Class information for:
Level 2: MOLECULAR DEPTH PROFILING//CLUSTER SIMS//ION BEAM ENGN EXPT

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2253 4237 25.7 66%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 3)


ID, lev.
above		 Publications Label for level above
170 54689 JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY//RAPID COMMUNICATIONS IN MASS SPECTROMETRY//PROTEOMICS

Classes in level below (level 1)


ID, lev. below Publications Label for level below
4055 1781 MOLECULAR DEPTH PROFILING//CLUSTER SIMS//ION BEAM ENGN EXPT
14066 730 NANOSCALE PHYS//NANO CLUSTER DEVICES LTD//PLASMA GAS CONDENSATION
15483 640 SURFACE INDUCED DISSOCIATION//ION SURFACE COLLISIONS//ION SOFT LANDING
18941 463 NANOPHYS FRONTIER PROJECTS//NANOPHYS FRONTIER PROJECT//ELE ON INFORMAT SCI
20754 386 LANGMUIR SORPTION MODEL//ION CLUSTER BEAM DEPOSITION//IONIZED CLUSTER BEAM TECHNIQUE
28804 162 NE ZHUKOVSKII CENT AEROHYDRODYNAM//TRANSPORT INTENSIFICATION//PORE STRUCTURE STABILITY
34268 75 GAS JET DEPOSITION//ELECTRON BEAM PLASMA//JET VAPOR DEPOSITION

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MOLECULAR DEPTH PROFILING Author keyword 76 93% 1% 28
2 CLUSTER SIMS Author keyword 56 84% 1% 31
3 ION BEAM ENGN EXPT Address 55 59% 1% 61
4 SURFACE INDUCED DISSOCIATION Author keyword 49 66% 1% 46
5 CLUSTER IMPACT Author keyword 45 80% 1% 28
6 CLUSTER PROJECTILES Author keyword 41 100% 0% 15
7 GAS CLUSTER ION BEAM Author keyword 38 63% 1% 38
8 NANOPHYS FRONTIER PROJECTS Address 38 86% 0% 19
9 CLUSTER ION Author keyword 35 51% 1% 49
10 NANOPHYS FRONTIER PROJECT Address 33 74% 1% 25

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 MOLECULAR DEPTH PROFILING 76 93% 1% 28 Search MOLECULAR+DEPTH+PROFILING Search MOLECULAR+DEPTH+PROFILING
2 CLUSTER SIMS 56 84% 1% 31 Search CLUSTER+SIMS Search CLUSTER+SIMS
3 SURFACE INDUCED DISSOCIATION 49 66% 1% 46 Search SURFACE+INDUCED+DISSOCIATION Search SURFACE+INDUCED+DISSOCIATION
4 CLUSTER IMPACT 45 80% 1% 28 Search CLUSTER+IMPACT Search CLUSTER+IMPACT
5 CLUSTER PROJECTILES 41 100% 0% 15 Search CLUSTER+PROJECTILES Search CLUSTER+PROJECTILES
6 GAS CLUSTER ION BEAM 38 63% 1% 38 Search GAS+CLUSTER+ION+BEAM Search GAS+CLUSTER+ION+BEAM
7 CLUSTER ION 35 51% 1% 49 Search CLUSTER+ION Search CLUSTER+ION
8 METAL CLUSTER COMPLEX 27 92% 0% 11 Search METAL+CLUSTER+COMPLEX Search METAL+CLUSTER+COMPLEX
9 CLUSTER ION BEAM 26 57% 1% 31 Search CLUSTER+ION+BEAM Search CLUSTER+ION+BEAM
10 ORGANIC DEPTH PROFILING 26 100% 0% 11 Search ORGANIC+DEPTH+PROFILING Search ORGANIC+DEPTH+PROFILING

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 GA BOMBARDMENT 108 88% 1% 51
2 ASSEMBLED MONOLAYER SURFACES 99 77% 2% 67
3 POLYATOMIC IONS 90 48% 3% 137
4 COALESCENCE GROWTH 62 92% 1% 24
5 SLOW POLYATOMIC IONS 62 92% 1% 24
6 BUCKMINSTERFULLERENE PROBE 56 89% 1% 25
7 THERMAL KINETIC ENERGIES 55 92% 1% 22
8 ETHANOL MOLECULAR IONS 52 100% 0% 18
9 CLUSTER BOMBARDMENT 46 82% 1% 27
10 MICROSCOPIC INSIGHTS 42 83% 1% 24

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
CLUSTER SECONDARY ION MASS SPECTROMETRY OF POLYMERS AND RELATED MATERIALS 2010 109 222 57%
Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions 2013 29 174 56%
Cluster-surface interaction: From soft landing to implantation 2011 63 298 53%
DEVELOPMENTS IN MOLECULAR SIMS DEPTH PROFILING AND 3D IMAGING OF BIOLOGICAL SYSTEMS USING POLYATOMIC PRIMARY IONS 2011 52 76 63%
Computational view of surface based organic mass spectrometry 2008 76 91 56%
Progress and applications of cluster ion beam technology 2015 1 20 95%
Biological Cluster Mass Spectrometry 2010 36 51 75%
Growth of nanostructures by cluster deposition: Experiments and simple models 1999 449 151 23%
Molecular sputter depth profiling using carbon cluster beams 2010 24 54 94%
A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems 2010 40 46 61%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ION BEAM ENGN EXPT 55 59% 1.4% 61
2 NANOPHYS FRONTIER PROJECTS 38 86% 0.4% 19
3 NANOPHYS FRONTIER PROJECT 33 74% 0.6% 25
4 PCPM 15 33% 0.8% 36
5 ELE ON OPT SALES 14 100% 0.2% 7
6 NANOSCALE PHYS 12 19% 1.3% 56
7 SMOLUCHOWSKI PHYS 11 21% 1.1% 48
8 NANO CLUSTER DEVICES LTD 11 78% 0.2% 7
9 QUANTUM SCI ENGN 9 13% 1.6% 68
10 EPSRC XPS USERS SERV NEXUS 9 83% 0.1% 5

Related classes at same level (level 2)


Rank Relatedness score Related classes
1 0.0000059354 IMAGING MASS SPECTROMETRY//MASS SPECTROMETRY IMAGING//MALDI IMAGING
2 0.0000021903 SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP
3 0.0000015040 SURFACE DIFFUSION//ISLAND MORPHOLOGY//LATINOAMER ESTUDIOS ILYA PRIGOGINE
4 0.0000011893 JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY//RAPID COMMUNICATIONS IN MASS SPECTROMETRY//INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
5 0.0000009133 ZEITSCHRIFT FUR PHYSIK D-ATOMS MOLECULES AND CLUSTERS//ATOMIC CLUSTERS//SUPERHALOGEN
6 0.0000007136 PROBLEMS GEOTHERMY//PROBLEMS GEOTHERM//BURYAT SCI
7 0.0000007124 HIPIMS//HPPMS//HIGH POWER IMPULSE MAGNETRON SPUTTERING
8 0.0000005551 ION BEAM MIXING//RADIAT BEAM MAT ENGN//BALLISTIC MIXING
9 0.0000005400 STOPPING POWER//LAMOR//RESONANT COHERENT EXCITATION
10 0.0000005258 MAEAM//MODIFIED EMBEDDED ATOM METHOD//RADIAT NUCL DETECT MAT ANAL