Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
33 | 32935 | 20.9 | 80% |
Classes in level above (level 3) |
Classes in level below (level 1) |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | GAN | Author keyword | 3015 | 58% | 10% | 3430 |
2 | NITRIDES | Author keyword | 865 | 45% | 4% | 1445 |
3 | GALLIUM NITRIDE | Author keyword | 783 | 56% | 3% | 956 |
4 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | Journal | 744 | 83% | 1% | 415 |
5 | INGAN | Author keyword | 679 | 62% | 2% | 708 |
6 | ALGAN | Author keyword | 485 | 60% | 2% | 531 |
7 | GALLIUM COMPOUNDS | Author keyword | 420 | 46% | 2% | 691 |
8 | ALGAN GAN | Author keyword | 338 | 64% | 1% | 335 |
9 | AKASAKI | Address | 322 | 97% | 0% | 93 |
10 | INN | Author keyword | 312 | 69% | 1% | 270 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | GAN | 3015 | 58% | 10% | 3430 | Search GAN | Search GAN |
2 | NITRIDES | 865 | 45% | 4% | 1445 | Search NITRIDES | Search NITRIDES |
3 | GALLIUM NITRIDE | 783 | 56% | 3% | 956 | Search GALLIUM+NITRIDE | Search GALLIUM+NITRIDE |
4 | INGAN | 679 | 62% | 2% | 708 | Search INGAN | Search INGAN |
5 | ALGAN | 485 | 60% | 2% | 531 | Search ALGAN | Search ALGAN |
6 | GALLIUM COMPOUNDS | 420 | 46% | 2% | 691 | Search GALLIUM+COMPOUNDS | Search GALLIUM+COMPOUNDS |
7 | ALGAN GAN | 338 | 64% | 1% | 335 | Search ALGAN+GAN | Search ALGAN+GAN |
8 | INN | 312 | 69% | 1% | 270 | Search INN | Search INN |
9 | HYDRIDE VAPOR PHASE EPITAXY | 301 | 79% | 1% | 194 | Search HYDRIDE+VAPOR+PHASE+EPITAXY | Search HYDRIDE+VAPOR+PHASE+EPITAXY |
10 | METALORGANIC CHEMICAL VAPOR DEPOSITION | 259 | 47% | 1% | 412 | Search METALORGANIC+CHEMICAL+VAPOR+DEPOSITION | Search METALORGANIC+CHEMICAL+VAPOR+DEPOSITION |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | GAN | 4165 | 53% | 17% | 5452 |
2 | GALLIUM NITRIDE | 2304 | 69% | 6% | 1975 |
3 | ALN | 1059 | 52% | 4% | 1441 |
4 | INN | 912 | 66% | 3% | 853 |
5 | VAPOR PHASE EPITAXY | 905 | 40% | 5% | 1789 |
6 | SAPPHIRE | 743 | 33% | 6% | 1822 |
7 | N TYPE GAN | 686 | 72% | 2% | 545 |
8 | INDIUM NITRIDE | 685 | 81% | 1% | 417 |
9 | FUNDAMENTAL BAND GAP | 608 | 78% | 1% | 405 |
10 | ALGAN | 563 | 75% | 1% | 411 |
Journals |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MRS INTERNET JOURNAL OF NITRIDE SEMICONDUCTOR RESEARCH | 744 | 83% | 1% | 415 |
2 | APPLIED PHYSICS EXPRESS | 77 | 15% | 1% | 470 |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Advances in transparent glass-ceramic phosphors for white light-emitting diodes-A review | 2015 | 6 | 36 | 61% |
When group-III nitrides go infrared: New properties and perspectives | 2009 | 373 | 259 | 89% |
First-principles calculations for defects and impurities: Applications to III-nitrides | 2004 | 1012 | 153 | 75% |
Band parameters for nitrogen-containing semiconductors | 2003 | 1372 | 362 | 61% |
GaN based nanorods for solid state lighting | 2012 | 144 | 126 | 91% |
Luminescence properties of defects in GaN | 2005 | 662 | 471 | 80% |
GaN: Processing, defects, and devices | 1999 | 1033 | 405 | 75% |
Ultraviolet light-emitting diodes based on group three nitrides | 2008 | 246 | 78 | 99% |
Indium nitride (InN): A review on growth, characterization, and properties | 2003 | 565 | 149 | 97% |
The roles of structural imperfections in InGaN-Based blue light-emitting diodes and laser diodes | 1998 | 1047 | 62 | 97% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AKASAKI | 322 | 97% | 0.3% | 93 |
2 | CRHEA | 235 | 58% | 0.8% | 268 |
3 | NITRIDE SEMICOND | 164 | 88% | 0.2% | 76 |
4 | SEMICOND | 149 | 14% | 2.9% | 953 |
5 | LED BUSINESS | 138 | 96% | 0.1% | 44 |
6 | UCSB GRP | 130 | 97% | 0.1% | 36 |
7 | GAN DEVICE TECHNOL | 122 | 95% | 0.1% | 40 |
8 | NANODEVICE SYST | 116 | 74% | 0.3% | 87 |
9 | STATE ARTIFICIAL MICROSTRUCT MESOSCOP P | 113 | 43% | 0.6% | 204 |
10 | RECH HETEROEPITAXIE PLICAT | 102 | 65% | 0.3% | 97 |
Related classes at same level (level 2) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000011218 | GALLIUM OXIDE//BETA GA2O3//GA2O3 |
2 | 0.0000008685 | ERBIUM//ERBIUM DOPED SILICON//ERBIUM IMPLANTATION |
3 | 0.0000006933 | INTERFACIAL SHEARS//MICROBENDING LOSS//RAPID THERMAL PROCESSING RTP |
4 | 0.0000005944 | SILICON CARBIDE//4H SIC//SIC |
5 | 0.0000005621 | GAINNAS//DILUTE NITRIDES//ANTIMONIDES |
6 | 0.0000005468 | SILICON NANOWIRES//QUANTUM DOT CELLULAR AUTOMATA QCA//QUANTUM DOT CELLULAR AUTOMATA |
7 | 0.0000005102 | ELECT ENGN OPTOELECT TECHNOL//GAN PHOTOCATHODE//GAAS PHOTOCATHODE |
8 | 0.0000005097 | IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL//SURFACE ACOUSTIC WAVE//PIEZOELECT DEVICE |
9 | 0.0000004800 | GAMNAS//GA MNAS//MNAS |
10 | 0.0000004484 | LT GAAS//ULTRAHIGH FREQUENCY SEMICOND ELECT//LOW TEMPERATURE GROWN GAAS |