Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 35271 | 100 | 14.3 | 50% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
| Cluster id | Level | Cluster label | #P |
|---|---|---|---|
| 10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
| 217 | 3 | OPTICS//APPLIED OPTICS//OPTICAL ENGINEERING | 50829 |
| 3925 | 2 | DOT MATRIX HOLOGRAM//BARCODE RECOGNITION//BAR CODE DECODING | 791 |
| 35271 | 1 | AUTOMAT CONTROL ENGN//DEFECT CLASSIFIER//ANALOG AND DIGITAL SIGNALS | 100 |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | AUTOMAT CONTROL ENGN | address | 704932 | 40% | 6% | 40 |
| 2 | DEFECT CLASSIFIER | authKW | 610713 | 2% | 100% | 2 |
| 3 | ANALOG AND DIGITAL SIGNALS | authKW | 305356 | 1% | 100% | 1 |
| 4 | BACKPROPAGATION NEURAL NETWORK INODEL | authKW | 305356 | 1% | 100% | 1 |
| 5 | BIDIRECTIONAL TEST | authKW | 305356 | 1% | 100% | 1 |
| 6 | BIO TEST STRIPS READER | authKW | 305356 | 1% | 100% | 1 |
| 7 | BIOCHIP INTERACTION | authKW | 305356 | 1% | 100% | 1 |
| 8 | BLACK MATRIX AREA | authKW | 305356 | 1% | 100% | 1 |
| 9 | BOTTOM UP TEST | authKW | 305356 | 1% | 100% | 1 |
| 10 | CAMERA SWITCHING ALGORITHM | authKW | 305356 | 1% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Engineering, General | 979 | 24% | 0% | 24 |
| 2 | Instruments & Instrumentation | 520 | 23% | 0% | 23 |
| 3 | Optics | 401 | 27% | 0% | 27 |
| 4 | Engineering, Manufacturing | 321 | 10% | 0% | 10 |
| 5 | Automation & Control Systems | 104 | 7% | 0% | 7 |
| 6 | Computer Science, Interdisciplinary Applications | 57 | 7% | 0% | 7 |
| 7 | Engineering, Electrical & Electronic | 56 | 16% | 0% | 16 |
| 8 | Robotics | 44 | 2% | 0% | 2 |
| 9 | Computer Science, Artificial Intelligence | 43 | 6% | 0% | 6 |
| 10 | Film, Radio, Television | 39 | 1% | 0% | 1 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | AUTOMAT CONTROL ENGN | 704932 | 40% | 6% | 40 |
| 2 | DISPLAY BUSINESS UNIT R51 | 305356 | 1% | 100% | 1 |
| 3 | INCORE FUEL MANAGEMENT SYST | 152677 | 1% | 50% | 1 |
| 4 | INTERGRATED CHINESE WESTERN MED | 152677 | 1% | 50% | 1 |
| 5 | MASTERS PROGRAM BIOMED INFORMAT BIOMED ENGN | 58159 | 2% | 10% | 2 |
| 6 | MOSCOW POWER ENGN MEI | 50891 | 1% | 17% | 1 |
| 7 | TELECOMMUN TECHNOL AUTOMAT | 50891 | 1% | 17% | 1 |
| 8 | MOSCOW POWER | 48208 | 3% | 5% | 3 |
| 9 | HIGH PERFORMANCE IMAGE PROC | 43621 | 1% | 14% | 1 |
| 10 | IMAGE PROCLKEB | 38168 | 1% | 13% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | MEASUREMENT TECHNIQUES | 30999 | 14% | 1% | 14 |
| 2 | CINEFORUM | 11743 | 1% | 4% | 1 |
| 3 | SENSOR REVIEW | 7114 | 3% | 1% | 3 |
| 4 | INTERNATIONAL JOURNAL OF OPTOMECHATRONICS | 5449 | 2% | 1% | 2 |
| 5 | ASSEMBLY AUTOMATION | 4356 | 3% | 0% | 3 |
| 6 | OPTIK | 3490 | 11% | 0% | 11 |
| 7 | INSTRUMENTATION SCIENCE & TECHNOLOGY | 2813 | 3% | 0% | 3 |
| 8 | COMPUTATIONAL AND MATHEMATICAL ORGANIZATION THEORY | 1685 | 1% | 1% | 1 |
| 9 | OPTICS AND LASER TECHNOLOGY | 1678 | 5% | 0% | 5 |
| 10 | JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH | 1620 | 4% | 0% | 4 |
Author Key Words |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | DEFECT CLASSIFIER | 610713 | 2% | 100% | 2 | Search DEFECT+CLASSIFIER | Search DEFECT+CLASSIFIER |
| 2 | ANALOG AND DIGITAL SIGNALS | 305356 | 1% | 100% | 1 | Search ANALOG+AND+DIGITAL+SIGNALS | Search ANALOG+AND+DIGITAL+SIGNALS |
