Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
3367 | 1217 | 20.3 | 47% |
Classes in level above (level 3) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
256 | 41787 | SOVIET PHYSICS SEMICONDUCTORS-USSR//GETTERING//SILICON |
Classes in level below (level 1) |
ID, lev. below | Publications | Label for level below |
---|---|---|
18051 | 506 | AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//METAL AIR INSULATOR SEMICONDUCTOR |
21613 | 354 | ELECTRON WORK FUNCTION//AERONAUT TESTING EVALUAT//MAT SCI ENGN AERONAUT SCI |
30241 | 141 | SUPERCONDUCTIVITY MECHANISM//FUNCTIONAL DENSITY//RESONATING VALENCE BOND THEORY |
32276 | 110 | EDUC SCANNING PROBE MICROSCOPY//LOBACHEVSKY PHYS TECH//PHOTOELECTRIC SPECTROSCOPY |
32587 | 106 | HIGHLY DISPERSED FERROMAGNETICS//PULSE PROC TECHNOL//LOW ENERGY DEUTERIUM INCIDENCE |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | AC SURFACE PHOTOVOLTAGE | Author keyword | 19 | 74% | 1% | 14 |
2 | ELECTRON WORK FUNCTION | Author keyword | 7 | 42% | 1% | 13 |
3 | SUPERCONDUCTIVITY MECHANISM | Author keyword | 6 | 80% | 0% | 4 |
4 | SCANNING PHOTON MICROSCOPE | Author keyword | 6 | 58% | 1% | 7 |
5 | OXIDE CHARGE | Author keyword | 4 | 25% | 1% | 15 |
6 | METAL AIR INSULATOR SEMICONDUCTOR | Author keyword | 4 | 75% | 0% | 3 |
7 | KELVIN PROBE | Author keyword | 4 | 13% | 2% | 27 |
8 | SURFACE PHOTOVOLTAGE | Author keyword | 3 | 11% | 2% | 30 |
9 | AC PHOTOVOLTAIC METHOD | Author keyword | 3 | 100% | 0% | 3 |
10 | AERONAUT TESTING EVALUAT | Address | 3 | 100% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | AC SURFACE PHOTOVOLTAGE | 19 | 74% | 1% | 14 | Search AC+SURFACE+PHOTOVOLTAGE | Search AC+SURFACE+PHOTOVOLTAGE |
2 | ELECTRON WORK FUNCTION | 7 | 42% | 1% | 13 | Search ELECTRON+WORK+FUNCTION | Search ELECTRON+WORK+FUNCTION |
3 | SUPERCONDUCTIVITY MECHANISM | 6 | 80% | 0% | 4 | Search SUPERCONDUCTIVITY+MECHANISM | Search SUPERCONDUCTIVITY+MECHANISM |
4 | SCANNING PHOTON MICROSCOPE | 6 | 58% | 1% | 7 | Search SCANNING+PHOTON+MICROSCOPE | Search SCANNING+PHOTON+MICROSCOPE |
5 | OXIDE CHARGE | 4 | 25% | 1% | 15 | Search OXIDE+CHARGE | Search OXIDE+CHARGE |
6 | METAL AIR INSULATOR SEMICONDUCTOR | 4 | 75% | 0% | 3 | Search METAL+AIR+INSULATOR+SEMICONDUCTOR | Search METAL+AIR+INSULATOR+SEMICONDUCTOR |
7 | KELVIN PROBE | 4 | 13% | 2% | 27 | Search KELVIN+PROBE | Search KELVIN+PROBE |
8 | SURFACE PHOTOVOLTAGE | 3 | 11% | 2% | 30 | Search SURFACE+PHOTOVOLTAGE | Search SURFACE+PHOTOVOLTAGE |
9 | AC PHOTOVOLTAIC METHOD | 3 | 100% | 0% | 3 | Search AC+PHOTOVOLTAIC+METHOD | Search AC+PHOTOVOLTAIC+METHOD |
10 | RCA SOLUTION | 3 | 100% | 0% | 3 | Search RCA+SOLUTION | Search RCA+SOLUTION |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AC SURFACE PHOTOVOLTAGES | 13 | 71% | 1% | 10 |
