Class information for:
Level 2: SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
886 10744 25.3 51%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 3)


ID, lev.
above		 Publications Label for level above
170 54689 JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY//RAPID COMMUNICATIONS IN MASS SPECTROMETRY//PROTEOMICS

Classes in level below (level 1)


ID, lev. below Publications Label for level below
2049 2307 IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION
3489 1893 KINETIC EXCITATION//ION PHOTON EMISSION//NON ADDITIVE SPUTTERING
5107 1603 OXYGEN BOMBARDMENT//STORING MATTER TECHNIQUE//SCI ANAL MAT SAM
7249 1313 ION SPUTTERING//HBEREICH AUTOMATISIERUNG INFORMAT//ION EROSION
14409 705 MAT CHARACTERIZAT PREPARAT IL//ADV ENGN MAT IL//STATIC SECONDARY ION MASS SPECTROMETRY
14602 693 AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//AUGER TRANSITION//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY
16879 566 AUGER PARAMETER//DIFFERENTIAL CHARGING//CHARGE REFERENCING
18870 466 CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB
21234 368 SUR E THIN FILM ANAL IFOS//SNMS//POST IONIZATION
25684 227 POSIDONIUS//PLINY THE ELDER//AU PT BIMETALLIC NANOCLUSTERS
26134 216 LINEAR LEAST SQUARES FITTING//LINEAR LEAST SQUARE FIT//LINEAR LEAST SQUARE METHOD
29643 149 INDUCTIVELY COUPLED PLASMA ETCH//SIC C COMPOSITE//SIC C
31684 119 CHAIR GEN CHEM//IV P ANIN BIOL INLAND WATERS//LIB CIVIL AVIAT
34755 63 RADIOSPECTROSCOPY//SEMENENKO GEOCHEM MINERAL ORE FORMAT//POWDER TECHNOL COATINGS
35001 56 LINEAR RAMAN SPECTROSCOPY//AUTOMOBILE EXHAUST GASES//

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of publ.
in class
1 SURFACE AND INTERFACE ANALYSIS Journal 331 21% 13% 1371
2 AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS Author keyword 103 97% 0% 30
3 IMFP Author keyword 102 100% 0% 30
4 ELASTIC PEAK ELECTRON SPECTROSCOPY Author keyword 82 92% 0% 33
5 SURFACE EXCITATION Author keyword 67 87% 0% 33
6 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA Journal 61 10% 5% 578
7 SURFACE EXCITATION PARAMETER Author keyword 56 100% 0% 19
8 EPES Author keyword 49 79% 0% 31
9 INELASTIC MEAN FREE PATH Author keyword 44 61% 0% 46
10 SIMS Author keyword 37 13% 3% 279

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS 103 97% 0% 30 Search AUGER+PHOTOELECTRON+COINCIDENCE+SPECTROSCOPY+APECS Search AUGER+PHOTOELECTRON+COINCIDENCE+SPECTROSCOPY+APECS
2 IMFP 102 100% 0% 30 Search IMFP Search IMFP
3 ELASTIC PEAK ELECTRON SPECTROSCOPY 82 92% 0% 33 Search ELASTIC+PEAK+ELECTRON+SPECTROSCOPY Search ELASTIC+PEAK+ELECTRON+SPECTROSCOPY
4 SURFACE EXCITATION 67 87% 0% 33 Search SURFACE+EXCITATION Search SURFACE+EXCITATION
5 SURFACE EXCITATION PARAMETER 56 100% 0% 19 Search SURFACE+EXCITATION+PARAMETER Search SURFACE+EXCITATION+PARAMETER
6 EPES 49 79% 0% 31 Search EPES Search EPES
7 INELASTIC MEAN FREE PATH 44 61% 0% 46 Search INELASTIC+MEAN+FREE+PATH Search INELASTIC+MEAN+FREE+PATH
8 SIMS 37 13% 3% 279 Search SIMS Search SIMS
9 QUANTITATIVE SURFACE ANALYSIS 37 81% 0% 22 Search QUANTITATIVE+SURFACE+ANALYSIS Search QUANTITATIVE+SURFACE+ANALYSIS
10 ELECTRON INELASTIC MEAN FREE PATH 32 85% 0% 17 Search ELECTRON+INELASTIC+MEAN+FREE+PATH Search ELECTRON+INELASTIC+MEAN+FREE+PATH

