Class information for: |
Basic class information |
Class id | #P | Avg. number of references |
Database coverage of references |
---|---|---|---|
11173 | 1003 | 21.0 | 56% |
Hierarchy of classes |
The table includes all classes above and classes immediately below the current class. |
Cluster id | Level | Cluster label | #P |
---|---|---|---|
10 | 4 | OPTICS//PHYSICS, PARTICLES & FIELDS//PHYSICS, MULTIDISCIPLINARY | 1131262 |
37 | 3 | PHYSICS, CONDENSED MATTER//PHYSICAL REVIEW B//QUANTUM DOTS | 103171 |
1348 | 2 | PHYSICS, CONDENSED MATTER//SUPERCONDUCTOR INSULATOR TRANSITION//PHYSICAL REVIEW B | 8307 |
11173 | 1 | COULOMB GLASSES//ELECTRON GLASS//GLASSY CHALCOGENIDES | 1003 |
Terms with highest relevance score |
rank | Term | termType | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|---|
1 | COULOMB GLASSES | authKW | 216478 | 1% | 89% | 8 |
2 | ELECTRON GLASS | authKW | 81177 | 0% | 67% | 4 |
3 | GLASSY CHALCOGENIDES | authKW | 81177 | 0% | 67% | 4 |
4 | CION | address | 60885 | 0% | 100% | 2 |
5 | VARIABLE RANGE HOPPING | authKW | 49469 | 2% | 9% | 19 |
6 | EQUIPE SEMICOND | address | 48703 | 0% | 40% | 4 |
7 | GRP ESNPS | address | 48703 | 0% | 40% | 4 |
8 | ETUD STRUCT ELECT OPT | address | 40589 | 0% | 67% | 2 |
9 | JOINT CHEM PHYS | address | 31302 | 1% | 17% | 6 |
10 | A SI1 YNIYH | authKW | 30442 | 0% | 100% | 1 |
Web of Science journal categories |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | Physics, Condensed Matter | 13900 | 61% | 0% | 612 |
2 | Physics, Multidisciplinary | 3112 | 26% | 0% | 265 |
3 | Physics, Applied | 304 | 14% | 0% | 140 |
4 | Materials Science, Ceramics | 95 | 2% | 0% | 23 |
5 | Materials Science, Multidisciplinary | 89 | 10% | 0% | 102 |
6 | Mechanics | 53 | 4% | 0% | 36 |
7 | Nanoscience & Nanotechnology | 21 | 3% | 0% | 26 |
8 | Physics, Mathematical | 21 | 2% | 0% | 20 |
9 | Materials Science, Composites | -0 | 0% | 0% | 2 |
10 | Physics, Fluids & Plasmas | -1 | 0% | 0% | 4 |
Address terms |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | CION | 60885 | 0% | 100% | 2 |
2 | EQUIPE SEMICOND | 48703 | 0% | 40% | 4 |
3 | GRP ESNPS | 48703 | 0% | 40% | 4 |
4 | ETUD STRUCT ELECT OPT | 40589 | 0% | 67% | 2 |
5 | JOINT CHEM PHYS | 31302 | 1% | 17% | 6 |
6 | DSM DRECAM SERV PHYS ETAT CONDENSE | 30442 | 0% | 100% | 1 |
7 | ELMELETI FISIKA TANSZEK | 30442 | 0% | 100% | 1 |
8 | GRPEQUIPE SEMICOND NANOTECHNOL PROGRAMMAT | 30442 | 0% | 100% | 1 |
9 | HIGHP SURE PHYS | 30442 | 0% | 100% | 1 |
10 | PHYS SEMI CRYSTALLINE SOLIDS | 30442 | 0% | 100% | 1 |
Journals |
Rank | Term | Chi square | Shr. of publ. in class containing term |
Class's shr. of term's tot. occurrences |
#P with term in class |
---|---|---|---|---|---|
1 | PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 10947 | 3% | 1% | 34 |
2 | PHYSICAL REVIEW B | 9370 | 23% | 0% | 227 |
3 | JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 5484 | 3% | 1% | 30 |
