The lectures cover the theory and main operating principles for several commonly used characterization techniques, such as: X-ray diffraction (XRD), atom force microscopy (AFM), Rutherford backscattering spectroscopy (RBS), secondary ion mass spectroscopy (SIMS), scanning electron microscopy (SEM), transmission electron microscopy (TEM), four-point probe resistivity measurements, Hall measurement and photoluminescence (PL). A large emphasis is also put on hands-on experience and individual training on the various analytical tools.
FIH3606 Material Characterization for Electronics and Photonics 10.5 credits
Information for research students about course offerings
period 2 every year
About course offering
For course offering
Autumn 2024 Start 28 Oct 2024 programme students
Target group
No information insertedPart of programme
No information insertedPeriods
P2 (10.5 hp)Duration
Pace of study
50%
Form of study
Normal Daytime
Language of instruction
English
Course location
KTH Campus
Number of places
Places are not limited
Planned modular schedule
Course memo
Course memo is not publishedSchedule
Schedule is not publishedApplication
For course offering
Autumn 2024 Start 28 Oct 2024 programme students
Application code
51005
Contact
For course offering
Autumn 2024 Start 28 Oct 2024 programme students
Examiner
No information insertedCourse coordinator
No information insertedTeachers
No information insertedContent and learning outcomes
Course contents
Intended learning outcomes
This course gives insight into basic structural, electrical and optical characterization techniques for semiconductor materials used in electronic and photonic applications. After finishing the course, the students should:
·be able to select measurement technique with appropriate sensitivity and resolution.
·possess sufficient hands-on experience from the instruments which are part of the laboratory course to be able to use them.
·be familiar to and able to analyze, interpret and validate spectra and measurement results from the techniques that are presented in the course.
·be able to correlate and cross-examine measurement results obtained using different techniques.
·reach a sufficient competence level in one of the studied techniques to be able to present own data in scientific journals.
Literature and preparations
Specific prerequisites
Basic knowledge in optics, electromagnetism, solid state physics and semiconductor physics.
Recommended prerequisites
Basic physics and chemistry courses
Equipment
Literature
Examination and completion
If the course is discontinued, students may request to be examined during the following two academic years.
Grading scale
Examination
- EXA1 - Examination, 10.5 credits, grading scale: P, F
Based on recommendation from KTH’s coordinator for disabilities, the examiner will decide how to adapt an examination for students with documented disability.
The examiner may apply another examination format when re-examining individual students.
Grading scale: Pass/Fail
Other requirements for final grade
For passing the course the student need to:
- pass the laborative exercises.
- Approved individual project after oral examination
- Oral presentation of principles and measured results for one selected technique.
Langugae of instruction: English only
Opportunity to complete the requirements via supplementary examination
Opportunity to raise an approved grade via renewed examination
Examiner
Ethical approach
- All members of a group are responsible for the group's work.
- In any assessment, every student shall honestly disclose any help received and sources used.
- In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.
Further information
Course room in Canvas
Offered by
Main field of study
Education cycle
Add-on studies
no