| 3 | BACKPROPAGATION NEURAL NETWORK INODEL | 305356 | 1% | 100% | 1 | Search BACKPROPAGATION+NEURAL+NETWORK+INODEL | Search BACKPROPAGATION+NEURAL+NETWORK+INODEL |
| 4 | BIDIRECTIONAL TEST | 305356 | 1% | 100% | 1 | Search BIDIRECTIONAL+TEST | Search BIDIRECTIONAL+TEST |
| 5 | BIO TEST STRIPS READER | 305356 | 1% | 100% | 1 | Search BIO+TEST+STRIPS+READER | Search BIO+TEST+STRIPS+READER |
| 6 | BIOCHIP INTERACTION | 305356 | 1% | 100% | 1 | Search BIOCHIP+INTERACTION | Search BIOCHIP+INTERACTION |
| 7 | BLACK MATRIX AREA | 305356 | 1% | 100% | 1 | Search BLACK+MATRIX+AREA | Search BLACK+MATRIX+AREA |
| 8 | BOTTOM UP TEST | 305356 | 1% | 100% | 1 | Search BOTTOM+UP+TEST | Search BOTTOM+UP+TEST |
| 9 | CAMERA SWITCHING ALGORITHM | 305356 | 1% | 100% | 1 | Search CAMERA+SWITCHING+ALGORITHM | Search CAMERA+SWITCHING+ALGORITHM |
| 10 | CENTROID ALGORITHMS | 305356 | 1% | 100% | 1 | Search CENTROID+ALGORITHMS | Search CENTROID+ALGORITHMS |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | LIN, CS , SU, YY , SHEI, HJ , TIEN, CL , LU, AT , (2011) AN AUTOMATIC INSPECTION AND CONTROL METHOD FOR A BIOLOGICAL REAGENT PRODUCTION SYSTEM WITH IMAGE PROCESSING TECHNIQUES.SENSOR REVIEW. VOL. 31. ISSUE 2. P. 166-172 | 6 | 100% | 2 |
| 2 | LIN, CS , TSAI, CW , TSENG, CM , CHIU, CC , CHANG, SC , (2010) AUTOMATIC INSPECTION FOR ETCHING TRANSISTORS IN TFT-LCD PANEL USING BINARY TREE STRUCTURE AND BINTREE SEARCHING AND GRADIENT ORIENTATION CODE.INTERNATIONAL JOURNAL OF ROBOTICS & AUTOMATION. VOL. 25. ISSUE 3. P. 175-185 | 9 | 53% | 0 |
| 3 | LIN, CS , SHIH, SJ , LU, AT , HUNG, SS , CHIU, CC , (2012) THE QUALITY IMPROVEMENT OF PI COATING PROCESS OF TFT-LCD PANELS WITH TAGUCHI METHODS.OPTIK. VOL. 123. ISSUE 8. P. 703-710 | 7 | 58% | 4 |
| 4 | SAVEHENKO, EV , YEVTIKHIEVA, OA , RINKEVICIUS, BS , (2007) DETERMINATION OF THE PARAMETERS OF AN ASTIGMATIC GAUSSIAN BEAM IN PROBLEMS OF LASER GRADIENT REFRACTOMETRY.MEASUREMENT TECHNIQUES. VOL. 50. ISSUE 4. P. 390-396 | 4 | 100% | 2 |
| 5 | LIN, CS , KAO, TN , CHANG, NC , LIN, NJ , CHEN, SW , (2015) QUALITY IMPROVEMENT TO THE SPINLESS COATING PROCESS OF TOUCH PANEL WITH TAGUCHI METHODS.INDIAN JOURNAL OF ENGINEERING AND MATERIALS SCIENCES. VOL. 22. ISSUE 1. P. 23 -28 | 7 | 41% | 0 |
| 6 | LIN, CS , KUO, J , LIN, CC , LAY, YL , SHEI, HJ , (2011) AUTOMATIC INSPECTION AND STRATEGY FOR SURFACE DEFECTS IN THE PI COATING PROCESS OF TFT-LCD PANELS.ASSEMBLY AUTOMATION. VOL. 31. ISSUE 3. P. 244-250 | 5 | 63% | 0 |
| 7 | LIN, CS , CHANG, SC , LAY, YL , YEH, MS , LIN, CC , (2010) A NOVEL POSITIONING METHOD FOR OPTICAL AUTOMATIC INSPECTION OF AN LCD ASSEMBLY PROCESS.OPTIK. VOL. 121. ISSUE 12. P. 1089-1095 | 5 | 63% | 1 |
| 8 | LIN, CS , HUANG, KH , LIN, TC , SHEI, HJ , TIEN, CL , (2011) AN AUTOMATIC INSPECTION METHOD FOR THE FRACTURE CONDITIONS OF ANISOTROPIC CONDUCTIVE FILM IN THE TFT-LCD ASSEMBLY PROCESS.INTERNATIONAL JOURNAL OF OPTOMECHATRONICS. VOL. 5. ISSUE 3. P. 286-298 | 6 | 50% | 1 |
| 9 | SMIRNOV, VI , (2010) FUNDAMENTAL LIMITATIONS ON THE ACCURACY OF SIMULTANEOUS MEASUREMENTS OF OPTICAL FIELD PARAMETERS.MEASUREMENT TECHNIQUES. VOL. 53. ISSUE 9. P. 1002 -1010 | 3 | 100% | 0 |
| 10 | NGUYEN, VT , RASKOVSKAYA, IL , RINKEVICHIUS, BS , (2009) ALGORITHMS FOR QUANTITATIVE DIAGNOSIS OF OPTICAL HETEROGENEITIES BY MEANS OF LASER REFRACTOGRAPHY.MEASUREMENT TECHNIQUES. VOL. 52. ISSUE 4. P. 368 -375 | 3 | 100% | 0 |
Classes with closest relation at Level 1 |