Class information for:
Level 3: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
372 29885 19.7 34%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 4)


ID, lev.
above		 Publications Label for level above
17 868753 COMPUTER SCIENCE, THEORY & METHODS//COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE//COMPUTER SCIENCE, INFORMATION SYSTEMS

Classes in level below (level 2)


ID, lev.
below		 Publications Label for level below
923 10486 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//HIGH LEVEL SYNTHESIS
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU
2512 3379 RESIDUE NUMBER SYSTEM RNS//RESIDUE NUMBER SYSTEM//RESIDUE ARITHMETIC
2570 3228 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//FLOORPLANNING//PHYSICAL DESIGN
2594 3152 MULTIPLE VALUED LOGIC//LOGIC SYNTHESIS//REED MULLER EXPANSIONS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of publ.
in class
1 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS Journal 1953 54% 8% 2500
2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE WoS category 1522 13% 38% 11300
3 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS Journal 906 72% 2% 714
4 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS Journal 874 47% 5% 1362
5 IEEE DESIGN & TEST OF COMPUTERS Journal 487 58% 2% 566
6 IEEE TRANSACTIONS ON COMPUTERS Journal 442 28% 4% 1344
7 INTEGRATION-THE VLSI JOURNAL Journal 359 54% 2% 461
8 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS Journal 267 54% 1% 348
9 IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES Journal 219 49% 1% 330
10 SINGLE EVENT UPSET SEU Author keyword 191 73% 0% 147

Web of Science journal categories


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of publ.
in class
1 Computer Science, Hardware & Architecture 1522 13% 38% 11300

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SINGLE EVENT UPSET SEU 191 73% 0% 147 Search SINGLE+EVENT+UPSET+SEU Search SINGLE+EVENT+UPSET+SEU
2 SINGLE EVENT UPSET 180 57% 1% 213 Search SINGLE+EVENT+UPSET Search SINGLE+EVENT+UPSET
3 HIGH LEVEL SYNTHESIS 175 45% 1% 294 Search HIGH+LEVEL+SYNTHESIS Search HIGH+LEVEL+SYNTHESIS
4 COMPUTER ARITHMETIC 161 50% 1% 231 Search COMPUTER+ARITHMETIC Search COMPUTER+ARITHMETIC
5 SRAM 159 37% 1% 341 Search SRAM Search SRAM
6 BUILT IN SELF TEST BIST 146 62% 0% 149 Search BUILT+IN+SELF+TEST+BIST Search BUILT+IN+SELF+TEST+BIST
7 DESIGN FOR TESTABILITY 142 52% 1% 195 Search DESIGN+FOR+TESTABILITY Search DESIGN+FOR+TESTABILITY
8 SINGLE EVENT TRANSIENT 136 69% 0% 115 Search SINGLE+EVENT+TRANSIENT Search SINGLE+EVENT+TRANSIENT
9 SOFT ERROR 132 51% 1% 184 Search SOFT+ERROR Search SOFT+ERROR
10 TRANSITION FAULTS 126 85% 0% 67 Search TRANSITION+FAULTS Search TRANSITION+FAULTS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SEU 202 78% 0% 135
2 SINGLE EVENT UPSET 135 63% 0% 135
3 UPSETS 119 72% 0% 94
4 SRAMS 104 66% 0% 96
5 TESTABILITY 102 55% 0% 129
6 UPSET 100 58% 0% 116
7 SRAM 89 50% 0% 129
8 DISCRETE COSINE TRANSFORM 82 34% 1% 197
9 SINGLE EVENT TRANSIENTS 79 72% 0% 62
10 SOFT ERROR RATE 75 72% 0% 59

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of publ.
in class
1 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 1953 54% 8% 2500
2 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 906 72% 2% 714
3 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 874 47% 5% 1362
4 IEEE DESIGN & TEST OF COMPUTERS 487 58% 2% 566
5 IEEE TRANSACTIONS ON COMPUTERS 442 28% 4% 1344
6 INTEGRATION-THE VLSI JOURNAL 359 54% 2% 461
7 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 267 54% 1% 348
8 IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES 219 49% 1% 330
9 IEEE JOURNAL OF SOLID-STATE CIRCUITS 143 13% 3% 1026
10 IET COMPUTERS AND DIGITAL TECHNIQUES 117 47% 1% 184

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Reconfigurable computing: A survey of systems and software 2002 435 25 96%
Basic mechanisms and modeling of single-event upset in digital microelectronics 2003 347 120 93%
Clock distribution networks in synchronous digital integrated circuits 2001 156 61 74%
IBM experiments in soft fails in computer electronics (1978-1994) 1996 152 18 100%
Reconfigurable computing: architectures and design methods 2005 95 22 82%
RECENT DIRECTIONS IN NETLIST PARTITIONING - A SURVEY 1995 209 34 71%
Reconfigurable computing for digital signal processing: A survey 2001 110 22 77%
SIMULATED ANNEALING - A TOOL FOR OPERATIONAL-RESEARCH 1990 315 17 65%
Statistical timing analysis: From basic principles to state of the art 2008 95 6 33%
On-line testing for VLSI - A compendium of approaches 1998 75 10 100%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SPACE DEF ELECT 122 86% 0.2% 62
2 IBM SYST TECHNOL GRP 56 69% 0.2% 48
3 COMP AIDED DESIGN TEST GRP 33 100% 0.0% 13
4 DIPARTIMENTO AUTOMAT INFORMAT 30 21% 0.4% 132
5 NSF HIGH PERFORMANCE RECONFIGURABLE COMP CHRE 27 78% 0.1% 18
6 VLSI DESIGN 26 32% 0.2% 68
7 RADIAT EFFECTS GRP 25 71% 0.1% 20
8 ADV COMP ARCHITECTURE 23 49% 0.1% 35
9 TIMA 23 45% 0.1% 38
10 EMBEDDED COMP SYST 22 43% 0.1% 40

Related classes at same level (level 3)


Rank Relatedness score Related classes
1 0.0000003691 COMPUTER SCIENCE, SOFTWARE ENGINEERING//COMPUTER SCIENCE, THEORY & METHODS//ACM SIGPLAN NOTICES
2 0.0000002691 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY//SIGNAL PROCESSING-IMAGE COMMUNICATION//VIDEO CODING
3 0.0000002039 IEEE JOURNAL OF SOLID-STATE CIRCUITS//IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS
4 0.0000001771 MEMBRANE COMPUTING//THEORETICAL COMPUTER SCIENCE//GRP NAT COMP
5 0.0000001631 DISCRETE MATHEMATICS//JOURNAL OF GRAPH THEORY//JOURNAL OF COMBINATORIAL THEORY SERIES B
6 0.0000001602 CRYPTOGRAPHY//JOURNAL OF CRYPTOLOGY//CRYPTANALYSIS
7 0.0000001550 ON LINE ALGORITHMS//BIN PACKING//COMPETITIVE ANALYSIS
8 0.0000001260 IEEE TRANSACTIONS ON RELIABILITY//MICROELECTRONICS AND RELIABILITY//RELIABILITY ENGINEERING & SYSTEM SAFETY
9 0.0000001139 IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS
10 0.0000001031 SILICON CARBIDE//4H SIC//SIC