Class information for:
Level 1: FLUCTUATION ELECTRON MICROSCOPY//REDUCED DENSITY FUNCTION//MEDIUM RANGE ORDER

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
13965 801 26.5 62%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
2 4 MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER 2836879
6 3       PHYSICS, APPLIED//IEEE TRANSACTIONS ON ELECTRON DEVICES//SILICON 155028
434 2             MICROCRYSTALLINE SILICON//JOURNAL OF NON-CRYSTALLINE SOLIDS//AMORPHOUS SILICON 16320
13965 1                   FLUCTUATION ELECTRON MICROSCOPY//REDUCED DENSITY FUNCTION//MEDIUM RANGE ORDER 801

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 FLUCTUATION ELECTRON MICROSCOPY authKW 550831 2% 85% 17
2 REDUCED DENSITY FUNCTION authKW 121983 0% 80% 4
3 MEDIUM RANGE ORDER authKW 96413 3% 10% 25
4 FLUCTUATION MICROSCOPY authKW 87128 0% 57% 4
5 3D ATOMIC MODEL authKW 76240 0% 100% 2
6 FLUCTUATION X RAY MICROSCOPY authKW 76240 0% 100% 2
7 REVERSE MONTE CARLO RMC SIMULATION authKW 76240 0% 100% 2
8 VIBRATIONAL DENSITIES OF STATES authKW 76240 0% 100% 2
9 CONDENSED MATTER SUR E SCI PROGRAM address 50724 2% 9% 15
10 GRMT address 48996 1% 14% 9

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Physics, Condensed Matter 5504 44% 0% 350
2 Materials Science, Ceramics 5249 16% 0% 130
3 Microscopy 3871 8% 0% 61
4 Materials Science, Multidisciplinary 1363 31% 0% 245
5 Physics, Multidisciplinary 419 12% 0% 96
6 Physics, Applied 382 17% 0% 133
7 Metallurgy & Metallurgical Engineering 36 3% 0% 26
8 Materials Science, Coatings & Films 30 2% 0% 15
9 COMPUTER APPLICATIONS & CYBERNETICS 13 0% 0% 1
10 Crystallography 12 2% 0% 14

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CONDENSED MATTER SUR E SCI PROGRAM 50724 2% 9% 15
2 GRMT 48996 1% 14% 9
3 ASTRON CONDENSED MATTER SUR E SCI PROGRAM 38120 0% 100% 1
4 DUPONT NORTHWESTERN DOW ABORAT ACCESS TEAM SY 38120 0% 100% 1
5 DUPONTNORTHWESTERNDOW ABORAT ACCESS TEAM SYNC 38120 0% 100% 1
6 ENGN ELE COMP ENGN 38120 0% 100% 1
7 FIS L OPT 38120 0% 100% 1
8 GLOBAL CLIMATE CHANGE OFF 38120 0% 100% 1
9 INFMSARDINIAN COMPUTAT MAT 38120 0% 100% 1
10 INSITUTE FUNDAMENTAL TECHNOL 38120 0% 100% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 JOURNAL OF NON-CRYSTALLINE SOLIDS 28263 16% 1% 130
2 PHYSICAL REVIEW B 7887 23% 0% 186
3 ULTRAMICROSCOPY 6523 4% 1% 31
4 MICROSCOPY AND MICROANALYSIS 2141 1% 1% 10
5 JOURNAL OF PHYSICS-CONDENSED MATTER 2130 5% 0% 42
6 PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES 1694 1% 0% 12
7 PHILOSOPHICAL MAGAZINE LETTERS 833 1% 0% 8
8 COMPUTATIONAL MATERIALS SCIENCE 630 1% 0% 11
9 SOLID STATE COMMUNICATIONS 563 2% 0% 20
10 SOLID STATE PHYSICS 550 0% 1% 1

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 FLUCTUATION ELECTRON MICROSCOPY 550831 2% 85% 17 Search FLUCTUATION+ELECTRON+MICROSCOPY Search FLUCTUATION+ELECTRON+MICROSCOPY
2 REDUCED DENSITY FUNCTION 121983 0% 80% 4 Search REDUCED+DENSITY+FUNCTION Search REDUCED+DENSITY+FUNCTION
3 MEDIUM RANGE ORDER 96413 3% 10% 25 Search MEDIUM+RANGE+ORDER Search MEDIUM+RANGE+ORDER
4 FLUCTUATION MICROSCOPY 87128 0% 57% 4 Search FLUCTUATION+MICROSCOPY Search FLUCTUATION+MICROSCOPY
5 3D ATOMIC MODEL 76240 0% 100% 2 Search 3D+ATOMIC+MODEL Search 3D+ATOMIC+MODEL
6 FLUCTUATION X RAY MICROSCOPY 76240 0% 100% 2 Search FLUCTUATION+X+RAY+MICROSCOPY Search FLUCTUATION+X+RAY+MICROSCOPY
7 REVERSE MONTE CARLO RMC SIMULATION 76240 0% 100% 2 Search REVERSE+MONTE+CARLO+RMC+SIMULATION Search REVERSE+MONTE+CARLO+RMC+SIMULATION
8 VIBRATIONAL DENSITIES OF STATES 76240 0% 100% 2 Search VIBRATIONAL+DENSITIES+OF+STATES Search VIBRATIONAL+DENSITIES+OF+STATES
9 A GE P SI HETEROSTRUCTURE 38120 0% 100% 1 Search A+GE+P+SI+HETEROSTRUCTURE Search A+GE+P+SI+HETEROSTRUCTURE
10 ALFE NANOPARTICLES 38120 0% 100% 1 Search ALFE+NANOPARTICLES Search ALFE+NANOPARTICLES

