Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
13882 | 807 | 26.6 | 50% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
2 | 4 | MATERIALS SCIENCE, MULTIDISCIPLINARY//PHYSICS, APPLIED//PHYSICS, CONDENSED MATTER | 2836879 |
550 | 3 | FERROELECTRICS//JOURNAL OF APPLIED CRYSTALLOGRAPHY//PHYSICS, CONDENSED MATTER | 18138 |
2691 | 2 | JOURNAL OF APPLIED CRYSTALLOGRAPHY//POWDER DIFFRACTION//LINE PROFILE ANALYSIS | 3360 |
13882 | 1 | LINE PROFILE ANALYSIS//WHOLE POWDER PATTERN MODELLING//X RAY PEAK PROFILE ANALYSIS | 807 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | LINE PROFILE ANALYSIS | authKW | 955417 | 6% | 50% | 51 |
2 | WHOLE POWDER PATTERN MODELLING | authKW | 416204 | 1% | 100% | 11 |
3 | X RAY PEAK PROFILE ANALYSIS | authKW | 242152 | 1% | 80% | 8 |
4 | CONTRAST FACTORS | authKW | 189183 | 1% | 100% | 5 |
5 | CRYSTAL IMPERFECTION PARAMETERS | authKW | 157651 | 1% | 83% | 5 |
6 | MAT ENGN IND TECHNOL | address | 117427 | 5% | 8% | 38 |
7 | CRYSTALLITE SIZE | authKW | 113909 | 5% | 7% | 41 |
8 | X RAY LINE PROFILE ANALYSIS | authKW | 90127 | 1% | 26% | 9 |
9 | BURGERS VECTOR POPULATION | authKW | 85131 | 0% | 75% | 3 |
10 | JOURNAL OF APPLIED CRYSTALLOGRAPHY | journal | 81233 | 14% | 2% | 110 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Crystallography | 7741 | 27% | 0% | 215 |
2 | Metallurgy & Metallurgical Engineering | 3723 | 23% | 0% | 187 |
3 | Materials Science, Characterization, Testing | 3349 | 8% | 0% | 66 |
4 | Materials Science, Multidisciplinary | 2339 | 39% | 0% | 312 |
5 | Chemistry, Multidisciplinary | 536 | 19% | 0% | 153 |
6 | Nanoscience & Nanotechnology | 236 | 7% | 0% | 54 |
7 | Physics, Condensed Matter | 181 | 10% | 0% | 80 |
8 | Materials Science, Textiles | 137 | 1% | 0% | 12 |
9 | Physics, Applied | 91 | 10% | 0% | 80 |
10 | Polymer Science | 74 | 5% | 0% | 39 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | MAT ENGN IND TECHNOL | 117427 | 5% | 8% | 38 |
2 | STUDIES SERICULTURE | 56752 | 0% | 50% | 3 |
3 | MATEMAT KRYPTOL | 50444 | 0% | 33% | 4 |
4 | STUDIES PHYS | 46426 | 5% | 3% | 37 |
5 | GEN PHYS | 38295 | 7% | 2% | 60 |
6 | CHINA NORTH MAT SCI ENGN TECHNOL GRP | 37837 | 0% | 100% | 1 |
7 | FIBERS EXPTL STN | 37837 | 0% | 100% | 1 |
8 | GEMS OUTSTN | 37837 | 0% | 100% | 1 |
9 | GRP CRISTALLCHIM | 37837 | 0% | 100% | 1 |
10 | HBEREICH INGN HRICHTUNG WERKSTOFFTECH GLAS | 37837 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | JOURNAL OF APPLIED CRYSTALLOGRAPHY | 81233 | 14% | 2% | 110 |
2 | POWDER DIFFRACTION | 27470 | 4% | 3% | 29 |
3 | ZEITSCHRIFT FUR KRISTALLOGRAPHIE | 19625 | 6% | 1% | 51 |
4 | MATERIALS SCIENCE FORUM | 5799 | 6% | 0% | 52 |