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SPUTTERED SURFACES 192 93% 1% 74
2 ROUGHENING INSTABILITY 180 83% 1% 102
3 MEAN FREE PATHS 145 37% 3% 310
4 DEPTH DISTRIBUTION FUNCTION 115 100% 0% 33
5 BOMBARDMENT 114 17% 6% 621
6 SAMPLE ROTATION 110 73% 1% 85
7 RIPPLE TOPOGRAPHY 109 89% 0% 49
8 AES 93 24% 3% 331
9 QUANTITATIVE AES 80 84% 0% 43
10 ATTENUATION LENGTHS 79 68% 1% 69

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of publ.
in class
1 SURFACE AND INTERFACE ANALYSIS 331 21% 13% 1371
2 JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 61 10% 5% 578
3 APPLICATIONS OF SURFACE SCIENCE 5 11% 0% 42

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Making waves: Kinetic processes controlling surface evolution during low energy ion sputtering 2007 248 218 67%
Morphology of ion-sputtered surfaces 2002 280 82 62%
Evaluation of calculated and measured electron inelastic mean free paths near solid surfaces 1999 248 105 82%
Electron transport in solids for quantitative surface analysis 2001 174 121 88%
CHEMICAL-ANALYSIS OF INORGANIC AND ORGANIC-SURFACES AND THIN-FILMS BY STATIC TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY (TOF-SIMS) 1994 243 19 79%
Universality classes of inelastic electron scattering cross-sections 1997 121 43 98%
Self-organized nanopattrening of silicon surfaces by ion beam sputtering 2014 6 237 76%
Sputter depth profile analysis of interfaces 1998 115 133 83%
Auger parameter and Wagner plot in the characterization of chemical states by X-ray photoelectron spectroscopy: a review 1998 164 174 58%
Comparison of electron elastic-scattering cross sections calculated from two commonly used atomic potentials 2004 98 79 63%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SCI ANAL MAT SAM 28 57% 0.3% 33
2 SUR E MICROANAL SCI 20 26% 0.6% 66
3 MAT CHARACTERIZAT PREPARAT IL 14 38% 0.3% 30
4 SUR E THIN FILM ANAL IFOS 13 80% 0.1% 8
5 ADV SIMS PROJECTS 12 75% 0.1% 9
6 MAT MEASUREMENT TECHNOL 11 38% 0.2% 23
7 ADV SIMS PROJECT 9 83% 0.0% 5
8 ALLGEMEINE PHYS 9 14% 0.6% 60
9 HBEREICH AUTOMATISIERUNG INFORMAT 8 100% 0.0% 5
10 SPECT TRANSLAT INTERACT MOL 6 80% 0.0% 4

Related classes at same level (level 2)


Rank Relatedness score Related classes
1 0.0000021903 MOLECULAR DEPTH PROFILING//CLUSTER SIMS//ION BEAM ENGN EXPT
2 0.0000018439 ION BEAM MIXING//RADIAT BEAM MAT ENGN//BALLISTIC MIXING
3 0.0000013714 SCANNING//LAMACOP//BACKSCATTERED ELECTRONS
4 0.0000013016 IMAGING MASS SPECTROMETRY//MASS SPECTROMETRY IMAGING//MALDI IMAGING
5 0.0000010418 STOPPING POWER//LAMOR//RESONANT COHERENT EXCITATION
6 0.0000008386 HIPIMS//HPPMS//HIGH POWER IMPULSE MAGNETRON SPUTTERING
7 0.0000008289 KINETIC ROUGHENING THEORY//ROUGH ELECTRODE//RESTRICTED SOLID ON SOLID MODEL
8 0.0000007089 NOVOSHAKHTINSK BRANCH//ELE OCHEM HYDROGEN ENERGY//AMORPHOUS III V SEMICONDUCTORS
9 0.0000005924 EPITAXIAL AL2O3//METAL INSULATOR HETEROSTRUCTURE//ALKALI HALIDES
10 0.0000005563 PHOTORESIST REMOVAL//WET OZONE//HYDROGEN TERMINATION