Class information for:
Level 3: IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
15 127408 21.9 66%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 4)



ID, lev.
above
Publications Label for level above
5 1620399 PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY

Classes in level below (level 2)



ID, lev.
below
Publications Label for level below
138 22619 IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS
252 19240 MICROCRYSTALLINE SILICON//JOURNAL OF NON-CRYSTALLINE SOLIDS//PHOTOVOLTA THIN FILM ELECT
599 13375 POROUS SILICON//SILICON NANOCRYSTALS//SI NANOCRYSTALS
603 13298 BETA FESI2//SILICIDE//SILICIDES
666 12577 SCANNING TUNNELING MICROSCOPY//ATOM WI LAYERS//VICINAL SINGLE CRYSTAL SURFACES
769 11658 SIGE//GERMANIUM//STRAINED SI
993 9970 THIN FILM TRANSISTOR//THIN FILM TRANSISTORS TFTS//THIN FILM TRANSISTOR TFT
1361 7789 HFO2//HIGH K//HIGH K DIELECTRICS
1463 7225 SILICON NANOWIRES//QUANTUM DOT CELLULAR AUTOMATA QCA//QUANTUM DOT CELLULAR AUTOMATA
2308 4091 LOW FREQUENCY NOISE//1 F NOISE//LOW FREQUENCY LF NOISE
2557 3267 INTERFACIAL SILICON EMISSION//SILICON OXIDATION//GENIE URBAIN ENVIRONM
2900 2299 PHOTORESIST REMOVAL//WET OZONE//HYDROGEN TERMINATION

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of publ.
in class
1 IEEE TRANSACTIONS ON ELECTRON DEVICES Journal 2307 36% 4% 5121
2 IEEE ELECTRON DEVICE LETTERS Journal 1815 41% 3% 3449
3 SOLID-STATE ELECTRONICS Journal 1334 34% 3% 3225
4 SILICON Author keyword 1274 24% 4% 4667
5 POROUS SILICON Author keyword 1231 55% 1% 1557
6 MICROCRYSTALLINE SILICON Author keyword 788 84% 0% 425
7 MOSFET Author keyword 725 42% 1% 1311
8 THIN SOLID FILMS Journal 706 14% 4% 4764
9 JOURNAL OF NON-CRYSTALLINE SOLIDS Journal 666 17% 3% 3654
10 THIN FILM TRANSISTOR Author keyword 630 64% 0% 624

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of publ.
in class
LCSH search Wikipedia search
1 SILICON 1274 24% 4% 4667 Search SILICON Search SILICON
2 POROUS SILICON 1231 55% 1% 1557 Search POROUS+SILICON Search POROUS+SILICON
3 MICROCRYSTALLINE SILICON 788 84% 0% 425 Search MICROCRYSTALLINE+SILICON Search MICROCRYSTALLINE+SILICON
4 MOSFET 725 42% 1% 1311 Search MOSFET Search MOSFET
5 THIN FILM TRANSISTOR 630 64% 0% 624 Search THIN+FILM+TRANSISTOR Search THIN+FILM+TRANSISTOR
6 THIN FILM TRANSISTOR TFT 611 77% 0% 412 Search THIN+FILM+TRANSISTOR+TFT Search THIN+FILM+TRANSISTOR+TFT
7 GERMANIUM 597 36% 1% 1335 Search GERMANIUM Search GERMANIUM
8 THIN FILM TRANSISTORS TFTS 560 82% 0% 327 Search THIN+FILM+TRANSISTORS+TFTS Search THIN+FILM+TRANSISTORS+TFTS
9 THIN FILM TRANSISTORS 436 55% 0% 546 Search THIN+FILM+TRANSISTORS Search THIN+FILM+TRANSISTORS
10 HIGH K 428 58% 0% 493 Search HIGH+K Search HIGH+K

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of publ.
in class
1 SI001 2848 69% 2% 2442
2 SI 2701 30% 6% 7607
3 MOSFETS 2700 59% 2% 3018
4 SILICON 2424 19% 9% 11330
5 SI100 2134 60% 2% 2356
6 POROUS SILICON 1867 50% 2% 2726
7 AMORPHOUS SILICON 1787 49% 2% 2628
8 HYDROGENATED AMORPHOUS SILICON 1553 69% 1% 1335
9 A SI H 1552 73% 1% 1186
10 MICROCRYSTALLINE SILICON 1254 70% 1% 1031