4 | PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 5155 | 6% | 0% | 58 |
5 | JETP LETTERS | 3160 | 3% | 0% | 35 |
6 | SOLID STATE COMMUNICATIONS | 3027 | 5% | 0% | 51 |
7 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 2851 | 2% | 0% | 23 |
8 | SEMICONDUCTORS | 2786 | 2% | 0% | 25 |
9 | PHYSICAL REVIEW LETTERS | 2449 | 9% | 0% | 89 |
10 | ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI | 1902 | 2% | 0% | 20 |
Author Key Words |
Core articles |
The table includes core articles in the class. The following variables is taken into account for the relevance score of an article in a cluster c: (1) Number of references referring to publications in the class. (2) Share of total number of active references referring to publications in the class. (3) Age of the article. New articles get higher score than old articles. (4) Citation rate, normalized to year. |
Rank | Reference | # ref. in cl. |
Shr. of ref. in cl. |
Citations |
---|---|---|---|---|
1 | AMIR, A , OREG, Y , IMRY, Y , (2011) ELECTRON GLASS DYNAMICS.ANNUAL REVIEW OF CONDENSED MATTER PHYSICS, VOL 2. VOL. 2. ISSUE . P. 235 -262 | 64 | 75% | 29 |
2 | OVADYAHU, Z , (2013) INTRINSIC ELECTRON-GLASS EFFECTS IN STRONGLY LOCALIZED TL2O3-X FILMS.PHYSICAL REVIEW B. VOL. 88. ISSUE 8. P. - | 42 | 81% | 4 |
3 | OVADYAHU, Z , (2016) NONEQUILIBRIUM TRANSPORT AND ELECTRON-GLASS EFFECTS IN THIN GE-X TE FILMS.PHYSICAL REVIEW B. VOL. 94. ISSUE 15. P. - | 33 | 85% | 0 |
4 | DELAHAYE, J , HONORE, J , GRENET, T , (2011) SLOW CONDUCTANCE RELAXATION IN INSULATING GRANULAR AL: EVIDENCE FOR SCREENING EFFECTS.PHYSICAL REVIEW LETTERS. VOL. 106. ISSUE 18. P. - | 30 | 100% | 9 |
5 | LEBANON, E , MULLER, M , (2005) MEMORY EFFECT IN ELECTRON GLASSES: THEORETICAL ANALYSIS VIA A PERCOLATION APPROACH.PHYSICAL REVIEW B. VOL. 72. ISSUE 17. P. - | 37 | 88% | 39 |
6 | DELAHAYE, J , GRENET, T , MARRACHE-KIKUCHI, CA , DRILLIEN, AA , BERGE, L , (2014) OBSERVATION OF THERMALLY ACTIVATED GLASSINESS AND MEMORY DIP IN A-NBSI INSULATING THIN FILMS.EPL. VOL. 106. ISSUE 6. P. - | 29 | 94% | 0 |
7 | ORTUNO, M , TALAMANTES, J , CUEVAS, E , DIAZ-SANCHEZ, A , (2001) COULOMB INTERACTIONS IN ANDERSON INSULATORS.PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES. VOL. 81. ISSUE 9. P. 1049 -1064 | 60 | 62% | 6 |
8 | SHUMILIN, AV , (2014) LOW FREQUENCY EXCITATIONS IN THE COULOMB GLASS: NUMERICAL ANALYSIS USING THE AVALANCHE METHOD.SOLID STATE COMMUNICATIONS. VOL. 183. ISSUE . P. 51 -55 | 24 | 100% | 1 |
9 | OVADYAHU, Z , (2008) SLOW CONDUCTANCE RELAXATIONS: DISTINGUISHING THE ELECTRON GLASS FROM EXTRINSIC MECHANISMS.PHYSICAL REVIEW B. VOL. 78. ISSUE 19. P. - | 34 | 79% | 15 |
10 | SURER, B , KATZGRABER, HG , ZIMANYI, GT , ALLGOOD, BA , BLATTER, G , (2009) DENSITY OF STATES AND CRITICAL BEHAVIOR OF THE COULOMB GLASS.PHYSICAL REVIEW LETTERS. VOL. 102. ISSUE 6. P. - | 31 | 82% | 18 |
Classes with closest relation at Level 1 |