Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
2308 | 4091 | 19.1 | 52% |
Classes in level above (level 3) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
15 | 127408 | IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS |
Classes in level below (level 1) |
ID, lev. below | Publications | Label for level below |
---|---|---|
2145 | 2274 | LOW FREQUENCY NOISE//1 F NOISE//LOW FREQUENCY LF NOISE |
14187 | 721 | SILVER PASTES//CONDUCTING POWDER//SILVER PASTE |
17215 | 547 | THICK FILM RESISTORS//ELECTROCOMPONENT SCIENCE AND TECHNOLOGY//THICK FILM RESISTOR |
23289 | 296 | MICROSYST ELECT PHOTON//LOW TEMPERATURE CO FIRED CERAMICS//BIPARAMETRIC ANALYSIS |
24736 | 253 | FLUCTUATION ENHANCED SENSING//ADSORPTION DESORPTION NOISE//NOISE BASED LOGIC |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | LOW FREQUENCY NOISE | Author keyword | 60 | 27% | 5% | 190 |
2 | 1 F NOISE | Author keyword | 32 | 17% | 4% | 175 |
3 | LOW FREQUENCY LF NOISE | Author keyword | 23 | 74% | 0% | 17 |
4 | FLUCTUATION AND NOISE LETTERS | Journal | 16 | 15% | 2% | 98 |
5 | OXIDE TRAP DENSITY | Author keyword | 15 | 77% | 0% | 10 |
6 | FLUCTUATION ENHANCED SENSING | Author keyword | 15 | 73% | 0% | 11 |
7 | PROD MICROTECH | Address | 12 | 53% | 0% | 16 |
8 | MICROSYST ELECT PHOTON | Address | 11 | 13% | 2% | 75 |
9 | ADSORPTION DESORPTION NOISE | Author keyword | 11 | 69% | 0% | 9 |
10 | FLICKER NOISE | Author keyword | 10 | 16% | 1% | 58 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | LOW FREQUENCY NOISE | 60 | 27% | 5% | 190 | Search LOW+FREQUENCY+NOISE | Search LOW+FREQUENCY+NOISE |
2 | 1 F NOISE | 32 | 17% | 4% | 175 | Search 1+F+NOISE | Search 1+F+NOISE |
3 | LOW FREQUENCY LF NOISE | 23 | 74% | 0% | 17 | Search LOW+FREQUENCY+LF+NOISE | Search LOW+FREQUENCY+LF+NOISE |
4 | OXIDE TRAP DENSITY | 15 | 77% | 0% | 10 | Search OXIDE+TRAP+DENSITY | Search OXIDE+TRAP+DENSITY |
5 | FLUCTUATION ENHANCED SENSING | 15 | 73% | 0% | 11 | Search FLUCTUATION+ENHANCED+SENSING | Search FLUCTUATION+ENHANCED+SENSING |
6 | ADSORPTION DESORPTION NOISE | 11 | 69% | 0% | 9 | Search ADSORPTION+DESORPTION+NOISE | Search ADSORPTION+DESORPTION+NOISE |
7 | FLICKER NOISE | 10 | 16% | 1% | 58 | Search FLICKER+NOISE | Search FLICKER+NOISE |
8 | NOISE BASED LOGIC | 8 | 75% | 0% | 6 | Search NOISE+BASED+LOGIC | Search NOISE+BASED+LOGIC |
9 | RANDOM TELEGRAPH SIGNAL RTS NOISE | 8 | 52% | 0% | 11 | Search RANDOM+TELEGRAPH+SIGNAL+RTS+NOISE | Search RANDOM+TELEGRAPH+SIGNAL+RTS+NOISE |
10 | GENERATION RECOMBINATION GR NOISE | 8 | 100% | 0% | 5 | Search GENERATION+RECOMBINATION+GR+NOISE | Search GENERATION+RECOMBINATION+GR+NOISE |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | 1 F NOISE | 149 | 22% | 15% | 611 |
2 | LOW FREQUENCY NOISE | 115 | 32% | 7% | 294 |
3 | FLICKER NOISE | 42 | 34% | 2% | 102 |
4 | CERMET RESISTORS | 36 | 77% | 1% | 24 |
5 | THICK FILM RESISTORS | 35 | 46% | 1% | 57 |
6 | MOSTS | 27 | 92% | 0% | 11 |
