Class information for:
Level 1: HELIUM ATOM MICROSCOPY//CNR IMEM//SCANNING HELIUM MICROSCOPE

Basic class information
Class id #P Avg. number of
references		 Database coverage
of references
30025 175 20.6 48%


Bar chart of Publication_year

Last years might be incomplete

Hierarchy of classes
The table includes all classes above and classes immediately below the current class.


Cluster id Level Cluster label #P
5 4 CHEMISTRY, ORGANIC//CHEMISTRY, INORGANIC & NUCLEAR//CHEMISTRY, MULTIDISCIPLINARY 1745167
3 3       PHYSICS, ATOMIC, MOLECULAR & CHEMICAL//JOURNAL OF CHEMICAL PHYSICS//CHEMISTRY, PHYSICAL 183883
674 2             PHYSICS, ATOMIC, MOLECULAR & CHEMICAL//JOURNAL OF CHEMICAL PHYSICS//JOURNAL OF MOLECULAR SPECTROSCOPY 13230
30025 1                   HELIUM ATOM MICROSCOPY//CNR IMEM//SCANNING HELIUM MICROSCOPE 175

Terms with highest relevance score


rank Term termType Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 HELIUM ATOM MICROSCOPY authKW 523465 2% 100% 3
2 CNR IMEM address 507593 5% 36% 8
3 SCANNING HELIUM MICROSCOPE authKW 348977 1% 100% 2
4 BEAM TIMING authKW 174488 1% 100% 1
5 CAMPARGUE authKW 174488 1% 100% 1
6 ELECTRON IMPACT IONIZER authKW 174488 1% 100% 1
7 ELECTROSTATIC DEFORMATION authKW 174488 1% 100% 1
8 FIELD ION DETECTION authKW 174488 1% 100% 1
9 FIELD IONIZATION OF HELIUM ATOMS authKW 174488 1% 100% 1
10 FIELD IONIZATION PROBABILITY authKW 174488 1% 100% 1

Web of Science journal categories


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 Instruments & Instrumentation 3377 43% 0% 76
2 Physics, Applied 921 47% 0% 82
3 Physics, Atomic, Molecular & Chemical 390 19% 0% 34
4 Engineering, General 147 7% 0% 13
5 Chemistry, Physical 83 17% 0% 30
6 Microscopy 71 2% 0% 4
7 Physics, Multidisciplinary 47 9% 0% 16
8 Materials Science, Coatings & Films 30 3% 0% 6
9 Optics 24 6% 0% 11
10 Nanoscience & Nanotechnology 9 3% 0% 6

Address terms


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 CNR IMEM 507593 5% 36% 8
2 PHYS EXPT PHYS FINE MECH WORKSHOP 174488 1% 100% 1
3 SUPELECLGEP SPEE S 174488 1% 100% 1
4 UNIV PIERRE MARIE CURIE P6 174488 1% 100% 1
5 SACKLER CHEM 63447 1% 18% 2
6 ORGAN ELECT 33395 5% 2% 9
7 SUR E INTER E VERRE 24925 1% 14% 1
8 BRISTOL NANOSCI QUANTUM INFORMAT 13420 1% 8% 1
9 RONTGENPHYS 10394 2% 2% 3
10 RUPRECHT HAENSEL 9692 1% 6% 1

Journals


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class
1 REVIEW OF SCIENTIFIC INSTRUMENTS 16346 30% 0% 53
2 VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 2 KHIMIYA 2204 3% 0% 5
3 INSTRUMENTS AND EXPERIMENTAL TECHNIQUES 2133 4% 0% 7
4 JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 792 1% 0% 2
5 INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES 491 1% 0% 2
6 MEASUREMENT SCIENCE AND TECHNOLOGY 473 3% 0% 5
7 NEW JOURNAL OF PHYSICS 309 2% 0% 4
8 JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS 301 1% 0% 2
9 VACUUM 288 2% 0% 4
10 JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS 281 2% 0% 3

Author Key Words


Rank Term Chi square Shr. of publ. in
class containing
term		 Class's shr. of
term's tot. occurrences		 #P with
term in
class		 LCSH search Wikipedia search
1 HELIUM ATOM MICROSCOPY 523465 2% 100% 3 Search HELIUM+ATOM+MICROSCOPY Search HELIUM+ATOM+MICROSCOPY
2 SCANNING HELIUM MICROSCOPE 348977 1% 100% 2 Search SCANNING+HELIUM+MICROSCOPE Search SCANNING+HELIUM+MICROSCOPE
3 BEAM TIMING 174488 1% 100% 1 Search BEAM+TIMING Search BEAM+TIMING
4 CAMPARGUE 174488 1% 100% 1 Search CAMPARGUE Search CAMPARGUE
5 ELECTRON IMPACT IONIZER 174488 1% 100% 1 Search ELECTRON+IMPACT+IONIZER Search ELECTRON+IMPACT+IONIZER
6 ELECTROSTATIC DEFORMATION 174488 1% 100% 1 Search ELECTROSTATIC+DEFORMATION Search ELECTROSTATIC+DEFORMATION
7 FIELD ION DETECTION 174488 1% 100% 1 Search FIELD+ION+DETECTION Search FIELD+ION+DETECTION
8 FIELD IONIZATION OF HELIUM ATOMS 174488 1% 100% 1 Search FIELD+IONIZATION+OF+HELIUM+ATOMS Search FIELD+IONIZATION+OF+HELIUM+ATOMS
9 FIELD IONIZATION PROBABILITY 174488 1% 100% 1 Search FIELD+IONIZATION+PROBABILITY Search FIELD+IONIZATION+PROBABILITY
10 FRESNEL ZONEPLATE 174488 1% 100% 1 Search FRESNEL+ZONEPLATE Search FRESNEL+ZONEPLATE

Core articles
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c:
(1) Number of references referring to publications in the class.
(2) Share of total number of active references referring to publications in the class.
(3) Age of the article. New articles get higher score than old articles.
(4) Citation rate, normalized to year.


