Class information for:
Level 2: EL2//NONIONIZING ENERGY LOSS NIEL//DX CENTERS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
913 10550 19.0 47%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 3)


ID, lev.
above		 Publications Label for level above
256 41787 SOVIET PHYSICS SEMICONDUCTORS-USSR//GETTERING//SILICON

Classes in level below (level 1)


ID, lev. below Publications Label for level below
1684 2456 EL2//CARBON ACCEPTOR//SEMI INSULATING GALLIUM ARSENIDE
5604 1534 DX CENTERS//DX CENTER//DX CENTRE
8869 1141 INFORMAT MAITRISE SCI PHYS//TECHNOL GUYANE//D5 IONS
11102 942 GAP N//PICOSECOND TIMING RESOLUTION//SI H BOND DISSOCIATION
11259 929 MAGNET SENSOR//GROUP III V EXCEPT NITRIDES//COPPER VACANCY COMPLEX
11802 889 FE DOPED INP//PHOSPHORUS VAPOR PRESSURE//WAFER ANNEALING
12522 837 NONIONIZING ENERGY LOSS NIEL//DISPLACEMENT DAMAGE DOSE//NONIONIZING ENERGY LOSS
18070 505 SCI PROD STATE ENTERPRISE//GRADED GAP ALXGA1 XAS STRUCTURES//GAAS RADIATION DETECTOR
19410 442 EMISSION RATE SPECTRUM//CAPACITANCE TRANSIENTS//DLTS RESOLUTION
23478 289 SURFACE AND INTERFACE PHENOMENA//TELECOMMUN ADVANCEMENTS ORG//SENDAI
25008 245 DOT IN A WELL STRUCTURES//EXCITATION POWER DEPENDENCES//RECOMBINATION BARRIER
27041 197 LOCAL VIBRATION MODES//DIRECT FAST SCARLET 4BS//GAAS C
29989 144 STATE SCI EXPT TECH INFORMAT PROTECT PRO//CN PPP//WIDE GAP NANOCRYSTALS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 EL2 Author keyword 27 59% 0% 30
2 NONIONIZING ENERGY LOSS NIEL Author keyword 26 87% 0% 13
3 DX CENTERS Author keyword 26 54% 0% 33
4 MAGNET SENSOR Address 24 82% 0% 14
5 DISPLACEMENT DAMAGE Author keyword 21 32% 1% 55
6 DISPLACEMENT DAMAGE DOSE Author keyword 19 80% 0% 12
7 NONIONIZING ENERGY LOSS Author keyword 19 76% 0% 13
8 GRADED GAP ALXGA1 XAS STRUCTURES Author keyword 18 83% 0% 10
9 INFORMAT MAITRISE SCI PHYS Address 18 89% 0% 8
10 PINNED PHOTODIODE PPD Author keyword 18 89% 0% 8

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 EL2 27 59% 0% 30 Search EL2 Search EL2
2 NONIONIZING ENERGY LOSS NIEL 26 87% 0% 13 Search NONIONIZING+ENERGY+LOSS+NIEL Search NONIONIZING+ENERGY+LOSS+NIEL
3 DX CENTERS 26 54% 0% 33 Search DX+CENTERS Search DX+CENTERS
4 DISPLACEMENT DAMAGE 21 32% 1% 55 Search DISPLACEMENT+DAMAGE Search DISPLACEMENT+DAMAGE
5 DISPLACEMENT DAMAGE DOSE 19 80% 0% 12 Search DISPLACEMENT+DAMAGE+DOSE Search DISPLACEMENT+DAMAGE+DOSE
6 NONIONIZING ENERGY LOSS 19 76% 0% 13 Search NONIONIZING+ENERGY+LOSS Search NONIONIZING+ENERGY+LOSS
7 GRADED GAP ALXGA1 XAS STRUCTURES 18 83% 0% 10 Search GRADED+GAP+ALXGA1+XAS+STRUCTURES Search GRADED+GAP+ALXGA1+XAS+STRUCTURES
8 PINNED PHOTODIODE PPD 18 89% 0% 8 Search PINNED+PHOTODIODE+PPD Search PINNED+PHOTODIODE+PPD
9 MONOLITHIC ACTIVE PIXEL SENSOR MAPS 17 100% 0% 8 Search MONOLITHIC+ACTIVE+PIXEL+SENSOR+MAPS Search MONOLITHIC+ACTIVE+PIXEL+SENSOR+MAPS
10 GAAS GE SOLAR CELLS 13 80% 0% 8 Search GAAS+GE+SOLAR+CELLS Search GAAS+GE+SOLAR+CELLS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SEMI INSULATING GAAS 161 63% 2% 163
2 ALXGA1 XAS ALLOYS 145 67% 1% 131
3 EL2 130 57% 1% 154
4 DX CENTERS 126 59% 1% 140
5 SEMIINSULATING GAAS 119 47% 2% 188
6 ENCAPSULATED CZOCHRALSKI GAAS 96 88% 0% 45
7 DX CENTER 95 63% 1% 96
8 ARSENIC ANTISITE DEFECT 94 77% 1% 64
9 EL2 DEFECT 75 76% 1% 53
10 SI DOPED ALXGA1 XAS 65 84% 0% 36

