Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
3213 | 2038 | 18.8 | 63% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
245 | 3 | PHOTONIC CRYSTAL//OPTICS//INTEGRATED OPTICS | 46930 |
297 | 2 | PHOTONIC CRYSTAL//PHOTONIC BAND GAP//PHOTONIC CRYSTAL WAVEGUIDE | 18652 |
3213 | 1 | SCATTEROMETRY//RIGOROUS COUPLED WAVE ANALYSIS//MODAL METHOD | 2038 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | SCATTEROMETRY | authKW | 243273 | 2% | 35% | 47 |
2 | RIGOROUS COUPLED WAVE ANALYSIS | authKW | 206367 | 2% | 34% | 41 |
3 | MODAL METHOD | authKW | 183576 | 1% | 51% | 24 |
4 | FOURIER MODAL METHOD | authKW | 176233 | 1% | 59% | 20 |
5 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | journal | 167568 | 16% | 3% | 331 |
6 | RCWA | authKW | 158477 | 1% | 46% | 23 |
7 | OPTICAL SCATTEROMETRY | authKW | 139437 | 1% | 85% | 11 |
8 | REFLECTIVE EFFICIENCY | authKW | 134831 | 0% | 100% | 9 |
9 | SANDWICHED GRATING | authKW | 119850 | 0% | 100% | 8 |
10 | TWO LAYER GRATING | authKW | 106531 | 0% | 89% | 8 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Optics | 67087 | 74% | 0% | 1516 |
2 | Physics, Applied | 985 | 17% | 0% | 340 |
3 | Engineering, Electrical & Electronic | 686 | 13% | 0% | 267 |
4 | Nanoscience & Nanotechnology | 277 | 5% | 0% | 100 |
5 | Telecommunications | 205 | 3% | 0% | 67 |
6 | Physics, Multidisciplinary | 81 | 5% | 0% | 96 |
7 | Instruments & Instrumentation | 41 | 2% | 0% | 47 |
8 | Spectroscopy | 31 | 2% | 0% | 36 |
9 | Materials Science, Coatings & Films | 24 | 1% | 0% | 26 |
10 | Engineering, Manufacturing | 17 | 1% | 0% | 16 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | THZ OPTOELECT | 48931 | 0% | 47% | 7 |
2 | BEIJING THZ SPECT IMAGING | 31717 | 0% | 35% | 6 |
3 | EQUIPE COMPOSANTS OPT MICROSTRUCT | 29962 | 0% | 100% | 2 |
4 | SIMULAT MODELISAT ELE OMAGNETISME | 29962 | 0% | 100% | 2 |
5 | UNITE PROPRE RECH ENSEIGNEMENT SUPER A 6079 | 26964 | 0% | 60% | 3 |
6 | LITHOG OPT | 22469 | 0% | 50% | 3 |
7 | PHYS OPTOELECT ENGN | 22332 | 3% | 3% | 54 |
8 | DISPLAY COMPONENTS | 19974 | 0% | 67% | 2 |
9 | OPT QUANTUM RADIOPHYS | 19974 | 0% | 67% | 2 |
10 | UNITE MIXTE RECH 6602 | 19258 | 0% | 43% | 3 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 167568 | 16% | 3% | 331 |
2 | APPLIED OPTICS | 26903 | 12% | 1% | 251 |
3 | JOURNAL OF MODERN OPTICS | 19137 | 4% | 1% | 90 |
4 | OPTICA ACTA | 13493 | 1% | 3% | 28 |
5 | JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS | 7630 | 1% | 3% | 17 |
6 | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 7103 | 1% | 2% | 20 |
7 | OPTICS LETTERS | 6355 | 6% | 0% | 113 |
8 | OPTICS EXPRESS | 6116 | 6% | 0% | 119 |
9 | OPTICS COMMUNICATIONS | 5292 | 5% | 0% | 97 |
10 | JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS | 5041 | 1% | 1% | 27 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SCATTEROMETRY | 243273 | 2% | 35% | 47 | Search SCATTEROMETRY | Search SCATTEROMETRY |
2 | RIGOROUS COUPLED WAVE ANALYSIS | 206367 | 2% | 34% | 41 | Search RIGOROUS+COUPLED+WAVE+ANALYSIS | Search RIGOROUS+COUPLED+WAVE+ANALYSIS |
3 | MODAL METHOD | 183576 | 1% | 51% | 24 | Search MODAL+METHOD | Search MODAL+METHOD |
