Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
2880 | 2335 | 15.4 | 39% |
Classes in level above (level 3) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
280 | 38393 | ULTRAMICROSCOPY//MICROSCOPY//JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B |
Classes in level below (level 1) |
ID, lev. below | Publications | Label for level below |
---|---|---|
13604 | 761 | WEDGE AND STRIP ANODE//MICROCHANNEL PLATE//POSITION SENSITIVE ANODE |
13898 | 742 | CANONICAL ABERRATION THEORY//OPT PHYS ELECT ENGN//ACCURACY OF COMPUTATION |
18196 | 499 | SECOND ORDER FOCUSING//SPACE PLASMA INSTRUMENT//SPHERICAL CONDENSER |
25783 | 224 | HAIRPIN FILAMENT//POINT CATHODE//MICROWAVE COMMUN SYST GRP |
32338 | 109 |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | WEDGE AND STRIP ANODE | Author keyword | 12 | 86% | 0% | 6 |
2 | CANONICAL ABERRATION THEORY | Author keyword | 11 | 100% | 0% | 6 |
3 | OPT PHYS ELECT ENGN | Address | 11 | 100% | 0% | 6 |
4 | MICROCHANNEL PLATE | Author keyword | 9 | 18% | 2% | 43 |
5 | SECOND ORDER FOCUSING | Author keyword | 8 | 100% | 0% | 5 |
6 | ACCURACY OF COMPUTATION | Author keyword | 6 | 80% | 0% | 4 |
7 | THIN LENS APPROXIMATION | Author keyword | 6 | 80% | 0% | 4 |
8 | ELECTROSTATIC LENS | Author keyword | 6 | 38% | 1% | 12 |
9 | POSITION SENSITIVE ANODE | Author keyword | 4 | 67% | 0% | 4 |
10 | ABERRATION COEFFICIENTS | Author keyword | 4 | 50% | 0% | 6 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MASS SEPARATORS | 17 | 100% | 0% | 8 |
2 | STRIP ANODES | 16 | 65% | 1% | 15 |
3 | HIGH COUNT RATES | 13 | 67% | 1% | 12 |
4 | TUNED FIELDS | 13 | 80% | 0% | 8 |
5 | MAGNEX SPECTROMETER | 10 | 63% | 0% | 10 |
6 | BEAM LITHOGRAPHY SYSTEMS | 10 | 58% | 0% | 11 |
7 | PARTICLE SPECTROGRAPHS | 9 | 83% | 0% | 5 |
8 | INTMAG | 8 | 75% | 0% | 6 |
9 | THIRD ORDER APPROXIMATION | 6 | 80% | 0% | 4 |
10 | MICROCHANNEL PLATES | 6 | 23% | 1% | 22 |
Journals |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ADVANCES IN ELECTRONINCS AND ELECTRON PHYSICS | 2 | 16% | 0% | 11 |
2 | ADVANCES IN IMAGING AND ELECTRON PHYSICS | 1 | 12% | 0% | 6 |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Recent advances in detector-array technology for mass spectrometry | 2004 | 21 | 67 | 61% |
DESIGN OF ELECTRON SPECTROMETERS | 1990 | 62 | 66 | 55% |
Detectors for single-molecule fluorescence imaging and spectroscopy | 2007 | 45 | 123 | 17% |
CANONICAL THEORY IN ELECTRON OPTICS | 1991 | 14 | 14 | 100% |
The hemispherical deflector analyser revisited. I. Motion in the ideal 1/r potential, generalized entry conditions, Kepler orbits and spectrometer basic equation | 2002 | 26 | 22 | 68% |
Charged Particles in Electromagnetic Fields | 2009 | 12 | 251 | 27% |
The Work of Albert Victor Crewe on the Scanning Transmission Electron Microscope and Related Topics | 2009 | 8 | 87 | 36% |
Detector arrays in spectroscopy | 1996 | 6 | 21 | 95% |
Plasma experiment for planetary exploration (PEPE) | 2007 | 3 | 18 | 67% |
Charged particle optics of systems with narrow gaps: A perturbation theory approach | 1998 | 2 | 56 | 77% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | OPT PHYS ELECT ENGN | 11 | 100% | 0.3% | 6 |
2 | EXPT ASTROPHYS GRP | 3 | 19% | 0.6% | 13 |
3 | MICROWAVE COMMUN SYST GRP | 1 | 25% | 0.2% | 5 |
4 | OPTRON ENGN | 1 | 100% | 0.1% | 2 |
5 | COLOGNEAMS | 1 | 50% | 0.0% | 1 |
6 | DEVICE ELECT | 1 | 50% | 0.0% | 1 |
7 | DIP SISTEMI ELETTR AUTOMAZIONE | 1 | 50% | 0.0% | 1 |
8 | FLEROV | 1 | 29% | 0.1% | 2 |
9 | SCI EXPT THEORET PHYS | 0 | 13% | 0.1% | 3 |
10 | AF JOFFE PHYSICOTECH | 0 | 33% | 0.0% | 1 |
Related classes at same level (level 2) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000014451 | EUV LITHOG//UNDULATORS//SPECTROMICROSCOPY |
2 | 0.0000012913 | SCANNING//LAMACOP//BACKSCATTERED ELECTRONS |
3 | 0.0000012090 | JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B//MICROELECTRONIC ENGINEERING//JOURNAL OF PHOTOPOLYMER SCIENCE AND TECHNOLOGY |
4 | 0.0000009567 | PROTON BEAM WRITING//NUCLEAR MICROPROBE//ION BEAM PLICAT |
5 | 0.0000009203 | IMPREGNATED CATHODES//OXIDE CATHODE//SCANDATE CATHODE |
6 | 0.0000008285 | MESH EXPERIMENT//CHARGE CLOUD SHAPE//X RAY EVENT |
7 | 0.0000008262 | ELECT ENGN OPTOELECT TECHNOL//GAN PHOTOCATHODE//GAAS PHOTOCATHODE |
8 | 0.0000008177 | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIAT//JOURNAL OF INSTRUMENTATION//IEEE TRANSACTIONS ON NUCLEAR SCIENCE |
9 | 0.0000007643 | PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS//PARTICLE ACCELERATORS//PROTON ENGN FRONTIER PROJECT |
10 | 0.0000006998 | GRAIN BOUNDARY DETECTION//SCANNING X RAY ANALYTICAL MICROSCOPE//QUANTUM DOT QUANTUM WELL QDQW |