Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 29861 | 178 | 16.0 | 35% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | DETERMINATION OF TRACE SILICON | authKW | 1029286 | 3% | 100% | 6 |
| 2 | MOLYBDOSILICIC ACID BLUE SPECTROPHOTOMETRY | authKW | 1029286 | 3% | 100% | 6 |
| 3 | SILICON TETRAFLUORIDE SEPARATION | authKW | 882243 | 3% | 86% | 6 |
| 4 | ECIL | address | 428864 | 3% | 50% | 5 |
| 5 | HIGH PURITY SELENIUM | authKW | 343095 | 1% | 100% | 2 |
| 6 | 1 2 THIAZOLYLAZO P CRESOL | authKW | 171548 | 1% | 100% | 1 |
| 7 | AMBERLITE IRA 93 | authKW | 171548 | 1% | 100% | 1 |
| 8 | AQUA REGIA VAPORS | authKW | 171548 | 1% | 100% | 1 |
| 9 | BENZOXAZOLYLACROLEINS | authKW | 171548 | 1% | 100% | 1 |
| 10 | CCL4 TREATMENT | authKW | 171548 | 1% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Chemistry, Analytical | 4771 | 69% | 0% | 123 |
| 2 | Spectroscopy | 334 | 12% | 0% | 22 |
| 3 | Nuclear Science & Technology | 39 | 5% | 0% | 9 |
| 4 | Chemistry, Inorganic & Nuclear | 37 | 6% | 0% | 11 |
| 5 | Chemistry, Multidisciplinary | 25 | 11% | 0% | 19 |
| 6 | Instruments & Instrumentation | 17 | 4% | 0% | 7 |
| 7 | Materials Science, Characterization, Testing | 11 | 1% | 0% | 2 |
| 8 | Electrochemistry | 6 | 2% | 0% | 4 |
| 9 | Metallurgy & Metallurgical Engineering | 2 | 2% | 0% | 4 |
| 10 | Materials Science, Coatings & Films | 1 | 1% | 0% | 2 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | ECIL | 428864 | 3% | 50% | 5 |
| 2 | COMPOSIST CHARACTEIZAT MAT | 171548 | 1% | 100% | 1 |
| 3 | EDIL | 171548 | 1% | 100% | 1 |
| 4 | GUANGDONG PROV PUBL ANAL TESTING TECHD | 171548 | 1% | 100% | 1 |
| 5 | ECIL PO | 171544 | 2% | 33% | 3 |
| 6 | SEISHIN S | 85773 | 1% | 50% | 1 |
| 7 | COMPOSIT CHARACTERISAT MAT | 77967 | 3% | 9% | 5 |
| 8 | COMPOSIT CHARACTERISAT MAT CCCM | 57181 | 1% | 33% | 1 |
| 9 | LEHRGEBIET ANALYT CHEM | 42885 | 1% | 25% | 1 |
| 10 | CHEM UNIV PLEIN 1 | 28590 | 1% | 17% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 25293 | 12% | 1% | 22 |
| 2 | ATOMIC SPECTROSCOPY | 20736 | 6% | 1% | 11 |
| 3 | BUNSEKI KAGAKU | 11799 | 11% | 0% | 20 |
| 4 | FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY | 4499 | 7% | 0% | 12 |
| 5 | ANALYTICAL INSTRUMENTATION | 4367 | 1% | 1% | 2 |
| 6 | CHEMICAL BIOMEDICAL AND ENVIRONMENTAL INSTRUMENTATION | 2521 | 1% | 1% | 1 |
| 7 | ANALYTICA CHIMICA ACTA | 1585 | 8% | 0% | 15 |
| 8 | JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 1395 | 4% | 0% | 7 |
| 9 | RESEARCH & DEVELOPMENT | 1278 | 1% | 1% | 1 |
| 10 | MIKROCHIMICA ACTA | 933 | 2% | 0% | 4 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | SAHAYAM, AC , THANGAVEL, S , CHAURASIA, SC , (2003) TRACE ELEMENT CHARACTERIZATION OF HIGH PURITY GALLIUM: MATRIX REMOVAL AS GALLIUM FLUORIDE PRECIPITATE.ATOMIC SPECTROSCOPY. VOL. 24. ISSUE 1. P. 11-14 | 8 | 100% | 5 |
