Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
422 | 25115 | 18.2 | 56% |
Classes in level above (level 4) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
5 | 1620399 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY |
Classes in level below (level 2) |
ID, lev. below |
Publications | Label for level below |
---|---|---|
778 | 11578 | CDTE//CDZNTE//ZNSE |
1528 | 6892 | CD1 XMNXTE//THIN FILM PHYS GRP//LEAD TELLURIDE |
1819 | 5697 | HGCDTE//CERDEC NIGHT VIS ELECT SENSORS DIRECTORATE//MICROPHYS |
3560 | 948 | DEMINERALIZED DENTIN MATRIX//ESTUDOS AVANCADOS IEAV//ASSOCIATED SENSORS MAT LAS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | HGCDTE | Author keyword | 542 | 52% | 3% | 737 |
2 | CDTE | Author keyword | 464 | 46% | 3% | 747 |
3 | CDZNTE | Author keyword | 308 | 54% | 2% | 394 |
4 | ZNSE | Author keyword | 169 | 40% | 1% | 334 |
5 | JOURNAL OF ELECTRONIC MATERIALS | Journal | 161 | 13% | 5% | 1131 |
6 | CADMIUM TELLURIDE | Author keyword | 151 | 47% | 1% | 235 |
7 | ZNTE | Author keyword | 124 | 55% | 1% | 154 |
8 | SOVIET PHYSICS SEMICONDUCTORS-USSR | Journal | 88 | 12% | 3% | 688 |
9 | MICROPHYS | Address | 83 | 72% | 0% | 66 |
10 | SEMICONDUCTING II VI MATERIALS | Author keyword | 83 | 31% | 1% | 224 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | HGCDTE | 542 | 52% | 3% | 737 | Search HGCDTE | Search HGCDTE |
2 | CDTE | 464 | 46% | 3% | 747 | Search CDTE | Search CDTE |
3 | CDZNTE | 308 | 54% | 2% | 394 | Search CDZNTE | Search CDZNTE |
4 | ZNSE | 169 | 40% | 1% | 334 | Search ZNSE | Search ZNSE |
5 | CADMIUM TELLURIDE | 151 | 47% | 1% | 235 | Search CADMIUM+TELLURIDE | Search CADMIUM+TELLURIDE |
6 | ZNTE | 124 | 55% | 1% | 154 | Search ZNTE | Search ZNTE |
7 | SEMICONDUCTING II VI MATERIALS | 83 | 31% | 1% | 224 | Search SEMICONDUCTING+II+VI+MATERIALS | Search SEMICONDUCTING+II+VI+MATERIALS |
8 | ZINC TELLURIDE | 60 | 73% | 0% | 46 | Search ZINC+TELLURIDE | Search ZINC+TELLURIDE |
9 | ZNMGSSE | 57 | 78% | 0% | 38 | Search ZNMGSSE | Search ZNMGSSE |
10 | CADMIUM COMPOUNDS | 49 | 30% | 1% | 139 | Search CADMIUM+COMPOUNDS | Search CADMIUM+COMPOUNDS |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | HG1 XCDXTE | 803 | 72% | 3% | 639 |
2 | CDTE | 627 | 38% | 5% | 1290 |
3 | CD1 XMNXTE | 567 | 72% | 2% | 450 |
4 | HGCDTE | 548 | 64% | 2% | 540 |
5 | P TYPE ZNSE | 451 | 84% | 1% | 243 |
6 | CADMIUM TELLURIDE | 438 | 66% | 2% | 406 |
7 | ZNSE | 390 | 41% | 3% | 735 |
8 | MERCURY CADMIUM TELLURIDE | 306 | 88% | 1% | 145 |
9 | CDZNTE | 286 | 67% | 1% | 261 |
10 | CD1 XZNXTE | 220 | 74% | 1% | 165 |
Journals |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | JOURNAL OF ELECTRONIC MATERIALS | 161 | 13% | 5% | 1131 |
2 | SOVIET PHYSICS SEMICONDUCTORS-USSR | 88 | 12% | 3% | 688 |
3 | INFRARED PHYSICS | 27 | 16% | 1% | 161 |
4 | SEMICONDUCTORS AND SEMIMETALS | 3 | 13% | 0% | 19 |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Cadmium zinc telluride and its use as a nuclear radiation detector material | 2001 | 451 | 133 | 82% |
DILUTED MAGNETIC SEMICONDUCTORS | 1988 | 1458 | 166 | 86% |
Laser beam induced current microscopy and photocurrent mapping for junction characterization of infrared photodetectors | 2015 | 6 | 72 | 50% |
Physics and chemistry of CdTe/CdS thin film heterojunction photovoltaic devices: fundamental and critical aspects | 2014 | 27 | 422 | 82% |
HgCdTe infrared detector material: history, status and outlook | 2005 | 221 | 70 | 69% |
Stability of CdTe/CdS thin-film solar cells | 2000 | 165 | 61 | 87% |
Review of the Shockley-Ramo theorem and its application in semiconductor gamma-ray detectors | 2001 | 145 | 20 | 95% |
Mixed-valence impurities in lead telluride-based solid solutions | 2002 | 124 | 107 | 93% |
Progress in the Development of CdTe and CdZnTe Semiconductor Radiation Detectors for Astrophysical and Medical Applications | 2009 | 84 | 63 | 63% |
Third-generation infrared photodetector arrays | 2009 | 192 | 94 | 26% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MICROPHYS | 83 | 72% | 0.3% | 66 |
2 | CERDEC NIGHT VIS ELECT SENSORS DIRECTORATE | 60 | 100% | 0.1% | 20 |
3 | THIN FILM PHYS GRP | 36 | 51% | 0.2% | 50 |
4 | NVESD | 33 | 71% | 0.1% | 27 |
5 | NONPROLIFERAT SECUR | 33 | 83% | 0.1% | 19 |
6 | ELECT ENGN COURSE | 29 | 77% | 0.1% | 20 |
7 | SHANGHAI TECH PHYS | 26 | 11% | 0.9% | 236 |
8 | HALBLEITER FESTKORPERPHYS | 17 | 23% | 0.3% | 66 |
9 | INFRARED IMAGING MAT DETECTORS | 17 | 36% | 0.2% | 39 |
10 | RISM | 15 | 56% | 0.1% | 18 |
Related classes at same level (level 3) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000004560 | CUINSE2//CUINS2//CUIN GASE 2 |
2 | 0.0000003521 | PHYSICAL REVIEW B//PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES//SUPERLATTICES AND MICROSTRUCTURES |
3 | 0.0000003173 | SOVIET PHYSICS SEMICONDUCTORS-USSR//GETTERING//SILICON |
4 | 0.0000002992 | SEMICONDUCTOR LASERS//IEEE JOURNAL OF QUANTUM ELECTRONICS//JOURNAL OF CRYSTAL GROWTH |
5 | 0.0000002605 | SKUTTERUDITE//FILLED SKUTTERUDITE//THERMOELECTRIC |
6 | 0.0000002284 | GAN//NITRIDES//GALLIUM NITRIDE |
7 | 0.0000002084 | POSITRON ANNIHILATION//POSITRONIUM//MAEAM |
8 | 0.0000001400 | ZNO//ZINC OXIDE//SNO2 |
9 | 0.0000001098 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIAT//JOURNAL OF INSTRUMENTATION//IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
10 | 0.0000001067 | LASER INDUCED BREAKDOWN SPECTROSCOPY//LIBS//LASER INDUCED BREAKDOWN SPECTROSCOPY LIBS |