Rank Reference # ref.
in cl.		 Shr. of ref. in
cl.		 Citations
1 PALAU, AS , BRACCO, G , HOLST, B , (2017) THEORETICAL MODEL OF THE HELIUM ZONE PLATE MICROSCOPE.PHYSICAL REVIEW A. VOL. 95. ISSUE 1. P. - 21 81% 0
2 PALAU, AS , BRACCO, G , HOLST, B , (2016) THEORETICAL MODEL OF THE HELIUM PINHOLE MICROSCOPE.PHYSICAL REVIEW A. VOL. 94. ISSUE 6. P. - 17 89% 0
3 EDER, SD , REISINGER, T , GREVE, MM , BRACCO, G , HOLST, B , (2012) FOCUSING OF A NEUTRAL HELIUM BEAM BELOW ONE MICRON.NEW JOURNAL OF PHYSICS. VOL. 14. ISSUE . P. - 19 70% 7
4 FAHY, A , BARR, M , MARTENS, J , DASTOOR, PC , (2015) A HIGHLY CONTRASTING SCANNING HELIUM MICROSCOPE.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 86. ISSUE 2. P. - 12 100% 3
5 BARR, M , O'DONNELL, KM , FAHY, A , ALLISON, W , DASTOOR, PC , (2012) A DESKTOP SUPERSONIC FREE-JET BEAM SOURCE FOR A SCANNING HELIUM MICROSCOPE (SHEM).MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 23. ISSUE 10. P. - 15 83% 1
6 CHRISTEN, W , (2013) STATIONARY FLOW CONDITIONS IN PULSED SUPERSONIC BEAMS.JOURNAL OF CHEMICAL PHYSICS. VOL. 139. ISSUE 15. P. - 35 30% 1
7 EDER, SD , BRACCO, G , KALTENBACHER, T , HOLST, B , (2014) TWO DIMENSIONAL IMAGING OF THE VIRTUAL SOURCE OF A SUPERSONIC BEAM: HELIUM AT 125 K.JOURNAL OF PHYSICAL CHEMISTRY A. VOL. 118. ISSUE 1. P. 4 -12 19 41% 4
8 EDER, SD , SAMELIN, B , BRACCO, G , ANSPERGER, K , HOLST, B , (2013) A FREE JET (SUPERSONIC), MOLECULAR BEAM SOURCE WITH AUTOMATIZED, 50 NM PRECISION NOZZLE-SKIMMER POSITIONING.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 84. ISSUE 9. P. - 20 37% 1
9 FLADISCHER, K , REINGRUBER, H , REISINGER, T , MAYRHOFER, V , ERNST, WE , ROSS, AE , MACLAREN, DA , ALLISON, W , LITWIN, D , GALAS, J , ET AL (2010) AN ELLIPSOIDAL MIRROR FOR FOCUSING NEUTRAL ATOMIC AND MOLECULAR BEAMS.NEW JOURNAL OF PHYSICS. VOL. 12. ISSUE . P. - 15 52% 10
10 PALAU, AS , EDER, SD , KALTENBACHER, T , SAMELIN, B , BRACCO, G , HOLST, B , (2016) A MODIFIED TIME-OF-FLIGHT METHOD FOR PRECISE DETERMINATION OF HIGH SPEED RATIOS IN MOLECULAR BEAMS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 87. ISSUE 2. P. - 9 69% 0

Classes with closest relation at Level 1


Rank Class id link
1 33754 MAGNICON//COLD QUALITY//HYBRID MAGNICON
2 5493 SURFACE SCIENCE//ATOM SOLID INTERACTIONS SCATTERING DIFFRACTION//ATOM SOLID SCATTERING AND DIFFRACTION INELASTIC
3 12222 SINGLE PHOTON IONIZATION//SUPERSONIC JET SPECTROMETRY//LASER MASS SPECTROMETRY
4 24684 ELECTRON BEAM TECHNIQUE//DIAGNOSTICS OF GAS MIXTURES//PLASMA METHANE
5 31115 URANIUM PENTAFLUORIDE//URANIUM HEXAFLUORIDE//PARA HYDROGEN RAMAN LASER
6 17527 BROMOFLUOROMETHANE//ROVIBRATIONAL ANALYSIS//ENCLOSIVE FLOW COOLING
7 13227 HELIUM TRIMER//FEW-BODY SYSTEMS//EFIMOV STATES
8 8633 ATOM INTERFEROMETRY//ATOM INTERFEROMETER//VCQ
9 13311 PARTIAL IONIZATION CROSS SECTION//ROVIBRATIONAL DISTRIBUTION//PENNING IONIZATION ELECTRON SPECTROSCOPY
10 31560 MOL FLUID DYNAM//ALL METAL JOINT//CHAIN CLAMPS

Go to start page