| 2 | YAMAGUCHI, H , ITOH, S , HASEGAWA, R , KOBAYASHI, T , (2001) DETERMINATION OF TRACE SILICON IN HIGH PURITY ALUMINIUM BY MOLYBDOSILICIC ACID BLUE SPECTROPHOTOMETRY AFTER FLUORIDE SEPARATION.TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN. VOL. 87. ISSUE 3. P. 129-131 | 6 | 100% | 1 |
| 3 | VENKATESWARLU, G , SAHAYAM, AC , CHAURASIA, SC , (2010) SYNERGISTIC EFFECT OF METHYL ISOBUTYL KETONE (MIBK) AND TRIBUTYL PHOSPHATE (TBP) ON THE EXTRACTION OF TELLURIUM FOR THE DETERMINATION OF TRACE IMPURITIES IN TELLURIUM.ATOMIC SPECTROSCOPY. VOL. 31. ISSUE 6. P. 187 -189 | 7 | 58% | 2 |
| 4 | SAHAYAM, AC , JIANG, SJ , WAN, CC , (2004) DETERMINATION OF ULTRA-TRACE IMPURITIES IN HIGH PURITY GALLIUM ARSENIDE BY INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY AFTER VOLATILIZATION OF MATRIX.JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. VOL. 19. ISSUE 3. P. 407-409 | 8 | 57% | 7 |
| 5 | BEINROHR, E , SILES, B , STEFANEC, J , RATTAY, V , (1991) DETERMINATION OF TRACES OF SODIUM AND POTASSIUM IN GALLIUM-ARSENIDE BY GRAPHITE-FURNACE ATOMIC-ABSORPTION SPECTROMETRY AND FLAME ATOMIC EMISSION-SPECTROMETRY.CHEMICAL PAPERS. VOL. 45. ISSUE 1. P. 61 -68 | 14 | 52% | 3 |
| 6 | TODA, E , HIOKI, A , KUBOTA, M , (1996) DETERMINATION OF IMPURITIES IN HIGH-PURITY SELENIUM BY INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY AFTER ACETATE-FORM ANION-EXCHANGE SEPARATION.ANALYTICA CHIMICA ACTA. VOL. 333. ISSUE 1-2. P. 51-58 | 9 | 64% | 2 |
| 7 | WAN, CC , JIANG, SJ , YOU, MT , SAHAYAM, AC , (2005) MICROWAVE-ASSISTED VAPOR PHASE DISSOLUTION OF PHOTORESIST AND SILICON OXIDE BASED SLURRY SAMPLES FOR THE DETERMINATION OF TRACE IMPURITIES BY HIGH RESOLUTION ICP-MS.JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. VOL. 20. ISSUE 11. P. 1290-1292 | 7 | 54% | 5 |
| 8 | UENG, RL , JIANG, SJ , WAN, CC , SAHAYAM, AC , (2005) MICROWAVE-ASSISTED VOLATILIZATION OF SILICON FLUORIDES FOR THE DETERMINATION OF TRACE IMPURITIES IN HIGH PURITY SILICON POWDER AND QUARTZ BY ICP-MS.ANALYTICA CHIMICA ACTA. VOL. 536. ISSUE 1-2. P. 295-299 | 7 | 54% | 4 |
| 9 | MUKHOPADHYAY, SS , KUNDU, D , (2013) A NEW METHOD FOR ON-LINE DISSOLUTION AND DETERMINATION OF TRACE IMPURITIES IN HIGH SILICA MATERIAL USING INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY.JOURNAL OF THE INDIAN CHEMICAL SOCIETY. VOL. 90. ISSUE 9. P. 1335-1339 | 3 | 100% | 0 |
| 10 | KUMAR, SJ , MEERAVALI, NN , ARUNACHALAM, J , (1998) DETERMINATION OF TRACE IMPURITIES IN HIGH PURITY GALLIUM BY INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY AND CROSS VALIDATION OF RESULTS BY TRANSVERSE HEATED GRAPHITE FURNACE ATOMIC ABSORPTION SPECTROMETRY.ANALYTICA CHIMICA ACTA. VOL. 371. ISSUE 2-3. P. 305-316 | 7 | 64% | 9 |
Classes with closest relation at Level 1 |