Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
14983 | 738 | 23.1 | 56% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | EBSD | authKW | 416041 | 19% | 7% | 142 |
2 | KIKUCHI PATTERN | authKW | 362323 | 2% | 52% | 17 |
3 | ELECTRON BACKSCATTER DIFFRACTION | authKW | 359497 | 9% | 13% | 68 |
4 | ECCI | authKW | 227549 | 1% | 50% | 11 |
5 | KIKUCHI LINES | authKW | 212781 | 1% | 86% | 6 |
6 | ELECTRON CHANNELING CONTRAST IMAGING ECCI | authKW | 184299 | 1% | 64% | 7 |
7 | HR EBSD | authKW | 184299 | 1% | 64% | 7 |
8 | ACOM | authKW | 165490 | 1% | 50% | 8 |
9 | ELECTRON BACKSCATTERING PATTERN | authKW | 147100 | 1% | 44% | 8 |
10 | ORIENTATION MAPPING | authKW | 138539 | 2% | 28% | 12 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Microscopy | 45255 | 27% | 1% | 198 |
2 | Metallurgy & Metallurgical Engineering | 7561 | 34% | 0% | 251 |
3 | Materials Science, Multidisciplinary | 3278 | 47% | 0% | 346 |
4 | Materials Science, Characterization, Testing | 1001 | 5% | 0% | 35 |
5 | Crystallography | 624 | 8% | 0% | 62 |
6 | Nanoscience & Nanotechnology | 202 | 7% | 0% | 48 |
7 | Physics, Applied | 179 | 13% | 0% | 95 |
8 | Mining & Mineral Processing | 88 | 1% | 0% | 9 |
9 | Physics, Condensed Matter | 59 | 7% | 0% | 51 |
10 | Mineralogy | 50 | 1% | 0% | 10 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MET INZYNIERII MATERIALOWEJ | 55165 | 0% | 67% | 2 |
2 | NEW DEVICE TEAM | 54433 | 1% | 26% | 5 |
3 | TSL | 54433 | 1% | 26% | 5 |
4 | BRUKER NANO | 41374 | 0% | 100% | 1 |
5 | CNRSENSMAUPR 3346ISAETELEPORT 2 | 41374 | 0% | 100% | 1 |
6 | DEV S SEMICOND MAT | 41374 | 0% | 100% | 1 |
7 | DRECAMCNRSUMR 12 | 41374 | 0% | 100% | 1 |
8 | EA3079 | 41374 | 0% | 100% | 1 |
9 | ESRC TECHNOL 3 5 | 41374 | 0% | 100% | 1 |
10 | ETUD MICROSTRUCT MECH MAT LEM3 | 41374 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | ULTRAMICROSCOPY | 42801 | 10% | 1% | 76 |
2 | PRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY | 37963 | 3% | 4% | 24 |
3 | MICROSCOPY AND MICROANALYSIS | 22479 | 4% | 2% | 31 |
4 | TEXTURES AND MICROSTRUCTURES | 15822 | 1% | 3% | 11 |
5 | JOURNAL OF MICROSCOPY | 10139 | 3% | 1% | 25 |
6 | JOURNAL OF MICROSCOPY-OXFORD | 7834 | 3% | 1% | 22 |
7 | MATERIALS CHARACTERIZATION | 5904 | 3% | 1% | 23 |
8 | JOURNAL OF APPLIED CRYSTALLOGRAPHY | 4551 | 3% | 0% | 25 |
9 | SCANNING | 2939 | 1% | 1% | 11 |
10 | ACTA MATERIALIA | 2772 | 4% | 0% | 29 |
Author Key Words |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | EBSD | 416041 | 19% | 7% | 142 | Search EBSD | Search EBSD |
2 | KIKUCHI PATTERN | 362323 | 2% | 52% | 17 | Search KIKUCHI+PATTERN | Search KIKUCHI+PATTERN |
3 | ELECTRON BACKSCATTER DIFFRACTION | 359497 | 9% | 13% | 68 | Search ELECTRON+BACKSCATTER+DIFFRACTION | Search ELECTRON+BACKSCATTER+DIFFRACTION |
4 | ECCI | 227549 | 1% | 50% | 11 | Search ECCI | Search ECCI |
5 | KIKUCHI LINES | 212781 | 1% | 86% | 6 | Search KIKUCHI+LINES | Search KIKUCHI+LINES |