4 | FOURIER MODAL METHOD | 176233 | 1% | 59% | 20 | Search FOURIER+MODAL+METHOD | Search FOURIER+MODAL+METHOD |
5 | RCWA | 158477 | 1% | 46% | 23 | Search RCWA | Search RCWA |
6 | OPTICAL SCATTEROMETRY | 139437 | 1% | 85% | 11 | Search OPTICAL+SCATTEROMETRY | Search OPTICAL+SCATTEROMETRY |
7 | REFLECTIVE EFFICIENCY | 134831 | 0% | 100% | 9 | Search REFLECTIVE+EFFICIENCY | Search REFLECTIVE+EFFICIENCY |
8 | SANDWICHED GRATING | 119850 | 0% | 100% | 8 | Search SANDWICHED+GRATING | Search SANDWICHED+GRATING |
9 | TWO LAYER GRATING | 106531 | 0% | 89% | 8 | Search TWO+LAYER+GRATING | Search TWO+LAYER+GRATING |
10 | SUBWAVELENGTH GRATING | 103972 | 1% | 26% | 27 | Search SUBWAVELENGTH+GRATING | Search SUBWAVELENGTH+GRATING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | TURUNEN, J , KUITTINEN, M , WYROWSKI, F , (2000) DIFFRACTIVE OPTICS: ELECTROMAGNETIC APPROACH.PROGRESS IN OPTICS, VOL XL. VOL. 40. ISSUE . P. 343 -388 | 104 | 66% | 15 |
2 | BONOD, N , NEAUPORT, J , (2016) DIFFRACTION GRATINGS: FROM PRINCIPLES TO APPLICATIONS IN HIGH-INTENSITY LASERS.ADVANCES IN OPTICS AND PHOTONICS. VOL. 8. ISSUE 1. P. 156 -199 | 57 | 50% | 6 |
3 | JING, XF , ZHANG, JC , JIN, SZ , LIANG, P , TIAN, Y , (2012) DESIGN OF HIGHLY EFFICIENT TRANSMISSION GRATINGS WITH DEEP ETCHED TRIANGULAR GROOVES.APPLIED OPTICS. VOL. 51. ISSUE 33. P. 7920 -7933 | 32 | 89% | 10 |
4 | LEE, YM , LI, JH , WANG, M , CHENG, HH , SHEN, YT , TSAI, KY , SHIEH, JJ , CHEN, AC , (2014) OPTICAL SCATTEROMETRY SYSTEM FOR DETECTING SPECIFIC LINE EDGE ROUGHNESS OF RESIST GRATINGS SUBJECTED TO DETECTOR NOISES.JOURNAL OF OPTICS. VOL. 16. ISSUE 6. P. - | 27 | 100% | 0 |
5 | LIU, V , FAN, SH , (2012) S-4: A FREE ELECTROMAGNETIC SOLVER FOR LAYERED PERIODIC STRUCTURES.COMPUTER PHYSICS COMMUNICATIONS. VOL. 183. ISSUE 10. P. 2233-2244 | 28 | 67% | 111 |
6 | LU, WT , LU, YY , (2012) HIGH ORDER INTEGRAL EQUATION METHOD FOR DIFFRACTION GRATINGS.JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION. VOL. 29. ISSUE 5. P. 734-740 | 25 | 89% | 3 |
7 | PASSILLY, N , KARVINEN, P , VENTOLA, K , LAAKKONEN, P , TURUNEN, J , TERVO, J , (2008) POLARIZATION CONVERSION BY DIELECTRIC SUBWAVELENGTH GRATINGS IN CONICAL MOUNTING.JOURNAL OF THE EUROPEAN OPTICAL SOCIETY-RAPID PUBLICATIONS. VOL. 3. ISSUE . P. - | 29 | 85% | 1 |
8 | ZHU, JL , LIU, SY , CHEN, XG , ZHANG, CW , JIANG, H , (2014) ROBUST SOLUTION TO THE INVERSE PROBLEM IN OPTICAL SCATTEROMETRY.OPTICS EXPRESS. VOL. 22. ISSUE 18. P. 22031 -22042 | 24 | 89% | 0 |
9 | ZHU, JL , SHI, YT , GODDARD, LL , LIU, SY , (2016) APPLICATION OF MEASUREMENT CONFIGURATION OPTIMIZATION FOR ACCURATE METROLOGY OF SUB-WAVELENGTH DIMENSIONS IN MULTILAYER GRATINGS USING OPTICAL SCATTEROMETRY.APPLIED OPTICS. VOL. 55. ISSUE 25. P. 6844 -6849 | 23 | 88% | 0 |
10 | NI, XJ , LIU, ZT , BOLTASSEVA, A , KILDISHEV, AV , (2010) THE VALIDATION OF THE PARALLEL THREE-DIMENSIONAL SOLVER FOR ANALYSIS OF OPTICAL PLASMONIC BI-PERIODIC MULTILAYER NANOSTRUCTURES.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. VOL. 100. ISSUE 2. P. 365-374 | 25 | 93% | 1 |
Classes with closest relation at Level 1 |