Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
26484 | 253 | 17.7 | 47% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
48 | 3 | THERMOELECTRIC//QUANTUM DOTS//MATERIALS SCIENCE, MULTIDISCIPLINARY | 93648 |
354 | 2 | THERMOELECTRIC//THERMOELECTRIC MATERIALS//THERMOELECTRIC PROPERTIES | 17454 |
26484 | 1 | ELECTROSTATICS BOUNDARY VALUE PROBLEM//VAN DER PAUW METHOD//C AS | 253 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | ELECTROSTATICS BOUNDARY VALUE PROBLEM | authKW | 482772 | 2% | 100% | 4 |
2 | VAN DER PAUW METHOD | authKW | 423880 | 5% | 29% | 12 |
3 | C AS | address | 310346 | 2% | 43% | 6 |
4 | VAN DER PAUW TECHNIQUE | authKW | 301727 | 2% | 50% | 5 |
5 | HARMAN METHOD | authKW | 295689 | 3% | 35% | 7 |
6 | ANTI ELECTROSTATIC COATINGS | authKW | 241386 | 1% | 100% | 2 |
7 | ZT SCANNER | authKW | 241386 | 1% | 100% | 2 |
8 | SCION DTU | address | 232096 | 2% | 38% | 5 |
9 | ADV STRUCT ENERGY MAT | address | 120693 | 0% | 100% | 1 |
10 | AMPS MCA GRP | address | 120693 | 0% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Instruments & Instrumentation | 4986 | 44% | 0% | 111 |
2 | Physics, Applied | 2596 | 64% | 0% | 162 |
3 | Engineering, General | 359 | 9% | 0% | 24 |
4 | Engineering, Electrical & Electronic | 113 | 15% | 0% | 37 |
5 | Materials Science, Multidisciplinary | 108 | 17% | 0% | 44 |
6 | Physics, Condensed Matter | 106 | 13% | 0% | 32 |
7 | Thermodynamics | 80 | 5% | 0% | 13 |
8 | Materials Science, Characterization, Testing | 54 | 2% | 0% | 5 |
9 | Materials Science, Ceramics | 38 | 3% | 0% | 7 |
10 | Mechanics | 23 | 4% | 0% | 11 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | C AS | 310346 | 2% | 43% | 6 |
2 | SCION DTU | 232096 | 2% | 38% | 5 |
3 | ADV STRUCT ENERGY MAT | 120693 | 0% | 100% | 1 |
4 | AMPS MCA GRP | 120693 | 0% | 100% | 1 |
5 | DWK | 120693 | 0% | 100% | 1 |
6 | ENGN OURCE ENGN | 120693 | 0% | 100% | 1 |
7 | ENSMN PHYS MATUMR 7556 | 120693 | 0% | 100% | 1 |
8 | MAT THERMOELECT MAT SYST | 120693 | 0% | 100% | 1 |
9 | MEASUREMENTS STAND DATA ENERGY CONVERS MAT PROJ | 120693 | 0% | 100% | 1 |
10 | CINF | 113926 | 5% | 7% | 13 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | REVIEW OF SCIENTIFIC INSTRUMENTS | 23866 | 30% | 0% | 77 |
2 | MEASUREMENT SCIENCE AND TECHNOLOGY | 2977 | 6% | 0% | 15 |
3 | JOURNAL OF ELECTRONIC MATERIALS | 2780 | 6% | 0% | 15 |
4 | MEASUREMENT | 2395 | 4% | 0% | 9 |
5 | ACS COMBINATORIAL SCIENCE | 875 | 1% | 0% | 2 |
6 | JOURNAL OF ELECTROSTATICS | 740 | 2% | 0% | 4 |
7 | REVUE INTERNATIONALE DES HAUTES TEMPERATURES ET DES REFRACTAIRES | 584 | 0% | 0% | 1 |
8 | JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY | 499 | 1% | 0% | 2 |
9 | INTERNATIONAL JOURNAL OF THERMOPHYSICS | 450 | 2% | 0% | 4 |