2 | SCANNING PHOTON MICROSCOPE | 6 | 80% | 0% | 4 |
3 | KELVIN METHOD | 5 | 55% | 0% | 6 |
4 | CAPACITANCE VOLTAGE MEASUREMENT | 4 | 75% | 0% | 3 |
5 | CONTACT POTENTIAL MEASUREMENT | 4 | 75% | 0% | 3 |
6 | STRONGLY INVERTED GE | 4 | 75% | 0% | 3 |
7 | KELVIN PROBE | 4 | 14% | 2% | 26 |
8 | SURFACE PHOTOVOLTAGE SPECTROSCOPY | 4 | 20% | 1% | 17 |
9 | AC SURFACE | 3 | 100% | 0% | 3 |
10 | INDUCED NEGATIVE CHARGE | 3 | 100% | 0% | 3 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Surface photovoltage phenomena: theory, experiment, and applications | 1999 | 841 | 437 | 35% |
Application of the contact potential difference technique for on-line rubbing surface monitoring (review) | 1998 | 46 | 1 | 100% |
Surface voltage and surface photovoltage: history, theory and applications | 2001 | 108 | 24 | 50% |
Studies on alpha-Glucosidase Inhibitors Development: Magic Molecules for the Treatment of Carbohydrate Mediated Diseases | 2012 | 7 | 56 | 25% |
Some questions in fractal nanotechnology | 2008 | 0 | 14 | 14% |
Molecular Photovoltaics in Nanoscale Dimension | 2011 | 6 | 100 | 4% |
Study of the transport mechanism in molecular self-assembling devices | 2010 | 2 | 82 | 5% |
RESONANT DESCRIPTIONS OF BONDING AND REACTIVITY OF GROUP-VIII-IB METALS IN THE SOLID-STATE | 1987 | 1 | 98 | 6% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AERONAUT TESTING EVALUAT | 3 | 100% | 0.2% | 3 |
2 | MAT SCI ENGN AERONAUT SCI | 3 | 100% | 0.2% | 3 |
3 | EDUC SCANNING PROBE MICROSCOPY | 3 | 50% | 0.3% | 4 |
4 | UP A 6069 | 2 | 50% | 0.2% | 3 |
5 | METASTABLE MAT MFG TECHNOL SCI | 1 | 100% | 0.2% | 2 |
6 | MST 10 GRP | 1 | 50% | 0.2% | 2 |
7 | PULSE PROC TECHNOL | 1 | 12% | 0.6% | 7 |
8 | BIOTECNOL ECOL MICRORGANISMOS | 1 | 50% | 0.1% | 1 |
9 | FUNDAMENTAL SCI MICRONANODEVICES S | 1 | 50% | 0.1% | 1 |
10 | HRICHTUNG CHEM 8 1 | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 2) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000020176 | PHOTORESIST REMOVAL//WET OZONE//HYDROGEN TERMINATION |
2 | 0.0000013627 | EDGE DEFINED FILM FED GROWTH//MULTICRYSTALLINE SILICON//PROGRESS IN PHOTOVOLTAICS |
3 | 0.0000012235 | INTERFACIAL SILICON EMISSION//SILICON OXIDATION//GENIE URBAIN ENVIRONM |
4 | 0.0000012145 | GALLIUM ARSENIDE//SULFUR PASSIVATION//INDIUM ARSENIDE |
5 | 0.0000011336 | STOMATOPODA//STEELMAKING SLAG//ORATOSQUILLA ORATORIA |
6 | 0.0000011124 | NUCLEAR FIELD SHIFT//THERMIONIC CONTRAST//ISOTOPE SEPARATION |
7 | 0.0000011027 | LATERAL PHOTOVOLTAGE//CEMOP//CONTINUOUS POSITION SENSITIVE DETECTOR |
8 | 0.0000010703 | ELECT ENGN OPTOELECT TECHNOL//GAN PHOTOCATHODE//GAAS PHOTOCATHODE |
9 | 0.0000009946 | FIELD EMISSION//VACUUM MICROELECTRONICS//FIELD EMITTER ARRAY |
10 | 0.0000009042 | HYDROGEN SENSOR//S SENCE//HYDROGEN SENSORS |