Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
858 | 3002 | 23.5 | 70% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
560 | 3 | CHALCOGENIDE GLASSES//CHALCOGENIDES//PHASE CHANGE MEMORY | 17255 |
1542 | 2 | PHASE CHANGE MEMORY//OPTICAL DISK//GE2SB2TE5 | 7441 |
858 | 1 | PHASE CHANGE MEMORY//GE2SB2TE5//PHASE CHANGE MEMORY PCM | 3002 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | PHASE CHANGE MEMORY | authKW | 1984908 | 9% | 75% | 261 |
2 | GE2SB2TE5 | authKW | 1041605 | 4% | 94% | 109 |
3 | PHASE CHANGE MEMORY PCM | authKW | 751898 | 3% | 81% | 91 |
4 | GE SB TE | authKW | 635166 | 2% | 87% | 72 |
5 | PHASE CHANGE MATERIALS | authKW | 437629 | 6% | 22% | 194 |
6 | STATE FUNCT MAT INFORMAT | address | 409238 | 9% | 15% | 262 |
7 | SHANGHAI MICROSYST INFORMAT TECHNOL | address | 370588 | 11% | 11% | 332 |
8 | ANTIMONY COMPOUNDS | authKW | 293566 | 2% | 53% | 54 |
9 | PCRAM | authKW | 237567 | 1% | 81% | 29 |
10 | GERMANIUM COMPOUNDS | authKW | 223703 | 2% | 34% | 65 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Applied | 27916 | 61% | 0% | 1835 |
2 | Materials Science, Multidisciplinary | 5274 | 31% | 0% | 931 |
3 | Physics, Condensed Matter | 4465 | 22% | 0% | 650 |
4 | Nanoscience & Nanotechnology | 2180 | 10% | 0% | 298 |
5 | Materials Science, Coatings & Films | 1883 | 6% | 0% | 184 |
6 | Engineering, Electrical & Electronic | 885 | 12% | 0% | 374 |
7 | Materials Science, Ceramics | 809 | 4% | 0% | 108 |
8 | Optics | 223 | 5% | 0% | 152 |
9 | Chemistry, Physical | 184 | 9% | 0% | 257 |
10 | Metallurgy & Metallurgical Engineering | 134 | 3% | 0% | 97 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | STATE FUNCT MAT INFORMAT | 409238 | 9% | 15% | 262 |
2 | SHANGHAI MICROSYST INFORMAT TECHNOL | 370588 | 11% | 11% | 332 |
3 | PHYS IA 1 | 204709 | 1% | 54% | 37 |
4 | IBM MACRONIX PCRAM JOINT PROJECT | 172887 | 1% | 100% | 17 |
5 | SHANGHAI NANOFABRICAT TECHNOL MEMORY | 134597 | 0% | 88% | 15 |
6 | SEMICOND MAT DEVICES | 97152 | 1% | 33% | 29 |
7 | FUNCT SEMICOND FILM ENGN TECHNOL | 92968 | 1% | 57% | 16 |
8 | STATE FUNCT MAT INFORMAT NANOTECHNOL LA | 92451 | 0% | 91% | 10 |
9 | UNITA AGRATE BRIANZA | 72377 | 0% | 65% | 11 |
10 | MAT SCI ANAL TECHNOL | 67792 | 0% | 67% | 10 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 16287 | 7% | 1% | 224 |
2 | APPLIED PHYSICS LETTERS | 10597 | 11% | 0% | 344 |
3 | JOURNAL OF APPLIED PHYSICS | 6158 | 9% | 0% | 260 |
4 | JAPANESE JOURNAL OF APPLIED PHYSICS | 4953 | 3% | 1% | 89 |
5 | JOURNAL OF NON-CRYSTALLINE SOLIDS | 3086 | 3% | 0% | 85 |
6 | IEEE ELECTRON DEVICE LETTERS | 3083 | 2% | 1% | 53 |
7 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 2389 | 2% | 0% | 61 |
8 | ECS SOLID STATE LETTERS | 2277 | 0% | 3% | 9 |
9 | JOURNAL OF OVONIC RESEARCH | 2029 | 0% | 3% | 7 |
10 | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | 1791 | 1% | 1% | 31 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | PHASE CHANGE MEMORY | 1984908 | 9% | 75% | 261 | Search PHASE+CHANGE+MEMORY | Search PHASE+CHANGE+MEMORY |
2 | GE2SB2TE5 | 1041605 | 4% | 94% | 109 | Search GE2SB2TE5 | Search GE2SB2TE5 |