7 | GLASS FRIT | 27 | 83% | 0% | 15 |
8 | TEMPERATURE COFIRED CERAMICS | 26 | 43% | 1% | 46 |
9 | THICK FILM CONTACTS | 25 | 75% | 0% | 18 |
10 | RTS NOISE | 23 | 70% | 0% | 19 |
Journals |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FLUCTUATION AND NOISE LETTERS | 16 | 15% | 2% | 98 |
2 | ELECTROCOMPONENT SCIENCE AND TECHNOLOGY | 8 | 28% | 1% | 24 |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
CERAMIC POWDER SYNTHESIS BY SPRAY-PYROLYSIS | 1993 | 690 | 41 | 46% |
NOISE IN SOLID-STATE MICROSTRUCTURES - A NEW PERSPECTIVE ON INDIVIDUAL DEFECTS, INTERFACE STATES AND LOW-FREQUENCY (1/F) NOISE | 1989 | 741 | 47 | 55% |
1/F NOISE AND OTHER SLOW, NONEXPONENTIAL KINETICS IN CONDENSED MATTER | 1988 | 930 | 97 | 56% |
Overview on fabrication of three-dimensional structures in multi-layer ceramic substrate | 2010 | 29 | 29 | 76% |
Thick-film sensors: Past, present and future | 1997 | 144 | 35 | 37% |
Low-frequency noise in silicon-on-insulator devices and technologies | 2007 | 21 | 90 | 70% |
UNIFIED PRESENTATION OF 1/F NOISE IN ELECTRONIC DEVICES - FUNDAMENTAL 1/F NOISE SOURCES | 1988 | 191 | 29 | 100% |
Measurement of 1/f noise and its application in materials science | 2002 | 49 | 86 | 65% |
Review of Bi2O3 based glasses for electronics and related applications | 2013 | 12 | 314 | 27% |
Traps centers impact on Silicon nanocrystal memories given by Random Telegraph Signal and low frequency noise | 2011 | 5 | 12 | 83% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PROD MICROTECH | 12 | 53% | 0.4% | 16 |
2 | MICROSYST ELECT PHOTON | 11 | 13% | 1.8% | 75 |
3 | RADIOPHYS DEP | 8 | 100% | 0.1% | 5 |
4 | THICK FILM MAT ELECT PACKAGING | 4 | 67% | 0.1% | 4 |
5 | GRMNT | 4 | 75% | 0.1% | 3 |
6 | MICROPERIPHER GRP | 4 | 75% | 0.1% | 3 |
7 | WETIL | 4 | 75% | 0.1% | 3 |
8 | THICK FILM MAT | 4 | 46% | 0.1% | 6 |
9 | ELECT FUNDAMENTALS | 3 | 23% | 0.3% | 13 |
10 | PHYS SEMICOND MICROELECT | 3 | 26% | 0.3% | 11 |
Related classes at same level (level 2) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000013839 | IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS |
2 | 0.0000011639 | HETEROJUNCTION BIPOLAR TRANSISTORS//HETEROJUNCTION BIPOLAR TRANSISTORS HBTS//HETEROJUNCTION BIPOLAR TRANSISTOR HBT |
3 | 0.0000008336 | EXTREMAL ELASTIC STRUCTURES//CONDUCTIVE POLYMER COMPOSITES//CONDUCTIVE POLYMER COMPOSITE |
4 | 0.0000007662 | NTC THERMISTOR//NICKEL MANGANITE//NTC THERMISTORS |
5 | 0.0000006505 | EDGE DEFINED FILM FED GROWTH//MULTICRYSTALLINE SILICON//PROGRESS IN PHOTOVOLTAICS |
6 | 0.0000006389 | THERMAL FLOW SENSOR//MICROHOTPLATE//THERMOPILE |
7 | 0.0000006154 | DIFFUSION BARRIER//ELECTROMIGRATION//CU METALLIZATION |
8 | 0.0000005893 | LT GAAS//ULTRAHIGH FREQUENCY SEMICOND ELECT//LOW TEMPERATURE GROWN GAAS |
9 | 0.0000005352 | INTERFACIAL SILICON EMISSION//SILICON OXIDATION//GENIE URBAIN ENVIRONM |
10 | 0.0000005277 | OKON ERNAHRUNGSWIRT AFT//ELECT MFG ENGN GRP//TIME PRESSURE DISPENSING |