Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
15 | 127408 | 21.9 | 66% |
Classes in level above (level 4) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
5 | 1620399 | PHYSICS, CONDENSED MATTER//PHYSICS, APPLIED//MATERIALS SCIENCE, MULTIDISCIPLINARY |
Classes in level below (level 2) |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | Journal | 2307 | 36% | 4% | 5121 |
2 | IEEE ELECTRON DEVICE LETTERS | Journal | 1815 | 41% | 3% | 3449 |
3 | SOLID-STATE ELECTRONICS | Journal | 1334 | 34% | 3% | 3225 |
4 | SILICON | Author keyword | 1274 | 24% | 4% | 4667 |
5 | POROUS SILICON | Author keyword | 1231 | 55% | 1% | 1557 |
6 | MICROCRYSTALLINE SILICON | Author keyword | 788 | 84% | 0% | 425 |
7 | MOSFET | Author keyword | 725 | 42% | 1% | 1311 |
8 | THIN SOLID FILMS | Journal | 706 | 14% | 4% | 4764 |
9 | JOURNAL OF NON-CRYSTALLINE SOLIDS | Journal | 666 | 17% | 3% | 3654 |
10 | THIN FILM TRANSISTOR | Author keyword | 630 | 64% | 0% | 624 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SILICON | 1274 | 24% | 4% | 4667 | Search SILICON | Search SILICON |
2 | POROUS SILICON | 1231 | 55% | 1% | 1557 | Search POROUS+SILICON | Search POROUS+SILICON |
3 | MICROCRYSTALLINE SILICON | 788 | 84% | 0% | 425 | Search MICROCRYSTALLINE+SILICON | Search MICROCRYSTALLINE+SILICON |
4 | MOSFET | 725 | 42% | 1% | 1311 | Search MOSFET | Search MOSFET |
5 | THIN FILM TRANSISTOR | 630 | 64% | 0% | 624 | Search THIN+FILM+TRANSISTOR | Search THIN+FILM+TRANSISTOR |
6 | THIN FILM TRANSISTOR TFT | 611 | 77% | 0% | 412 | Search THIN+FILM+TRANSISTOR+TFT | Search THIN+FILM+TRANSISTOR+TFT |
7 | GERMANIUM | 597 | 36% | 1% | 1335 | Search GERMANIUM | Search GERMANIUM |
8 | THIN FILM TRANSISTORS TFTS | 560 | 82% | 0% | 327 | Search THIN+FILM+TRANSISTORS+TFTS | Search THIN+FILM+TRANSISTORS+TFTS |
9 | THIN FILM TRANSISTORS | 436 | 55% | 0% | 546 | Search THIN+FILM+TRANSISTORS | Search THIN+FILM+TRANSISTORS |
10 | HIGH K | 428 | 58% | 0% | 493 | Search HIGH+K | Search HIGH+K |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SI001 | 2848 | 69% | 2% | 2442 |
2 | SI | 2701 | 30% | 6% | 7607 |
3 | MOSFETS | 2700 | 59% | 2% | 3018 |
4 | SILICON | 2424 | 19% | 9% | 11330 |
5 | SI100 | 2134 | 60% | 2% | 2356 |
6 | POROUS SILICON | 1867 | 50% | 2% | 2726 |
7 | AMORPHOUS SILICON | 1787 | 49% | 2% | 2628 |
8 | HYDROGENATED AMORPHOUS SILICON | 1553 | 69% | 1% | 1335 |
9 | A SI H | 1552 | 73% | 1% | 1186 |
10 | MICROCRYSTALLINE SILICON | 1254 | 70% | 1% | 1031 |
Journals |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | IEEE TRANSACTIONS ON ELECTRON DEVICES | 2307 | 36% | 4% | 5121 |
2 | IEEE ELECTRON DEVICE LETTERS | 1815 | 41% | 3% | 3449 |
3 | SOLID-STATE ELECTRONICS | 1334 | 34% | 3% | 3225 |
4 | THIN SOLID FILMS | 706 | 14% | 4% | 4764 |
5 | JOURNAL OF NON-CRYSTALLINE SOLIDS | 666 | 17% | 3% | 3654 |