6 | ELECTRON CHANNELING CONTRAST IMAGING ECCI | 184299 | 1% | 64% | 7 | Search ELECTRON+CHANNELING+CONTRAST+IMAGING+ECCI | Search ELECTRON+CHANNELING+CONTRAST+IMAGING+ECCI |
7 | HR EBSD | 184299 | 1% | 64% | 7 | Search HR+EBSD | Search HR+EBSD |
8 | ACOM | 165490 | 1% | 50% | 8 | Search ACOM | Search ACOM |
9 | ELECTRON BACKSCATTERING PATTERN | 147100 | 1% | 44% | 8 | Search ELECTRON+BACKSCATTERING+PATTERN | Search ELECTRON+BACKSCATTERING+PATTERN |
10 | ORIENTATION MAPPING | 138539 | 2% | 28% | 12 | Search ORIENTATION+MAPPING | Search ORIENTATION+MAPPING |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | WILKINSON, AJ , BRITTON, TB , (2012) STRAINS, PLANES, AND EBSD IN MATERIALS SCIENCE.MATERIALS TODAY. VOL. 15. ISSUE 9. P. 366 -376 | 54 | 73% | 47 |
2 | WRIGHT, SI , NOWELL, MM , FIELD, DP , (2011) A REVIEW OF STRAIN ANALYSIS USING ELECTRON BACKSCATTER DIFFRACTION.MICROSCOPY AND MICROANALYSIS. VOL. 17. ISSUE 3. P. 316 -329 | 24 | 89% | 128 |
3 | RAM, F , ZAEFFERER, S , RAABE, D , (2014) KIKUCHI BANDLET METHOD FOR THE ACCURATE DECONVOLUTION AND LOCALIZATION OF KIKUCHI BANDS IN KIKUCHI DIFFRACTION PATTERNS.JOURNAL OF APPLIED CRYSTALLOGRAPHY. VOL. 47. ISSUE . P. 264 -275 | 29 | 94% | 2 |
4 | BEN BRITTON, T , JIANG, J , KARAMCHED, PS , WILKINSON, AJ , (2013) PROBING DEFORMATION AND REVEALING MICROSTRUCTURAL MECHANISMS WITH CROSS-CORRELATION-BASED, HIGH-RESOLUTION ELECTRON BACKSCATTER DIFFRACTION.JOM. VOL. 65. ISSUE 9. P. 1245 -1253 | 31 | 72% | 2 |
5 | VAN BREMEN, R , GOMES, DR , DE JEER, LTH , OCELIK, V , DE HOSSON, JTM , (2016) ON THE OPTIMUM RESOLUTION OF TRANSMISSION-ELECTRON BACKSCATTERED DIFFRACTION (T-EBSD).ULTRAMICROSCOPY. VOL. 160. ISSUE . P. 256 -264 | 20 | 77% | 5 |
6 | TONG, V , JIANG, J , WILKINSON, AJ , BEN BRITTON, T , (2015) THE EFFECT OF PATTERN OVERLAP ON THE ACCURACY OF HIGH RESOLUTION ELECTRON BACKSCATTER DIFFRACTION MEASUREMENTS.ULTRAMICROSCOPY. VOL. 155. ISSUE . P. 62 -73 | 25 | 81% | 2 |
7 | MIKAMI, Y , ODA, K , KAMAYA, M , MOCHIZUKI, M , (2015) EFFECT OF REFERENCE POINT SELECTION ON MICROSCOPIC STRESS MEASUREMENT USING EBSD.MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING. VOL. 647. ISSUE . P. 256 -264 | 30 | 64% | 3 |
8 | HARDIN, TJ , RUGGLES, TJ , KOCH, DP , NIEZGODA, SR , FULLWOOD, DT , HOMER, ER , (2015) ANALYSIS OF TRACTION-FREE ASSUMPTION IN HIGH-RESOLUTION EBSD MEASUREMENTS.JOURNAL OF MICROSCOPY. VOL. 260. ISSUE 1. P. 73 -85 | 23 | 85% | 1 |
9 | BABA-KISHI, KZ , (2002) REVIEW - ELECTRON BACKSCATTER KIKUCHI DIFFRACTION IN THE SCANNING ELECTRON MICROSCOPE FOR CRYSTALLOGRAPHIC ANALYSIS.JOURNAL OF MATERIALS SCIENCE. VOL. 37. ISSUE 9. P. 1715 -1746 | 38 | 67% | 63 |
10 | RUGGLES, TJ , FULLWOOD, DT , KYSAR, JW , (2016) RESOLVING GEOMETRICALLY NECESSARY DISLOCATION DENSITY ONTO INDIVIDUAL DISLOCATION TYPES USING EBSD-BASED CONTINUUM DISLOCATION MICROSCOPY.INTERNATIONAL JOURNAL OF PLASTICITY. VOL. 76. ISSUE . P. 231 -243 | 25 | 63% | 3 |
Classes with closest relation at Level 1 |