5 | ACTA CRYSTALLOGRAPHICA SECTION A | 3727 | 2% | 1% | 15 |
6 | ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2974 | 1% | 1% | 10 |
7 | INDUSTRIAL LABORATORY | 1429 | 1% | 1% | 7 |
8 | MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1417 | 4% | 0% | 33 |
9 | NANOSTRUCTURED MATERIALS | 1148 | 1% | 1% | 6 |
10 | MATERIALS CHARACTERIZATION | 1009 | 1% | 0% | 10 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | MITTEMEIJER, EJ , WELZEL, U , (2008) THE "STATE OF THE ART" OF THE DIFFRACTION ANALYSIS OF CRYSTALLITE SIZE AND LATTICE STRAIN.ZEITSCHRIFT FUR KRISTALLOGRAPHIE. VOL. 223. ISSUE 9. P. 552-560 | 33 | 65% | 121 |
2 | UNGAR, T , GUBICZA, J , (2007) NANOCRYSTALLINE MATERIALS STUDIED BY POWDER DIFFRACTION LINE PROFILE ANALYSIS.ZEITSCHRIFT FUR KRISTALLOGRAPHIE. VOL. 222. ISSUE 3-4. P. 114-128 | 50 | 50% | 22 |
3 | KUZEL, R , (2007) KINEMATICAL DIFFRACTION BY DISTORTED CRYSTALS - DISLOCATION X-RAY LINE BROADENING.ZEITSCHRIFT FUR KRISTALLOGRAPHIE. VOL. 222. ISSUE 3-4. P. 136-149 | 27 | 90% | 18 |
4 | GUBICZA, J , UNGAR, T , (2007) CHARACTERIZATION OF DEFECT STRUCTURES IN NANOCRYSTALLINE MATERIALS BY X-RAY LINE PROFILE ANALYSIS.ZEITSCHRIFT FUR KRISTALLOGRAPHIE. VOL. 222. ISSUE 11. P. 567 -579 | 43 | 55% | 25 |
5 | UNGAR, T , GUBICZA, J , RIBARIK, G , BORBELY, A , (2001) CRYSTALLITE SIZE DISTRIBUTION AND DISLOCATION STRUCTURE DETERMINED BY DIFFRACTION PROFILE ANALYSIS: PRINCIPLES AND PRACTICAL APPLICATION TO CUBIC AND HEXAGONAL CRYSTALS.JOURNAL OF APPLIED CRYSTALLOGRAPHY. VOL. 34. ISSUE . P. 298 -310 | 28 | 62% | 343 |
6 | SCARDI, P , LEONI, M , DELHEZ, R , (2004) LINE BROADENING ANALYSIS USING INTEGRAL BREADTH METHODS: A CRITICAL REVIEW.JOURNAL OF APPLIED CRYSTALLOGRAPHY. VOL. 37. ISSUE . P. 381-390 | 26 | 70% | 153 |
7 | BORBELY, A , UNGAR, T , (2012) X-RAY LINE PROFILES ANALYSIS OF PLASTICALLY DEFORMED METALS.COMPTES RENDUS PHYSIQUE. VOL. 13. ISSUE 3. P. 293-306 | 32 | 52% | 13 |
8 | SOLEIMANIAN, V , ABEDI, M , AGHDAEE, SR , (2015) MICROSTRUCTURE EVALUATION OF NANOCRYSTALLINE MGO POWDERS USING THE ADVANCED X-RAY LINE PROFILE ANALYSIS.JOURNAL OF CRYSTAL GROWTH. VOL. 411. ISSUE . P. 4 -11 | 20 | 74% | 2 |
9 | BALOGH, L , LONG, F , DAYMOND, MR , (2016) CONTRAST FACTORS OF IRRADIATION-INDUCED DISLOCATION LOOPS IN HEXAGONAL MATERIALS.JOURNAL OF APPLIED CRYSTALLOGRAPHY. VOL. 49. ISSUE . P. 2184 -2200 | 26 | 58% | 0 |
10 | KERBER, MB , ZEHETBAUER, MJ , SCHAFLER, E , SPIECKERMANN, FC , BERNSTORFF, S , UNGAR, T , (2011) X-RAY LINE PROFILE ANALYSIS-AN IDEAL TOOL TO QUANTIFY STRUCTURAL PARAMETERS OF NANOMATERIALS.JOM. VOL. 63. ISSUE 7. P. 61-69 | 31 | 51% | 10 |
Classes with closest relation at Level 1 |