Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
3034 | 1987 | 23.3 | 44% |
Classes in level above (level 3) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
26 | 108319 | METALLURGY & METALLURGICAL ENGINEERING//MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING//JOURNAL OF MATERIALS PROCESSING TECHNOLOGY |
Classes in level below (level 1) |
ID, lev. below | Publications | Label for level below |
---|---|---|
15215 | 656 | LINE PROFILE ANALYSIS//X RAY PEAK PROFILE ANALYSIS//WHOLE POWDER PATTERN MODELLING |
17547 | 530 | AIIBVI COMPOUNDS//ONE DIMENSIONAL DISORDER//PLANAR DISORDER |
19488 | 438 | PAIR DISTRIBUTION FUNCTION//TOTAL SCATTERING//ATOMIC PAIR DISTRIBUTION |
26838 | 201 | CRYSTAL IMPERFECTION PARAMETERS//LALS//STUDIES SERICULTURE |
33723 | 86 | SUBSTRUCTURE INHOMOGENEITY//GENERALIZED POLE FIGURE//X RAY LINE PROFILE |
34221 | 76 | LOCAL AND GLOBAL STRUCTURE//BEIJING SYNCHROTRON RADIAT ILITIES//SUPPORTED GOLD CATALYSTS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | LINE PROFILE ANALYSIS | Author keyword | 28 | 47% | 2% | 45 |
2 | X RAY PEAK PROFILE ANALYSIS | Author keyword | 21 | 90% | 0% | 9 |
3 | WHOLE POWDER PATTERN MODELLING | Author keyword | 15 | 82% | 0% | 9 |
4 | SUBSTRUCTURE INHOMOGENEITY | Author keyword | 12 | 75% | 0% | 9 |
5 | CONTRAST FACTORS | Author keyword | 8 | 100% | 0% | 5 |
6 | X RAY LINE PROFILE | Author keyword | 7 | 64% | 0% | 7 |
7 | AIIBVI COMPOUNDS | Author keyword | 6 | 80% | 0% | 4 |
8 | DISLOCATION CHARACTER | Author keyword | 6 | 80% | 0% | 4 |
9 | ONE DIMENSIONAL DISORDER | Author keyword | 6 | 71% | 0% | 5 |
10 | GENERALIZED POLE FIGURE | Author keyword | 5 | 47% | 0% | 8 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PLASTICALLY DEFORMED CRYSTALS | 56 | 74% | 2% | 42 |
2 | NON CUBIC MATERIALS | 42 | 83% | 1% | 24 |
3 | AUTOMATIC REFINEMENT | 35 | 89% | 1% | 16 |
4 | HEXAGONAL CRYSTALS | 34 | 60% | 2% | 37 |
5 | LINE PROFILE ANALYSIS | 29 | 42% | 3% | 53 |
6 | CONTRAST FACTORS | 21 | 71% | 1% | 17 |
7 | 2H 12R | 21 | 90% | 0% | 9 |
8 | CRYSTALLITE SIZE DISTRIBUTION | 20 | 53% | 1% | 27 |
9 | DISLOCATION CONTRAST | 18 | 46% | 1% | 29 |
10 | LATTICE IMPERFECTIONS | 15 | 71% | 1% | 12 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Line broadening analysis using integral breadth methods: a critical review | 2004 | 127 | 37 | 65% |
The crystallography of correlated disorder | 2015 | 1 | 60 | 30% |
A SURVEY OF THE PHENOMENON OF POLYTYPISM IN CRYSTALS | 1991 | 71 | 110 | 55% |
Pitfalls in the characterization of nanoporous and nanosized materials | 2011 | 33 | 29 | 28% |
The problem with determining atomic structure at the nanoscale | 2007 | 198 | 49 | 16% |
Analysis of disordered materials using total scattering and the atomic pair distribution function | 2006 | 15 | 26 | 58% |
X-RAY-DIFFRACTION LINE BROADENING - MODELING AND APPLICATIONS TO HIGH-TC SUPERCONDUCTORS | 1993 | 78 | 72 | 22% |
MICROPARACRYSTALS - THE INTERMEDIATE STAGE BETWEEN CRYSTALLINE AND AMORPHOUS | 1991 | 50 | 21 | 43% |
DIFFUSE-X-RAY SCATTERING AND MODELS OF DISORDER | 1985 | 96 | 15 | 67% |
Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis | 2007 | 21 | 78 | 53% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | STUDIES SERICULTURE | 2 | 50% | 0.2% | 3 |
2 | BEIJING SYNCHROTRON RADIAT ILITIES | 1 | 100% | 0.1% | 2 |
3 | MCX BEAMLINE | 1 | 50% | 0.1% | 2 |
4 | PETR MIN | 1 | 50% | 0.1% | 2 |
5 | XRAY CRYSTAL GROWTH | 1 | 100% | 0.1% | 2 |
6 | MATEMAT KRYPTOL | 1 | 25% | 0.2% | 3 |
7 | B UJI ENGN TECHNOL | 1 | 50% | 0.1% | 1 |
8 | BIO NANOSYSTEMS IBN 3 | 1 | 50% | 0.1% | 1 |
9 | CHAIR MAT IMPACT ENGN | 1 | 50% | 0.1% | 1 |
10 | CHIM SOLIDE INORGAN | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 2) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000020124 | ACTA CRYSTALLOGRAPHICA SECTION D-BIOLOGICAL CRYSTALLOGRAPHY//ACTA CRYSTALLOGRAPHICA SECTION A//JOURNAL OF APPLIED CRYSTALLOGRAPHY |
2 | 0.0000019196 | SEVERE PLASTIC DEFORMATION//EQUAL CHANNEL ANGULAR PRESSING//PHYS ADV MAT |
3 | 0.0000013820 | PHONON HOLE BURNING//PIEZOELECTRIC POWDER//CONTINUOUS HYDROTHERMAL FLOW SYNTHESIS |
4 | 0.0000011274 | TEXTURES AND MICROSTRUCTURES//SECONDARY RECRYSTALLIZATION//RECRYSTALLIZATION |
5 | 0.0000010845 | NEGATIVE THERMAL EXPANSION//ZRW2O8//ANTIPEROVSKITE |
6 | 0.0000008928 | TWIP STEEL//EPSILON MARTENSITE//TWIP |
7 | 0.0000008013 | STRUCT ORGAN ANAL//AZANION//AB INITIO FORCE FIELD |
8 | 0.0000007824 | ICSAELS//PHYSICAL MESOMECHANICS//STRENGTH PHYS MAT SCI |
9 | 0.0000007591 | MECHANICAL ALLOYING//HEUSLER ALLOY//HEUSLER ALLOYS |
10 | 0.0000007252 | SET COVARIANCE//LEHRSTUHL FUNKT MAT//BK MOL SCI |