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 ACTA ELECTRONICA 1 11% 0% 6

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
DEEP DONOR LEVELS (DX CENTERS) IN III-V SEMICONDUCTORS 1990 548 104 86%
Review of displacement damage effects in silicon devices 2003 192 51 82%
Exponential analysis in physical phenomena 1999 257 153 33%
PHOTOLUMINESCENCE OF ALXGA1-XAS ALLOYS 1994 339 214 40%
Positron annihilation spectroscopy of defects in semiconductors 1998 70 78 51%
NATIVE DEFECTS IN GALLIUM-ARSENIDE 1988 215 160 92%
Fe in III-V and II-VI semiconductors 2008 43 84 60%
A comprehensive thermodynamic analysis of native point defect and dopant solubilities in gallium arsenide 1999 69 99 48%
IRRADIATION-INDUCED DEFECTS IN GAAS 1985 329 34 91%
Radiation effects on photonic imagers - A historical perspective 2003 38 61 64%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MAGNET SENSOR 24 82% 0.1% 14
2 INFORMAT MAITRISE SCI PHYS 18 89% 0.1% 8
3 SCI PROD STATE ENTERPRISE 17 100% 0.1% 8
4 TECHNOL GUYANE 8 100% 0.0% 5
5 SENDAI 7 30% 0.2% 19
6 GESEC RD 6 71% 0.0% 5
7 SCI STATE 6 71% 0.0% 5
8 IMAGE SENSOR TEAM 4 67% 0.0% 4
9 PROGRAM ELECT BEAM TECHNOL 4 75% 0.0% 3
10 UNIV ELE ON ACCELERATORS 4 75% 0.0% 3

Related classes at same level (level 2)


Rank Relatedness score Related classes
1 0.0000018991 MICROSYST IMICRO//MULTIPHONON RECOMBINATION//INFORMAT OPT TECHNOL
2 0.0000017475 GAAS ON SI//GAAS SI//GAINP
3 0.0000013963 LT GAAS//ULTRAHIGH FREQUENCY SEMICOND ELECT//LOW TEMPERATURE GROWN GAAS
4 0.0000013408 SWAMP//OXYGEN PRECIPITATION//GROWN IN DEFECT
5 0.0000012477 SCI PROD ASSOC PHYS SUN//STARODUBTSEV PHYSICOTECH//SOLAR PHYS PROD CORP
6 0.0000009140 EDGE DEFINED FILM FED GROWTH//MULTICRYSTALLINE SILICON//PROGRESS IN PHOTOVOLTAICS
7 0.0000008495 ENERGIA SOLAR//LUMINESCENT SOLAR CONCENTRATORS//INTERMEDIATE BAND
8 0.0000008266 GALLIUM ARSENIDE//SULFUR PASSIVATION//INDIUM ARSENIDE
9 0.0000007863 CDTE//CDZNTE//ZNSE
10 0.0000007308 GAINNAS//DILUTE NITRIDES//ANTIMONIDES