Class information for: |
Basic class information |
| Class id | #P | Avg. number of references |
Database coverage of references |
|---|---|---|---|
| 29215 | 190 | 21.6 | 30% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
| rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|---|
| 1 | FG RUMENTELLE ANALYT | address | 321426 | 1% | 100% | 2 |
| 2 | THETA PINCH DISCHARGE | authKW | 214282 | 1% | 67% | 2 |
| 3 | COMPUTER BASED INTELLIGENCE | authKW | 160713 | 1% | 100% | 1 |
| 4 | FG RUMETELLE ANALYT | address | 160713 | 1% | 100% | 1 |
| 5 | INORGANIC ADDITIVES IN POLYMERIC MATERIALS | authKW | 160713 | 1% | 100% | 1 |
| 6 | NON CONDUCTING SOLIDS | authKW | 160713 | 1% | 100% | 1 |
| 7 | POSITION SHIFT OF A SPECTRAL LINE | authKW | 160713 | 1% | 100% | 1 |
| 8 | SEQUENTIAL ICP AES SPECTROMETER | authKW | 160713 | 1% | 100% | 1 |
| 9 | SEQUENTIAL ICP SPECTROMETER | authKW | 160713 | 1% | 100% | 1 |
| 10 | SEQUENTIAL INDUCTIVELY COUPLED PLASMA SPECTROMETER | authKW | 160713 | 1% | 100% | 1 |
Web of Science journal categories |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | Spectroscopy | 6257 | 49% | 0% | 94 |
| 2 | Instruments & Instrumentation | 1778 | 31% | 0% | 58 |
| 3 | Chemistry, Analytical | 595 | 25% | 0% | 47 |
| 4 | Optics | 26 | 6% | 0% | 12 |
| 5 | Materials Science, Characterization, Testing | 25 | 2% | 0% | 3 |
| 6 | Physics, Applied | 22 | 10% | 0% | 19 |
| 7 | Physics, Multidisciplinary | 8 | 5% | 0% | 9 |
| 8 | Microscopy | 3 | 1% | 0% | 1 |
| 9 | Physics, Fluids & Plasmas | 1 | 1% | 0% | 2 |
| 10 | Education, Scientific Disciplines | 1 | 1% | 0% | 1 |
Address terms |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | FG RUMENTELLE ANALYT | 321426 | 1% | 100% | 2 |
| 2 | FG RUMETELLE ANALYT | 160713 | 1% | 100% | 1 |
| 3 | PLASMA SPECT | 80355 | 1% | 50% | 1 |
| 4 | GRATING TECHNOL | 10712 | 1% | 7% | 1 |
| 5 | CHEM MET | 4278 | 2% | 1% | 4 |
| 6 | PHYS ANALYT CHEM | 95 | 1% | 0% | 1 |
| 7 | PROC ENGN | 90 | 1% | 0% | 2 |
| 8 | CHANGCHUN OPT FINE MECH PHYS | 46 | 1% | 0% | 1 |
| 9 | MET | 8 | 1% | 0% | 1 |
| 10 | ELECT ELECT ENGN | 1 | 1% | 0% | 1 |
Journals |
| Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
|---|---|---|---|---|---|
| 1 | APPLIED SPECTROSCOPY | 45310 | 25% | 1% | 48 |
| 2 | SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 27847 | 16% | 1% | 31 |
| 3 | PROGRESS IN ANALYTICAL ATOMIC SPECTROSCOPY | 20733 | 1% | 6% | 2 |
| 4 | REVUE ROUMAINE DE PHYSIQUE | 7431 | 3% | 1% | 5 |
| 5 | COMPUTING AND CONTROL ENGINEERING | 5182 | 1% | 3% | 1 |
| 6 | ANALYTICAL CHEMISTRY | 3510 | 15% | 0% | 28 |
| 7 | JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 663 | 3% | 0% | 5 |
| 8 | ACCREDITATION AND QUALITY ASSURANCE | 500 | 1% | 0% | 2 |
| 9 | INDUSTRIAL LABORATORY | 496 | 1% | 0% | 2 |
| 10 | ANNALES PHARMACEUTIQUES FRANCAISES | 488 | 1% | 0% | 1 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
| Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
|---|---|---|---|---|
| 1 | NAVARRE, EC , GOLDBERG, JM , (2011) DESIGN AND CHARACTERIZATION OF A THETA-PINCH IMPLODING THIN FILM PLASMA SOURCE FOR ATOMIC EMISSION SPECTROCHEMICAL ANALYSIS.APPLIED SPECTROSCOPY. VOL. 65. ISSUE 1. P. 26-35 | 22 | 71% | 1 |
| 2 | BYE, CA , SCHEELINE, A , (1993) STARK ELECTRON-DENSITY MAPPING IN THE HIGH-VOLTAGE SPARK DISCHARGE.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 48. ISSUE 13. P. 1593-1605 | 21 | 55% | 3 |
| 3 | CAPPEL, JB , SCHEELINE, A , GOLDBERG, JM , (1993) EFFECT OF ADDITION OF HYDROGEN TO THE ARGON SHEATH OF A UNIDIRECTIONAL, HIGH-VOLTAGE SPARK.APPLIED SPECTROSCOPY. VOL. 47. ISSUE 3. P. 309-316 | 14 | 82% | 1 |
| 4 | MASON, KJ , GOLDBERG, JM , (1991) CHARACTERIZATION OF A LASER PLASMA IN A PULSED MAGNETIC-FIELD .1. SPATIALLY RESOLVED EMISSION STUDIES.APPLIED SPECTROSCOPY. VOL. 45. ISSUE 3. P. 370-379 | 17 | 71% | 14 |
| 5 | BYE, CA , SCHEELINE, A , (1993) SAHA-BOLTZMANN STATISTICS FOR DETERMINATION OF ELECTRON-TEMPERATURE AND DENSITY IN SPARK DISCHARGES USING AN ECHELLE CCD SYSTEM.APPLIED SPECTROSCOPY. VOL. 47. ISSUE 12. P. 2022-2030 | 15 | 68% | 27 |
| 6 | SCHEELINE, A , (1984) HIGH-VOLTAGE DISCHARGES - DIAGNOSTICS AND OPPORTUNITIES.PROGRESS IN ANALYTICAL ATOMIC SPECTROSCOPY. VOL. 7. ISSUE 1. P. 21-65 | 33 | 49% | 10 |
| 7 | BYE, CA , SCHEELINE, A , (1995) ELECTRON-DENSITY PROFILES IN SINGLE SPARK DISCHARGES.JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER. VOL. 53. ISSUE 1. P. 75-93 | 19 | 48% | 4 |
| 8 | CARNEY, KP , GOLDBERG, JM , (1986) PRODUCTION AND INITIAL CHARACTERIZATION OF AN IMPLODING THIN-FILM PLASMA SOURCE FOR ATOMIC SPECTROMETRY.ANALYTICAL CHEMISTRY. VOL. 58. ISSUE 14. P. 3108-3115 | 15 | 88% | 7 |
| 9 | GOLDBERG, JM , ROBINSON, DS , (1995) PARAMETRIC STUDIES OF EMISSION FROM A PLASMA GUN SOURCE FOR ATOMIC SPECTROSCOPY.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 50. ISSUE 8. P. 885-905 | 8 | 100% | 2 |
| 10 | SCHEELINE, A , WHITE, JS , (1988) DEVELOPMENT OF THETA-PINCH DISCHARGES FOR EMISSION SPECTROCHEMICAL ANALYSIS.SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. VOL. 43. ISSUE 4-5. P. 551-559 | 12 | 92% | 1 |
Classes with closest relation at Level 1 |