6 | MICROELECTRONICS RELIABILITY | 451 | 26% | 1% | 1488 |
7 | SURFACE SCIENCE | 425 | 12% | 3% | 3235 |
8 | MICROELECTRONIC ENGINEERING | 406 | 20% | 1% | 1863 |
9 | JAPANESE JOURNAL OF APPLIED PHYSICS | 228 | 12% | 1% | 1730 |
10 | SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 195 | 15% | 1% | 1161 |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Plasmonics for improved photovoltaic devices | 2010 | 2670 | 80 | 53% |
High-kappa gate dielectrics: Current status and materials properties considerations | 2001 | 3972 | 93 | 89% |
Oxide Semiconductor Thin-Film Transistors: A Review of Recent Advances | 2012 | 431 | 411 | 78% |
The structural and luminescence properties of porous silicon | 1997 | 1877 | 477 | 93% |
Silicon nanostructures for photonics and photovoltaics | 2014 | 83 | 157 | 64% |
High dielectric constant gate oxides for metal oxide Si transistors | 2006 | 819 | 210 | 90% |
Metal-Assisted Chemical Etching of Silicon: A Review | 2011 | 396 | 107 | 70% |
High-K materials and metal gates for CMOS applications | 2015 | 6 | 283 | 88% |
Light management for photovoltaics using high-index nanostructures | 2014 | 56 | 92 | 74% |
Review of recent developments in amorphous oxide semiconductor thin-film transistor devices | 2012 | 191 | 100 | 92% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MICROELECT | 563 | 18% | 2.2% | 2794 |
2 | SILICON NANO DEVICE | 387 | 81% | 0.2% | 232 |
3 | PHOTOVOLTA THIN FILM ELECT | 199 | 77% | 0.1% | 136 |
4 | ADV LSI TECHNOL | 178 | 69% | 0.1% | 151 |
5 | SID PHYS DEVICES | 163 | 95% | 0.0% | 55 |
6 | DEVICE MODELLING GRP | 146 | 81% | 0.1% | 87 |
7 | ENERGY UNIT | 144 | 60% | 0.1% | 157 |
8 | SEMICOND PHYS | 128 | 15% | 0.6% | 778 |
9 | PHYS INTER ES COUCHES MINCES | 127 | 47% | 0.2% | 198 |
10 | ATOM WI LAYERS | 124 | 90% | 0.0% | 54 |
Related classes at same level (level 3) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000003468 | SOVIET PHYSICS SEMICONDUCTORS-USSR//GETTERING//SILICON |
2 | 0.0000003167 | SILICON CARBIDE//4H SIC//SIC |
3 | 0.0000001992 | SEMICONDUCTOR LASERS//IEEE JOURNAL OF QUANTUM ELECTRONICS//JOURNAL OF CRYSTAL GROWTH |
4 | 0.0000001977 | SURFACE & COATINGS TECHNOLOGY//PLASMA NITRIDING//HIGH ENTROPY ALLOYS |
5 | 0.0000001739 | RESISTIVE SWITCHING//CHALCOGENIDE GLASSES//RESISTIVE RANDOM ACCESS MEMORY RRAM |
6 | 0.0000001731 | ZNO//ZINC OXIDE//SNO2 |
7 | 0.0000001500 | GAN//NITRIDES//GALLIUM NITRIDE |
8 | 0.0000001378 | LASER INDUCED BREAKDOWN SPECTROSCOPY//LIBS//LASER INDUCED BREAKDOWN SPECTROSCOPY LIBS |
9 | 0.0000001352 | PLASMA SOURCES SCIENCE & TECHNOLOGY//DIELECTRIC BARRIER DISCHARGE//NON THERMAL PLASMA |
10 | 0.0000001284 | JOURNAL OF MICROELECTROMECHANICAL SYSTEMS//SENSORS AND ACTUATORS A-PHYSICAL//JOURNAL OF MICROMECHANICS AND MICROENGINEERING |