3 | PHASE CHANGE MEMORY PCM | 751898 | 3% | 81% | 91 | Search PHASE+CHANGE+MEMORY+PCM | Search PHASE+CHANGE+MEMORY+PCM |
4 | GE SB TE | 635166 | 2% | 87% | 72 | Search GE+SB+TE | Search GE+SB+TE |
5 | PHASE CHANGE MATERIALS | 437629 | 6% | 22% | 194 | Search PHASE+CHANGE+MATERIALS | Search PHASE+CHANGE+MATERIALS |
6 | ANTIMONY COMPOUNDS | 293566 | 2% | 53% | 54 | Search ANTIMONY+COMPOUNDS | Search ANTIMONY+COMPOUNDS |
7 | PCRAM | 237567 | 1% | 81% | 29 | Search PCRAM | Search PCRAM |
8 | GERMANIUM COMPOUNDS | 223703 | 2% | 34% | 65 | Search GERMANIUM+COMPOUNDS | Search GERMANIUM+COMPOUNDS |
9 | PHASE CHANGE | 218981 | 6% | 12% | 184 | Search PHASE+CHANGE | Search PHASE+CHANGE |
10 | PHASE CHANGE OPTICAL DISK | 198884 | 1% | 67% | 29 | Search PHASE+CHANGE+OPTICAL+DISK | Search PHASE+CHANGE+OPTICAL+DISK |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | LENCER, D , SALINGA, M , WUTTIG, M , (2011) DESIGN RULES FOR PHASE-CHANGE MATERIALS IN DATA STORAGE APPLICATIONS.ADVANCED MATERIALS. VOL. 23. ISSUE 18. P. 2030 -2058 | 152 | 80% | 148 |
2 | BURR, GW , BREITWISCH, MJ , FRANCESCHINI, M , GARETTO, D , GOPALAKRISHNAN, K , JACKSON, B , KURDI, B , LAM, C , LASTRAS, LA , PADILLA, A , ET AL (2010) PHASE CHANGE MEMORY TECHNOLOGY.JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. VOL. 28. ISSUE 2. P. 223 -262 | 111 | 84% | 302 |
3 | DERINGER, VL , DRONSKOWSKI, R , WUTTIG, M , (2015) MICROSCOPIC COMPLEXITY IN PHASE-CHANGE MATERIALS AND ITS ROLE FOR APPLICATIONS.ADVANCED FUNCTIONAL MATERIALS. VOL. 25. ISSUE 40. P. 6343 -6359 | 113 | 75% | 4 |
4 | RAOUX, S , WELNIC, W , IELMINI, D , (2010) PHASE CHANGE MATERIALS AND THEIR APPLICATION TO NONVOLATILE MEMORIES.CHEMICAL REVIEWS. VOL. 110. ISSUE 1. P. 240 -267 | 81 | 72% | 254 |
5 | WONG, HSP , RAOUX, S , KIM, S , LIANG, JL , REIFENBERG, JP , RAJENDRAN, B , ASHEGHI, M , GOODSON, KE , (2010) PHASE CHANGE MEMORY.PROCEEDINGS OF THE IEEE. VOL. 98. ISSUE 12. P. 2201 -2227 | 63 | 83% | 346 |
6 | WUTTIG, M , YAMADA, N , (2007) PHASE-CHANGE MATERIALS FOR REWRITEABLE DATA STORAGE.NATURE MATERIALS. VOL. 6. ISSUE 11. P. 824-832 | 38 | 79% | 1106 |
7 | ZHANG, W , DERINGER, VL , DRONSKOWSKI, R , MAZZARELLO, R , MA, E , WUTTIG, M , (2015) DENSITY-FUNCTIONAL THEORY GUIDED ADVANCES IN PHASE-CHANGE MATERIALS AND MEMORIES.MRS BULLETIN. VOL. 40. ISSUE 10. P. 856 -869 | 65 | 86% | 1 |
8 | BOGOSLOVSKIY, NA , TSENDIN, KD , (2012) PHYSICS OF SWITCHING AND MEMORY EFFECTS IN CHALCOGENIDE GLASSY SEMICONDUCTORS.SEMICONDUCTORS. VOL. 46. ISSUE 5. P. 559 -590 | 65 | 86% | 16 |
9 | SIEGRIST, T , MERKELBACH, P , WUTTIG, M , (2012) PHASE CHANGE MATERIALS: CHALLENGES ON THE PATH TO A UNIVERSAL STORAGE DEVICE.ANNUAL REVIEW OF CONDENSED MATTER PHYSICS, VOL 3. VOL. 3. ISSUE . P. 215 -237 | 57 | 84% | 39 |
10 | RAOUX, S , BURR, GW , BREITWISCH, MJ , RETTNER, CT , CHEN, YC , SHELBY, RM , SALINGA, M , KREBS, D , CHEN, SH , LUNG, HL , ET AL (2008) PHASE-CHANGE RANDOM ACCESS MEMORY: A SCALABLE TECHNOLOGY.IBM JOURNAL OF RESEARCH AND DEVELOPMENT. VOL. 52. ISSUE 4-5. P. 465 -479 | 40 | 93% | 256 |
Classes with closest relation at Level 1 |