKO, R , (2008) STUDY ON THE INFLUENCE OF X-RAY TUBE SPECTRAL DISTRIBUTION ON THE ANALYSIS OF BULK SAMPLES AND THIN FILMS: FUNDAMENTAL PARAMETERS METHOD AND THEORETICAL COEFFICIENT ALGORITHMS.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 63. ISSUE 11. P. 1297-1302 | 14 | 70% | 4 |
6 | ZARKADAS, C , KARYDAS, AG , (2004) FUNDAMENTAL PARAMETERS APPROACH IN TUBE-EXCITED SECONDARY TARGET XRF SET-UPS: COMPARISON BETWEEN THEORY AND EXPERIMENT.X-RAY SPECTROMETRY. VOL. 33. ISSUE 6. P. 447 -454 | 14 | 78% | 7 |
7 | MARKOWICZ, A , (2011) AN OVERVIEW OF QUANTIFICATION METHODS IN ENERGY-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS.PRAMANA-JOURNAL OF PHYSICS. VOL. 76. ISSUE 2. P. 321 -329 | 11 | 79% | 13 |
8 | VUCHKOVA, L , JORDANOV, J , (2000) FUSION METHOD FOR PREPARATION OF REFRACTORY NICKEL BASED ALLOY POWDERS FOR X-RAY FLUORESCENCE SPECTROMETRY.ANALYST. VOL. 125. ISSUE 9. P. 1681 -1685 | 15 | 79% | 5 |
9 | WANG, YZ , (1996) DIRECT DETERMINATION METHOD FOR HOMOGENEOUS SOLID SAMPLES IN X-RAY FLUORESCENCE ANALYSIS.X-RAY SPECTROMETRY. VOL. 25. ISSUE 5. P. 245-257 | 13 | 100% | 5 |
10 | HAN, XY , ZHUO, SJ , SHEN, RX , WANG, PL , (2007) CALCULATION OF THE CONTRIBUTIONS OF SCATTERING EFFECTS TO THE X-RAY FLUORESCENCE INTENSITIES.SPECTROSCOPY AND SPECTRAL ANALYSIS. VOL. 27. ISSUE 2. P. 391-394 | 9 | 100% | 1 |
Classes with closest relation at Level 1 |