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IH2652 Methods and Instruments of Analysis 7.5 credits

Administer About course

Advanced materials analysis is of crucial importance for an increasing amount of high-tech applications based on control and understanding of material properties down to the atomic scale. This includes structural, optical, electrical, and other physical properties and often requires a plethora of different and complementary methods for a full analysis and understanding.

This course aims to give an overview of a range of analytical methods and instruments of particular importance for applied materials research and nanotechnology. These include ion beam-based methods, electron microscopies, scanning probe microscopy, X-ray diffraction, electric and optical methods, as well as electron and photon spectroscopies. Extensive laboratory exercises provide the students with the opportunity to test hands-on various analytical tools that are available at the School of Information and Communication Technology research departments.

Information per course offering

Choose semester and course offering to see current information and more about the course, such as course syllabus, study period, and application information.

Termin

Information for Autumn 2025 TNTEM programme students

Course location

KTH Campus

Duration
27 Oct 2025 - 12 Jan 2026
Periods
P2 (7.5 hp)
Pace of study

50%

Application code

50686

Form of study

Normal Daytime

Language of instruction

English

Course memo
Course memo is not published
Number of places

Places are not limited

Target group

Open to all programmes as long as it can be included in your programme.

Planned modular schedule
No information inserted
Schedule
Schedule is not published

Contact

Course coordinator

Profile picture Anders Västberg

Course syllabus as PDF

Please note: all information from the Course syllabus is available on this page in an accessible format.

Course syllabus IH2652 (Autumn 2025–)
Headings with content from the Course syllabus IH2652 (Autumn 2025–) are denoted with an asterisk ( )

Content and learning outcomes

Course contents

The course refers to material analysis methods, with an emphasis on applications in the nano and semiconductor technology, and includes theory and labs (the later marked with *) for the following methods:

  • X-ray diffraction (XRD)*
  • Sweep tube microscopy (AFM)*
  • Ion beam based methods (SIMS, RBS*)
  • Electron microscopy (TEM, SEM*)
  • Photo-electron spectroscopy (XPS, UPS, Auger, etc.)
  • Electric characterisation methods (I/V, C/V, etc.)
  • Optical methods (fotoluminescence, Raman, FTIR, etc.)

Intended learning outcomes

After passing the course, the student should be able to:

  • give an account of thedesign and function of a number of advanced material analysis methods
  • relevant for applied material research, especially semiconductor technology and nanotechnology, and analyse and interpret measurement results from these methods
  • choose appropriate method of analysis or combine methods of analysis for a specific material analysis issue
  • correlate measurement results that have been obtained through different methods
  • identify and suggest supplementary analysis needed
  • critically review material analysis results that are presented in the scientific literature or in other contexts
  • independently use different analysis equipment that are available at KTH.

Literature and preparations

Specific prerequisites

Knowledge of physics encompassing 30 higher education credits, in the form of completed courses.

Recommended prerequisites

Physics from bachelor level or within the master's program (Optics, Thermodynamics, Electromagnetism,  Solid State Physics and Semiconductor Physics)

Literature

You can find information about course literature either in the course memo for the course offering or in the course room in Canvas.

Examination and completion

If the course is discontinued, students may request to be examined during the following two academic years.

Grading scale

A, B, C, D, E, FX, F

Examination

  • LAB1 - Laboratory Course, 2.5 credits, grading scale: P, F
  • TEN1 - Examination, 5.0 credits, grading scale: A, B, C, D, E, FX, F

Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.

The examiner may apply another examination format when re-examining individual students.

Other requirements for final grade

For passed labs, an active participation in the laboratory work and completed preparatory assignments and laboratory assignments and a well-structured laboratory report are required.

Examiner

Profile picture Mattias Hammar

Ethical approach

  • All members of a group are responsible for the group's work.
  • In any assessment, every student shall honestly disclose any help received and sources used.
  • In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.

Further information

Course room in Canvas

Registered students find further information about the implementation of the course in the course room in Canvas. A link to the course room can be found under the tab Studies in the Personal menu at the start of the course.

Offered by

EECS/Electrical Engineering

Main field of study

Electrical Engineering

Education cycle

Second cycle

Transitional regulations

Students that have TEN1 left, may make TENM instead.

Supplementary information

In this course, the EECS code of honor applies, see: http://www.kth.se/en/eecs/utbildning/hederskodex.

Also offered for PhD students:

IH3606 Materials Characterization for Electronics and Photonics