10 | IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING | 305 | 1% | 0% | 2 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | RAWAT, PK , PAUL, B , (2016) SIMPLE DESIGN FOR SEEBECK MEASUREMENT OF BULK SAMPLE BY 2-PROBE METHOD CONCURRENTLY WITH ELECTRICAL RESISTIVITY BY 4-PROBE METHOD IN THE TEMPERATURE RANGE 300-1000 K.MEASUREMENT. VOL. 91. ISSUE . P. 613 -619 | 22 | 73% | 0 |
2 | OH, D , AHN, C , KIM, M , PARK, EK , KIM, YS , (2016) APPLICATION OF THE VAN DER PAUW METHOD FOR SAMPLES WITH HOLES.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 27. ISSUE 12. P. - | 14 | 100% | 0 |
3 | DE BOOR, J , MULLER, E , (2013) DATA ANALYSIS FOR SEEBECK COEFFICIENT MEASUREMENTS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 84. ISSUE 6. P. - | 13 | 81% | 23 |
4 | HE, X , YANG, JY , JIANG, QH , LUO, YB , ZHANG, D , ZHOU, ZW , REN, YY , LI, X , XIN, JW , HOU, JD , (2016) A NEW METHOD FOR SIMULTANEOUS MEASUREMENT OF SEEBECK COEFFICIENT AND RESISTIVITY.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 87. ISSUE 12. P. - | 15 | 71% | 0 |
5 | DE BOOR, J , ZABROCKI, K , FROHRING, J , MULLER, E , (2014) ELECTRICAL CONDUCTIVITY MEASUREMENTS ON DISK-SHAPED SAMPLES.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 85. ISSUE 7. P. - | 13 | 81% | 0 |
6 | ZIOLKOWSKI, P , STIEWE, C , DE BOOR, J , DRUSCHKE, I , ZABROCKI, K , EDLER, F , HAUPT, S , KONIG, J , MUELLER, E , (2017) IRON DISILICIDE AS HIGH-TEMPERATURE REFERENCE MATERIAL FOR TRACEABLE MEASUREMENTS OF SEEBECK COEFFICIENT BETWEEN 300 K AND 800 K.JOURNAL OF ELECTRONIC MATERIALS. VOL. 46. ISSUE 1. P. 51 -63 | 18 | 55% | 0 |
7 | MACKEY, J , DYNYS, F , SEHIRLIOGLU, A , (2014) UNCERTAINTY ANALYSIS FOR COMMON SEEBECK AND ELECTRICAL RESISTIVITY MEASUREMENT SYSTEMS.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 85. ISSUE 8. P. - | 13 | 72% | 12 |
8 | GUNES, M , PARLAK, M , OZENBAS, M , (2014) AN INSTRUMENT FOR THE HIGH TEMPERATURE MEASUREMENT OF THE SEEBECK COEFFICIENT AND ELECTRICAL RESISTIVITY.MEASUREMENT SCIENCE AND TECHNOLOGY. VOL. 25. ISSUE 5. P. - | 16 | 64% | 2 |
9 | ABADLIA, L , GASSER, F , KHALOUK, K , MAYOUFI, M , GASSER, JG , (2014) NEW EXPERIMENTAL METHODOLOGY, SETUP AND LABVIEW PROGRAM FOR ACCURATE ABSOLUTE THERMOELECTRIC POWER AND ELECTRICAL RESISTIVITY MEASUREMENTS BETWEEN 25 AND 1600 K: APPLICATION TO PURE COPPER, PLATINUM, TUNGSTEN, AND NICKEL AT VERY HIGH TEMPERATURES.REVIEW OF SCIENTIFIC INSTRUMENTS. VOL. 85. ISSUE 9. P. - | 16 | 64% | 2 |
10 | KOON, DW , WANG, F , PETERSEN, DH , HANSEN, O , (2014) SENSITIVITY OF RESISTIVE AND HALL MEASUREMENTS TO LOCAL INHOMOGENEITIES: FINITE-FIELD, INTENSITY, AND AREA CORRECTIONS.JOURNAL OF APPLIED PHYSICS. VOL. 116. ISSUE 13. P. - | 11 | 92% | 2 |
Classes with closest relation at Level 1 |