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 REZIKYAN, A , JIBBEN, ZJ , ROCK, BA , ZHAO, GP , KOECK, FAM , NEMANICH, RF , TREACY, MMJ , (2015) SPECKLE SUPPRESSION BY DECOHERENCE IN FLUCTUATION ELECTRON MICROSCOPY.MICROSCOPY AND MICROANALYSIS. VOL. 21. ISSUE 6. P. 1455 -1474 36 77% 1
2 LI, TT , BOGLE, SN , ABELSON, JR , (2014) QUANTITATIVE FLUCTUATION ELECTRON MICROSCOPY IN THE STEM: METHODS TO IDENTIFY, AVOID, AND CORRECT FOR ARTIFACTS.MICROSCOPY AND MICROANALYSIS. VOL. 20. ISSUE 5. P. 1605 -1618 28 88% 3
3 TREACY, MMJ , GIBSON, JM , (2012) EXAMINATION OF A POLYCRYSTALLINE THIN-FILM MODEL TO EXPLORE THE RELATION BETWEEN PROBE SIZE AND STRUCTURAL CORRELATION LENGTH IN FLUCTUATION ELECTRON MICROSCOPY.MICROSCOPY AND MICROANALYSIS. VOL. 18. ISSUE 1. P. 241 -253 28 90% 4
4 BERNSTEIN, N , FELDMAN, JL , FORNARI, M , (2006) STRUCTURAL MODEL OF AMORPHOUS SILICON ANNEALED WITH TIGHT BINDING.PHYSICAL REVIEW B. VOL. 74. ISSUE 20. P. - 36 68% 15
5 DAULTON, TL , BONDI, KS , KELTON, KF , (2010) NANOBEAM DIFFRACTION FLUCTUATION ELECTRON MICROSCOPY TECHNIQUE FOR STRUCTURAL CHARACTERIZATION OF DISORDERED MATERIALS-APPLICATION TO AL88-XY7FE5TIX METALLIC GLASSES.ULTRAMICROSCOPY. VOL. 110. ISSUE 10. P. 1279-1289 28 74% 9
6 BORISENKO, KB , HABERL, B , LIU, ACY , CHEN, YX , LI, GQ , WILLIAMS, JS , BRADBY, JE , COCKAYNE, DJH , TREACY, MMJ , (2012) MEDIUM-RANGE ORDER IN AMORPHOUS SILICON INVESTIGATED BY CONSTRAINED STRUCTURAL RELAXATION OF TWO-BODY AND FOUR-BODY ELECTRON DIFFRACTION DATA.ACTA MATERIALIA. VOL. 60. ISSUE 1. P. 359 -375 28 68% 12
7 KUGLER, S , (2012) ADVANCES IN UNDERSTANDING THE DEFECTS CONTRIBUTING TO THE TAIL STATES IN PURE AMORPHOUS SILICON.JOURNAL OF NON-CRYSTALLINE SOLIDS. VOL. 358. ISSUE 17. P. 2060-2062 19 86% 2
8 LEE, BS , BISHOP, SG , ABELSON, JR , (2010) FLUCTUATION TRANSMISSION ELECTRON MICROSCOPY: DETECTING NANOSCALE ORDER IN DISORDERED STRUCTURES.CHEMPHYSCHEM. VOL. 11. ISSUE 11. P. 2311-2317 21 81% 4
9 UKPONG, AM , (2009) STUDIES OF THE ELECTRONIC AND VIBRATIONAL SIGNATURES OF THE UNUSUAL BONDING GEOMETRIES IN MELT-QUENCHED AMORPHOUS SILICON.MOLECULAR PHYSICS. VOL. 107. ISSUE 23-24. P. 2521 -2530 25 68% 1
10 PUSZTAI, L , KUGLER, S , (2005) COMPARISON OF THE STRUCTURES OF EVAPORATED AND ION-IMPLANTED AMORPHOUS SILICON SAMPLES.JOURNAL OF PHYSICS-CONDENSED MATTER. VOL. 17. ISSUE 17. P. 2617-2624 22 85% 4

Classes with closest relation at Level 1


Rank Class id link
1 13297 GERMANIUM CARBON//FELIX FREE ELE ON LASER IL//GERMANIUM CARBIDE
2 8986 IBIEC//AMORPHOUS POCKET//SOLID PHASE EPITAXIAL GROWTH
3 26907 AMORPHOUS III V SEMICONDUCTORS//GAAS1 XNX THIN FILMS//AMORPHOUS GALLIUM ARSENIDE
4 45 JOURNAL OF NON-CRYSTALLINE SOLIDS//PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES//HYDROGENATED AMORPHOUS SILICON
5 4559 KOHN SHAM EQUATION//KOHN SHAM DENSITY FUNCTIONAL THEORY//LINEAR SCALING ALGORITHMS
6 24168 RADIAT NUCL DETECT MAT ANAL//ENGN NANOSCI NANOTECHNOL INITIAT//INTERATOMIC ENERGY
7 6354 JOURNAL OF NON-CRYSTALLINE SOLIDS//GCR//CHALCOGENIDE GLASSES
8 356 MICROCRYSTALLINE SILICON//ENERGY UNIT//NANOCRYSTALLINE SILICON
9 28929 NANOPOROUS GERMANIUM//THIN FOIL IRRADIATION//TIN ION
10 22887 COORDINATION POLYHEDRONS//FRANK KASPER STRUCTURES//NON DEBYE KINETICS

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