Journals



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of publ.
in class
1 IEEE TRANSACTIONS ON ELECTRON DEVICES 2307 36% 4% 5121
2 IEEE ELECTRON DEVICE LETTERS 1815 41% 3% 3449
3 SOLID-STATE ELECTRONICS 1334 34% 3% 3225
4 THIN SOLID FILMS 706 14% 4% 4764
5 JOURNAL OF NON-CRYSTALLINE SOLIDS 666 17% 3% 3654
6 MICROELECTRONICS RELIABILITY 451 26% 1% 1488
7 SURFACE SCIENCE 425 12% 3% 3235
8 MICROELECTRONIC ENGINEERING 406 20% 1% 1863
9 JAPANESE JOURNAL OF APPLIED PHYSICS 228 12% 1% 1730
10 SEMICONDUCTOR SCIENCE AND TECHNOLOGY 195 15% 1% 1161

Reviews



Title Publ. year Cit. Active references % act. ref.
to same field
Plasmonics for improved photovoltaic devices 2010 2670 80 53%
High-kappa gate dielectrics: Current status and materials properties considerations 2001 3972 93 89%
Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances 2012 431 411 78%
The structural and luminescence properties of porous silicon 1997 1877 477 93%
Silicon nanostructures for photonics and photovoltaics 2014 83 157 64%
High dielectric constant gate oxides for metal oxide Si transistors 2006 819 210 90%
Metal-Assisted Chemical Etching of Silicon: A Review 2011 396 107 70%
High-K materials and metal gates for CMOS applications 2015 6 283 88%
Light management for photovoltaics using high-index nanostructures 2014 56 92 74%
Review of recent developments in amorphous oxide semiconductor thin-film transistor devices 2012 191 100 92%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of publ.
in class
1 MICROELECT 563 18% 2.2% 2794
2 SILICON NANO DEVICE 387 81% 0.2% 232
3 PHOTOVOLTA THIN FILM ELECT 199 77% 0.1% 136
4 ADV LSI TECHNOL 178 69% 0.1% 151
5 SID PHYS DEVICES 163 95% 0.0% 55
6 DEVICE MODELLING GRP 146 81% 0.1% 87
7 ENERGY UNIT 144 60% 0.1% 157
8 SEMICOND PHYS 128 15% 0.6% 778
9 PHYS INTER ES COUCHES MINCES 127 47% 0.2% 198
10 ATOM WI LAYERS 124 90% 0.0% 54

Related classes at same level (level 3)



Rank Relatedness score Related classes
1 0.0000003468 SOVIET PHYSICS SEMICONDUCTORS-USSR//GETTERING//SILICON
2 0.0000003167 SILICON CARBIDE//4H SIC//SIC
3 0.0000001992 SEMICONDUCTOR LASERS//IEEE JOURNAL OF QUANTUM ELECTRONICS//JOURNAL OF CRYSTAL GROWTH
4 0.0000001977 SURFACE & COATINGS TECHNOLOGY//PLASMA NITRIDING//HIGH ENTROPY ALLOYS
5 0.0000001739 RESISTIVE SWITCHING//CHALCOGENIDE GLASSES//RESISTIVE RANDOM ACCESS MEMORY RRAM
6 0.0000001731 ZNO//ZINC OXIDE//SNO2
7 0.0000001500 GAN//NITRIDES//GALLIUM NITRIDE
8 0.0000001378 LASER INDUCED BREAKDOWN SPECTROSCOPY//LIBS//LASER INDUCED BREAKDOWN SPECTROSCOPY LIBS
9 0.0000001352 PLASMA SOURCES SCIENCE & TECHNOLOGY//DIELECTRIC BARRIER DISCHARGE//NON THERMAL PLASMA
10 0.0000001284 JOURNAL OF MICROELECTROMECHANICAL SYSTEMS//SENSORS AND ACTUATORS A-PHYSICAL//JOURNAL OF MICROMECHANICS AND MICROENGINEERING